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    • 5. 发明授权
    • Nonvolatile semiconductor memory with virtual ground array
    • 具有虚拟接地阵列的非易失性半导体存储器
    • US07408820B2
    • 2008-08-05
    • US11641951
    • 2006-12-20
    • Takafumi MaruyamaKazuyuki KounoAkifumi KawaharaYasuhiro Tomita
    • Takafumi MaruyamaKazuyuki KounoAkifumi KawaharaYasuhiro Tomita
    • G11C11/34
    • G11C16/0491G11C16/28
    • A nonvolatile semiconductor memory of virtual ground array in which a common connection of the sources and a common connection of the drains of nonvolatile memory cells arranged in rows and columns in a memory cell array are used as bit lines, the nonvolatile memory cells including: a reference cell from which a characteristic used as a reference in a differential readout determination operation is obtained; and a neighbor cell at one side of the reference cell, the neighbor cell sharing one of the source and the drain of the reference cell and being connected to a word line which is connected to the reference cell, wherein the nonvolatile semiconductor memory includes a neighbor cell programming circuit to set the neighbor cell to a programmed state when the word line is activated to set the reference cell to a conduction state, the neighbor cell being kept in a non-conduction state during the programmed state.
    • 虚拟接地阵列的非易失性半导体存储器用作位线,其中源和存储单元阵列中以列和列排列的非易失性存储单元的漏极的公共连接的公共连接用作位线,非易失性存储单元包括: 获得在差分读出确定操作中用作参考的特性的参考单元; 以及在所述参考小区的一侧的相邻小区,所述相邻小区分享所述参考小区的源和漏极之一并且连接到连接到所述参考小区的字线,其中所述非易失性半导体存储器包括邻居 当字线被激活以将参考单元设置为导通状态时,相邻单元在编程状态期间保持在非导通状态,将相邻单元设置为编程状态。
    • 6. 发明申请
    • Nonvolatile semiconductor memory
    • 非易失性半导体存储器
    • US20070183240A1
    • 2007-08-09
    • US11641951
    • 2006-12-20
    • Takafumi MaruyamaKazuyuki KounoAkifumi KawaharaYasuhiro Tomita
    • Takafumi MaruyamaKazuyuki KounoAkifumi KawaharaYasuhiro Tomita
    • G11C7/02
    • G11C16/0491G11C16/28
    • A nonvolatile semiconductor memory of virtual ground array in which a common connection of the sources and a common connection of the drains of nonvolatile memory cells arranged in rows and columns in a memory cell array are used as bit lines, the nonvolatile memory cells including: a reference cell from which a characteristic used as a reference in a differential readout determination operation is obtained; and a neighbor cell at one side of the reference cell, the neighbor cell sharing one of the source and the drain of the reference cell and being connected to a word line which is connected to the reference cell, wherein the nonvolatile semiconductor memory includes a neighbor cell programming circuit to set the neighbor cell to a programmed state when the word line is activated to set the reference cell to a conduction state, the neighbor cell being kept in a non-conduction state during the programmed state.
    • 虚拟接地阵列的非易失性半导体存储器用作位线,其中源和存储单元阵列中以列和列排列的非易失性存储单元的漏极的公共连接的公共连接用作位线,非易失性存储单元包括: 获得在差分读出确定操作中用作参考的特性的参考单元; 以及在所述参考小区的一侧的相邻小区,所述相邻小区分享所述参考小区的源和漏极之一并且连接到连接到所述参考小区的字线,其中所述非易失性半导体存储器包括邻居 当字线被激活以将参考单元设置为导通状态时,相邻单元在编程状态期间保持在非导通状态,将相邻单元设置为编程状态。
    • 7. 发明申请
    • Regulator circuit
    • 调节器电路
    • US20060119421A1
    • 2006-06-08
    • US11272807
    • 2005-11-15
    • Kazuyuki KounoNorio Hattori
    • Kazuyuki KounoNorio Hattori
    • G05F1/10
    • G05F1/56
    • A regulator circuit includes: a detection circuit, for outputting a feedback voltage in accordance with an output voltage; a reference voltage input section; a feedback voltage input section; an operational amplification circuit, for comparing a reference voltage and the feedback voltage and outputting a voltage as a comparison result; an output circuit, for supplying an output voltage in accordance with the output of the operational amplification circuit; a connection/disconnection circuit, for connecting or disconnecting the output terminal of the detection circuit and the feedback voltage input section; and a voltage setup circuit, for setting for the feedback voltage input section a predetermined voltage. In the standby state, the connection/disconnection circuit disconnects the output terminal of the detection circuit from the feedback voltage input section, and the voltage setup circuit sets a predetermined voltage for the feedback input section.
