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    • 5. 发明授权
    • Carbon overcoat for a slider with improved step coverage
    • 用于滑块的碳涂层,具有改进的台阶覆盖
    • US5943187A
    • 1999-08-24
    • US878976
    • 1997-06-18
    • Pei C. ChenCherngye HwangVedantham RamanJila Tabib
    • Pei C. ChenCherngye HwangVedantham RamanJila Tabib
    • G11B5/10G11B5/255G11B5/31G11B5/39G11B5/60G11B5/72G11B5/82G11B5/84
    • G11B5/6005G11B5/10G11B5/255G11B5/3106G11B5/3967G11B5/72G11B5/82G11B5/8408
    • A method is provided for applying an overcoat to a slider and sensitive elements of a magnetic head which has improved coverage, reduced spacing loss and improved corrosion resistance. After lapping, an overcoat material is sputter deposited on the air bearing surface (ABS) of the slider, followed by a step of sputter etching the overcoat. The sputter etching redeposits material from high points on the slider and fills in trenches formed during the lapping process. The redeposition of the overcoat from the high places to the low places of the slider decreases the overall thickness of the overcoat, thereby decreasing spacing loss. The filling of the trenches implements increased coverage which increases wear resistance of the slider and more adequately protects the sensitive elements of the magnetic head from corrosion. In a preferred embodiment, a portion of the overcoat is left on the high places to ensure that the sputter etching does not damage the sensitive elements of the magnetic head. If the overcoat is completely etched from the high places an optional second overcoat may be applied which is thinner than the first overcoat. This method may also be applied to other articles such as a magnetic disk.
    • 提供了一种将外涂层施加到滑块和磁头的敏感元件的方法,其具有改进的覆盖范围,减小的间隔损耗和改善的耐腐蚀性。 研磨后,将外涂层材料溅射沉积在滑块的空气轴承表面(ABS)上,随后溅射蚀刻外涂层。 溅射蚀刻从滑块上的高点重新沉积材料,并填充研磨过程中形成的沟槽。 外涂层从滑块的高处重新沉积到滑块的低处降低了外涂层的总厚度,从而减小了间隔损耗。 沟槽的填充实现增加的覆盖,增加滑块的耐磨性,并更充分地保护磁头的敏感元件不被腐蚀。 在优选实施例中,外涂层的一部分留在高处,以确保溅射蚀刻不会损坏磁头的敏感元件。 如果外涂层从高处完全蚀刻,则可以施加比第一外涂层更薄的任选的第二外涂层。 该方法也可以应用于诸如磁盘的其它物品。
    • 8. 发明授权
    • Dual gap horizontal thin film inductive head
    • 双间隙水平薄膜感应头
    • US5926350A
    • 1999-07-20
    • US616607
    • 1996-03-15
    • Andrew ChiuCherngye HwangRandall George Simmons
    • Andrew ChiuCherngye HwangRandall George Simmons
    • G11B5/23G11B5/245G11B5/31G11B5/29G11B5/147
    • G11B5/3153G11B5/3163G11B5/3183G11B5/23G11B5/2455
    • A dual gap horizontal thin film inductive head is provided which writes wide and reads narrow so as to avoid noise problems when reading an information track on a magnetic medium. The head has first and second gap layers between first and second horizontal pole tips. The pole tips and the corresponding pole pieces of the head are constructed of a high magnetic moment material, such as NiFe (Permalloy). The first gap layer is constructed of a magnetic insulator, such as tungsten, and the second gap layer is constructed of a low magnetic moment material, such as NiFeCr. Accordingly, the magnetic moment of the second gap layer is lower than the magnetic moment of the first and second pole tips and the corresponding first and second pole pieces. During recording both gap layers function as a gap because the second gap layer is saturated and behaves as a magnetic insulator. During playback only the first gap layer functions a gap because the second gap layer is not saturated causing it to behave as a magnetic conductor. Accordingly, during record the head "writes wide" and during playback the head "reads narrow." A unique method is provided for making the head which employs a vertical edge of a photoresist layer for forming the first and second gap layers.
    • 提供双间隙水平薄膜感应头,其写入宽且读取窄,以便在磁介质上读取信息轨道时避免噪声问题。 头部在第一和第二水平极尖之间具有第一和第二间隙层。 磁头尖端和磁头的对应极片由高磁矩材料(如NiFe(坡莫合金))构成。 第一间隙层由诸如钨的磁绝缘体构成,第二间隙层由诸如NiFeCr的低磁矩材料构成。 因此,第二间隙层的磁矩低于第一和第二极尖以及对应的第一和第二极靴的磁矩。 在记录期间,两个间隙层用作间隙,因为第二间隙层是饱和的并且表现为磁绝缘体。 在回放期间,只有第一间隙层起间隙的作用,因为第二间隙层不饱和导致其作为磁导体。 因此,在记录期间,头部“写入宽”,并且在播放期间,头部“读取狭窄”。 提供了一种独特的方法来制造采用光致抗蚀剂层的垂直边缘以形成第一和第二间隙层的头部。
    • 9. 发明授权
    • Method of forming uniform features using photoresist
    • 使用光刻胶形成均匀特征的方法
    • US07560225B2
    • 2009-07-14
    • US10448501
    • 2003-05-29
    • Omar Eduardo Montero CamachoPei-C ChenCherngye HwangDiana PerezEric Yongjian Sun
    • Omar Eduardo Montero CamachoPei-C ChenCherngye HwangDiana PerezEric Yongjian Sun
    • G03F7/40B44C1/22
    • G11B5/3173G03F7/40G03F7/405G11B5/102
    • A process for ion milling using photoresist as a mask is described. In a preferred embodiment the invention is used in the fabricating air-bearing features on sliders for use in magnetic storage devices. According to the invention the photoresist (liquid or dry) is applied, developed and removed as in the prior art which includes baking steps. The embodiment of the invention includes an additional baking step beyond whatever baking steps are used in the photolithography process. The additional baking step is preferably performed immediately prior to ion milling. The additional baking step according to the invention yields increased uniformity of the depth of the ion milling which is believed to result from reduction of volatile material such as water in the photoresist. When the invention is used as part of the manufacturing process for ion milling the air-bearing features on a slider, the features are more uniform which improves the overall quality and performance.
    • 描述使用光致抗蚀剂作为掩模的离子铣削的方法。 在优选实施例中,本发明用于制造用于磁存储装置的滑块上的空气轴承特征。 根据本发明,如在包括烘烤步骤的现有技术中,应用,显影和去除光致抗蚀剂(液体或干燥)。 本发明的实施例包括除了在光刻工艺中使用的任何烘烤步骤之外的额外的烘烤步骤。 额外的烘烤步骤优选在离子研磨之前立即进行。 根据本发明的另外的烘烤步骤产生离子研磨深度的均匀性,这被认为是通过光致抗蚀剂中的挥发性物质例如水的还原引起的。 当将本发明用作离子铣削制造过程的一部分时,滑块上的空气轴承特征更加均匀,这提高了整体的质量和性能。