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    • 6. 发明授权
    • Internally controlling and enhancing logic built-in self test in a multiple core microprocessor
    • 在多核微处理器中内部控制和增强逻辑内置自检
    • US08122312B2
    • 2012-02-21
    • US12423442
    • 2009-04-14
    • Michael S. FloydJoshua D. FriedrichRobert B. GassNorman K. James
    • Michael S. FloydJoshua D. FriedrichRobert B. GassNorman K. James
    • G01R31/28
    • G01R31/3187G01R31/31724G06F11/27
    • A mechanism is provided for internally controlling and enhancing logic built-in self test in a multiple core microprocessor. The control core may use architectural support for scan and external scan communication (XSCOM) to independently test the other cores while adjusting their frequency and/or voltage. A program loaded onto the control core may adjust the frequency and configure the LBIST to run on each of the cores under test. Once LBIST has completed on a core under test, the control core's program may evaluate the results and decide a next test to run for that core. For isolating failing latch positions, the control core may iteratively configure the LBIST mask and sequence registers on the core under test to determine the location of the failing latch. The control core may control the LBIST stump masks to isolate the failure to a particular latch scan ring and then position within that ring.
    • 提供了一种用于在多核微处理器内部控制和增强逻辑内置自检的机制。 控制核心可以使用架构支持扫描和外部扫描通信(XSCOM)来独立测试其他内核,同时调整其频率和/或电压。 加载到控制核心上的程序可以调整频率并配置LBIST以在被测试的每个核心上运行。 一旦LBIST已经在被测核心上完成,控制核心的程序可以评估结果并决定下一个测试以运行该核心。 为了隔离失效的锁存位置,控制核可以迭代地配置待测核心上的LBIST掩码和序列寄存器,以确定故障锁存器的位置。 控制核心可以控制LBIST残端掩模以将故障隔离到特定的锁存扫描环,然后位于该环内。