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    • 8. 发明授权
    • Group III-nitride growth on silicon or silicon germanium substrates and method and devices therefor
    • 硅或硅锗衬底上的III族氮化物生长及其方法和装置
    • US07928471B2
    • 2011-04-19
    • US11566288
    • 2006-12-04
    • Michael A. MastroCharles R. Eddy, Jr.Shahzad Akbar
    • Michael A. MastroCharles R. Eddy, Jr.Shahzad Akbar
    • H01L31/102H01L33/00H01S5/00
    • H01L31/078H01L31/1812H01L31/184Y02E10/544
    • A structure including a Si1-xGex substrate and a distributed Bragg reflector layer disposed directly onto the substrate. The distributed Bragg reflector layer includes a repeating pattern that includes at least one aluminum nitride layer and a second layer having the general formula AlyGa1-yN. Another aspect of the present invention is various devices including this structure. Another aspect of the present invention is directed to a method of forming such a structure comprising providing a Si1-xGex substrate and depositing a distributed Bragg reflector layer directly onto the substrate. Another aspect of the present invention is directed to a photodetector or photovoltaic cell device, including a Si1-xGex substrate device, a group III-nitride device and contacts to provide a conductive path for a current generated across at least one of the Si1-xGex substrate device and the group III-nitride device upon incident light.
    • 包括Si1-xGex衬底和直接设置在衬底上的分布式布拉格反射层的结构。 分布布拉格反射层包括重复图案,其包括至少一个氮化铝层和具有通式AllyGa1-yN的第二层。 本发明的另一方面是包括该结构的各种装置。 本发明的另一方面涉及一种形成这种结构的方法,包括提供Si 1-x Ge x衬底并将分布式布拉格反射层直接沉积到衬底上。 本发明的另一方面涉及一种光电检测器或光伏电池器件,其包括Si1-xGex衬底器件,III族氮化物器件和触点,以提供穿过Si1-xGex中的至少一个产生的电流的导电路径 衬底器件和III族氮化物器件。