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    • 1. 发明授权
    • Infrared microscope for analysis of a selected sample area
    • 红外显微镜用于分析选定的样品区域
    • US5754335A
    • 1998-05-19
    • US848499
    • 1997-05-08
    • Nobuo TakagiHiroshi OhtaTadashi Wachi
    • Nobuo TakagiHiroshi OhtaTadashi Wachi
    • G01N21/27G01J3/28G01N21/35G02B21/00H04N7/18
    • G01J3/28
    • Before a measurement for an infrared analysis of a sample is performed, a measurement area of the sample is set. In the measurement area setting mode, a camera takes the image of the whole sample, and the image is shown on a display. An image of an aperture is superimposed on the image of the sample in the display. When an operator uses a mouse connected to a controller of the infrared microscope to change the width of the image of the aperture on the display, an aperture signal generator generates an aperture signal corresponding to the width of the aperture image. An aperture image signal generator receives the aperture signal and generates an aperture image signal having the width. Thus the image of the sample superimposed on the image of the aperture in the display changes accordingly, by which the operator confirms the measurement area, i.e., the position and width of the aperture, in the sample. Since the image of the aperture is generated electronically in the present invention, no hardware such as expensive lenses or a precise mirror-moving mechanism is necessary.
    • 在对样品的红外分析进行测量之前,设定样品的测量区域。 在测量区域设定模式下,相机拍摄整个样本的图像,并将图像显示在显示屏上。 孔径的图像叠加在显示器中的样品的图像上。 当操作者使用连接到红外显微镜的控制器的鼠标来改变显示器上的孔径的图像的宽度时,孔径信号发生器产生对应于孔径图像的宽度的孔径信号。 孔径图像信号发生器接收孔径信号并产生具有宽度的孔径图像信号。 因此,叠加在显示器上的孔径的图像上的样本的图像相应地改变,由此操作者确认样本中的测量区域,即孔的位置和宽度。 由于在本发明中电子地生成孔径的图像,所以不需要诸如昂贵的透镜或精确的镜像移动机构的硬件。