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1. 发明授权

US4906833A Electron beam information exchange apparatus with converting light signals 失效
标题翻译：具有转换光信号的电子束信息交换装置
公开(公告)号：US4906833A
公开(公告)日：1990-03-06
申请号：US240467
申请日：1988-09-06
申请人： Mamoru Miyawaki , Yukio Masuda , Ryuichi Arai , Nobutoshi Mizusawa , Takahiko Ishiwatari , Masahiko Okunuki
发明人： Mamoru Miyawaki , Yukio Masuda , Ryuichi Arai , Nobutoshi Mizusawa , Takahiko Ishiwatari , Masahiko Okunuki
IPC分类号： H01J31/06 , H04Q3/52
CPC分类号： H01J31/06
摘要： An electron-beam information exchange apparatus adapted to effect information exchange in incoming light signals and outgoing light signals by utilizing electron beams. The apparatus has a plurality of electron beam generating means for generating electron beams according to the incoming light signals; a plurality of electron beam deflecting means for independently deflecting individual electron beams emitted from the electron beam generating means; and a plurality of electron beam detecting means for reproducing information from the thus-deflected electron beams to generate the outgoing light beams. The electron beam detecting means controls the electron beams so that each of the electron beams is made incident upon a desired one of said electron beam detecting means. Also, the electron beam generating means are semiconductor devices for generating electron beams.
摘要翻译：一种电子束信息交换装置，其适用于通过利用电子束来影响入射光信号和出射光信号中的信息交换。该装置具有多个电子束发生装置，用于根据入射光信号产生电子束; 多个电子束偏转装置，用于独立地偏转从电子束发生装置发射的各个电子束; 以及多个电子束检测装置，用于从如此偏转的电子束再现信息以产生出射光束。电子束检测装置控制电子束，使得每个电子束入射到所需的所述电子束检测装置中。而且，电子束产生装置是用于产生电子束的半导体装置。

2. 发明授权

US4906894A Photoelectron beam converting device and method of driving the same 失效
标题翻译：光电子束转换装置及其驱动方法
公开(公告)号：US4906894A
公开(公告)日：1990-03-06
申请号：US331007
申请日：1989-03-28
申请人： Mamoru Miyawaki , Yukio Masuda , Ryuichi Arai , Nobutoshi Mizusawa , Takahiko Ishiwatari , Hitoshi Oda
发明人： Mamoru Miyawaki , Yukio Masuda , Ryuichi Arai , Nobutoshi Mizusawa , Takahiko Ishiwatari , Hitoshi Oda
IPC分类号： H01J1/34
CPC分类号： H01J1/34 , H01J2201/3423
摘要： A photoelectron beam converting device including a semiconductor substrate having a p-n junction formed between an n-type region and a p-type region and an opening portion formed on the side of the semiconductor substrate. An electron beam is generated by a light which enters from the opening portion and by a reverse voltage to be applied to the p-n junction.
摘要翻译：一种光电子束转换装置，包括在n型区域和p型区域之间形成有p-n结的半导体衬底和形成在半导体衬底的侧面上的开口部分。电子束由从开口部分进入的光和由p-n结施加的反向电压产生。

3. 发明授权

US5270990A Tracking error signal detecting apparatus using an electron beam and apparatus for effecting recording/reproduction of information by the utilization of a plurality of electron beams 失效
标题翻译：使用电子束的跟踪误差信号检测装置和利用多个电子束进行信息记录/再生的装置
公开(公告)号：US5270990A
公开(公告)日：1993-12-14
申请号：US972732
申请日：1992-11-06
申请人： Nobutoshi Mizasawa , Takahiko Ishiwatari , Ryuichi Arai , Mamoru Miyawaki , Yukio Masuda , Hitoshi Oda
发明人： Nobutoshi Mizasawa , Takahiko Ishiwatari , Ryuichi Arai , Mamoru Miyawaki , Yukio Masuda , Hitoshi Oda
IPC分类号： G11B9/10
CPC分类号： G11B9/10
摘要： A tracking error signal detecting apparatus includes a device for supplying an electron beam, a device for applying the electron beam to a tracking pattern formed on a recording medium, and a device for forming a tracking error signal on the basis of a signal produced from the tracking pattern upon application of the electron beam. An information recording-reproducing apparatus includes an applying device having a plurality of electron ray sources, a device for controlling the driving of the plurality of electron ray sources in response to a signal, a device for directing the electron rays from the electron ray sources to a recording medium, and a device for reproducing information from signals produced upon application of the electron rays to the recording medium.
摘要翻译：跟踪误差信号检测装置包括用于提供电子束的装置，用于将电子束施加到形成在记录介质上的跟踪图案的装置，以及用于根据从所述记录介质产生的信号形成跟踪误差信号的装置应用电子束时的跟踪图案。信息记录再现装置包括具有多个电子射线源的施加装置，用于响应于信号控制多个电子射线源的驱动的装置，用于将来自电子射线源的电子射线引导到记录介质，以及用于从施加电子射线到记录介质上产生的信号再现信息的装置。

