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1. 发明授权

US06934897B2 Scheduling the concurrent testing of multiple cores embedded in an integrated circuit 有权
标题翻译：调度嵌入在集成电路中的多个内核的并发测试
公开(公告)号：US06934897B2
公开(公告)日：2005-08-23
申请号：US10210794
申请日：2002-07-31
申请人： Nilanjan Mukherjee , Chien-Chung Tsai , Wu-Tung Cheng , Omer Ghazi Samman , Yahya M. Z. Mustafa , Paul J. Reuter , Yu Huang , Sudhakar Mannapuram Reddy
发明人： Nilanjan Mukherjee , Chien-Chung Tsai , Wu-Tung Cheng , Omer Ghazi Samman , Yahya M. Z. Mustafa , Paul J. Reuter , Yu Huang , Sudhakar Mannapuram Reddy
IPC分类号： G01R31/3193 , G01R31/28
CPC分类号： G01R31/3193
摘要： Methods are described for scheduling the concurrent testing of multiple cores embedded in an integrated circuit. Test scheduling is performed by formulating the problem as a bin-packing problem and using a modified two-dimensional or three-dimensional bin-packing heuristic. The tests of multiple cores are represented as functions of at least the integrated circuit pins used to test the core and the core test time. The representations may include a third dimension of peak power required to test the core. The test schedule is represented as a bin having dimensions of at least integrated circuit pins and integrated circuit test time. The bin may include a third dimension of peak power. The scheduling of the multiple cores is accomplished by fitting the multiple core test representations into the bin.
摘要翻译：描述了用于调度嵌入在集成电路中的多个核的并发测试的方法。通过将问题解决为二进制包装问题并使用修改后的二维或三维二进制包装启发式来进行测试调度。多个核心的测试表示为至少用于测试核心和核心测试时间的集成电路引脚的功能。表示可以包括测试核心所需的峰值功率的第三维度。测试计划表示为具有至少集成电路引脚和集成电路测试时间的尺寸的存储区。箱可以包括峰值功率的第三维度。多核的调度是通过将多个核心测试表示拟合到bin来实现的。

2. 发明授权

US07424660B2 Synchronization point across different memory BIST controllers 有权
标题翻译：跨不同内存BIST控制器的同步点
公开(公告)号：US07424660B2
公开(公告)日：2008-09-09
申请号：US11397822
申请日：2006-04-03
申请人： Omar Kebichi , Wu-Tung Cheng , Christopher John Hill , Paul J. Reuter , Yahya M. Z. Mustafa
发明人： Omar Kebichi , Wu-Tung Cheng , Christopher John Hill , Paul J. Reuter , Yahya M. Z. Mustafa
IPC分类号： G01R31/28 , G06F11/00
CPC分类号： G11C29/12015 , G11C29/14 , G11C29/56012 , G11C2029/0401 , G11C2029/2602
摘要： A circuit is disclosed for testing memories using multiple built-in self test (BIST) controllers embedded in an integrated circuit (IC). The BIST controllers are brought to a synchronization point during the memory test by allowing for a synchronization state. An output signal from an output pin on the IC indicates the existence of a synchronization state to automated test equipment (ATE). After an ATE receives the output signal, it issues a resume signal through an IC input pin that causes the controllers to advance out of the synchronization state. The ATE controls the synchronization state length by delaying the resume signal. Synchronization states can be used in parametric test algorithms, such as for retention and IDDQ tests. Synchronization states can be incorporated into user-defined algorithms by software design tools that generate an HDL description of a BIST controller operable to apply the algorithm with the synchronization state.
摘要翻译：公开了一种用于使用嵌入在集成电路（IC）中的多个内置自测（BIST）控制器测试存储器的电路。通过允许同步状态，BIST控制器在存储器测试期间被带到同步点。来自IC上的输出引脚的输出信号表示存在与自动测试设备（ATE）的同步状态。 ATE接收到输出信号后，通过IC输入引脚发出一个恢复信号，导致控制器进入同步状态。 ATE通过延迟恢复信号来控制同步状态长度。同步状态可用于参数化测试算法，例如保留和IDDQ测试。可以通过软件设计工具将同步状态并入用户定义的算法，该工具可生成可操作以将同步状态应用于算法的BIST控制器的HDL描述。

