专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US10724840B2 Control method of shape measuring apparatus 有权
公开(公告)号：US10724840B2
公开(公告)日：2020-07-28
申请号：US15819274
申请日：2017-11-21
申请人： MITUTOYO CORPORATION
发明人： Takashi Noda , Hiromi Deguchi
IPC分类号： G01B5/008 , G01B21/04 , G05B19/401 , G05B19/04
摘要： A scanning path is divided after every predetermined number of segments and a set of measurement commands is defined for each of the predetermined number of segments. While executing the measurement command, a speed pattern plan is created for the following measurement command. At this time, planning is conducted such that a final speed of a speed pattern plan of the measurement command is the same as an initial speed of the speed pattern plan of the following measurement command. While executing the measurement command, a gap time (from a current time to an estimated end time of the measurement command) is calculated continuously. When the gap time is longer than a planning calculation time, the initial speed of the speed pattern plan of the following measurement command is kept the same as the final speed of the speed pattern plan of the measurement command.

2. 发明授权

US10379520B2 Method for controlling shape measuring apparatus 有权
公开(公告)号：US10379520B2
公开(公告)日：2019-08-13
申请号：US15271824
申请日：2016-09-21
申请人： Mitutoyo Corporation
发明人： Takashi Noda , Hiromi Deguchi , Norihiko Murata
IPC分类号： G01B5/008 , G01B7/008 , G06F17/16 , G05B19/401
摘要： There is provided a method for controlling a shape measuring apparatus which can achieve both trajectory correcting capability and control stability. A stylus tip is moved along a scanning path while controlling the stylus tip so as to keep an amount of deflection of a probe to a workpiece to be a reference amount of deflection. A movement instruction for the probe is generated according to a combined velocity vector V represented by the following expression: combined velocity vector V=Gf·Vf+Ge·Ve+Gc·Vc2, where Vf is a path velocity vector to move the probe along the scanning path, Ve is a deflection correcting vector to keep the amount of deflection of the probe to the workpiece to be the reference amount of deflection, Vc2 is a second trajectory correcting vector represented by (Vc1·q)q, Vc1 is a first trajectory correcting vector to correct a position of the probe so that the stylus tip heads to the scanning path, and q is a trajectory correcting direction vector given by a vector product of a normal line of a surface of the workpiece and the path velocity vector Vf.

3. 发明授权

US09448052B2 Shape measuring apparatus and control method of shape measuring apparatus 有权
标题翻译：形状测量装置及形状测量装置的控制方法
公开(公告)号：US09448052B2
公开(公告)日：2016-09-20
申请号：US13941880
申请日：2013-07-15
申请人： MITUTOYO CORPORATION
发明人： Takashi Noda , Hiromi Deguchi
IPC分类号： G05B11/01 , G01B5/20 , G01B21/20 , G06F17/40 , G06F19/00 , G01B5/008 , G01B21/04
CPC分类号： G01B5/008 , G01B5/20 , G01B21/042 , G01B21/20 , G05B11/01 , G06F17/40 , G06F19/00
摘要： A control method of a shape measuring apparatus divides a curve indicating a movement path of a probe into a plurality of sections. A measurement target section is selected from the plurality of sections sequentially from a starting point side of the curve indicating the movement path of the probe. A first curvature radius is calculated from a curvature of the measurement target section. A second curvature radius is calculated according to an angle between a first straight line connecting a starting point to an ending point of the measurement target section and a second straight line connecting a starting point to an ending point of a section next to the measurement target section. A smaller value from among the first curvature radius and the second curvature radius is set as an effective radius. A maximum speed of probe movement increasing according to an increase in the effective radius is calculated for the measurement target section.
摘要翻译：形状测量装置的控制方法将指示探针的移动路径的曲线分成多个部分。从指示探针的移动路径的曲线的起始点依次从多个部分中选择测量对象部分。从测量对象部分的曲率计算第一曲率半径。根据连接起始点到测量对象部分的终点的第一直线与将测量目标部分的下一个部分的起点连接到终点的第二直线来计算第二曲率半径。将第一曲率半径和第二曲率半径之间的较小值设定为有效半径。针对测量目标部分计算探头移动的最大速度根据有效半径的增加而增加。

