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1. 发明申请

US20130127298A1 PIEZOELECTRIC MATERIAL AND DEVICES USING THE SAME 有权
标题翻译：压电材料和使用其的装置
公开(公告)号：US20130127298A1
公开(公告)日：2013-05-23
申请号：US13580061
申请日：2011-02-28
申请人： Makoto Kubota , Kaoru Miura , Hisato Yabuta , Takayuki Watanabe , Jumpei Hayashi , Hiroshi Funakubo , Tomoaki Yamada , Shintaro Yasui , Keisuke Yazawa , Hiroshi Uchida , Jun-ichi Nagata
发明人： Makoto Kubota , Kaoru Miura , Hisato Yabuta , Takayuki Watanabe , Jumpei Hayashi , Hiroshi Funakubo , Tomoaki Yamada , Shintaro Yasui , Keisuke Yazawa , Hiroshi Uchida , Jun-ichi Nagata
IPC分类号： H01L41/18
CPC分类号： H01L41/18 , C04B35/01 , C04B35/016 , C04B35/2625 , C04B35/44 , C04B35/453 , C04B35/475 , C04B35/6325 , C04B2235/3206 , C04B2235/3217 , C04B2235/3224 , C04B2235/3225 , C04B2235/3227 , C04B2235/3232 , C04B2235/3267 , C04B2235/3272 , C04B2235/3284 , C04B2235/3286 , C04B2235/3298 , C04B2235/449 , C04B2235/76 , C04B2235/765 , C04B2235/768 , C04B2235/787 , H01L41/0805 , H01L41/0973 , H01L41/1878 , H01L41/316 , H01L41/318 , H02N2/106 , H02N2/163
摘要： Provided is a Bi-based piezoelectric material having good piezoelectric properties. The piezoelectric material includes a perovskite-type metal oxide represented by the following general formula (1): Ax(ZnjTi(1-j))l(MgkTi(1-k))mMnO3 General formula (1) where: A represents a Bi element, or one or more kinds of elements selected from the group consisting of trivalent metal elements and containing at least a Bi element; M represents at least one kind of an element selected from the group consisting of Fe, Al, Sc, Mn, Y, Ga, and Yb; and 0.9≦x≦1.25, 0.4≦j≦0.6, 0.4≦k≦0.6, 0.09≦l≦0.49, 0.19≦m≦0.64, 0.13≦n≦0.48, and l+m+n=1 are satisfied.
摘要翻译：提供具有良好的压电性能的Bi基压电材料。压电材料包括由以下通式（1）表示的钙钛矿型金属氧化物：Ax（ZnjTi（1-j））l（MgkTi（1-k））mMnO3通式（1）其中：A表示Bi元素，或选自三价金属元素并且至少含有Bi元素的一种或多种元素; M表示选自Fe，Al，Sc，Mn，Y，Ga和Yb中的至少一种元素; 和0.9 @ x @ 1.25，0.4 @ j @ 0.6，0.4 @ k @ 0.6，0.09 @ l @ 0.49，0.19 @ m @ 0.64，0.13 @ n @ 0.48和l + m + n = 1。