3. 发明授权

US07036064B1 Synchronization point across different memory BIST controllers 有权
公开(公告)号：US07036064B1
公开(公告)日：2006-04-25
申请号：US09872212
申请日：2001-05-31
申请人： Omar Kebichi , Wu-Tung Cheng , Christopher John Hill , Paul J. Reuter , Yahya M. Z. Mustafa
发明人： Omar Kebichi , Wu-Tung Cheng , Christopher John Hill , Paul J. Reuter , Yahya M. Z. Mustafa
IPC分类号： G01R31/28 , G06F11/00
CPC分类号： G11C29/12015 , G11C29/14 , G11C29/56012 , G11C2029/0401 , G11C2029/2602
摘要： A circuit is disclosed for testing memories using multiple built-in self test (BIST) controllers embedded in an integrated circuit (IC). The BIST controllers are brought to a synchronization point during the memory test by allowing for a synchronization state. An output signal from an output pin on the IC indicates the existence of a synchronization state to automated test equipment (ATE). After an ATE receives the output signal, it issues a resume signal through an IC input pin that causes the controllers to advance out of the synchronization state. The ATE controls the synchronization state length by delaying the resume signal. Synchronization states can be used in parametric test algorithms, such as for retention and IDDQ tests. Synchronization states can be incorporated into user-defined algorithms by software design tools that generate an HDL description of a BIST controller operable to apply the algorithm with the synchronization state.

4. 发明授权

US07434131B2 Flexible memory built-in-self-test (MBIST) method and apparatus 有权
标题翻译：灵活内存内置自检（MBIST）方法和装置
公开(公告)号：US07434131B2
公开(公告)日：2008-10-07
申请号：US11282938
申请日：2005-11-18
申请人： Nilanjan Mukherjee , Xiaogang Du , Wu-Tung Cheng
发明人： Nilanjan Mukherjee , Xiaogang Du , Wu-Tung Cheng
IPC分类号： G01R31/28
CPC分类号： G01R31/3187 , G01R31/31724 , G01R31/318519 , G11C29/10 , G11C29/1201 , G11C29/16 , G11C29/20 , G11C2029/0401 , G11C2029/0405 , G11C2029/3602 , G11C2029/5604
摘要： Programmable memory built-in self-test (MBIST) methods, apparatus, and systems are disclosed. Exemplary embodiments of the disclosed technology can be used, for example, to test one or more memories located on an integrated circuit during manufacturing testing.
摘要翻译：公开了可编程存储器内置的自检（MBIST）方法，装置和系统。所公开的技术的示例性实施例可以用于例如在制造测试期间测试位于集成电路上的一个或多个存储器。

5. 发明授权

US07487419B2 Reduced-pin-count-testing architectures for applying test patterns 有权
标题翻译：用于应用测试模式的减少针数测试架构
公开(公告)号：US07487419B2
公开(公告)日：2009-02-03
申请号：US11305849
申请日：2005-12-16
申请人： Nilanjan Mukherjee , Jay Jahangiri , Ronald Press , Wu-Tung Cheng
发明人： Nilanjan Mukherjee , Jay Jahangiri , Ronald Press , Wu-Tung Cheng
IPC分类号： G01R31/28
CPC分类号： G01R31/318541 , G01R31/318572 , G01R31/318583
摘要： Methods, apparatus, and systems for testing integrated circuits using one or more boundary scan cells are disclosed. The methods, apparatus, and systems can be used, for example, to apply at-speed test patterns through one or more boundary scan cells. For instance, in one exemplary nonlimiting embodiment, a circuit is disclosed comprising one or more boundary scan cells coupled to primary input ports or primary output ports of a circuit-under-test. The circuit further includes a boundary scan cell controller configured to apply test control signals to the one or more boundary scan cells. In this embodiment, the controller is configured to operate in a mode of operation whereby the controller applies test control signals to the one or more boundary scan cells that correspond to test control signals used to control one or more internal scan chains of the circuit-under-test during testing. The control signals of this exemplary embodiment include an at-speed-clock signal generated outside of the boundary scan cell controller.
摘要翻译：公开了使用一个或多个边界扫描单元测试集成电路的方法，装置和系统。方法，装置和系统可以用于例如通过一个或多个边界扫描单元应用速度测试图案。例如，在一个示例性非限制性实施例中，公开了一种电路，其包括耦合到被测电路的主输入端口或主输出端口的一个或多个边界扫描单元。电路还包括配置成将测试控制信号施加到一个或多个边界扫描单元的边界扫描单元控制器。在该实施例中，控制器被配置为在操作模式下操作，由此控制器将测试控制信号施加到对应于用于控制电路的一个或多个内部扫描链的测试控制信号的一个或多个边界扫描单元测试中测试。该示例性实施例的控制信号包括在边界扫描单元控制器之外产生的一个速度 - 时钟信号。

