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1. 发明授权

US07999530B2 Device under test power supply 有权
标题翻译：被测设备电源
公开(公告)号：US07999530B2
公开(公告)日：2011-08-16
申请号：US12408157
申请日：2009-03-20
申请人： Patrick Sullivan , Steven R. Bristow , William Robert Creek , Jeffrey Allen King
发明人： Patrick Sullivan , Steven R. Bristow , William Robert Creek , Jeffrey Allen King
IPC分类号： H02M3/156 , G01R31/40
CPC分类号： H03F3/72 , H03F3/45475
摘要： A power supply with and input and output includes an amplifier configured to set an output voltage of the power supply output equal to a fixed input voltage for the power supply. The power supply has a first output stage coupled to the amplifier and configured to source and sink current at the output of the power supply between a first voltage rail and a third voltage rail. The power supply has a second output stage coupled to the amplifier and configured to source and sink current to the output of the power supply between a second voltage rail and the third voltage rail. A selection device is configured to enable the first and second output stages based on a selection input signal. The selection device is situated outside of the first and the second output stages.
摘要翻译：具有输入和输出的电源包括放大器，其配置为将电源输出的输出电压设置为等于电源的固定输入电压。电源具有耦合到放大器的第一输出级，并且被配置为在第一电压轨和第三电压轨之间的电源的输出处源极和吸收电流。电源具有耦合到放大器的第二输出级，并且被配置为将电流源流和吸收到第二电压轨和第三电压轨之间的电源的输出。选择装置被配置为基于选择输入信号启用第一和第二输出级。选择装置位于第一和第二输出级之外。

2. 发明申请

US20110298483A1 TESTER HAVING DEVICE UNDER TEST POWER SUPPLY 有权
标题翻译：具有测试电源的设备的测试仪
公开(公告)号：US20110298483A1
公开(公告)日：2011-12-08
申请号：US13211077
申请日：2011-08-16
申请人： Patrick Sullivan , Steven R. Bristow , William Robert Creek , Jeffrey Allen King
发明人： Patrick Sullivan , Steven R. Bristow , William Robert Creek , Jeffrey Allen King
IPC分类号： G01R31/00
CPC分类号： H03F3/72 , H03F3/45475
摘要： A tester includes a device under test (DUT) power supply (DPS) with and input and output includes an amplifier configured to set an output voltage of the DPS output equal to an input voltage for the DPS. The DPS has a first output stage coupled to the amplifier and configured to source and sink current at the output of the DPS between a first voltage rail and a third voltage rail. TheDPS has a second output stage coupled to the amplifier and configured to source and sink current to the output of the DPS between a second voltage rail and the third voltage rail. A selection device is configured to enable the first and second output stages based on a selection input signal. The selection device is situated outside of the first and the second output stages.
摘要翻译：测试器包括被测设备（DUT）电源（DPS），输入和输出包括放大器，其配置为将DPS输出的输出电压设置为等于DPS的输入电压。 DPS具有耦合到放大器并被配置为在第一电压轨和第三电压轨之间的DPS的输出端处的电流和电流的第一输出级。 DPS具有耦合到放大器的第二输出级，并被配置为将电流源和吸收到DPS在第二电压轨和第三电压轨之间的输出。选择装置被配置为基于选择输入信号启用第一和第二输出级。选择装置位于第一和第二输出级之外。

3. 发明申请

US20100066448A1 DEVICE UNDER TEST POWER SUPPLY 有权
标题翻译：测试电源下的设备
公开(公告)号：US20100066448A1
公开(公告)日：2010-03-18
申请号：US12408157
申请日：2009-03-20
申请人： Patrick G. Sullivan , Steven R. Bristow , William Robert Creek , Jeffrey Allen King
发明人： Patrick G. Sullivan , Steven R. Bristow , William Robert Creek , Jeffrey Allen King
IPC分类号： H03F3/45
CPC分类号： H03F3/72 , H03F3/45475
摘要： A power supply with and input and output includes an amplifier configured to set an output voltage of the power supply output equal to a fixed input voltage for the power supply. The power supply has a first output stage coupled to the amplifier and configured to source and sink current at the output of the power supply between a first voltage rail and a third voltage rail. The power supply has a second output stage coupled to the amplifier and configured to source and sink current to the output of the power supply between a second voltage rail and the third voltage rail. A selection device is configured to enable the first and second output stages based on a selection input signal. The selection device is situated outside of the first and the second output stages.
摘要翻译：具有输入和输出的电源包括放大器，其配置为将电源输出的输出电压设置为等于电源的固定输入电压。电源具有耦合到放大器的第一输出级，并且被配置为在第一电压轨和第三电压轨之间的电源的输出处源极和吸收电流。电源具有耦合到放大器的第二输出级，并且被配置为将电流源流和吸收到第二电压轨和第三电压轨之间的电源的输出。选择装置被配置为基于选择输入信号启用第一和第二输出级。选择装置位于第一和第二输出级之外。

