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1. 发明授权

US10036677B2 Method for analyzing stress in an object 有权
公开(公告)号：US10036677B2
公开(公告)日：2018-07-31
申请号：US15653855
申请日：2017-07-19
申请人： National Tsing Hua University
发明人： Wei-Chung Wang , Po-Chi Sung , Yu-An Chiang , Te-Heng Hung
IPC分类号： G01L1/24 , G01B11/16 , G06F17/17 , G06F17/12 , G06F17/13 , G06F17/14
CPC分类号： G01L1/241 , G01B11/168 , G01B11/18 , G06F17/12 , G06F17/13 , G06F17/147 , G06F17/17 , G06F17/5009 , G06F2217/16
摘要： A method for analyzing stress in an object according to spectrum data is provided. The spectrum data is obtained from an interference fringe pattern of the object that results from performing photoelasticity. The method includes: analyzing the spectrum data to obtain three sets of intensity data related respectively to different wavelengths of light used in photoelasticity; calculating wrapped phases according to the three sets of intensity data, respectively; calculating preliminary stress values according to the wrapped phases, respectively; determining a system of stress equations according to a relation among the preliminary stress values; and calculating an estimated stress value using the system of stress equations.

2. 发明授权

US08780348B2 Apparatus for quantifying unknown stress and residual stress of a material and method thereof 有权
标题翻译：用于量化材料的未知应力和残余应力的装置及其方法
公开(公告)号：US08780348B2
公开(公告)日：2014-07-15
申请号：US13622358
申请日：2012-09-18
申请人： National Tsing Hua University
发明人： Wei-Chung Wang , Chi-Hung Huang , Po-Chi Sung , Wei-Ren Chen , Guan-Ting Lai
IPC分类号： G01J4/00 , G01L1/24 , G01N21/23
CPC分类号： G01L1/24 , G01L1/241 , G01N21/23
摘要： An apparatus for quantifying unknown stress and residual stress of a material to be tested, the material being a birefringent or temporary birefringent material, which includes a light source, a polarizer in front of the light source for converting a light beam from the light source into a beam with linear polarization, a first quarter-wave plate in front of the polarizer for generating circular polarization, a standard material, a second quarter-wave plate, an analyzer, a loading unit, a spectrometer for obtaining transmissivity spectrum of the standard material under the wavelength of the light source and a detecting module connected to the spectrometer to have the transmissivity spectrum of the material to be tested and consequently a stress quantifying formula for the standard material.
摘要翻译：一种用于量化被测材料的未知应力和残余应力的装置，该材料是双折射或临时双折射材料，其包括光源，在光源前方的偏振器，用于将来自光源的光束转换成具有线性偏振的光束，用于产生圆偏振的偏振器前面的第一四分之一波片，标准材料，第二四分之一波片，分析器，加载单元，用于获得标准材料的透射光谱的光谱仪在光源的波长和连接到光谱仪的检测模块上，使待测材料的透射光谱和标准材料的应力量化公式。

3. 发明授权

US10067012B2 Stress measurement method and system for optical materials 有权
公开(公告)号：US10067012B2
公开(公告)日：2018-09-04
申请号：US15618145
申请日：2017-06-09
申请人： NATIONAL TSING HUA UNIVERSITY
发明人： Wei-Chung Wang , Po-Chi Sung , Zheng-Yong Lu , Yu-Liang Yeh , Po-Yu Chen
IPC分类号： G01L1/24 , G03F1/32 , G01L5/00
CPC分类号： G01L1/24 , G01L1/241 , G01L5/0047 , G03F1/32 , G03F1/82
摘要： A stress measurement method is provided of the present disclosure. The stress measurement method includes an image capturing procedure, a phase shift calculation procedure, an isochromatic intensifying procedure and a transformation procedure. The image capturing procedure is used to capture four light intensity images with four different phase angles of a sample. The phase shift calculation procedure is used to obtain an isochromatic retardation of the sample when the four light intensity images have sufficient light intensity values. The isochromatic intensifying procedure is used to calculate two enhanced light intensity values, the background of intensified isochromatic light intensity value and the amplitude of intensified isochromatic light intensity value to obtain an isochromatic retardation when the sample is in a low stress condition. The transformation procedure is used to transform the isochromatic retardation to a stress value of the sample.

