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1. 发明申请

US20140021338A1 OPTICAL CHARACTERISTIC MEASURING APPARATUS 有权
公开(公告)号：US20140021338A1
公开(公告)日：2014-01-23
申请号：US13670397
申请日：2012-11-06
申请人： OTSUKA ELECTRONICS CO., LTD.
发明人： Kazuaki OHKUBO , Hisashi SHIRAIWA
IPC分类号： G02B17/00 , G01J1/04
CPC分类号： G02B17/00 , G01J1/0214 , G01J1/04 , G01J1/0407 , G01J1/0425 , G01J3/0218 , G01J3/0254 , G01J3/0262 , G01J3/505 , G01J2001/0481 , G01J2001/4252 , G02B5/08
摘要： An optical characteristic measuring apparatus includes a hemispheric portion having a reflective surface on its inner wall, and a plane portion arranged to close an opening of the hemispheric portion and having a reflective surface on an inner-wall side of the hemispheric portion. The plane portion includes a first window occupying a range including a substantial center of curvature of the hemispheric portion for attaching a light source to the first window. At least one of the hemispheric portion and the plane portion includes a plurality of second windows arranged in accordance with a predetermined rule for extracting light from inside the hemispheric portion.

2. 发明申请

US20140224970A1 STANDARD LIGHT SOURCE AND MEASUREMENT METHOD 有权
标题翻译：标准光源和测量方法
公开(公告)号：US20140224970A1
公开(公告)日：2014-08-14
申请号：US14161690
申请日：2014-01-23
申请人： OTSUKA ELECTRONICS CO., LTD.
发明人： Kazuaki OHKUBO
IPC分类号： G01J1/08 , G01J1/42
CPC分类号： G01J1/08 , G01J1/42 , G01J2001/061 , G01J2001/4252
摘要： A novel standard light source with a more simplified construction, which is suitable for measurement of total luminous flux of a light source different in luminous intensity distribution characteristics from a conventional standard light source, and a measurement method with the use of that standard light source are provided. A standard light source includes a light emitting portion, a power feed portion electrically connected to the light emitting portion, and a restriction portion provided between the light emitting portion and the power feed portion, for restricting propagation of light radiated from the light emitting portion toward the power feed portion. A surface of the restriction portion on which light from the light emitting portion is incident is constructed for diffuse reflection.
摘要翻译：具有更简化结构的新型标准光源，其适合于测量与常规标准光源不同的发光强度分布特性的光源的总光通量，以及使用该标准光源的测量方法提供。标准光源包括发光部分，电连接到发光部分的供电部分和设置在发光部分和供电部分之间的限制部分，用于限制从发光部分辐射的光的传播朝向供电部。限制部分的来自发光部分的光入射的表面被构造用于漫反射。

3. 发明申请

US20140021340A1 OPTICAL CHARACTERISTIC MEASURING APPARATUS 有权
标题翻译：光学特性测量装置
公开(公告)号：US20140021340A1
公开(公告)日：2014-01-23
申请号：US13861377
申请日：2013-04-12
申请人： OTSUKA ELECTRONICS CO., LTD.
发明人： Kazuaki OHKUBO , Hisashi SHIRAIWA
IPC分类号： G01J1/04 , G02B5/08
CPC分类号： G02B17/00 , G01J1/0214 , G01J1/04 , G01J1/0407 , G01J1/0425 , G01J3/0218 , G01J3/0254 , G01J3/0262 , G01J3/505 , G01J2001/0481 , G01J2001/4252 , G02B5/08
摘要： An optical characteristic measuring apparatus includes a hemispheric portion having a reflective surface on its inner wall, and a plane portion arranged to close an opening of the hemispheric portion and having a reflective surface on an inner-wall side of the hemispheric portion. The plane portion includes a first window occupying a range including a substantial center of curvature of the hemispheric portion for attaching a light source to the first window. At least one of the hemispheric portion and the plane portion includes a plurality of second windows arranged in accordance with a predetermined rule for extracting light from inside the hemispheric portion.
摘要翻译：光学特性测量装置包括在其内壁上具有反射表面的半球形部分和布置成关闭半球形部分的开口并且在半球形部分的内壁侧上具有反射表面的平面部分。平面部分包括占据包括半球部分的基本曲率中心的范围的第一窗口，用于将光源附接到第一窗口。半球部分和平面部分中的至少一个包括根据用于从半球部分内部提取光的预定规则布置的多个第二窗口。

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