    • 调节器电路包括:检测电路,用于根据输出电压输出反馈电压; 基准电压输入部; 反馈电压输入部; 用于比较参考电压和反馈电压并输出电压作为比较结果的运算放大电路; 输出电路,用于根据所述运算放大电路的输出提供输出电压; 连接/断开电路,用于连接或断开检测电路的输出端和反馈电压输入部分; 以及用于将反馈电压输入部分设定为预定电压的电压设置电路。 在待机状态下,连接/断开电路将检测电路的输出端与反馈电压输入部分断开,并且电压建立电路为反馈输入部分设定预定的电压。
    • 8. 发明授权
    • Regulator circuit
    • 调节器电路
    • US07439798B2
    • 2008-10-21
    • US11272807
    • 2005-11-15
    • Kazuyuki KounoNorio Hattori
    • Kazuyuki KounoNorio Hattori
    • G05F1/10G05F3/02
    • G05F1/56
    • A regulator circuit includes: a detection circuit, for outputting a feedback voltage in accordance with an output voltage; a reference voltage input section; a feedback voltage input section; an operational amplification circuit, for comparing a reference voltage and the feedback voltage and outputting a voltage as a comparison result; an output circuit, for supplying an output voltage in accordance with the output of the operational amplification circuit; a connection/disconnection circuit, for connecting or disconnecting the output terminal of the detection circuit and the feedback voltage input section; and a voltage setup circuit, for setting for the feedback voltage input section a predetermined voltage. In the standby state, the connection/disconnection circuit disconnects the output terminal of the detection circuit from the feedback voltage input section, and the voltage setup circuit sets a predetermined voltage for the feedback input section.
    • 调节器电路包括:检测电路,用于根据输出电压输出反馈电压; 基准电压输入部; 反馈电压输入部; 用于比较参考电压和反馈电压并输出电压作为比较结果的运算放大电路; 输出电路,用于根据所述运算放大电路的输出提供输出电压; 连接/断开电路,用于连接或断开检测电路的输出端和反馈电压输入部分; 以及用于将反馈电压输入部分设定为预定电压的电压设置电路。 在待机状态下,连接/断开电路将检测电路的输出端与反馈电压输入部分断开,并且电压建立电路为反馈输入部分设定预定的电压。
    • 9. 发明授权
    • Non-volatile semiconductor memory device and writing method therefor
    • 非易失性半导体存储器件及其写入方法
    • US07260016B2
    • 2007-08-21
    • US11085575
    • 2005-03-22
    • Kazuyuki Kouno
    • Kazuyuki Kouno
    • G11C16/24
    • G11C29/36G11C16/04G11C16/3454G11C2029/3602
    • To provide a non-volatile semiconductor memory device which can increase the speed of a writing operation of a physical checker pattern, a logical checker pattern, etc. carried out in an inspection process.First group writing circuits 30a, 30c connected to even-numbered bit lines BL0, BL2 and second group writing circuits 30b, 30d connected to odd-numbered bit lines BL1, BL3 are controlled to an active state and a non-active state respectively on the basis of control signals TSE, TSO. The writing operation of the physical checker pattern is carried out by a program operation for a first page which is carried out while a first word and the first group writing circuits are set to the active state, a program operation for a second page which is carried out while a second word line and the second group writing circuits are set to the active state, and a simultaneous verify operation of the first and second pages which is carried out while the first and second word lines and all the writing circuits are set to the active state.
    • 提供一种可以提高在检查过程中执行的物理检查图案,逻辑检查图案等的写入操作的速度的非易失性半导体存储器件。 连接到偶数位线BL 0,BL 2的第一组写入电路30a,连接到奇数位线BL 1,BL 3的第二组写入电路30b,30d被控制为有效状态, 分别基于控制信号TSE,TSO的非有效状态。 物理检查器图案的写入操作通过在第一个字和第一个组写入电路被设置为活动状态的同时执行的第一页的程序操作来执行,该第二页被携带的第二页的程序操作 在第二字线和第二组写入电路被设置为有效状态的同时,在第一和第二字线和所有写入电路被设置为第一和第二页面的同时验证操作中执行第一和第二页面 活跃状态