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    • 6. 发明授权
    • Apparatus, systems and methods for for digital testing of ADC/DAC combination
    • 用于ADC / DAC组合的数字测试的装置,系统和方法
    • US08866650B2
    • 2014-10-21
    • US13992765
    • 2011-12-07
    • Stephen J. SpinksAndrew TalbotColin Mair
    • Stephen J. SpinksAndrew TalbotColin Mair
    • H03M1/10H03M1/46H03M1/66
    • H03M1/1071H03M1/10H03M1/109H03M1/365H03M1/46H03M1/66H03M1/765
    • A circuit for testing digital-to-analog (DAC) and analog-to-digital converters (ADC) is provided. The circuit applies a code pattern having a plurality of sequential values to the digital to analog converter. A plurality of built-in test switches (BTS) couple at least one tap voltage from the DAC to a test bus and to the ADC as a variable reference input voltage. In one form, the circuit uses incremental digital codes to test for defects in a resistor string, a switch array, and a decode logic that form part of the DAC. In another form, the circuit uses the tap voltages from the DAC to test the comparators that form part of the ADC. Instead of performing time-consuming analog to digital conversions, the functionality of the above mentioned circuitry is tested by varying the code pattern around a reference point and by selecting the appropriate combination of BTS switches.
    • 提供了一个用于测试数模(DAC)和模数转换器(ADC)的电路。 电路将具有多个顺序值的码模式应用于数模转换器。 多个内置测试开关(BTS)将来自DAC的至少一个抽头电压耦合到测试总线,并将ADC作为可变参考输入电压耦合。 在一种形式中,电路使用增量数字代码来测试构成DAC一部分的电阻串,开关阵列和解码逻辑中的缺陷。 在另一种形式中,电路使用DAC的抽头电压来测试形成ADC一部分的比较器。 代替执行耗时的模数转换,通过改变参考点周围的码模式,并通过选择BTS交换机的适当组合来测试上述电路的功能。
    • 7. 发明申请
    • APPARATUS, SYSTEMS AND METHODS FOR FOR DIGITAL TESTING OF ADC/DAC COMBINATION
    • 用于ADC / DAC组合数字测试的装置,系统和方法
    • US20140191890A1
    • 2014-07-10
    • US13992765
    • 2011-12-07
    • Stephen J. SpinksAndrew TalbotColin Mair
    • Stephen J. SpinksAndrew TalbotColin Mair
    • H03M1/10
    • H03M1/1071H03M1/10H03M1/109H03M1/365H03M1/46H03M1/66H03M1/765
    • A circuit for testing digital-to-analog (DAC) and analog-to-digital converters (ADC) is provided. The circuit applies a code pattern having a plurality of sequential values to the digital to analog converter. A plurality of built-in test switches (BTS) couple at least one tap voltage from the DAC to a test bus and to the ADC as a variable reference input voltage. In one form, the circuit uses incremental digital codes to test for defects in a resistor string, a switch array, and a decode logic that form part of the DAC. In another form, the circuit uses the tap voltages from the DAC to test the comparators that form part of the ADC. Instead of performing time-consuming analog to digital conversions, the functionality of the above mentioned circuitry is tested by varying the code pattern around a reference point and by selecting the appropriate combination of BTS switches.
    • 提供了一个用于测试数模(DAC)和模数转换器(ADC)的电路。 电路将具有多个顺序值的码模式应用于数模转换器。 多个内置测试开关(BTS)将来自DAC的至少一个抽头电压耦合到测试总线,并将ADC作为可变参考输入电压耦合。 在一种形式中,电路使用增量数字代码来测试构成DAC一部分的电阻串,开关阵列和解码逻辑中的缺陷。 在另一种形式中,电路使用DAC的抽头电压来测试形成ADC一部分的比较器。 代替执行耗时的模数转换,通过改变参考点周围的码模式,并通过选择BTS交换机的适当组合来测试上述电路的功能。