专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20050085257A1 Mobile emergency notification system 有权
标题翻译：移动紧急通知系统
公开(公告)号：US20050085257A1
公开(公告)日：2005-04-21
申请号：US10957083
申请日：2004-10-01
申请人： Mark Laird , Michael Glier
发明人： Mark Laird , Michael Glier
IPC分类号： A61B5/00 , A61B5/04 , A61B5/11 , G01C21/20 , H04M11/04 , H04W4/02 , H04W4/22 , H04W84/16
CPC分类号： A61B5/002 , A61B5/0022 , A61B5/04 , A61B5/1112 , A61B5/1117 , A61B5/411 , A61B5/7465 , A61B2560/0242 , G01C21/20 , G06F19/00 , H04L67/12 , H04L67/18 , H04L67/306 , H04M3/5116 , H04M2250/12 , H04W4/02 , H04W4/90 , H04W76/50 , H04W84/16
摘要： A handset uses one or more systems, such as GPS, a carrier-based network or a wireless local area network, to ascertain its location. The handset can include sensors, such as temperature or heart rate sensors. In response to detecting an attempt to place an emergency call or send a message, or in response to automatically detecting an emergency, the handset provides a server with the identity and location of the handset and information about the emergency. The server provides the handset with information to correct errors in the location information or the server corrects the location errors. Communications between the server and handset are carried over the carrier-based network, WLAN and/or another wireless channel. The server displays information about the handset, a user and the sensors, so a dispatcher can dispatch assistance and/or provide information about the emergency to another agency.
摘要翻译：手机使用一个或多个系统，例如GPS，基于运营商的网络或无线局域网，以确定其位置。手机可以包括诸如温度或心率传感器的传感器。响应于检测到发出紧急呼叫或发送消息的尝试，或者响应于自动检测到紧急情况，手持机向服务器提供手机的身份和位置以及关于紧急情况的信息。服务器为手机提供信息以纠正位置信息中的错误或服务器纠正位置错误。服务器和手机之间的通信通过基于运营商的网络，WLAN和/或另一无线信道承载。服务器显示有关手机，用户和传感器的信息，因此调度员可以向其他机构发送援助和/或提供有关紧急情况的信息。

2. 发明申请

US20050075116A1 Wireless virtual campus escort system 有权
标题翻译：无线虚拟校园护送系统
公开(公告)号：US20050075116A1
公开(公告)日：2005-04-07
申请号：US10956495
申请日：2004-10-01
申请人： Mark Laird , Michael Glier
发明人： Mark Laird , Michael Glier
IPC分类号： A61B5/00 , A61B5/04 , A61B5/11 , G01C21/20 , H04M11/04 , H04W4/02 , H04W4/22 , H04W84/16 , H04Q7/20
CPC分类号： A61B5/002 , A61B5/0022 , A61B5/04 , A61B5/1112 , A61B5/1117 , A61B5/411 , A61B5/7465 , A61B2560/0242 , G01C21/20 , G06F19/00 , H04L67/12 , H04L67/18 , H04L67/306 , H04M3/5116 , H04M2250/12 , H04W4/02 , H04W4/90 , H04W76/50 , H04W84/16
摘要： A user selects a route between a starting point and a destination. A mobile handset monitors the user's progress along the route by monitoring the location and movement of the handset and, optionally, sensor data, and by comparing this information to rules that define permitted or prohibited locations or movements or threshold sensor values. The handset uses one or more positioning systems, such as GPS, to ascertain its location. A server provides the handset with information to correct errors in the location information. If a rule fires, possibly indicating that the user is in danger, the handset attempts to ascertain the user's wellbeing, warns the user to return to the prescribed route and begins sending the handset's location to a server, which displays the information to a dispatcher who dispatches safety or security personnel to the user's location. The handset and servers communicate via any available wireless channel(s).
摘要翻译：用户选择起点和目的地之间的路由。移动手持机通过监视手机的位置和移动以及可选地传感器数据，并将该信息与限定允许或禁止的位置或移动或阈值传感器值的规则进行比较来监视用户沿着路线的进展。手机使用一个或多个定位系统（如GPS）来确定其位置。服务器为手机提供信息以纠正位置信息中的错误。如果规则触发，可能指示用户处于危险中，手机会尝试确定用户的健康状况，警告用户返回到规定的路线，并开始将手机的位置发送到服务器，服务器将信息显示给调度员将安全或保安人员派到用户的位置。手机和服务器通过任何可用的无线信道进行通信。