4. 发明授权

US4974736A Multi-electron-beam pattern drawing apparatus 失效
公开(公告)号：US4974736A
公开(公告)日：1990-12-04
申请号：US469730
申请日：1990-01-24
申请人： Masahiko Okunuki , Mitsuaki Seki , Isamu Shimoda , Mamoru Miyawaki , Takeo Tsukamoto , Akira Suzuki , Tetsuya Kaneko , Toshihiko Takeda
发明人： Masahiko Okunuki , Mitsuaki Seki , Isamu Shimoda , Mamoru Miyawaki , Takeo Tsukamoto , Akira Suzuki , Tetsuya Kaneko , Toshihiko Takeda
IPC分类号： H01J37/073 , H01J37/317
CPC分类号： B82Y10/00 , B82Y40/00 , H01J37/073 , H01J37/3177
摘要： A multi-electron-beam pattern drawing apparatus having a plurality of electron beam sources and a plurality of electron beam sensors, provided on a common base member, is disclosed. The electron beam sources can be selectively driven for different uses, such as a pattern drawing (exposure) purpose and position detecting purpose, for example. In another aspect, the apparatus is provided with a function for correcting the pattern drawing magnification.

5. 发明授权

US4897552A Multi-electron-beam pattern drawing apparatus 失效
标题翻译：多电子束图形绘制装置
公开(公告)号：US4897552A
公开(公告)日：1990-01-30
申请号：US186967
申请日：1988-04-27
申请人： Masahiko Okunuki , Isamu Shimoda , Mamoru Miyawaki , Takeo Tsukamoto , Akira Suzuki , Tetsuya Kaneko , Toshihiko Takeda , Mitsuaki Seki
发明人： Masahiko Okunuki , Isamu Shimoda , Mamoru Miyawaki , Takeo Tsukamoto , Akira Suzuki , Tetsuya Kaneko , Toshihiko Takeda , Mitsuaki Seki
IPC分类号： H01J37/30 , H01J37/317
CPC分类号： B82Y10/00 , B82Y40/00 , H01J37/3007 , H01J37/3177
摘要： A charged-particle beam pattern drawing apparatus for drawing, by use of a charged-particle beam, a desired circuit pattern on a workpiece having a surface coated with a sensitive material, is disclosed. The apparatus includes a data source having data stored therein related to the circuit pattern, a plurality of charged-particle beam producing sources for emitting charged-particle beams toward the workpiece, in accordance with the data supplied thereto from the data source, and a plurality of deflecting electrodes each being provided for a corresponding one of the charged-particle beam producing source, for deflecting the charged-particle beams from the charged-particle beam producing sources independently of each other and in accordance with the data supplied from the data source.

6. 发明授权

US4904895A Electron emission device 失效
标题翻译：电子发射装置
公开(公告)号：US4904895A
公开(公告)日：1990-02-27
申请号：US189216
申请日：1988-05-02
申请人： Takeo Tsukamoto , Mamoru Miyawaki , Tetsuya Kaneko , Akira Suzuki , Isamu Shimoda , Toshihiko Takeda , Masahiko Okunuki
发明人： Takeo Tsukamoto , Mamoru Miyawaki , Tetsuya Kaneko , Akira Suzuki , Isamu Shimoda , Toshihiko Takeda , Masahiko Okunuki
IPC分类号： H01J1/304 , H01J3/02
CPC分类号： B82Y10/00 , H01J1/3042 , H01J3/022
摘要： An electron emission device comprises an electron emission electrode with a pointed end and a counter electrode positioned opposite to the pointed end, both formed by fine working of a conductive layer laminated on an insulating substrate.

7. 发明授权

US06515640B2 Electron emission device with gap between electron emission electrode and substrate 失效
标题翻译：具有电子发射电极和衬底之间间隙的电子发射器件
公开(公告)号：US06515640B2
公开(公告)日：2003-02-04
申请号：US09060354
申请日：1998-04-15
申请人： Takeo Tsukamoto , Mamoru Miyawaki , Tetsuya Kaneko , Akira Suzuki , Isamu Shimoda , Toshihiko Takeda , Masahiko Okunuki
发明人： Takeo Tsukamoto , Mamoru Miyawaki , Tetsuya Kaneko , Akira Suzuki , Isamu Shimoda , Toshihiko Takeda , Masahiko Okunuki
IPC分类号： G09G320
CPC分类号： B82Y10/00 , H01J1/3042 , H01J3/022
摘要： An electron emission device comprises an electron emission electrode with a pointed end and a counter electrode positioned opposite to the pointed end, both formed by fine working of a conductive layer laminated on an insulating substrate.
摘要翻译：电子发射装置包括具有尖端的电子发射电极和与尖端相对定位的对电极，两者都是通过层压在绝缘衬底上的导电层的精细加工形成的。

