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    • 2. 发明授权
    • Semiconductor device having data input/output unit connected to bus line
    • 具有连接到总线的数据输入/输出单元的半导体器件
    • US08174907B2
    • 2012-05-08
    • US12763741
    • 2010-04-20
    • Takuyo KodamaYoji Idei
    • Takuyo KodamaYoji Idei
    • G11C7/10
    • G11C11/4094G11C7/1006G11C7/1012G11C7/1048G11C11/4096G11C11/4097
    • To provide a semiconductor device including: first and second bus lines; a first buffer connected between the first and second bus lines; second and third buffers connected to the first bus line; fourth and fifth buffers connected to the second bus line; first to fourth banks connected via the first, second, and third buffers to the second bus line; fifth to eighth banks connected via the fourth and fifth buffers to the second bus line; and a data input/output unit connected to the second bus line. Transfer delay times of the fourth and fifth buffers are longer than transfer delay times of the first, second, and third buffers. Thereby, it becomes possible to eliminate differences in data transfer times resulting from differences in distances between far and near ends without causing significant increase in wire density, increase in power consumption, or the like.
    • 提供一种半导体器件,包括:第一和第二总线; 连接在第一和第二总线之间的第一缓冲器; 连接到第一总线的第二和第三缓冲器; 连接到第二总线的第四和第五缓冲器; 经由第一,第二和第三缓冲器连接到第二总线的第一至第四组; 经由第四和第五缓冲器连接到第二总线的第五至第八组; 以及连接到第二总线的数据输入/输出单元。 第四和第五缓冲器的传输延迟时间长于第一,第二和第三缓冲器的传输延迟时间。 由此,可以消除由于近端和近端之间的距离的差异导致的数据传输时间的差异,而不会导致线密度的显着增加,功率消耗的增加等。
    • 5. 发明申请
    • SEMICONDUCTOR MEMORY DEVICE
    • 半导体存储器件
    • US20090016126A1
    • 2009-01-15
    • US12170561
    • 2008-07-10
    • Kazuhiro TeramotoYoji IdeiTakenori Sato
    • Kazuhiro TeramotoYoji IdeiTakenori Sato
    • G11C7/00G11C8/08
    • G11C29/02G11C29/025G11C29/50008G11C2029/1204G11C2029/5006
    • A semiconductor memory device is provided that is capable of detecting a short circuit defect to be detected in a memory array without causing an error due to off-current of a sense amplifier circuit. Sense amplifier circuits amplify a potential between a pair of bit lines, which occurs based on potential of memory cells selected by driving word lines and bit lines. Selection transistors are provided between the bit lines and the sense amplifier circuits. A word-SE interval control circuit included in an X timing generating circuit turns off the selection transistors and disconnects the bit lines from the sense amplifier circuits based on a signal representing a test state for expanded time when a test to expand an interval between word line driving and activation of the sense amplifier circuits and detect defect sites of the bit lines is performed.
    • 提供一种半导体存储器件,其能够检测在存储器阵列中要检测的短路缺陷,而不会由于读出放大器电路的截止电流而引起误差。 感测放大器电路根据通过驱动字线和位线选择的存储器单元的电位放大一对位线之间的电位。 选择晶体管设置在位线和读出放大器电路之间。 包括在X定时发生电路中的字SE间隔控制电路关闭选择晶体管,并且当扩展字线之间的间隔的测试时,基于表示用于扩展时间的测试状态的信号,从读出放大器电路断开位线 执行感测放大器电路的驱动和激活并检测位线的缺陷位置。
    • 6. 发明授权
    • Semiconductor storage device
    • 半导体存储设备
    • US07719911B2
    • 2010-05-18
    • US12169873
    • 2008-07-09
    • Kazuhiro TeramotoYoji IdeiTakenori SatoHiroki Fujisawa
    • Kazuhiro TeramotoYoji IdeiTakenori SatoHiroki Fujisawa
    • G11C7/00
    • G11C5/14G11C7/08G11C11/4091
    • A semiconductor storage device is provided which enables use of an overdrive method at low voltage and for a small device area. The semiconductor device includes: memory cells; sense amplifiers, each having P-channel and N-channel MOS transistors and amplifying a signal read from a memory cell; a first power supply line connected to a source terminal of the P-channel MOS transistor provided in each of the sense amplifiers; a second power supply line which supplies an overdrive voltage to the sense amplifiers at a potential higher than a write potential of the memory cell; a third power supply line connected to an external power supply, a connection element which connects and disconnects the first power supply line and the second power supply line; a capacitance element connected to the second power supply line; and a resistance element inserted between the second power supply line and the third power supply line.