2. 发明授权

US09082975B2 Piezoelectric material and devices using the same 有权
标题翻译：压电材料和使用相同的器件
公开(公告)号：US09082975B2
公开(公告)日：2015-07-14
申请号：US13580061
申请日：2011-02-28
申请人： Makoto Kubota , Kaoru Miura , Hisato Yabuta , Takayuki Watanabe , Jumpei Hayashi , Hiroshi Funakubo , Tomoaki Yamada , Shintaro Yasui , Keisuke Yazawa , Hiroshi Uchida , Jun-ichi Nagata
发明人： Makoto Kubota , Kaoru Miura , Hisato Yabuta , Takayuki Watanabe , Jumpei Hayashi , Hiroshi Funakubo , Tomoaki Yamada , Shintaro Yasui , Keisuke Yazawa , Hiroshi Uchida , Jun-ichi Nagata
IPC分类号： H01L41/187 , H01L41/18 , C04B35/01 , C04B35/26 , C04B35/44 , C04B35/453 , C04B35/475 , C04B35/632 , H01L41/08 , H01L41/09 , H02N2/10 , H02N2/16 , H01L41/316 , H01L41/318
CPC分类号： H01L41/18 , C04B35/01 , C04B35/016 , C04B35/2625 , C04B35/44 , C04B35/453 , C04B35/475 , C04B35/6325 , C04B2235/3206 , C04B2235/3217 , C04B2235/3224 , C04B2235/3225 , C04B2235/3227 , C04B2235/3232 , C04B2235/3267 , C04B2235/3272 , C04B2235/3284 , C04B2235/3286 , C04B2235/3298 , C04B2235/449 , C04B2235/76 , C04B2235/765 , C04B2235/768 , C04B2235/787 , H01L41/0805 , H01L41/0973 , H01L41/1878 , H01L41/316 , H01L41/318 , H02N2/106 , H02N2/163
摘要： Provided is a Bi-based piezoelectric material having good piezoelectric properties. The piezoelectric material includes a perovskite-type metal oxide represented by the following general formula (1): Ax(ZnjTi(1-j))l(MgkTi(1-k))mMnO3 General formula (1) where: A represents a Bi element, or one or more kinds of elements selected from the group consisting of trivalent metal elements and containing at least a Bi element; M represents at least one kind of an element selected from the group consisting of Fe, Al, Sc, Mn, Y, Ga, and Yb; and 0.9≦x≦1.25, 0.4≦j≦0.6, 0.4≦k≦0.6, 0.09≦l≦0.49, 0.19≦m≦0.64, 0.13≦n≦0.48, and l+m+n=1 are satisfied.
摘要翻译：提供具有良好的压电性能的Bi基压电材料。压电材料包括由以下通式（1）表示的钙钛矿型金属氧化物：Ax（ZnjTi（1-j））l（MgkTi（1-k））mMnO3通式（1）其中：A表示Bi 元素或选自三价金属元素并且至少含有Bi元素的一种或多种元素; M表示选自Fe，Al，Sc，Mn，Y，Ga和Yb中的至少一种元素; 其中n为1，n为1，n为1，n为1，n为1，n为1，n为1，n为1， 1满足

3. 发明申请

US20100008543A1 SHAPE MEASURING DEVICE AND SHAPE MEASURING METHOD 有权
标题翻译：形状测量装置和形状测量方法
公开(公告)号：US20100008543A1
公开(公告)日：2010-01-14
申请号：US12565179
申请日：2009-09-23
申请人： Tomoaki Yamada
发明人： Tomoaki Yamada
IPC分类号： G06K9/00 , G01B11/24
CPC分类号： G01B11/2518 , G06T7/521
摘要： A shape measuring device includes: a slit pattern projection unit (1) for projecting a slit light onto a test object (20); an imaging lens (3) and a plane parallel plate (4) for forming a plurality of slit images, which is generated when the slit light is reflected by the object (20), separated in a direction perpendicular to a slit base line direction; an imaging unit (5) for picking up the plurality of slit images and generating a plurality of slit picture images; an XYZ stage drive unit (12) for relatively moving the slit light and the test object (20) in a direction different from the slit base line direction of the slit light; a slit picture image selection unit (8) for comparing the brightness of each pixel of slit picture image on the slit base line direction, and selecting a slit picture image having an optimum brightness to determine the shape of the test object (20) on the slit base line direction, and acquiring image data to determine the shape of the test object (20); and a shape computing unit (9) for computing a shape of the test object (20) using a relative position of the slit light with respect to the test object (20) and the slit picture image data.
摘要翻译：一种形状测量装置，包括：用于将狭缝光投射到测试对象（20）上的狭缝图案投影单元（1）; 用于形成当狭缝光被物体（20）反射时产生的多个狭缝图像的成像透镜（3）和平面平行板（4）在垂直于狭缝基线方向的方向上分离; 用于拾取多个狭缝图像并产生多个狭缝图像的成像单元（5）; XYZ平台驱动单元，用于沿着与狭缝光的狭缝基线方向不同的方向相对地移动狭缝光和测试对象（20）; 狭缝图像图像选择单元，用于比较狭缝基线方向上的狭缝图像的每个像素的亮度，并选择具有最佳亮度的狭缝图像，以确定测试对象（20）的形状并且获取图像数据以确定被检体（20）的形状; 以及形状计算单元（9），用于使用狭缝光相对于被检体（20）的相对位置和狭缝图像图像数据来计算被检体（20）的形状。

