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    • 10. 发明授权
    • Sample analysis method
    • 样品分析方法
    • US08514403B2
    • 2013-08-20
    • US13086759
    • 2011-04-14
    • Yuichi OgawaShinichiro HayashiSeiji KambaTakashi Kondo
    • Yuichi OgawaShinichiro HayashiSeiji KambaTakashi Kondo
    • G01B11/02
    • G01N21/3581G01N21/3563
    • A sample analysis method is provided for analyzing a sample having a permeability to terahertz radiation and accurately measure the composition, physical properties, mass and dimensions of a very small sample or a minute amount of sample by irradiating the sample with terahertz radiation. In the method, a reflective member is provided adjoining a first principal surface of the sample, an entrance member is provided adjoining a second principal surface of the sample, terahertz radiation is delivered from outside of entrance member towards the sample, and the sample is analyzed using an interference wave generated from a first-surface reflected wave at the interface between the first principal surface of the sample and the reflective member and a second-surface reflected wave at the interface between the second principal surface of the sample and the entrance member.
    • 提供样品分析方法,用于分析具有太赫兹辐射渗透性的样品,并通过用太赫兹辐射照射样品来精确测量非常小样品或微量样品的组成,物理性质,质量和尺寸。 在该方法中,邻接样品的第一主表面设置反射构件,邻接样品的第二主表面设置入口构件,将太赫兹辐射从入口构件的外部朝向样品传送,并分析样品 使用从样品的第一主表面和反射构件之间的界面处的第一表面反射波产生的干涉波和在样品的第二主表面与入口构件之间的界面处的第二表面反射波。