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    • 4. 发明授权
    • Semiconductor memory including voltage detection circuit for generating sense amplifier signal
    • 半导体存储器包括用于产生读出放大器信号的电压检测电路
    • US08064241B2
    • 2011-11-22
    • US12603065
    • 2009-10-21
    • Keizo MoritaKenichi Nakabayashi
    • Keizo MoritaKenichi Nakabayashi
    • G11C11/22
    • G11C11/22G11C7/08G11C7/222G11C7/227
    • A voltage detection circuit outputs a detection signal when an amount of charges read to one of a pair of bit lines reaches a predetermined amount. A mask circuit of a timing generator masks an output of a sense amplifier activation signal until the detection signal is output. A sense amplifier determines logics of data read to the bit lines from memory cells in synchronization with the sense amplifier activation signal. An operation of the sense amplifier is started after predetermined amounts of charges are read from the memory cells to the bit lines, that is, after the detection signal is output. Accordingly, even when a timing to output a timing signal becomes early due to a variance of manufacturing conditions of a semiconductor memory, data read from the memory cells can be latched correctly in the sense amplifier. As a result, malfunctions of the semiconductor memory can be prevented.
    • 当对一对位线之一读取的电荷量达到预定量时,电压检测电路输出检测信号。 定时发生器的屏蔽电路屏蔽感测放大器激活信号的输出,直到输出检测信号。 读出放大器与读出放大器激活信号同步地确定从存储器单元读取到位线的数据的逻辑。 在从存储器单元读取预定量的电荷到位线之后,即在检测信号被输出之后,开始读出放大器的操作。 因此,即使由于半导体存储器的制造条件的变化而导致定时信号的输出定时变得早,因此可以在读出放大器中正确地锁存从存储单元读出的数据。 结果,可以防止半导体存储器的故障。
    • 6. 发明授权
    • Magnetic rotary encoder for detection of incremental angular displacement
    • 用于检测增量角位移的磁性旋转编码器
    • US4319188A
    • 1982-03-09
    • US219759
    • 1980-12-24
    • Susumu ItoMorimasa NagaoKaoru TokiKeizo Morita
    • Susumu ItoMorimasa NagaoKaoru TokiKeizo Morita
    • G01B7/00G01B7/30G01D5/14G01D5/16G01D5/244G01D5/245G01P3/487H03M1/00G01P3/48
    • G01D5/145G01D5/24404G01D5/2457G01P3/487H03M1/30
    • A magnetic rotary encoder for detecting incremental angular displacement, angular velocity and rotating direction using magneto-resistors is disclosed. A drum, disk or cupshaped rotary member is attachable to a rotatable shaft. A magnetic medium is provided on a surface of the rotary member and is divided at a pitch p into a plurality of magnetic sections each of which has a magnetic signal recorded. The magnetic medium produces an alternating magnetic field as the rotary member revolves. Alternatively, a plurality of permanent magnets are provided on the surface of the rotary member to produce the alternating magnetic field of the rotary member revolves. A magnetic field detector includes at least one magneto-resistor having a stripe-like configuration with width D. The magneto-resistor is located in the vicinity of the rotary member so as to be spaced from the magnetic medium or the permanent magnets by equal to or less than p at its nearest portion and by equal to or less than 20p at its furthest portion. The width D is selected so as not to be in excess of 20p but to be equal or less than p .sec .phi., where .phi. is an angle defined by the nearest surfaces of the magneto-resistor and the magnetic medium or permanent magnets. The magneto-resistor is responsive to the alternating magnetic field to generate an analog signal representative of its electrical resistance change corresponding to the increment of the rotational angle of the rotary member. A rotary condition detector is electrically connected to the magnetic field detector to receive the analog signal and produce signals indicative of the rotating conditions of the rotatable shaft.