4. 发明申请

US20170090455A1 METHOD FOR CONTROLLING SHAPE MEASURING APPARATUS 审中-公开
公开(公告)号：US20170090455A1
公开(公告)日：2017-03-30
申请号：US15271824
申请日：2016-09-21
申请人： Mitutoyo Corporation
发明人： Takashi Noda , Hiromi Deguchi , Norihiko Murata
IPC分类号： G05B19/401 , G06F17/16 , G01B7/008
CPC分类号： G05B19/401 , G01B5/008 , G01B7/008 , G05B2219/23385 , G06F17/16
摘要： There is provided a method for controlling a shape measuring apparatus which can achieve both trajectory correcting capability and control stability. A stylus tip is moved along a scanning path while controlling the stylus tip so as to keep an amount of deflection of a probe to a workpiece to be a reference amount of deflection. A movement instruction for the probe is generated according to a combined velocity vector V represented by the following expression: combined velocity vector V=Gf·Vf+Ge·Ve+Gc·Vc2, where Vf is a path velocity vector to move the probe along the scanning path, Ve is a deflection correcting vector to keep the amount of deflection of the probe to the workpiece to be the reference amount of deflection, Vc2 is a second trajectory correcting vector represented by (Vc1·q)q, Vc1 is a first trajectory correcting vector to correct a position of the probe so that the stylus tip heads to the scanning path, and q is a trajectory correcting direction vector given by a vector product of a normal line of a surface of the workpiece and the path velocity vector Vf.

5. 发明授权

US09964392B2 Control method of profile measuring apparatus 有权
公开(公告)号：US09964392B2
公开(公告)日：2018-05-08
申请号：US15275985
申请日：2016-09-26
申请人： MITUTOYO CORPORATION
发明人： Takashi Noda , Hiromi Deguchi
IPC分类号： G01B5/008 , G01B5/012 , G01B5/20 , G01B21/04
CPC分类号： G01B5/012 , G01B5/20 , G01B21/04
摘要： During a retraction where a stylus tip separates from a work piece from a state where the stylus tip and the work piece are in contact, whether there is contact between the stylus tip and the work piece is monitored. When the contact between the stylus tip and the work piece is detected during the retraction, a probe is displaced to a position where the stylus tip does not come in contact with the work piece and a recovery process is executed. When a distance between a point on a surface of the work piece at a retraction start point and a contact point between the stylus tip and the work piece is Lm, and a value defined by (Lm−d) multiplied by a coefficient k (0

6. 发明授权

US09366522B2 Form measuring apparatus and form measurement method 有权
标题翻译：形状测量装置和形式测量方法
公开(公告)号：US09366522B2
公开(公告)日：2016-06-14
申请号：US14554608
申请日：2014-11-26
申请人： MITUTOYO CORPORATION
发明人： Takashi Noda , Hiromi Deguchi , Shoichi Todaka
IPC分类号： G01B5/008 , G01B5/20 , G01B21/04
CPC分类号： G01B5/20 , G01B5/008 , G01B21/04
摘要： Stylus head displacer displaces a stylus head on a first measurement path. A path definer defines the first measurement path. A displacement controller controls the stylus head displacer such that the stylus head displaces along the first measurement path. A position detector detects a position of the stylus head. A depression amount detector detects the depression amount of the stylus head. A measurement results memory stores the position and amount of depression of the stylus head. The depression amount detector outputs an error signal when detecting a measurement error. The displacement controller stops displacement of the stylus head in response to the error signal and displaces the stylus head to a starting point of the first measurement path, and controls the stylus head displacer such that the stylus head is displaced from the starting point to an end point of the first measurement path with a fixed depression amount.
摘要翻译：触针头置换器置换第一测量路径上的触针头。路径定义器定义第一测量路径。位移控制器控制触针头置换器，使得触针头沿着第一测量路径移位。位置检测器检测触针头的位置。抑制量检测器检测触针头的凹陷量。测量结果存储器存储触控头的凹陷的位置和量。当检测到测量误差时，抑制量检测器输出错误信号。位移控制器响应于误差信号停止触针头的位移，并将触针头移动到第一测量路径的起点，并且控制触笔头置换器，使得触针头从起始点移动到末端具有固定下压量的第一测量路径的点。

