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    • 2. 发明申请
    • Semiconductor integrated circuit and method of testing the same
    • 半导体集成电路和测试方法相同
    • US20060179378A1
    • 2006-08-10
    • US11338684
    • 2006-01-25
    • Masahisa IidaYuji Yamasaki
    • Masahisa IidaYuji Yamasaki
    • G01R31/28
    • G11C29/12G11C5/147G11C29/02G11C29/021G11C29/028G11C29/12005
    • In this semiconductor integrated circuit, outputs of a fuse for power supply level adjustment and an internal register are selectively switched by a selector, and a selected output is inputted to a reference voltage generating circuit. Hence, the same reference voltage can be generated before and after blowing the fuse. An internal power supply voltage is generated based on this reference voltage. That makes it possible to output the same internal power supply voltage as that after blowing the fuse by using the output of the internal register before blowing the fuse. As the result of this, a redundant relief determination test using the internal power supply can be performed, and by executing a test at the same speed as that of an actual operation using BIST, an error between the internal voltages during a test and during an actual operation can be eliminated, thus achieving a highly accurate redundant relief determination of a marginal bit.
    • 在该半导体集成电路中,通过选择器选择性地切换用于电源电平调整的熔丝的输出和内部寄存器,并且将选择的输出输入到参考电压产生电路。 因此,在熔断器之前和之后可以产生相同的参考电压。 基于该参考电压产生内部电源电压。 这样可以在熔断保险丝之前,使用内部寄存器的输出,输出与熔断器相同的内部电源电压。 其结果,可以进行使用内部电源的冗余放电判定试验,通过以与使用BIST的实际动作相同的速度进行试验,在试验中和内部电压之间产生内部电压之间的误差 可以消除实际操作,从而实现边缘位的高度精确的冗余补偿确定。
    • 10. 发明授权
    • Semiconductor device
    • 半导体器件
    • US06507529B2
    • 2003-01-14
    • US10003430
    • 2001-12-06
    • Tomonori FujimotoKiyoto OhtaYuji Yamasaki
    • Tomonori FujimotoKiyoto OhtaYuji Yamasaki
    • G11C700
    • G11C11/406
    • A semiconductor device capable of refreshing a plurality of memory cells. In operation, when requesting a data read operation a /row selection control signal is input to a set/reset circuit of a row selection control circuit, whereby an H-level hidden refresh control signal is output and an internal row selection control signal transitions to the H level. As a result, an intended word line is selected, and a refresh operation is initiated. Then, a sense amplifier activation completion signal SEND is input via a delay circuit to the set/reset circuit after completion of a sense operation, and the internal row selection control signal transitions to the L level. The sense amplifier activation completion signal SEND is input to another set/reset circuit after passing through three delay circuits, and an RW row selection control signal transitions to the H level, thereby performing a data read operation.
    • 一种能够刷新多个存储单元的半导体器件。 在操作中,当请求数据读取操作时,a /行选择控制信号被输入到行选择控制电路的设置/复位电路,由此输出H电平隐藏刷新控制信号,并且内部行选择控制信号转换到 H级。 结果,选择预期的字线,并且启动刷新操作。 然后,在感测操作完成之后,通过延迟电路将感测放大器激活完成信号SEND输入到设置/复位电路,并且内部行选择控制信号转换到L电平。 在通过三个延迟电路之后,读出放大器激活完成信号SEND被输入到另一个设置/复位电路,并且RW行选择控制信号转换到H电平,从而进行数据读取操作。