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    • 4. 发明申请
    • Memory controller, semiconductor integrated circuit device, semiconductor device, microcomputer, and electronic device
    • 存储控制器,半导体集成电路器件,半导体器件,微计算机和电子器件
    • US20050235101A1
    • 2005-10-20
    • US11100228
    • 2005-04-06
    • Mikio Sakurai
    • Mikio Sakurai
    • G06F12/00G06F13/16G11C11/406
    • G06F13/1636
    • A memory controller is connected with a first memory requiring refresh and a second memory not requiring refresh, both of which share part of a bus, comprising: a first memory controller that conducts access control and auto-refresh control for the first memory; a second memory controller that conducts access control for the second memory; and an arbiter that adjusts the timing of outputting a signal generated for the first memory and another signal generated for the second memory to a bus, wherein, with a judgment that the signal from the first memory controller is an auto-refresh request, a refresh request signal for the first memory is outputted even while the second memory is being accessed.
    • 存储器控制器与需要刷新的第一存储器和不需要刷新的第二存储器连接,二者共享总线的一部分,包括:对第一存储器进行访问控制和自动刷新控制的第一存储器控制器; 执行第二存储器的访问控制的第二存储器控制器; 以及仲裁器,其将对所述第一存储器生成的信号和将所述第二存储器生成的信号的输出的时序输出到总线的定时,其中,通过判断来自所述第一存储器控制器的信号是自动刷新请求, 即使在访问第二存储器时也输出第一存储器的请求信号。
    • 7. 发明授权
    • Semiconductor device having an improved immunity to a short-circuit at a
power supply line
    • 具有对电源线短路的抗干扰性的半导体装置
    • US5519650A
    • 1996-05-21
    • US301752
    • 1994-09-07
    • Tooru IchimuraKazuhiro SakemiShigeru MoriMikio Sakurai
    • Tooru IchimuraKazuhiro SakemiShigeru MoriMikio Sakurai
    • G11C11/41G11C29/50H01L21/3205H01L21/82H01L23/52H01L23/525G11C5/06
    • G11C29/50H01L23/5258H01L2924/0002
    • A semiconductor memory device includes a memory cell array (1) having a plurality of memory cells arranged in rows and columns, a plurality of column select lines (3) extending over the memory cell array and coupled to received column select signals generated by a column decoder (100), a plurality of power supply lines (4) provided in parallel with the column select lines to transfer a power supply voltage from a main power supply line (130), and a plurality of ground lines (5) provided in parallel with the column select lines to transfer a ground voltage from a main ground line. A plurality of fuse elements (6) are provided for each of the column select lines. When a short-circuit is found between a column select line and power supply line or a ground line, a fuse element corresponding to the short-circuited column select line is blown off and the short-circuited column select line is isolated from the column decoder. By repairing the short-circuited column select line with a redundant column select line (60), the memory device operates correctly without an adverse effect of the short-circuit.
    • 半导体存储器件包括具有以行和列排列的多个存储器单元的存储单元阵列(1),在存储单元阵列上延伸的多个列选择线(3),并与由列产生的接收列选择信号耦合 解码器(100),与列选择线并联设置的多个电源线(4),用于传送来自主电源线(130)的电源电压和并联设置的多个接地线(5) 列选择线从主地线传输接地电压。 为每个列选择线提供多个熔丝元件(6)。 当在列选择线和电源线或接地线之间发现短路时,与短路列选择线相对应的熔丝元件被断开,并且短路列选择线与列解码器隔离 。 通过修复具有冗余列选择线(60)的短路列选择线,存储器件正常工作而没有短路的不利影响。
    • 9. 发明申请
    • IMAGING APPARATUS AND DUST REDUCTION APPARATUS
    • 成像装置和减尘装置
    • US20100060760A1
    • 2010-03-11
    • US12556631
    • 2009-09-10
    • Mikio Sakurai
    • Mikio Sakurai
    • H04N5/335F28G7/00
    • H04N5/2254
    • An imaging apparatus includes an imaging device operable to convert light to an electrical signal, a vibrating unit including an optical member arranged on a light-receiving surface side of the imaging device, a vibration applying unit arranged to contact the vibrating unit and vibrates upon application of a voltage, the vibration applying unit vibrating integrally with the vibrating unit to vibrate the vibrating unit, and a member operable to sandwich the vibrating unit and the vibration applying unit. A zero-amplitude reference plane of resonance produced by the integral vibration of the vibrating unit and the vibration applying unit is located on the vibrating unit.
    • 一种成像装置,包括可将光转换为电信号的成像装置,包括配置在摄像装置的受光面侧的光学部件的振动单元,配置为接触振动单元并在施加时振动的振动施加单元 所述振动施加单元与所述振动单元一体地振动以振动所述振动单元,以及可操作地夹持所述振动单元和所述振动施加单元的构件。 由振动单元和振动施加单元的整体振动产生的共振零参考平面位于振动单元上。
    • 10. 发明授权
    • Multi-bank synchronous semiconductor memory device with easy control
    • 多组同步半导体存储器件易于控制
    • US05999472A
    • 1999-12-07
    • US23599
    • 1998-02-13
    • Mikio Sakurai
    • Mikio Sakurai
    • G11C11/407G11C11/406G11C7/00
    • G11C11/40618G11C11/406
    • When refresh of a memory bank having a plurality of array banks is instructed, a refresh control circuit carries out the refresh by saving a row address latched in a row address latch circuit and a bank activation signal supplied to a bank drive unit respectively in a row address saving circuit and a bank activating information saving circuit. After the refresh completes, each array bank is returned to its original state before the refresh instruction is supplied, according to the saved row address and bank activate information. Accordingly, a synchronous semiconductor memory device in which the penalty at the time of the refresh is reduced is provided.
    • 当指示具有多个阵列组的存储体的刷新时,刷新控制电路通过将分别锁存在行地址锁存电路中的行地址和提供给行驱动单元的存储体激活信号分别保存在行中来执行刷新 地址保存电路和银行激活信息保存电路。 刷新完成后,根据保存的行地址和存储体激活信息,在提供刷新指令之前,每个阵列组都返回到其原始状态。 因此,提供了其中减少刷新时的惩罚的同步半导体存储器件。