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    • 1. 发明授权
    • Apparatus and method for specimen inspection
    • 检测仪器及方法
    • US4807984A
    • 1989-02-28
    • US13799
    • 1987-02-12
    • Masaaki KurimuraRyohei YabeIsao Shindo
    • Masaaki KurimuraRyohei YabeIsao Shindo
    • G01N35/00G02B21/26G02B21/24
    • G01N35/00029G02B21/26G01N2035/00039G01N2035/00059G01N2035/00089
    • A slide specimen extracted from a cassette at a receiving position is carried to a holding position for waiting by a carrier along a carrying pass. While at the holding position, a previously inspected specimen that has been observed through a microscope is placed on the carrying pass at a specimen replacing position. Thereafter the specimen that has been held at the holding position is carried to the replacing position by the carrier, while at the same time the specimen that has just been placed at the replacing position is moved along the carrying pass by the carrier. The specimen then placed in the replacing position is picked up by a pair of holding arms and carried to an observing position of the microscope. The specimen is retained by vacuum adsorption and by specimen retainers which resiliently hold it by means of springs in contact with the vacuum adsorption surface. In the meantime, the specimen that has already been observed and shifted toward the specimen feeder is moved the rest of the way to the specimen feeder and replaced into the original cassette from which it was extracted. After replacing the specimen, a new specimen is extracted and carried to the holding position as the process is repeated until all of the slide specimens have been observed.
    • 从接收位置处的盒中提取的载玻片样本被携带到用于通过载体等待的保持位置。 在保持位置,将通过显微镜观察到的先前检查的样品放置在样品置换位置的携带通道上。 此后,被保持在保持位置的样本被载体运送到更换位置,同时刚刚放置在更换位置的样本沿着运送通道移动。 然后将放置在替换位置的样品由一对夹持臂拾取并携带到显微镜的观察位置。 样品通过真空吸附和通过与真空吸附表面接触的弹簧弹性保持的样品保持器保持。 同时,已经观察并向样品供料器移动的样品将其余部分移动到样品进料器,并更换为从中提取的原始盒式样。 在更换样品后,重复一个新的样品并将其运送到保持位置,直到观察到所有的载玻片样品。
    • 4. 发明授权
    • Method and apparatus for optically analyzing specimen by using two light
beams
    • 用两光束光学分析试样的方法和装置
    • US4176957A
    • 1979-12-04
    • US760130
    • 1977-01-17
    • Yoshio MaedaKoichi MatsumotoKenji FukudaIsao Shindo
    • Yoshio MaedaKoichi MatsumotoKenji FukudaIsao Shindo
    • G01J3/02G01J3/42
    • G01J3/42
    • Method for optically analyzing a specimen by using two light beams comprises steps of initiating automatically wavelength scanning operation when a predetermined time has elapsed after the switching-on of a power source, sampling a ratio between a reference light intensity and a specimen light intensity during the wavelength scanning operation when no specimen to be measured is placed in the sample cell, and storing signals derived from the sampling operation in a volatile memory. When the specimen is to be measured or analyzed, the measure signal representative of ratio between the reference light intensity and the specimen transmitting light intensity which are produced or the wavelength scanning operation proceeds is corrected by the corresponding signal read out from the volatile memory in accordance with the wavelength of the measure signal, and the corrected signals are processed as the error-free measure signal.
    • 通过使用两个光束对样本进行光学分析的方法包括以下步骤:在电源接通之后经过预定时间时自动启动波长扫描操作,在该期间对参考光强度和标本光强之间的比率进行采样 波长扫描操作,当不测量样本被放置在采样单元中,并将从取样操作得到的信号存储在易失性存储器中。 当要测量或分析样本时,表示参考光强度和所产生的样品透射光强度之间的比率的测量信号或波长扫描操作的进行是通过根据从易失性存储器读出的对应信号来校正的 与测量信号的波长,并且校正的信号被作为无差错测量信号被处理。