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    • 3. 发明申请
    • Semiconductor structure and an apparatus and a method for producing a semiconductor structure
    • 半导体结构以及半导体结构的制造装置及其制造方法
    • US20080211115A1
    • 2008-09-04
    • US11713568
    • 2007-03-02
    • Olaf StorbeckRegina Hayn
    • Olaf StorbeckRegina Hayn
    • H01L23/29
    • H01L21/3144H01L21/0214H01L21/02238H01L21/02252H01L21/02332H01L21/0234H01L21/31662
    • In a method of forming an insulating layer on a silicon substrate, the silicon substrate is arranged inside a process chamber. An oxide layer is formed on the substrate's surface. An electrical field is applied and an oxygen particles containing plasma is provided above the substrate's surface. The electrical field accelerates the oxygen particles in the direction of the surface so that the oxygen particles penetrate inside the substrate and form said oxide layer. Thereafter, the stoichiometry of the oxide layer is modified. A nitrogen particles containing plasma is provided above the substrate's surface. The electrical field accelerates the nitrogen particles in the direction of the surface so that the nitrogen particles penetrate inside the oxide layer and modify the stoichiometry of the oxide layer. The step of forming the oxide layer and the step of modifying the stoichiometry are carried out inside the same process chamber.
    • 在硅衬底上形成绝缘层的方法中,硅衬底布置在处理室的内部。 在基板的表面上形成氧化物层。 施加电场,并且在基板表面上方设置含有等离子体的氧颗粒。 电场在表面的方向上加速氧颗粒,使得氧颗粒穿透衬底内并形成所述氧化物层。 此后,改变氧化物层的化学计量。 含有等离子体的氮颗粒设置在基板的表面上方。 电场在表面的方向上加速氮颗粒,使得氮颗粒穿透氧化物层内部并改变氧化物层的化学计量。 形成氧化物层的步骤和改变化学计量的步骤在相同的处理室内进行。
    • 7. 发明授权
    • Trench capacitor structure and process for applying a covering layer and a mask for trench etching processes in semiconductor substrates
    • 沟槽电容器结构和用于在半导体衬底中施加用于沟槽蚀刻工艺的覆盖层和掩模的工艺
    • US07547646B2
    • 2009-06-16
    • US10974797
    • 2004-10-28
    • Henry BernhardtMichael StadtmüllerOlaf StorbeckStefan Kainz
    • Henry BernhardtMichael StadtmüllerOlaf StorbeckStefan Kainz
    • H01L21/31H01L21/469
    • H01L27/10861H01L21/3081H01L21/3144H01L21/3185H01L27/1087H01L29/66181
    • A stress relief layer between a single-crystal semiconductor substrate and a deposited silicon nitride layer or pad nitride is formed from thermally produced silicon nitride. The stress relief layer made from thermally produced silicon nitride replaces a silicon dioxide layer or pad oxide which is customary at this location for example in connection with mask layers. After patterning of a mask, which includes a protective layer portion formed from deposited silicon nitride, the material which is provided according to the invention for the stress relief layer reduces the restrictions imposed for subsequent process steps, such as for example wet-etching steps, acting both on the semiconductor substrate or structures in the semiconductor substrate and also on the stress relief layer. The thermal nitriding is advantageously incorporated into a preanneal step for expelling oxygen from the semiconductor substrate, so that the semiconductor substrate is protected from the etching action of the expelled oxygen by the stress relief layer which is formed, there is no need for an additional temporary etching protection layer for the semiconductor substrate and the overall processing is streamlined.
    • 单晶半导体衬底和沉积的氮化硅层或衬垫氮化物之间的应力消除层由热生产的氮化硅形成。 由热产生的氮化硅制成的应力消除层代替例如与掩模层结合在该位置上通常的二氧化硅层或焊盘氧化物。 在包括由沉积的氮化硅形成的保护层部分的掩模图案化之后,根据本发明为应力消除层提供的材料减少了对随后的工艺步骤施加的限制,例如湿蚀刻步骤, 在半导体衬底或半导体衬底中的结构以及应力消除层上均起作用。 热氮化有利地结合到用于从半导体衬底排出氧的预退火步骤中,使得半导体衬底被形成的应力消除层免受排出的氧的蚀刻作用,不需要额外的临时 用于半导体衬底的蚀刻保护层和整体处理被简化。