4. 发明授权

US08207725B2 Tester having device under test power supply 有权
标题翻译：测试仪具有受测试电源
公开(公告)号：US08207725B2
公开(公告)日：2012-06-26
申请号：US13211077
申请日：2011-08-16
申请人： Patrick Sullivan , Steven R. Bristow , William R. Creek , Jeffrey Allen King
发明人： Patrick Sullivan , Steven R. Bristow , William R. Creek , Jeffrey Allen King
IPC分类号： H02M3/156 , G01R31/40
CPC分类号： H03F3/72 , H03F3/45475
摘要： A tester includes a device under test (DUT) power supply (DPS) with and input and output includes an amplifier configured to set an output voltage of the DPS output equal to an input voltage for the DPS. The DPS has a first output stage coupled to the amplifier and configured to source and sink current at the output of the DPS between a first voltage rail and a third voltage rail. The DPS has a second output stage coupled to the amplifier and configured to source and sink current to the output of the DPS between a second voltage rail and the third voltage rail. A selection device is configured to enable the first and second output stages based on a selection input signal. The selection device is situated outside of the first and the second output stages.
摘要翻译：测试器包括被测设备（DUT）电源（DPS），输入和输出包括放大器，其配置为将DPS输出的输出电压设置为等于DPS的输入电压。 DPS具有耦合到放大器并被配置为在第一电压轨和第三电压轨之间的DPS的输出端处的电流和电流的第一输出级。 DPS具有耦合到放大器的第二输出级，并被配置为将电流源和吸收到DPS在第二电压轨和第三电压轨之间的输出。选择装置被配置为基于选择输入信号启用第一和第二输出级。选择装置位于第一和第二输出级之外。

5. 发明申请

US20150028905A1 SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES 有权
公开(公告)号：US20150028905A1
公开(公告)日：2015-01-29
申请号：US13960662
申请日：2013-08-06
申请人： Jeffrey Allen King
发明人： Jeffrey Allen King
IPC分类号： G01R35/00
CPC分类号： G01R31/3191 , G01R31/2879 , G01R35/005
摘要： Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.

6. 发明申请

US20150028902A1 SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES 有权
标题翻译：电子设备中电路温度依赖性的系统和方法
公开(公告)号：US20150028902A1
公开(公告)日：2015-01-29
申请号：US13960615
申请日：2013-08-06
申请人： Jeffrey Allen King
发明人： Jeffrey Allen King
IPC分类号： G01R31/319
CPC分类号： G01R31/3191 , G01R31/2879 , G01R35/005
摘要： Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.
摘要翻译：公开了用于补偿电子电路和系统的性能的温度变化的方法和系统。在一些实施例中，系统被配置为存储在校准中确定的补偿参数，其中系统使用补偿参数来修改性能。在一些实施例中，系统是自动测试设备（ATE）系统的一部分。

7. 发明申请

US20150028899A1 SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES 有权
公开(公告)号：US20150028899A1
公开(公告)日：2015-01-29
申请号：US13960566
申请日：2013-08-06
申请人： Jeffrey Allen King
发明人： Jeffrey Allen King
IPC分类号： G01R31/319
CPC分类号： G01R31/3191 , G01R31/2879 , G01R35/005
摘要： Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.

8. 发明授权

US10180453B2 Increased power efficiency in driver circuits 有权
公开(公告)号：US10180453B2
公开(公告)日：2019-01-15
申请号：US14845776
申请日：2015-09-04
申请人： Jeffrey Allen King
发明人： Jeffrey Allen King
IPC分类号： G01R31/28 , H03K17/00 , H02M1/00
摘要： Methods and systems for sourcing and/or sinking current from power supplies of differing voltage levels. A driving circuit may, for example, receive power from first and second power supplies, where the first power supply provides current to the driving circuit at a first voltage level and the second power supply provides current to the driving circuit at a second voltage level, and where the first voltage is greater than the second voltage. As a result, the first power supply allows the driving circuit to provide current over a wide voltage range, and the second power supply allows the driving circuit to provide current at lower voltages with less power consumption.

9. 发明申请

US20150028904A1 SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES 有权
公开(公告)号：US20150028904A1
公开(公告)日：2015-01-29
申请号：US13960643
申请日：2013-08-06
申请人： Jeffrey Allen King
发明人： Jeffrey Allen King
IPC分类号： G01R31/319
CPC分类号： G01R31/3191 , G01R31/2879 , G01R35/005
摘要： Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.

10. 发明申请

US20150032403A1 SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES 有权
公开(公告)号：US20150032403A1
公开(公告)日：2015-01-29
申请号：US13960674
申请日：2013-08-06
申请人： Jeffrey Allen King
发明人： Jeffrey Allen King
IPC分类号： G01R31/319
CPC分类号： G01R31/3191 , G01R31/2879 , G01R35/005
摘要： Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.

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