4. 发明申请

US20080203799A1 Seat Reclining apparatus for vehicle 审中-公开
标题翻译：座椅倾斜装置
公开(公告)号：US20080203799A1
公开(公告)日：2008-08-28
申请号：US12068160
申请日：2008-02-04
申请人： Tomoaki Yamada
发明人： Tomoaki Yamada
IPC分类号： B60N2/235
CPC分类号： B60N2/2362 , B60N2205/50
摘要： A seat reclining apparatus includes: a disk-shaped base-side case; a disk-shaped arm-side case; a center shaft rotatably disposed in center part of the base-side case and center part of the arm-side case; a cam member fitted on the center shaft to rotate integrally with the center shaft; a lock tooth unit which cooperates with the cam member and engaged with a inner circumferential tooth portion formed on an inner periphery portion of the arm-side case; a lock spring; a protrusion protruding from an outer surface of the base-side case; and a recess at a position corresponding to the protrusion on an inner surface of the base-side case, wherein the lock spring is arranged in a space formed by the recess and a component accommodation space formed between the base-side case and arm-side case.
摘要翻译：座椅倾斜装置包括：盘形基座壳体; 盘形臂侧壳体; 中心轴可旋转地设置在基座侧壳体的中心部分和臂侧壳体的中心部分; 安装在所述中心轴上以与所述中心轴一体旋转的凸轮构件; 锁定齿单元，其与所述凸轮构件配合并与形成在所述臂侧壳体的内周部上的内周齿部配合; 锁弹簧; 从所述基座壳体的外表面突出的突起; 以及在与所述基座侧壳体的内表面上的所述突起对应的位置处的凹部，其中，所述锁定弹簧布置在由所述凹部形成的空间中，以及形成在所述基座侧壳体和所述臂侧之间的部件容纳空间案件。

5. 发明授权

US07197176B2 Mark position detecting apparatus and mark position detecting method 有权
标题翻译：标记位置检测装置和标记位置检测方法
公开(公告)号：US07197176B2
公开(公告)日：2007-03-27
申请号：US10461443
申请日：2003-06-16
申请人： Tatsuo Fukui , Tomoaki Yamada , Hirofumi Arima
发明人： Tatsuo Fukui , Tomoaki Yamada , Hirofumi Arima
IPC分类号： G06K9/00
CPC分类号： G06T7/0004 , G06T7/73 , G06T2207/30148
摘要： A mark position detection apparatus includes: an illumination unit that illuminates a substrate having a mark formed thereupon; an image-capturing unit that captures an image of the substrate by using reflected light from the substrate and outputs image signals; a storage unit at which information related to fixed pattern noise contained in the image signals output by the image-capturing unit is stored in memory; and a control unit that calculates a position of the mark on the substrate based upon the information related to the fixed pattern noise stored in memory at the storage unit and the image signals output from the image-capturing unit.
摘要翻译：标记位置检测装置包括：照射具有在其上形成的标记的基板的照明单元; 图像捕获单元，其通过使用来自所述基板的反射光捕获所述基板的图像并输出图像信号; 存储单元，在该存储单元中存储与图像捕获单元输出的图像信号中包含的固定图案噪声有关的信息; 以及控制单元，其基于与存储在存储单元中的存储器中的固定模式噪声有关的信息和从图像捕获单元输出的图像信号来计算基板上的标记的位置。