3. 发明申请

US20100005436A1 METHOD AND APPARATUS FOR CHARACTERIZING AN INTEGRATED CIRCUIT MANUFACTURING PROCESS 有权
标题翻译：用于表征集成电路制造工艺的方法和装置
公开(公告)号：US20100005436A1
公开(公告)日：2010-01-07
申请号：US12166781
申请日：2008-07-02
申请人： Mark Laird , Wayne Clark , Yiping Szu
发明人： Mark Laird , Wayne Clark , Yiping Szu
IPC分类号： G06F17/50
CPC分类号： H01L22/12 , H01L22/20
摘要： A system that characterizes an integrated circuit manufacturing process is presented. During operation, the system receives a layout which includes a plurality of test structures for semiconductor devices, wherein each test structure varies one or more design variables. The system then fabricates a plurality of wafers based on the layout, wherein each wafer in the plurality of wafers is fabricated using one of a plurality of process settings. Next, the system obtains performance characteristics for the plurality of test structures on the plurality of wafers. The system then generates a process model that is based on at least the effect that values for the one or more design variables and the plurality of process settings have on the performance characteristics of the plurality of test structures.
摘要翻译：介绍了一个表征集成电路制造过程的系统。在操作期间，系统接收包括用于半导体器件的多个测试结构的布局，其中每个测试结构改变一个或多个设计变量。然后，系统基于布局制造多个晶片，其中使用多个工艺设置中的一个来制造多个晶片中的每个晶片。接下来，系统获得多个晶片上的多个测试结构的性能特征。该系统然后基于至少基于一个或多个设计变量和多个处理设置的值对多个测试结构的性能特征的影响来生成过程模型。

4. 发明授权

US5701398A Adaptive classifier having multiple subnetworks 失效
标题翻译：具有多个子网络的自适应分类器
公开(公告)号：US5701398A
公开(公告)日：1997-12-23
申请号：US684683
申请日：1996-07-19
申请人： Michael T. Glier , John Cole , Mark Laird
发明人： Michael T. Glier , John Cole , Mark Laird
IPC分类号： G06N3/04 , G06N3/063 , G06F15/18
CPC分类号： G06K9/6273 , G06K9/6274 , G06N3/0454 , G06N3/063
摘要： A neural network including a plurality of sub-nets stored in a memory array and a method of operation. Each of the sub-nets includes a corresponding plurality of weights and is individually operable to classify an input vector. A computation unit, including a distance calculation unit and a math unit, is responsive to an input vector comprising input training features for determining a distance between the weights of each sub-net to each of the input features of the input vector and for determining whether the distance is within a particular region of influence. Also described is a parallel process for training the sub-nets.
摘要翻译：包括存储在存储器阵列中的多个子网的神经网络和操作方法。每个子网包括相应的多个权重，并且可单独地操作以对输入向量进行分类。包括距离计算单元和数学单元的计算单元响应于包括输入训练特征的输入向量，用于确定每个子网的权重与输入向量的每个输入特征之间的距离，并且用于确定是否距离在特定的影响范围内。还描述了用于训练子网的并行过程。

5. 发明授权

US08091063B2 Method and apparatus for characterizing an integrated circuit manufacturing process 有权
标题翻译：用于表征集成电路制造过程的方法和装置
公开(公告)号：US08091063B2
公开(公告)日：2012-01-03
申请号：US12166781
申请日：2008-07-02
申请人： Mark Laird , Wayne Clark , Yiping Szu
发明人： Mark Laird , Wayne Clark , Yiping Szu
IPC分类号： G06F17/50
CPC分类号： H01L22/12 , H01L22/20
摘要： A system that characterizes an integrated circuit manufacturing process is presented. During operation, the system receives a layout which includes a plurality of test structures for semiconductor devices, wherein each test structure varies one or more design variables. The system then fabricates a plurality of wafers based on the layout, wherein each wafer in the plurality of wafers is fabricated using one of a plurality of process settings. Next, the system obtains performance characteristics for the plurality of test structures on the plurality of wafers. The system then generates a process model that is based on at least the effect that values for the one or more design variables and the plurality of process settings have on the performance characteristics of the plurality of test structures.
摘要翻译：介绍了一个表征集成电路制造过程的系统。在操作期间，系统接收包括用于半导体器件的多个测试结构的布局，其中每个测试结构改变一个或多个设计变量。然后，系统基于布局制造多个晶片，其中使用多个工艺设置中的一个来制造多个晶片中的每个晶片。接下来，系统获得多个晶片上的多个测试结构的性能特征。该系统然后基于至少基于一个或多个设计变量和多个处理设置的值对多个测试结构的性能特征的影响来生成过程模型。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式