    • 提供一种半导体存储装置,其能够在低电压和小的装置区域中使用过驱动方法。 半导体器件包括:存储单元; 读出放大器,每个具有P沟道和N沟道MOS晶体管,并放大从存储单元读取的信号; 连接到设置在每个读出放大器中的P沟道MOS晶体管的源极端子的第一电源线; 第二电源线,其以比存储单元的写入电位高的电位向读出放大器提供过驱动电压; 连接到外部电源的第三电源线,连接和断开第一电源线和第二电源线的连接元件; 连接到第二电源线的电容元件; 以及插入在第二电源线和第三电源线之间的电阻元件。
    • 8. 发明授权
    • Clock synchronization circuit having bidirectional delay circuit strings and controllable pre and post stage delay circuits connected thereto and semiconductor device manufactured thereof
    • 时钟同步电路具有双向延迟电路串和与其连接的可控的前级和后级延迟电路及其制造的半导体器件
    • US06867626B2
    • 2005-03-15
    • US10624801
    • 2003-07-22
    • Yoji Idei
    • Yoji Idei
    • G06F1/10G11C7/22G11C11/407G11C11/4076H03K5/13H03K5/131H03L7/00
    • G11C7/1066G11C7/22G11C7/222G11C11/4076
    • A clock synchronization circuit includes a first delay circuit for delaying a clock signal and outputting the delayed clock signal, first and second bidirectional delay circuit strings, a first pre-stage delay circuit and a first post-stage delay circuit of variable delay time type, arranged in a pre-stage and a post-stage of the first bidirectional delay circuit string (BDDA), a second pre-stage delay circuit and a second post-stage delay circuit of variable delay time type, arranged in a pre-stage and a post-stage of the second bidirectional delay circuit string (BDDB), and a multiplexer, supplied with and multiplexing outputs of the first and second post-stage delay circuits to output the resulting signals. An output signal of the first delay circuit is supplied in common to the first and second pre-stage delay circuits. A first path composed of the first pre-stage delay circuit, first bidirectional delay circuit string and the first post-stage delay circuit and a second path composed of the second pre-stage delay circuit, second bidirectional delay circuit string and the second post-stage delay circuit are alternately switched in an interval of one cycle of the clock signal.
    • 时钟同步电路包括用于延迟时钟信号并输出​​延迟的时钟信号的第一延迟电路,第一和第二双向延迟电路串,可变延迟时间类型的第一前级延迟电路和第一后级延迟电路, 布置在前级和后级的第一双向延迟电路串(BDDA),第二预延迟电路和可变延迟时间类型的第二后级延迟电路,布置在前级和 第二双向延迟电路串(BDDB)的后级,以及多路复用器,提供并复用第一和第二后级延迟电路的输出,以输出结果信号。 第一延迟电路的输出信号被共同地提供给第一和第二前级延迟电路。 由第一前级延迟电路,第一双向延迟电路串和第一后级延迟电路组成的第一路径和由第二前级延迟电路,第二双向延迟电路串和第二后级延迟电路组成的第二路径, 在时钟信号的一个周期的间隔中交替地切换级延迟电路。
    • 9. 发明授权
    • Semiconductor integrated circuit device having step-down voltage circuit
    • 具有降压电压电路的半导体集成电路器件
    • US6067257A
    • 2000-05-23
    • US270677
    • 1999-03-16
    • Goro KitsukawaYoji Idei
    • Goro KitsukawaYoji Idei
    • G11C5/14G11C11/4074G11C7/00
    • G11C5/147G11C11/4074
    • A semiconductor integrated circuit device is provided with an internal circuit which receives a source voltage supplied from an external terminal and is activated based on a voltage obtained by reducing the source voltage, and an output circuit which outputs a signal to be outputted produced by the internal circuit, through an external terminal in accordance with a timing signal. In the semiconductor integrated circuit device, a level shift circuit converts the signal produced by the internal circuit to a signal level corresponding to the level of the source voltage supplied from the external terminal. The output circuit outputs the level-shifted signal therefrom using a timing signal of a voltage level corresponding to the source voltage supplied from the external terminal.
    • 半导体集成电路器件具有内部电路,该内部电路接收从外部端子提供的源极电压,并且基于通过降低源极电压获得的电压而被激活;以及输出电路,其输出由内部产生的输出信号 电路,通过外部端子根据定时信号。 在半导体集成电路装置中,电平移位电路将由内部电路产生的信号转换为与从外部端子提供的源极电压的电平相对应的信号电平。 输出电路使用与从外部端子提供的源极电压相对应的电压电平的定时信号输出电平移位信号。
    • 10. 发明授权
    • Power supply voltage dropping circuit using an N-channel transistor output stage
    • 使用N沟道晶体管输出级的电源降压电路
    • US07863969B2
    • 2011-01-04
    • US12435780
    • 2009-05-05
    • Ryohei FuruyaYoji Idei
    • Ryohei FuruyaYoji Idei
    • G05F1/563H02M3/00
    • G05F1/563
    • A device includes an N-channel transistor for output, a voltage raising circuit, a voltage dropping circuit, and an amplifier. A power supply voltage that is a first voltage is supplied to one end of the output N-channel transistor, and the other end of the output N-channel transistor functions as an output terminal. The voltage raising circuit raises the first voltage to generate a second voltage higher than the first voltage. The voltage dropping circuit reduces the second voltage to generate a third voltage that is higher than the first voltage and is lower than the second voltage. The amplifier amplifies the difference between a reference voltage and a voltage generated at the output terminal, using the third voltage as a power supply voltage, to generate a fourth voltage, and supplies the fourth voltage to the gate of the N-channel transistor for output.
    • 一种器件包括用于输出的N沟道晶体管,升压电路,降压电路和放大器。 作为第一电压的电源电压被提供给输出N沟道晶体管的一端,输出N沟道晶体管的另一端用作输出端子。 升压电路升高第一电压以产生高于第一电压的第二电压。 降压电路降低第二电压以产生比第一电压高的第三电压并且低于第二电压。 该放大器利用第三电压作为电源电压来放大参考电压和在输出端产生的电压之间的差,以产生第四电压,并将第四电压提供给N沟道晶体管的栅极用于输出 。