8. 发明授权

US5786658A Electron emission device with gap between electron emission electrode and substrate 失效
公开(公告)号：US5786658A
公开(公告)日：1998-07-28
申请号：US199967
申请日：1994-02-22
申请人： Takeo Tsukamoto , Mamoru Miyawaki , Tetsuya Kaneko , Akira Suzuki , Isamu Shimoda , Toshihiko Takeda , Masahiko Okunuki
发明人： Takeo Tsukamoto , Mamoru Miyawaki , Tetsuya Kaneko , Akira Suzuki , Isamu Shimoda , Toshihiko Takeda , Masahiko Okunuki
IPC分类号： H01J1/304 , H01J3/02 , H01J1/02
CPC分类号： B82Y10/00 , H01J1/3042 , H01J3/022
摘要： An electron emission device comprises an electron emission electrode with a pointed end and a counter electrode positioned opposite to the pointed end, both formed by fine working of a conductive layer laminated on an insulating substrate.

9. 发明授权

US4894611A System for measuring characteristics of electron emitting sources 失效
标题翻译：用于测量电子发射源特性的系统
公开(公告)号：US4894611A
公开(公告)日：1990-01-16
申请号：US186963
申请日：1988-04-27
申请人： Isamu Shimoda , Mamoru Miyawaki , Akira Suzuki , Tetsuya Kaneko , Takeo Tsukamoto , Toshihiko Takeda , Masahiko Okunuki
发明人： Isamu Shimoda , Mamoru Miyawaki , Akira Suzuki , Tetsuya Kaneko , Takeo Tsukamoto , Toshihiko Takeda , Masahiko Okunuki
IPC分类号： G01R31/26 , G01R31/24 , H01J9/42 , H01J37/06
CPC分类号： G01R31/24
摘要： A measuring system particularly suitably usable with an apparatus having a plurality of electron emitting sources, for measuring the characteristics of the electron emitting sources is disclosed. In the measuring system, the electron emitting sources are driven so that they emit electron flows of predetermined and different frequencies. The emitted electron flows are collected and, thereafter, only those signals having components corresponding to the predetermined frequencies are extracted. Based on the extracted signals, the characteristics of the electron emitting sources are measured at the same time and independently of each other.
摘要翻译：公开了一种特别适用于具有多个电子发射源的装置的测量系统，用于测量电子发射源的特性。在测量系统中，电子发射源被驱动，使得它们发射预定和不同频率的电子流。收集发射的电子流，然后仅提取具有与预定频率对应的分量的那些信号。基于所提取的信号，电子发射源的特性同时并且彼此独立地被测量。

10. 发明授权

US09036080B2 Apparatus and method for acquiring information about light-field data 有权
标题翻译：用于获取关于光场数据的信息的装置和方法
公开(公告)号：US09036080B2
公开(公告)日：2015-05-19
申请号：US13603294
申请日：2012-09-04
申请人： Mamoru Miyawaki
发明人： Mamoru Miyawaki
IPC分类号： H04N5/225 , H04N5/232 , H04N5/33 , G03B13/20 , G03B35/10
CPC分类号： H04N5/2254 , G03B13/20 , G03B35/10 , H04N5/23232 , H04N5/33
摘要： An apparatus to acquire information about light-field data includes: a beam splitter configured to split light, through a lens unit which is connected to the apparatus, from an object into a first light beam and a second light beam; an image sensor configured to detect the first light beam to form an image of the object; and a light-field sensor, including a lenslet array and a detecting unit to detect the second light beam through the lenslet array, configured to acquire information about the light-field data, the lenslet array including a plurality of lenslets, wherein a first position where the detecting unit is provided is conjugate to a second position of a pupil of the lens unit.
摘要翻译：获取关于光场数据的信息的装置包括：分束器，被配置为通过连接到装置的透镜单元将光从对象分离成第一光束和第二光束; 被配置为检测所述第一光束以形成所述物体的图像的图像传感器; 以及包括小透镜阵列和检测单元的光场传感器，用于检测穿过小透镜阵列的第二光束，被配置为获取关于光场数据的信息，小透镜阵列包括多个小透镜，其中第一位置其中设置检测单元与透镜单元的光瞳的第二位置共轭。

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