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1. 发明授权

US07882754B2 Gas component collector, gas component collecting device, filter producing method, and gas component analyzing apparatus 有权
标题翻译：气体成分收集器，气体成分收集装置，过滤器制造方法以及气体成分分析装置
公开(公告)号：US07882754B2
公开(公告)日：2011-02-08
申请号：US11907905
申请日：2007-10-18
申请人： Masao Suga , Masuyoshi Yamada , Izumi Waki
发明人： Masao Suga , Masuyoshi Yamada , Izumi Waki
IPC分类号： G01N1/22
CPC分类号： A61B5/097 , G01N1/2205 , G01N2001/2244
摘要： A gas component collector comprises a filter assembly 3 comprising an adsorbent and an adsorbent holding plate having a first face, a second face and a plurality of holes that are bored through from the first face to the second face and are filled with the adsorbent adsorbing at least one gas component to be analyzed, the filter assembly satisfying (AL−V)2/L3≧0.003 mm3 and V/AL≧0.3, where V is a total volume of the adsorbent, A is a sum of an opening areas of the holes, and L is an average length of the holes, and a holding container 2 housing the filter assembly 3. On at least one of the holding container 2 a first opening portion for introducing gas and a second opening portion for allowing the introduced gas to be discharged are formed.
摘要翻译：气体成分收集器包括一个过滤器组件3，它包括一个吸附剂和一个吸附剂保持板，该吸附剂保持板具有第一面，第二面和多个从第一面到第二面穿透的孔，并填充吸附在至少一个要分析的气体组分，过滤器组件满足（AL-V）2 /L3≥0.003mm3，V /AL≥0.3，其中V是吸附剂的总体积，A是并且L是孔的平均长度，以及容纳过滤器组件3的保持容器2.在保持容器2中的至少一个上用于引入气体的第一开口部分和用于允许引入气体的第二开口部分被排出形成。

2. 发明授权

US07375316B2 Mass spectrometer and mass spectrometry 有权
标题翻译：质谱仪和质谱仪
公开(公告)号：US07375316B2
公开(公告)日：2008-05-20
申请号：US11712922
申请日：2007-03-02
申请人： Masuyoshi Yamada , Masao Suga , Izumi Waki
发明人： Masuyoshi Yamada , Masao Suga , Izumi Waki
IPC分类号： H01J49/00 , H01J3/07 , B01D59/44
CPC分类号： H01J49/0422 , H01J49/107
摘要： A mass spectrometer capable of measuring under switching two ion sources at different pressure levels in which a sample gas separated by GC column is branched, and separately introduced to a first ion source (for example, APCI ion source) and a second ion source (for example, EI ion source) at a pressure level lower than that of the first ion source respectively. Preferably, the flow rate of the sample gas introduced to the APCI ion source is made more than the flow rate of the sample gas introduced to the EI ion source, so that the pressure for each of the ion sources can be maintained and analysis can be conducted by each ionization at a good balance in view of the sensitivity.
摘要翻译：一种能够在不同压力水平下切换两个离子源的质谱仪，其中由GC柱分离的样品气体被分支，并分别引入第一离子源（例如APCI离子源）和第二离子源（用于例如，EI离子源），其压力水平分别低于第一离子源的压力水平。优选地，引入到APCI离子源的样品气体的流量比引入到EI离子源的样品气体的流量更多，从而可以保持每个离子源的压力并且可以分析鉴于敏感性，通过各种电离进行良好的平衡。

3. 发明申请

US20080092629A1 Gas component collector, gas component collecting device, filter producing method, and gas component analyzing apparatus 有权
标题翻译：气体成分收集器，气体成分收集装置，过滤器制造方法以及气体成分分析装置
公开(公告)号：US20080092629A1
公开(公告)日：2008-04-24
申请号：US11907905
申请日：2007-10-18
申请人： Masao Suga , Masuyoshi Yamada , Izumi Waki
发明人： Masao Suga , Masuyoshi Yamada , Izumi Waki
IPC分类号： G01N1/22
CPC分类号： A61B5/097 , G01N1/2205 , G01N2001/2244
摘要： A gas component collector comprises a filter assembly 3 comprising an adsorbent and an adsorbent holding plate having a first face, a second face and a plurality of holes that are bored through from the first face to the second face and are filled with the adsorbent adsorbing at least one gas component to be analyzed, the filter assembly satisfying (AL−V)2/L3≧0.003 mm3 and V/AL≧0.3, where V is a total volume of the adsorbent, A is a sum of an opening areas of the holes, and L is an average length of the holes, and a holding container 2 housing the filter assembly 3. On at least one of the holding container 2 a first opening portion for introducing gas and a second opening portion for allowing the introduced gas to be discharged are formed.
摘要翻译：气体成分收集器包括一个过滤器组件3，它包括一个吸附剂和一个吸附剂保持板，该吸附剂保持板具有第一面，第二面和多个从第一面到第二面穿透的孔，并填充吸附在要分析的至少一个气体成分，满足（AL-V）2 / L 3 / SUP 3 = 0.003mm 3和V / AL> = 0.3，其中V是吸附剂的总体积，A是孔的开口面积的总和，L是孔的平均长度，以及容纳过滤器组件3的保持容器2。在保持容器2的至少一个上形成用于引入气体的第一开口部分和用于允许引入气体排出的第二开口部分。