6. 发明申请

US20060156133A1 Flexible memory built-in-self-test (MBIST) method and apparatus 有权
标题翻译：灵活内存内置自检（MBIST）方法和装置
公开(公告)号：US20060156133A1
公开(公告)日：2006-07-13
申请号：US11282938
申请日：2005-11-18
申请人： Nilanjan Mukherjee , Xiaogang Du , Wu-Tung Cheng
发明人： Nilanjan Mukherjee , Xiaogang Du , Wu-Tung Cheng
IPC分类号： G01R31/28
CPC分类号： G01R31/3187 , G01R31/31724 , G01R31/318519 , G11C29/10 , G11C29/1201 , G11C29/16 , G11C29/20 , G11C2029/0401 , G11C2029/0405 , G11C2029/3602 , G11C2029/5604
摘要： Programmable memory built-in self-test (MBIST) methods, apparatus, and systems are disclosed. Exemplary embodiments of the disclosed technology can be used, for example, to test one or more memories located on an integrated circuit during manufacturing testing.
摘要翻译：公开了可编程存储器内置的自检（MBIST）方法，装置和系统。所公开的技术的示例性实施例可以用于例如在制造测试期间测试位于集成电路上的一个或多个存储器。

7. 发明授权

US07426668B2 Performing memory built-in-self-test (MBIST) 有权
标题翻译：执行内存自检（MBIST）
公开(公告)号：US07426668B2
公开(公告)日：2008-09-16
申请号：US11283499
申请日：2005-11-18
申请人： Nilanjan Mukherjee , Xiaogang Du , Wu-Tung Cheng
发明人： Nilanjan Mukherjee , Xiaogang Du , Wu-Tung Cheng
IPC分类号： G01R31/28
CPC分类号： G01R31/3187 , G01R31/31724 , G01R31/318519 , G11C29/10 , G11C29/1201 , G11C29/16 , G11C29/20 , G11C2029/0401 , G11C2029/0405 , G11C2029/3602 , G11C2029/5604
摘要： Programmable memory built-in self-test (MBIST) methods, apparatus, and systems are disclosed. Exemplary embodiments of the disclosed technology can be used, for example, to test one or more memories located on an integrated circuit during manufacturing testing.
摘要翻译：公开了可编程存储器内置的自检（MBIST）方法，装置和系统。所公开的技术的示例性实施例可以用于例如在制造测试期间测试位于集成电路上的一个或多个存储器。

8. 发明申请

US20060156134A1 Programmable memory built-in-self-test (MBIST) method and apparatus 有权
标题翻译：可编程存储器内置自检（MBIST）方法和装置
公开(公告)号：US20060156134A1
公开(公告)日：2006-07-13
申请号：US11283527
申请日：2005-11-18
申请人： Nilanjan Mukherjee , Xiaogang Du , Wu-Tung Cheng
发明人： Nilanjan Mukherjee , Xiaogang Du , Wu-Tung Cheng
IPC分类号： G01R31/28
CPC分类号： G01R31/3187 , G01R31/31724 , G01R31/318519 , G11C29/10 , G11C29/1201 , G11C29/16 , G11C29/20 , G11C2029/0401 , G11C2029/0405 , G11C2029/3602 , G11C2029/5604
摘要： Programmable memory built-in self-test (MBIST) methods, apparatus, and systems are disclosed. Exemplary embodiments of the disclosed technology can be used, for example, to test one or more memories located on an integrated circuit during manufacturing testing.
摘要翻译：公开了可编程存储器内置的自检（MBIST）方法，装置和系统。所公开的技术的示例性实施例可以用于例如在制造测试期间测试位于集成电路上的一个或多个存储器。

