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    • 2. 发明申请
    • DETECTOR FOR ALPHA PARTICLE OR COSMIC RAY
    • ALPHA颗粒或COSMIC RAY的检测器
    • US20050012045A1
    • 2005-01-20
    • US10604416
    • 2003-07-18
    • John FifieldPaul KartschokeWilliam KIaasenStephen KosonockyRandy MannJeffery OppoldNorman Rohrer
    • John FifieldPaul KartschokeWilliam KIaasenStephen KosonockyRandy MannJeffery OppoldNorman Rohrer
    • G01J1/00G11C11/412
    • G11C11/4125
    • A detector circuit and method for detecting a silicon well voltage or current to indicate an alpha particle or cosmic ray strike of the silicon well. One significant application for the detection circuit of the present invention is for the redundancy repair latches that are used in SRAMs. The redundancy repair latches are normally written once at power-up to record failed latch data and are not normally written again. If one of the latches changes states due to an SER (Soft Error Rate-such as a strike by an alpha particle or cosmic ray) event, the repair data in the redundancy latches of the SRAM would now be incorrectly mapped. The detector circuit and method monitors the latches for the occurrence of an SER event, and responsive thereto issues a reload of the repair data to the redundancy repair latches. A first embodiment of the detector circuit differentially detects the floating voltages of first and second silicon wells during periods of non-operation of the circuits fabricated in the first and second silicon wells. In a second embodiment, a detector circuit monitors the background voltage level of a single silicon well over first and second consecutive periods of time. A second application for the detection circuit is for traditional logic circuits.
    • 一种用于检测硅阱电压或电流以指示硅阱的α粒子或宇宙射线冲击的检测器电路和方法。 本发明的检测电路的一个重要应用是用于SRAM中的冗余修复锁存器。 冗余修复锁存器在上电时通常写入一次,以记录失败的锁存数据,并且通常不会再次写入。 如果其中一个锁存器由于SER(软错误率(例如α粒子或宇宙射线的击穿))事件而改变状态,则SRAM的冗余锁存器中的修复数据现在将被错误地映射。 检测器电路和方法监视锁存器以发生SER事件,并且响应于此,将修复数据重新加载到冗余修复锁存器。 检测器电路的第一实施例在第一和第二硅阱中制造的电路的非操作期间差分地检测第一和第二硅阱的浮置电压。 在第二实施例中,检测器电路在第一和第二连续时间段内监测单个硅阱的背景电压电平。 检测电路的第二个应用是传统的逻辑电路。
    • 5. 发明申请
    • Circuits and methods for characterizing random variations in device characteristics in semiconductor integrated circuits
    • 用于表征半导体集成电路器件特性随机变化的电路和方法
    • US20050043908A1
    • 2005-02-24
    • US10643193
    • 2003-08-18
    • Azeez BhavnagarwalaDavid FrankStephen Kosonocky
    • Azeez BhavnagarwalaDavid FrankStephen Kosonocky
    • G01R27/28G01R31/26G01R31/30G01R31/317G01R31/3173G01R31/3193G11C29/50
    • G11C29/50004G01R31/2603G01R31/3016G01R31/31725G01R31/31727G01R31/3173G01R31/31937G11C11/41G11C29/50G11C2029/5002
    • Circuits and methods for measuring and characterizing random variations in device characteristics of semiconductor integrated circuit devices, which enable circuit designers to accurately measure and characterize random variations in device characteristics (such as transistor threshold voltage) between neighboring devices resulting from random sources such as dopant fluctuations and line edge roughness, for purposes of integrated circuit design and analysis. In one aspect, a method for characterizing random variations in device mismatch (e.g., threshold voltage mismatch) between a pair of device (e.g., transistors) is performed by obtaining subthreshold DC voltage characteristic data for the device pair, and then determining a distribution in voltage threshold mismatch for the device pair directly from the corresponding subthreshold DC voltage characteristic data. The voltage threshold mismatch distributions of different device pairs of a given circuit design can then be used to determine voltage threshold variations of the constituent circuit devices. The voltage threshold variation of the devices can be used to characterize the random variations of the given circuit.
