专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US12023429B2 Photodynamic therapy device and photodynamic therapy device cartridge 有权
公开(公告)号：US12023429B2
公开(公告)日：2024-07-02
申请号：US17433864
申请日：2019-02-26
申请人： OTSUKA ELECTRONICS CO., LTD.
发明人： Akira Tanaka , Shinpei Kajiwara
IPC分类号： A61M1/36 , A61N5/06
CPC分类号： A61M1/3683 , A61N5/062 , A61M2205/18 , A61N2005/0628 , A61N2005/0652
摘要： Provided is a photodynamic therapy device that enables efficient light irradiation of blood of a patient. A photodynamic therapy device (100) of this disclosure includes a cartridge (10) including a winding core and a tube arranged so as to be wound around the winding core, a casing (50) configured to accommodate the cartridge (10), and a light source (60), which is arranged inside the casing (50), and is configured to irradiate the tube with light. The tube arranged around the winding core has a cross section taken along a direction orthogonal to an extending direction of the tube, which has a first dimension in a first direction and a second dimension in a second direction orthogonal to the first direction. The second dimension is smaller than the first dimension. The second direction is directed outward with respect to the winding core.

2. 发明申请

US20220316862A1 OPTICAL MEASUREMENT SYSTEM, OPTICAL MEASUREMENT METHOD, AND NON-TRANSITORY STORAGE MEDIUM HAVING MEASUREMENT PROGRAM STORED THEREON 有权
公开(公告)号：US20220316862A1
公开(公告)日：2022-10-06
申请号：US17655899
申请日：2022-03-22
申请人： Otsuka Electronics Co., Ltd.
发明人： Shiro KAWAGUCHI , Kazuya NAKAJIMA , Hayato TAKIZAWA , Goro MAEDA
IPC分类号： G01B11/06 , G01J3/02 , G01J3/10
摘要： An optical measurement system includes a light source, a spectroscopic detector, a reference sample, a switching mechanism that switches between a first optical path through which a sample to be measured is irradiated with light from the light source and light produced at the sample is guided to the spectroscopic detector and a second optical path through which the reference sample is irradiated with light from the light source and light produced at the reference sample is guided to the spectroscopic detector, and a processing unit that calculates, by performing correction processing based on change between a first detection result at first time and a second detection result at second time, a measurement value of the sample from a third detection result provided from the spectroscopic detector as a result of irradiation of the sample with light from the light source at third time temporally proximate to the second time.

3. 发明授权

US11215443B2 Optical measurement apparatus and optical measurement method 有权
公开(公告)号：US11215443B2
公开(公告)日：2022-01-04
申请号：US17033996
申请日：2020-09-28
申请人： Otsuka Electronics Co., Ltd.
发明人： Kunikazu Taguchi
IPC分类号： G01B11/06 , G01B9/02 , G01N21/84
摘要： An optical measurement apparatus including: an irradiation optical system configured to irradiate, in a straight direction, a target area that includes a measurement area and a non-measurement area that is an area different from the measurement area, with irradiation light that includes a plurality of wavelengths; a reception optical system configured to receive measurement light that is transmission light or reflection light travelling from the target area as a result of the target area being irradiated with the irradiation light; and a calculation unit configured to generate a reception light spectrum that indicates a relationship between a wavelength and an intensity of the measurement light, for each position in the target area, based on a result of reception of the measurement light performed by the reception optical system, and calculate, for each wavelength, a transmittance or a reflectance of a measurement subject that is placed on the measurement area, based on the reception light spectrum thus generated, wherein the calculation unit calculates a transmittance spectrum or a reflectance spectrum of the measurement subject based on a first criterion spectrum that is the reception light spectrum that is based on the measurement light travelling from the measurement area when the measurement subject is not present on the measurement area, a second criterion spectrum that is the reception light spectrum that is based on the measurement light travelling from the non-measurement area, and a measurement spectrum that is the reception light spectrum that is based on the measurement light travelling from the measurement area when the measurement subject is present on the measurement area.

4. 发明申请

US20210140758A1 FILM THICKNESS MEASURING APPARATUS AND FILM THICKNESS MEASURING METHOD 有权
公开(公告)号：US20210140758A1
公开(公告)日：2021-05-13
申请号：US17035519
申请日：2020-09-28
申请人： Otsuka Electronics Co., Ltd.
发明人： Shiro KAWAGUCHI , Kazuya NAKAJIMA
IPC分类号： G01B11/06
摘要： A film thickness measuring apparatus including: a measurement light path for irradiating a measurement target object with light from a light source; a correction light path for irradiating a reference member with light from the light source; and a light switching unit that selectively guides reflected light from the measurement target object or reflected light from the reference member, to a spectroscope.

5. 发明申请

US20190353523A1 OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD 审中-公开
公开(公告)号：US20190353523A1
公开(公告)日：2019-11-21
申请号：US16414798
申请日：2019-05-17
申请人： Otsuka Electronics Co., Ltd.
发明人： Toshiki SHINKE , Shiro KAWAGUCHI , Nobuyuki INOUE
IPC分类号： G01J3/02 , G01J3/46 , G02B27/09
摘要： an optical measurement apparatus includes: a probe including a transmissive optical member having a reference surface, the probe being configured to irradiate a sample with light through the reference surface, and receive a first reflected light from the reference surface, a second reflected light from a front side of the sample, and a third reflected light from a back side of the sample; and a calculator configured to calculate a first distance from the reference surface to the front side of the sample with use of a first reflection interference light to be generated by the first reflected light and the second reflected light, and to calculate a thickness of the sample with use of a second reflection interference light to be generated by the second reflected light and the third reflected light.