    • 公开了一种用于使用磁阻电阻检测增量角位移,角速度和旋转方向的磁旋转编码器。 鼓,盘或杯形旋转构件可附接到可旋转的轴。 磁性介质设置在旋转构件的表面上,并以间距p分成多个磁区,每个磁区具有记录的磁信号。 当旋转构件旋转时,磁介质产生交变磁场。 或者,在旋转构件的表面上设置多个永磁体,以产生旋转构件的交变磁场旋转。 磁场检测器包括至少一个具有宽度为D的条状结构的磁阻电阻器。磁电阻器位于旋转部件附近,以便与磁介质或永磁体间隔相等 或小于其最近部分处的p,并且在其最远部分等于或小于20p。 宽度D被选择为不超过20p但是等于或小于p.sec phi,其中phi是由磁电阻器和磁介质或永磁体的最近表面限定的角度。 磁阻电阻响应于交变磁场以产生代表其电阻变化的模拟信号,其对应于旋转构件的旋转角度的增量。 旋转状态检测器电连接到磁场检测器以接收模拟信号并产生指示可旋转轴的旋转状态的信号。
    • 7. 发明申请
    • SEMICONDUCTOR STORAGE DEVICE, AND DATA READING METHOD
    • 半导体存储器件和数据读取方法
    • US20090168577A1
    • 2009-07-02
    • US12398816
    • 2009-03-05
    • Keizo MoritaShoichiro Kawashima
    • Keizo MoritaShoichiro Kawashima
    • G11C7/02
    • G11C11/22
    • A semiconductor storage device comprises of a memory cell connected to a plate line and a bit line, a potential shift circuit which is connected to a bit line, temporarily changes in output voltage corresponding to the voltage change of the bit line when a voltage is applied to the plate line, and then outputs a voltage before the application of the voltage to the plate line, a charge transfer circuit for transferring charge stored on the potential shift circuit corresponding to the temporary output voltage change of the potential shift circuit, and a charge accumulation circuit for generating a read voltage from a memory cell after accumulating the transferred charge.
    • 半导体存储装置包括连接到板线和位线的存储单元,连接到位线的电位移动电路在施加电压时临时改变与位线的电压变化相对应的输出电压 然后在对板线施加电压之前输出电压;电荷转移电路,用于转移与电位移动电路的临时输出电压变化对应的电位移位电路上存储的电荷,以及电荷 累积电路,用于在累积传送的电荷之后从存储单元产生读取电压。
    • 8. 发明授权
    • Semiconductor memory
    • 半导体存储器
    • US07180766B2
    • 2007-02-20
    • US11154797
    • 2005-06-17
    • Keizo Morita
    • Keizo Morita
    • G11C11/22
    • G11C11/22
    • The semiconductor memory has word lines; normal memory cells each having a storage capacitor; normal bit lines connected to the normal memory cells; a reference memory cell having a capacitor storing prescribed data; and a reference bit line connected to the reference memory cell. When a word line is selected, the potential of normal bit lines and of reference bit line changes according to the charge on the storage capacitors and on the reference capacitor. A current mirror circuit is also provided, which has a first transistor drain of which is connected to the reference bit line and second transistors drains of which are respectively connected to normal bit lines, the gates of the first and second transistors being connected in common to the reference bit line. Thus even though the capacitance values of ferroelectric capacitors is scattered, the scattering in bit line potentials during read operations can be prevented.
    • 半导体存储器具有字线; 各存储电容器的正常存储单元; 正常位线连接到正常存储器单元; 参考存储单元,具有存储规定数据的电容器; 以及连接到参考存储单元的参考位线。 当选择字线时,正常位线和参考位线的电位根据存储电容器和参考电容器上的电荷而改变。 还提供了电流镜电路,其具有连接到参考位线的第一晶体管漏极和分别连接到通常位线的第二晶体管漏极,第一和第二晶体管的栅极共同连接到 参考位线。 因此,即使铁电电容器的电容值散布,也可以防止在读取操作期间位线电位的散射。
    • 9. 发明申请
    • Semiconductor memory
    • 半导体存储器
    • US20060146625A1
    • 2006-07-06
    • US11154797
    • 2005-06-17
    • Keizo Morita
    • Keizo Morita
    • G11C7/02G11C7/14G11C11/22
    • G11C11/22
    • The semiconductor memory has word lines; normal memory cells each having a storage capacitor; normal bit lines connected to the normal memory cells; a reference memory cell having a capacitor storing prescribed data; and a reference bit line connected to the reference memory cell. When a word line is selected, the potential of normal bit lines and of reference bit line changes according to the charge on the storage capacitors and on the reference capacitor. A current mirror circuit is also provided, which has a first transistor drain of which is connected to the reference bit line and second transistors drains of which are respectively connected to normal bit lines, the gates of the first and second transistors being connected in common to the reference bit line. Thus even though the capacitance values of ferroelectric capacitors is scattered, the scattering in bit line potentials during read operations can be prevented.
    • 半导体存储器具有字线; 各存储电容器的正常存储单元; 正常位线连接到正常存储器单元; 参考存储单元,具有存储规定数据的电容器; 以及连接到参考存储单元的参考位线。 当选择字线时,正常位线和参考位线的电位根据存储电容器和参考电容器上的电荷而改变。 还提供了电流镜电路,其具有连接到参考位线的第一晶体管漏极和分别连接到通常位线的第二晶体管漏极,第一和第二晶体管的栅极共同连接到 参考位线。 因此,即使铁电电容器的电容值散布,也可以防止在读取操作期间位线电位的散射。