    • 用于测量和表征半导体集成电路器件的器件特性的随机变化的电路和方法,其使电路设计者能够精确地测量和表征由诸如掺杂剂波动的随机源产生的相邻器件之间的器件特性(例如晶体管阈值电压)的随机变化 和线边缘粗糙度,用于集成电路设计和分析。 在一方面,通过获得器件对的亚阈值DC电压特性数据来执行用于表征一对器件(例如,晶体管)之间的器件失配(例如,阈值电压失配)的随机变化的方法,然后确定器件对中的分布 直接从对应的亚阈值直流电压特性数据中的器件对的电压阈值失配。 然后可以使用给定电路设计的不同器件对的电压阈值失配分布来确定构成电路器件的电压阈值变化。 器件的电压阈值变化可用于表征给定电路的随机变化。
    • 9. 发明申请
    • Static random access memory cell with improved stability
    • 静态随机存取存储单元具有改进的稳定性
    • US20070247896A1
    • 2007-10-25
    • US11409858
    • 2006-04-24
    • Azeez BhavnagarwalaStephen KosonockySampath PurushothamanKenneth Rodbell
    • Azeez BhavnagarwalaStephen KosonockySampath PurushothamanKenneth Rodbell
    • G11C11/00
    • G11C11/4125Y10S257/903
    • A memory cell comprises a wordline, a first digital inverter with a first input and a first output, and a second digital inverter with a second input and a second output. Moreover, the memory cell further comprises a first feedback connection connecting the first output to the second input, and a second feedback connection connecting the second output to the first input. The first feedback connection comprises a first resistive element and the second feedback connection comprises a second resistive element. What is more, each digital inverter has an associated capacitance. The memory cell is configured such that reading the memory cell includes applying a read voltage pulse to the wordline. In addition, the first and second resistive elements are configured such that the first and second feedback connections have resistance-capacitance induced delays longer than the applied read voltage pulse.
    • 存储单元包括字线,具有第一输入和第一输出的第一数字逆变器以及具有第二输入和第二输出的第二数字反相器。 此外,存储单元还包括将第一输出连接到第二输入的第一反馈连接和将第二输出连接到第一输入的第二反馈连接。 第一反馈连接包括第一电阻元件,第二反馈连接包括第二电阻元件。 更重要的是,每个数字逆变器都有相关的电容。 存储单元被配置为使得读取存储器单元包括将读取电压脉冲施加到字线。 此外,第一和第二电阻元件被配置为使得第一和第二反馈连接具有比施加的读取电压脉冲更长的电阻 - 电容感应延迟。
    • 10. 发明申请
    • Charge recycling power gate
    • 充电回收电源门
    • US20050285628A1
    • 2005-12-29
    • US10880111
    • 2004-06-29
    • Suhwan KimDaniel KnebelStephen Kosonocky
    • Suhwan KimDaniel KnebelStephen Kosonocky
    • H03K19/00H03K19/094
    • H03K19/0019
    • A charge recycling power gate and corresponding method are provided for using a charge sharing effect between a capacitive load of a functional unit and a parasitic capacitance of a charge recycling means to turn on a switching means between a virtual ground and a ground, the charge recycling power gate including a first transistor, a virtual ground in signal communication with a first terminal of the first transistor, a ground in signal communication with a second terminal of the first transistor, a capacitor having a first terminal in signal communication with a third terminal of the first transistor and a second terminal in signal communication with the ground, and a second transistor having a first terminal in signal communication with the virtual ground and a second terminal in signal communication with the third terminal of the first transistor.
    • 提供电荷回收功率门和相应的方法,用于使用功能单元的电容性负载与电荷回收装置的寄生电容之间的电荷共享效应,以接通虚拟地面和地面之间的开关装置,电荷回收 功率门,包括第一晶体管,与第一晶体管的第一端子进行信号通信的虚拟地,与第一晶体管的第二端子进行信号通信的地,电容器,具有与第三晶体管的第三端子信号通信的第一端子 第一晶体管和与地面信号通信的第二端子,以及第二晶体管,其具有与虚拟接地信号通信的第一端子和与第一晶体管的第三端子信号通信的第二端子。