7. 发明授权

US10365630B2 Control method of profile measuring apparatus 有权
公开(公告)号：US10365630B2
公开(公告)日：2019-07-30
申请号：US15638932
申请日：2017-06-30
申请人： MITUTOYO CORPORATION
发明人： Takashi Noda , Hiromi Deguchi , Norihiko Murata
IPC分类号： G01B21/04 , G01B21/20 , G01B5/008 , G05B19/04 , G05B19/401
摘要： A probe displacement command in a scanning measurement is generated according to a composite speed vector V: V=Gf·Vf+Ge·Ve+sp(p)·Gc·Vc2 wherein Vf is a vector along which a probe is displaced along a scanning path, Ve is a vector maintaining a deflection amount of the probe toward a work piece at a standard deflection amount. Vc2 is represented by (Vc1·q)q, Vc1 is a vector in a direction correcting a probe position such that a stylus tip is oriented along a scanning course, q is a vector given by a vector product of the normal line of a surface of the work piece and Vf, The normal direction of a measured surface is designated as Nw, p is a scalar product of Vc2 and Nw, and sg(p) is a function returning +1 or −1 in accordance with a value of p.

8. 发明授权

US10274297B2 Method for controlling shape measuring apparatus 有权
公开(公告)号：US10274297B2
公开(公告)日：2019-04-30
申请号：US15158800
申请日：2016-05-19
申请人： MITUTOYO CORPORATION
发明人： Takashi Noda , Hiromi Deguchi , Naoya Kikuchi
IPC分类号： G06F3/0484 , G01B3/00 , G01B5/20 , G06F3/0481 , G01B5/008
摘要： A method for nominal scanning measurement includes allowing a user to select a shape of an object to be measured from a geometric shape menu prepared in advance, allowing the user to input, according to the selected geometric shape, a parameter to specify the geometric shape, allowing the user to select a measurement path from a measurement path menu prepared in advance, allowing the user to input, according to the selected measurement path, a parameter to specify the measurement path, calculating, based on the selected geometric shape, the input parameter of the geometric shape, the selected measurement path, and the input parameter of the measurement path, measurement points on a workpiece and a normal line direction at each of measurement points using a calculation formula prepared in advance, and calculating a path for scanning measurement to move while scanning a sequence of the measurement points.

9. 发明授权

US09298178B2 Shape measuring apparatus 有权
标题翻译：形状测量仪
公开(公告)号：US09298178B2
公开(公告)日：2016-03-29
申请号：US13893864
申请日：2013-05-14
申请人： MITUTOYO CORPORATION
发明人： Takashi Noda , Hiromi Deguchi
IPC分类号： G05B19/18 , G05B19/04 , G01B21/04 , G05B19/401
CPC分类号： G05B19/041 , G01B21/04 , G05B19/401 , G05B2219/37043 , G05B2219/37374 , G05B2219/37411 , Y02P90/265
摘要： A shape measuring apparatus includes: a probe having a stylus tip; a movable mechanism configured to move the stylus tip; an information acquiring unit configured to acquire design information of a workpiece; a path setting unit configured to set a path of the stylus tip; a path component calculating section configured to calculate a path velocity vector; a push direction component calculating section configured to detect a deflection, and calculate a push correction vector; a locus correction component calculating section configured to detect an amount and a direction of locus deviation of the probe from the path, and calculate a locus correction vector; a velocity synthesizing section configured to calculate a velocity synthesis vector by combining the path velocity vector, the push correction vector, and the locus correction vector; and a drive control unit configured to move the probe according to the velocity synthesis vector.
摘要翻译：一种形状测量装置，包括：具有触针尖的探针; 移动机构，其构造成移动所述触针尖; 信息获取单元，被配置为获取工件的设计信息; 路径设置单元，被配置为设置触控笔尖的路径; 路径分量计算部，被配置为计算路径速度矢量; 推动方向分量计算部，被配置为检测偏转，并计算推压校正矢量; 轨迹校正分量计算部，被配置为从所述路径检测所述探测器的轨迹偏离的量和方向，并计算轨迹校正矢量; 速度合成部，被配置为通过组合路径速度矢量，推压校正矢量和轨迹校正矢量来计算速度合成矢量; 以及驱动控制单元，被配置为根据速度合成向量移动探针。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式