4. 发明授权

US07064320B2 Mass chromatograph 有权
标题翻译：质谱仪
公开(公告)号：US07064320B2
公开(公告)日：2006-06-20
申请号：US11071345
申请日：2005-03-04
申请人： Masuyoshi Yamada , Izumi Waki , Hideo Kasima
发明人： Masuyoshi Yamada , Izumi Waki , Hideo Kasima
IPC分类号： H01J49/26 , G01N27/62
CPC分类号： H01J49/0422 , G01N30/7213 , H01J49/145 , H01J49/168
摘要： A mass spectrometer has an atmospheric pressure chemical ionization source that includes a first ionization portion including a needle electrode, for generating a primary ion by discharge of the needle electrode a primary ion introduction aperture, and a second ionization portion including an introduction aperture, for generating a sample ion by the reaction between the primary ion and the sample gas introduced from an end of a column of gas chromatography, a sample ion movement aperture; and a mass analysis portion; wherein the end is arranged at a position satisfying the relation r≦2R where R is a radius of an inner diameter of the aperture and r is a distance between an axis connecting the center of the aperture and the center of the aperture, and the end.
摘要翻译：质谱仪具有大气压化学电离源，其包括第一离子化部分，其包括针状电极，用于通过针状电极排出初级离子引入孔而产生初级离子;以及第二离子化部分，其包括引入孔，用于产生通过从气相色谱柱的端部引入的初级离子和样品气体之间的反应的样品离子，样品离子运动孔; 和质量分析部分; 其中端部被布置在满足关系r <= 2R的位置处，其中R是孔的内径的半径，r是连接孔的中心的轴线与孔的中心之间的距离，结束。

5. 发明申请

US20060266353A1 Exhaled air filter, exhaled air collecting apparatus, exhaled air analyzing system and exhaled air analyzing method 审中-公开
标题翻译：呼出空气过滤器，呼出空气收集装置，呼出空气分析系统和呼气分析方法
公开(公告)号：US20060266353A1
公开(公告)日：2006-11-30
申请号：US11210738
申请日：2005-08-25
申请人： Masuyoshi Yamada , Masao Suga , Izumi Waki
发明人： Masuyoshi Yamada , Masao Suga , Izumi Waki
IPC分类号： A62B18/08 , A62B7/10
CPC分类号： A61B5/097 , G01N1/2214 , G01N33/497
摘要： For collecting a component of an exhaled air, a filter comprises an adsorbent for adsorbing the component of the exhaled air, and a collector body including a passage hole which the adsorbent is contained and through which the exhaled air is capable of passing.
摘要翻译：为了收集呼出空气的组分，过滤器包括用于吸附呼出空气的组分的吸附剂，以及包含吸附剂被容纳并且呼出的空气能够通过的通道孔的集电体。

6. 发明申请

US20070181801A1 Mass spectrometer and mass spectrometry 有权
公开(公告)号：US20070181801A1
公开(公告)日：2007-08-09
申请号：US11699366
申请日：2007-01-30
申请人： Masuyoshi Yamada , Masao Suga , Izumi Waki
发明人： Masuyoshi Yamada , Masao Suga , Izumi Waki
IPC分类号： H01J49/00
CPC分类号： H01J49/0422 , H01J49/107
摘要： A mass spectrometer capable of measuring under switching two ion sources at different pressure levels in which a sample gas separated by GC column is branched, and separately introduced to a first ion source (for example, APCI ion source) and a second ion source (for example, EI ion source) at a pressure level lower than that of the first ion source respectively. Preferably, the flow rate of the sample gas introduced to the APCI ion source is made more than the flow rate of the sample gas introduced to the EI ion source, so that the pressure for each of the ion sources can be maintained and analysis can be conducted by each ionization at a good balance in view of the sensitivity.

7. 发明申请

US20060054806A1 Mass chromatograph 有权
公开(公告)号：US20060054806A1
公开(公告)日：2006-03-16
申请号：US11071345
申请日：2005-03-04
申请人： Masuyoshi Yamada , Izumi Waki , Hideo Kasima
发明人： Masuyoshi Yamada , Izumi Waki , Hideo Kasima
IPC分类号： G01N27/62 , H01J49/04
CPC分类号： H01J49/0422 , G01N30/7213 , H01J49/145 , H01J49/168
摘要： A mass spectrometer has an atmospheric pressure chemical ionization source that includes a first ionization portion including a needle electrode, for generating a primary ion by discharge of the needle electrode a primary ion introduction aperture, and a second ionization portion including an introduction aperture, for generating a sample ion by the reaction between the primary ion and the sample gas introduced from an end of a column of gas chromatography, a sample ion movement aperture; and a mass analysis portion; wherein the end is arranged at a position satisfying the relation r≦2R where R is a radius of an inner diameter of the aperture and r is a distance between an axis connecting the center of the aperture and the center of the aperture, and the end.