6. 发明申请

US20190331842A1 CONFOCAL OPTICAL SYSTEM-BASED MEASUREMENT APPARATUS AND METHOD FOR MANUFACTURING CONFOCAL OPTICAL SYSTEM-BASED MEASUREMENT APPARATUS 审中-公开
公开(公告)号：US20190331842A1
公开(公告)日：2019-10-31
申请号：US16369219
申请日：2019-03-29
申请人： Otsuka Electronics Co., Ltd.
发明人： Haruka OTSUKA , Hisashi SHIRAIWA , Tsutomu MIZUGUCHI
IPC分类号： F21V8/00 , G02B6/04 , G01J3/02
摘要： A confocal optical system-based measurement apparatus includes: a light source; a light projecting optical fiber group; a light receiving optical fiber group; a spectroscope; and a confocal optical system configured to condense each of a plurality of beams from a plurality of light projecting optical fibers to irradiate a sample therewith, and cause a plurality of beams from a plurality of condensing points on the sample to form images on the plurality of light receiving optical fibers, respectively, wherein the light projecting optical fiber group includes the plurality of light projecting optical fibers configured to receive light from the light source, the light receiving optical fiber group includes the plurality of light receiving optical fibers configured to guide received light to the spectroscope, the shape of an end face of the light projecting optical fiber group and the shape of an end face of the light receiving optical fiber group are in a mirror image relationship, and in the light projecting optical fiber group and the light receiving optical fiber group, the shape of an end face of each light projecting optical fiber and the shape of an end face of a light receiving optical fiber corresponding thereto are in a mirror image relationship.

7. 发明授权

US10429238B2 Optical measurement method and optical measurement apparatus 有权
公开(公告)号：US10429238B2
公开(公告)日：2019-10-01
申请号：US15677606
申请日：2017-08-15
申请人： Otsuka Electronics Co., Ltd.
发明人： Nobuyuki Inoue , Taku Nagashima
IPC分类号： G01J3/02 , G01N21/27 , G01J3/28 , G01N21/359
摘要： There is provided an optical measurement method using a detector having a detection sensitivity to at least a near-infrared region. The optical measurement method including: obtaining an output value by measuring a light sample at any exposure time with the detector; and correcting the output value with an amount of correction corresponding to the output value, when the exposure time at which the output value is obtained is within a second range. The amount of correction includes a product of a coefficient and a square of the exposure time, the coefficient indicating a degree to which an output value obtained when the light sample is measured with the detector at an exposure time within the second range deviates from output linearity obtained when the light sample is measured with the detector at an exposure time within a first range.

8. 发明授权

US10422695B2 Optical characteristic measurement system and calibration method for optical characteristic measurement system 有权
公开(公告)号：US10422695B2
公开(公告)日：2019-09-24
申请号：US16271621
申请日：2019-02-08
申请人： Otsuka Electronics Co., Ltd.
发明人： Yoshihiro Osawa , Tsutomu Mizuguchi , Munehiro Noguchi
IPC分类号： G01J3/28 , G01J3/18 , G01N21/27 , G01J3/02 , G01N21/64 , G01N21/33 , G01N21/35 , G01N21/03
摘要： There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.

9. 发明授权

US10422694B2 Optical characteristic measurement system and calibration method for optical characteristic measurement system 有权
公开(公告)号：US10422694B2
公开(公告)日：2019-09-24
申请号：US16271608
申请日：2019-02-08
申请人： Otsuka Electronics Co., Ltd.
发明人： Yoshihiro Osawa , Tsutomu Mizuguchi , Munehiro Noguchi
IPC分类号： G01J3/28 , G01J3/18 , G01N21/27 , G01J3/02 , G01N21/64 , G01N21/33 , G01N21/35 , G01N21/03
摘要： There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.

10. 发明申请

US20190170578A1 OPTICAL CHARACTERISTIC MEASUREMENT SYSTEM AND CALIBRATION METHOD FOR OPTICAL CHARACTERISTIC MEASUREMENT SYSTEM 审中-公开
公开(公告)号：US20190170578A1
公开(公告)日：2019-06-06
申请号：US16271621
申请日：2019-02-08
申请人： Otsuka Electronics Co., Ltd.
发明人： Yoshihiro OSAWA , Tsutomu MIZUGUCHI , Munehiro NOGUCHI
IPC分类号： G01J3/28 , G01J3/18 , G01N21/27 , G01J3/02 , G01N21/64 , G01N21/35 , G01N21/33
CPC分类号： G01J3/28 , G01J3/0218 , G01J3/0251 , G01J3/0254 , G01J3/0286 , G01J3/18 , G01N21/0332 , G01N21/274 , G01N21/33 , G01N21/35 , G01N21/645 , G01N2201/1211
摘要： There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式