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    • 2. 发明授权
    • Electrically erasable and programmable non-volatile memory cell
    • 电可擦除和可编程的非易失性存储单元
    • US06876033B2
    • 2005-04-05
    • US10606164
    • 2003-06-25
    • Paolo CappellettiPaolo GhezziAlfonso MaurelliLoris VendramePaola Zabberoni
    • Paolo CappellettiPaolo GhezziAlfonso MaurelliLoris VendramePaola Zabberoni
    • H01L21/8247H01L27/105H01L29/788
    • H01L27/11526H01L27/105H01L27/11534H01L29/7885
    • An electrically erasable and programmable memory cell is provided. The memory cell includes a floating gate MOS transistor and a bipolar transistor for injecting an electric charge into the floating gate. The floating gate transistor has a source region and a drain region formed in a first well with a channel defined between the drain and source regions, a control gate region, and a floating gate extending over the channel and the control gate region. The bipolar transistor has an emitter region formed in the first well, a base region consisting of the first well, and a collector region consisting of the channel. The memory cell includes a second well that is insulated from the first well, and the control gate region is formed in the second well. Further embodiments of the present invention provide a memory including at least one such memory cell, an electronic device including such a memory, and methods of integrating a memory cell and erasing a memory cell.
    • 提供电可擦除和可编程的存储单元。 存储单元包括浮置栅极MOS晶体管和用于将电荷注入浮置栅极的双极晶体管。 浮置栅极晶体管具有形成在第一阱中的源极区和漏极区,沟道限定在漏极和源极区之间,控制栅极区以及在沟道和控制栅极区上延伸的浮动栅极。 双极晶体管具有形成在第一阱中的发射极区域,由第一阱构成的基极区域和由沟道组成的集电极区域。 存储单元包括与第一阱绝缘的第二阱,并且控制栅区形成在第二阱中。 本发明的另外的实施例提供了包括至少一个这样的存储单元的存储器,包括这种存储器的电子设备,以及集成存储器单元和擦除存储器单元的方法。
    • 4. 发明申请
    • MANUFACTURING METHOD FOR NON-ACTIVE ELECTRICALLY STRUCTURES OF AN INTEGRATED ELECTRONIC CIRCUIT FORMED ON A SEMICONDUCTOR SUBSTRATE AND CORRESPONDING ELECTRONIC CIRCUIT
    • 在半导体基板和相应电子电路上形成的集成电子电路的非主动电气结构的制造方法
    • US20070287290A1
    • 2007-12-13
    • US11754494
    • 2007-05-29
    • Alfonso MaurelliDaniela PeschiaroliFausto PiazzaCarlo VigianiPaola Zabberoni
    • Alfonso MaurelliDaniela PeschiaroliFausto PiazzaCarlo VigianiPaola Zabberoni
    • H01L21/302H01L21/31
    • H01L27/11526H01L27/0207H01L27/105H01L27/1052H01L27/11519H01L27/11534
    • Electrically non-active structures are formed for an electronic circuit to make uniform a surface above a semiconductor substrate. The electronic circuit includes first electrically active structures comprising conductive elements of a first height projecting from the semiconductor substrate, and second electrically active structures comprising conductive elements of a second height projecting from the semiconductor substrate. The first height is different from the second height. The electrically non-active structures are formed by identifying, among the electrically non-active structures, a first group of electrically non-active structures formed within areas that substantially extend for a radius around each electrical component belonging to the second electrically active structures. The method further includes identifying, among the electrically non-active structures, a second group of electrically non-active structures not belonging to the first group of electrically non-active structures. The electrically non-active structures belonging to the first group of electrically non-active structures are formed with elements projecting from the semiconductor substrate having a height equal to the second height. The electrically non-active structures belonging to the second group of electrically non-active structures are formed with elements projecting from the semiconductor substrate having a height equal to the first height.
    • 形成用于电子电路的电非结构以在半导体衬底上方形成均匀的表面。 电子电路包括第一电活动结构,其包括从半导体衬底突出的第一高度的导电元件,以及包括从半导体衬底突出的第二高度的导电元件的第二电活动结构。 第一高度与第二高度不同。 电非活性结构通过在电非活性结构之中识别形成在基本上延伸用于围绕属于第二电活动结构的每个电气部件的半径的区域内的第一组电非活性结构而形成。 该方法还包括在电非活性结构中识别不属于第一组电非活性结构的第二组电非活性结构。 属于第一组电非活性结构的电非活性结构由具有等于第二高度的高度从半导体衬底突出的元件形成。 属于第二组电非活性结构的电非活性结构由具有等于第一高度的高度的半导体衬底突出的元件形成。
    • 10. 发明授权
    • Method of fabrication of a no-field MOS transistor
    • 无场MOS晶体管的制造方法
    • US06350637B1
    • 2002-02-26
    • US09543400
    • 2000-04-05
    • Alfonso MaurelliPaola Zabberoni
    • Alfonso MaurelliPaola Zabberoni
    • H01L21336
    • H01L29/0847H01L29/4238H01L29/66477
    • Method of fabrication of a no-field transistor with no extra process costs, providing for defining an active area for the transistor surrounded by a thick field oxide layer, insulatively placing a polysilicon gate electrode across the active area to define source/drain regions of the no-field transistor, providing an implant protection mask over a boundary between at least one of the source/drain regions and the field oxide layer, selectively implanting in said source/drain regions a relatively heavy dose of dopants to form relatively heavily doped source/drain regions and to simultaneously dope the polysilicon gate electrode, the polysilicon gate electrode formed with lateral wings extending towards the at least one source/drain region, and the implant protection mask extending over the lateral wings but not over the polysilicon gate.
    • 制造没有额外工艺成本的无场晶体管的方法,提供限定由厚场氧化物层围绕的晶体管的有源区域,绝缘地将多晶硅栅极电极放置在有源区域上以限定源极/漏极区域 无源晶体管,在源极/漏极区域和场氧化物层中的至少一个之间的边界上提供注入保护掩模,选择性地在所述源/漏区域中注入相对较大剂量的掺杂剂以形成相对高掺杂的源极/ 漏极区域并且同时掺杂多晶硅栅电极,形成有朝向至少一个源极/漏极区域延伸的侧翼的多晶硅栅极电极以及在侧翼上延伸但不在多晶硅栅极上的植入物保护掩模。