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    • 5. 发明授权
    • Semiconductor strain sensor
    • 半导体应变传感器
    • US06521966B1
    • 2003-02-18
    • US09547457
    • 2000-04-12
    • Seiichiro IshioInao ToyodaYasutoshi Suzuki
    • Seiichiro IshioInao ToyodaYasutoshi Suzuki
    • H01L2982
    • G01L19/147H01L2224/48091H01L2224/49171H01L2224/73265H01L2924/01068H01L2924/00014
    • A semiconductor strain sensor in which a sensor element for detecting a strain signal is mounted in a resin package member, which can restrain a creep stress of the package member from affecting to the sensor element. A semiconductor strain sensor is provided with a lead frame integrally molded with a resin package member, and a sensor chip made of silicon. The sensor chip is mounted on one surface of an element mounting portion of the lead frame, and is capable of externally outputting electric signal via a wire in accordance with strain when pressure is applied. An opening portion is provided in the package member, so that the entire area of another surface of the lead frame, where positions beneath the sensor chip, is non-contacted with the package member. Since another surface of the lead frame is non-contacted with the package member at the opening portion, even if the creep occurs in the package member, it can prevent stress (creep stress) undergone in accordance with the creep deformation from being transferred to the sensor chip.
    • 一种半导体应变传感器,其中用于检测应变信号的传感器元件安装在树脂封装构件中,其可以抑制封装构件的蠕变应力对传感器元件的影响。 半导体应变传感器设置有与树脂封装构件一体模制的引线框架和由硅制成的传感器芯片。 传感器芯片安装在引线框架的元件安装部分的一个表面上,并且能够在施加压力时根据应变通过导线从外部输出电信号。 开口部分设置在封装构件中,使得引线框架的另一表面的位于传感器芯片下方的位置的整个区域与封装构件不接触。 由于引线框架的另一表面在开口部处与封装构件不接触,所以即使在封装构件中发生蠕变,也可以防止根据蠕变变形而发生的应力(蠕变应力)被转移到 传感器芯片。