4. 发明授权

US09952034B2 Optical interferometric system for measurement of a full-field thickness of a plate-like object in real time 有权
公开(公告)号：US09952034B2
公开(公告)日：2018-04-24
申请号：US15609862
申请日：2017-05-31
申请人： National Tsing Hua University
发明人： Wei-Chung Wang , Po-Chi Sung
IPC分类号： G01B11/06 , G01B9/02 , G01J9/04
CPC分类号： G01B11/06 , G01B9/02019 , G01B2290/45 , G01J9/04
摘要： An optical interferometric system for measurement of a full-field thickness of a plate-like object in real time includes two light sources, two screens, two image capturing devices, and an image processing module. The light sources radiate incident lights toward a reference point on the plate-like object in respective directions to produce respective interference fringe patterns (IFPs). The image capturing devices capture light intensity distribution images respectively of the IFPS imaged respectively on the screens. The image processing module calculates a fringe order at the reference point according to the light intensity distribution images, and obtains a full-field thickness distribution of the plate-like object according to the fringe order.

5. 发明授权

US09644947B2 Optical interferometric apparatus for real-time full-field thickness inspection and method thereof 有权
公开(公告)号：US09644947B2
公开(公告)日：2017-05-09
申请号：US14461548
申请日：2014-08-18
申请人： National Tsing Hua University
发明人： Wei-Chung Wang , Chi-Hung Huang , Po-Chi Sung , Meng-Hsiu Li
IPC分类号： G01B9/02 , G01B11/06
CPC分类号： G01B11/0675
摘要： A device for real-time thickness inspection is provided. An optical interferometric technique is used. Measurement requirements in rapid online thickness inspection can be satisfied. An object is measured in a non-contact and non-destructive way. For measuring, an optical spherical wavefront is radiated on the object in an oblique angle. The interference fringe pattern (IFP) thus imaged on a screen is directly related to the thickness distribution of the object. The phase difference on the same horizontal cross section in the IFP monotonically decreases from the light source side to the other side. Accordingly, phase unwrapping can be effectively performed without using phase shift. The present invention achieves rapid on-line thickness inspection through the optical path of interference without using optical lens groups and special optical elements. The present invention radiates a high-coherence point-expanded spherical-wavefront light beam in an oblique angle for an instantaneous and wide-area full-field thickness measurement.

6. 发明申请

US20150204655A1 Optical Interferometric Apparatus for Real-Time Full-Field Thickness Inspection and Method Thereof 有权
标题翻译：用于实时全场厚度检测的光学干涉仪及其方法
公开(公告)号：US20150204655A1
公开(公告)日：2015-07-23
申请号：US14461548
申请日：2014-08-18
申请人： National Tsing Hua University
发明人： Wei-Chung Wang , Chi-Hung Huang , Po-Chi Sung , Meng-Hsiu Li
IPC分类号： G01B11/06
CPC分类号： G01B11/0675
摘要： A device for real-time thickness inspection is provided. An optical interferometric technique is used. Measurement requirements in rapid online thickness inspection can be satisfied. An object is measured in a non-contact and non-destructive way. For measuring, an optical spherical wavefront is radiated on the object in an oblique angle. The interference fringe pattern (IFP) thus imaged on a screen is directly related to the thickness distribution of the object. The phase difference on the same horizontal cross section in the IFP monotonically decreases from the light source side to the other side. Accordingly, phase unwrapping can be effectively performed without using phase shift. The present invention achieves rapid on-line thickness inspection through the optical path of interference without using optical lens groups and special optical elements. The present invention radiates a high-coherence point-expanded spherical-wavefront light beam in an oblique angle for an instantaneous and wide-area full-field thickness measurement.
摘要翻译：提供了一种用于实时厚度检测的设备。使用光学干涉技术。可以满足快速在线厚度检测的测量要求。以非接触和非破坏性方式测量物体。对于测量，光学球面波前以倾斜角辐射在物体上。因此在屏幕上成像的干涉条纹图案（IFP）与物体的厚度分布直接相关。 IFP中相同水平截面上的相位差从光源侧单调减小到另一侧。因此，可以在不使用相移的情况下有效地执行相位展开。本发明通过干涉光路实现快速在线厚度检测，而不使用光学透镜组和特殊光学元件。本发明为了实现瞬时和广域全场厚度测量以斜角辐射高相干点扩展的球面波前光束。

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