8. 发明授权

US06852970B2 Mass spectrometer 失效
标题翻译：质谱仪
公开(公告)号：US06852970B2
公开(公告)日：2005-02-08
申请号：US10699805
申请日：2003-11-04
申请人： Masuyoshi Yamada , Izumi Waki
发明人： Masuyoshi Yamada , Izumi Waki
IPC分类号： G01N27/62 , G01N33/00 , H01J49/04 , H01J49/10 , H01M8/04 , H01J49/28
CPC分类号： H01J49/04 , G01N33/005 , H01M8/04082
摘要： There will be provided a mass spectrometer for detecting impurity in sample gas of a low flow rate. A mass spectrometer including: an atmospheric pressure chemical ionization source having a primary ionization part 28 for generating a primary ion by means of electric discharge of reagent gas, and a secondary ionization part 23 for generating an ion of the sample by a reaction of the primary ion and the sample; a mass spectrometric part 11 for performing mass spectrometric analysis of the ion generated; a mixing portion 33 for mixing the sample to be introduced into the secondary ionization part with dilution gas; and a mean 30 for controlling a flow rate of the dilution gas for flowing through the mixing portion; and a mean 12-1 or 12-2 or 12-3 for controlling a flow rate of the sample gas, wherein mixed gas obtained by mixing the sample with the dilution gas is introduced into the secondary ionization part and the sample is ionized.
摘要翻译：将提供用于检测低流量的样品气体中的杂质的质谱仪。一种质谱仪，包括：大气压化学电离源，其具有通过反应气体的放电产生一次离子的一次离子化部28;以及二次离子化部23，其通过所述一次反应生成该样品的离子离子和样品; 用于对生成的离子进行质谱分析的质谱部11; 混合部分33，用于将要引入二次电离部分的样品与稀释气体混合; 以及用于控制用于流过混合部分的稀释气体的流量的平均值30; 以及用于控制样品气体的流量的平均值12-1或12-2或12-3，其中通过将样品与稀释气体混合而获得的混合气体被引入二次电离部分，并且样品被离子化。

9. 发明授权

US07420180B2 Mass spectrometer and mass spectrometry 有权
公开(公告)号：US07420180B2
公开(公告)日：2008-09-02
申请号：US11699366
申请日：2007-01-30
申请人： Masuyoshi Yamada , Masao Suga , Izumi Waki
发明人： Masuyoshi Yamada , Masao Suga , Izumi Waki
IPC分类号： H01J49/00 , H01J49/10
CPC分类号： H01J49/0422 , H01J49/107
摘要： A mass spectrometer capable of measuring under switching two ion sources at different pressure levels in which a sample gas separated by GC column is branched, and separately introduced to a first ion source (for example, APCI ion source) and a second ion source (for example, EI ion source) at a pressure level lower than that of the first ion source respectively. Preferably, the flow rate of the sample gas introduced to the APCI ion source is made more than the flow rate of the sample gas introduced to the EI ion source, so that the pressure for each of the ion sources can be maintained and analysis can be conducted by each ionization at a good balance in view of the sensitivity.

10. 发明申请

US20070181802A1 Mass spectrometer and mass spectrometry 有权
标题翻译：质谱仪和质谱仪
公开(公告)号：US20070181802A1
公开(公告)日：2007-08-09
申请号：US11712922
申请日：2007-03-02
申请人： Masuyoshi Yamada , Masao Suga , Izumi Waki
发明人： Masuyoshi Yamada , Masao Suga , Izumi Waki
IPC分类号： H01J49/00
CPC分类号： H01J49/0422 , H01J49/107
摘要： A mass spectrometer capable of measuring under switching two ion sources at different pressure levels in which a sample gas separated by GC column is branched, and separately introduced to a first ion source (for example, APCI ion source) and a second ion source (for example, EI ion source) at a pressure level lower than that of the first ion source respectively. Preferably, the flow rate of the sample gas introduced to the APCI ion source is made more than the flow rate of the sample gas introduced to the EI ion source, so that the pressure for each of the ion sources can be maintained and analysis can be conducted by each ionization at a good balance in view of the sensitivity.
摘要翻译：一种能够在不同压力水平下切换两个离子源的质谱仪，其中由GC柱分离的样品气体被分支，并分别引入第一离子源（例如APCI离子源）和第二离子源（用于例如，EI离子源），其压力水平分别低于第一离子源的压力水平。优选地，引入到APCI离子源的样品气体的流量比引入到EI离子源的样品气体的流量更多，从而可以保持每个离子源的压力并且可以分析鉴于敏感性，通过各种电离进行良好的平衡。

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