9. 发明授权

US07428680B2 Programmable memory built-in-self-test (MBIST) method and apparatus 有权
标题翻译：可编程存储器内置自检（MBIST）方法和装置
公开(公告)号：US07428680B2
公开(公告)日：2008-09-23
申请号：US11283527
申请日：2005-11-18
申请人： Nilanjan Mukherjee , Xiaogang Du , Wu-Tung Cheng
发明人： Nilanjan Mukherjee , Xiaogang Du , Wu-Tung Cheng
IPC分类号： G01R31/28
CPC分类号： G01R31/3187 , G01R31/31724 , G01R31/318519 , G11C29/10 , G11C29/1201 , G11C29/16 , G11C29/20 , G11C2029/0401 , G11C2029/0405 , G11C2029/3602 , G11C2029/5604
摘要： Programmable memory built-in self-test (MBIST) methods, apparatus, and systems are disclosed. Exemplary embodiments of the disclosed technology can be used, for example, to test one or more memories located on an integrated circuit during manufacturing testing.
摘要翻译：公开了可编程存储器内置的自检（MBIST）方法，装置和系统。所公开的技术的示例性实施例可以用于例如在制造测试期间测试位于集成电路上的一个或多个存储器。

10. 发明申请

US20070011542A1 Reduced-pin-count-testing architectures for applying test patterns 有权
标题翻译：用于应用测试模式的减少针数测试架构
公开(公告)号：US20070011542A1
公开(公告)日：2007-01-11
申请号：US11305849
申请日：2005-12-16
申请人： Nilanjan Mukherjee , Jay Jahangiri , Ronald Press , Wu-Tung Cheng
发明人： Nilanjan Mukherjee , Jay Jahangiri , Ronald Press , Wu-Tung Cheng
IPC分类号： G01R31/28 , G06F11/00
CPC分类号： G01R31/318541 , G01R31/318572 , G01R31/318583
摘要： Methods, apparatus, and systems for testing integrated circuits using one or more boundary scan cells are disclosed. The methods, apparatus, and systems can be used, for example, to apply at-speed test patterns through one or more boundary scan cells. For instance, in one exemplary nonlimiting embodiment, a circuit is disclosed comprising one or more boundary scan cells coupled to primary input ports or primary output ports of a circuit-under-test. The circuit further includes a boundary scan cell controller configured to apply test control signals to the one or more boundary scan cells. In this embodiment, the controller is configured to operate in a mode of operation whereby the controller applies test control signals to the one or more boundary scan cells that correspond to test control signals used to control one or more internal scan chains of the circuit-under-test during testing. The control signals of this exemplary embodiment include an at-speed-clock signal generated outside of the boundary scan cell controller.
摘要翻译：公开了使用一个或多个边界扫描单元测试集成电路的方法，装置和系统。方法，装置和系统可以用于例如通过一个或多个边界扫描单元应用速度测试图案。例如，在一个示例性非限制性实施例中，公开了一种电路，其包括耦合到被测电路的主输入端口或主输出端口的一个或多个边界扫描单元。电路还包括配置成将测试控制信号施加到一个或多个边界扫描单元的边界扫描单元控制器。在该实施例中，控制器被配置为在操作模式下操作，由此控制器将测试控制信号施加到与用于控制电路的一个或多个内部扫描链的测试控制信号相对应的一个或多个边界扫描单元测试中测试。该示例性实施例的控制信号包括在边界扫描单元控制器之外产生的一个速度 - 时钟信号。

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