6. 外观设计

USD738465S1 Electromagnetic valve 有权
公开(公告)号：USD738465S1
公开(公告)日：2015-09-08
申请号：US29495950
申请日：2014-07-08
申请人： Masami Yoshida , Tomoaki Yamada , Hikaru Tsuyuki
设计人： Masami Yoshida , Tomoaki Yamada , Hikaru Tsuyuki

7. 外观设计

USD738463S1 Electromagnetic valve 有权
公开(公告)号：USD738463S1
公开(公告)日：2015-09-08
申请号：US29495948
申请日：2014-07-08
申请人： Masami Yoshida , Tomoaki Yamada , Hikaru Tsuyuki
设计人： Masami Yoshida , Tomoaki Yamada , Hikaru Tsuyuki

8. 发明授权

US08244023B2 Shape measuring device and shape measuring method 有权
标题翻译：形状测量装置和形状测量方法
公开(公告)号：US08244023B2
公开(公告)日：2012-08-14
申请号：US12565179
申请日：2009-09-23
申请人： Tomoaki Yamada
发明人： Tomoaki Yamada
IPC分类号： G06K9/00
CPC分类号： G01B11/2518 , G06T7/521
摘要： A shape measuring device includes: a slit pattern projection unit (1) for projecting a slit light onto a test object (20); an imaging lens (3) and a plane parallel plate (4) for forming a plurality of slit images, which is generated when the slit light is reflected by the object (20), separated in a direction perpendicular to a slit base line direction; an imaging unit (5) for picking up the plurality of slit images and generating a plurality of slit picture images; an XYZ stage drive unit (12) for relatively moving the slit light and the test object (20) in a direction different from the slit base line direction of the slit light; a slit picture image selection unit (8) for comparing the brightness of each pixel of slit picture image on the slit base line direction, and selecting a slit picture image having an optimum brightness to determine the shape of the test object (20) on the slit base line direction, and acquiring image data to determine the shape of the test object (20); and a shape computing unit (9) for computing a shape of the test object (20) using a relative position of the slit light with respect to the test object (20) and the slit picture image data.
摘要翻译：一种形状测量装置，包括：用于将狭缝光投射到测试对象（20）上的狭缝图案投影单元（1）; 用于形成当狭缝光被物体（20）反射时产生的多个狭缝图像的成像透镜（3）和平面平行板（4）在垂直于狭缝基线方向的方向上分离; 用于拾取多个狭缝图像并产生多个狭缝图像的成像单元（5）; XYZ平台驱动单元，用于沿着与狭缝光的狭缝基线方向不同的方向相对地移动狭缝光和测试对象（20）; 狭缝图像图像选择单元，用于比较狭缝基线方向上的狭缝图像的每个像素的亮度，并选择具有最佳亮度的狭缝图像，以确定测试对象（20）的形状并且获取图像数据以确定被检体（20）的形状; 以及形状计算单元（9），用于使用狭缝光相对于被检体（20）的相对位置和狭缝图像图像数据来计算被检体（20）的形状。

9. 发明授权

US10074043B2 Image forming apparatus capable of changing operating state 有权
公开(公告)号：US10074043B2
公开(公告)日：2018-09-11
申请号：US13681912
申请日：2012-11-20
申请人： Tomoaki Yamada
发明人： Tomoaki Yamada
IPC分类号： G06K15/02 , G03G15/00 , G06K15/00 , H04N1/00 , G06F1/32
CPC分类号： G06K15/02 , G03G15/5004 , G06F1/3231 , G06F1/3284 , G06K15/005 , G06K15/406 , H04N1/00323 , H04N1/00496 , H04N1/00896 , H04N1/00912 , H04N2201/0094 , Y02D10/159 , Y02D10/173
摘要： An image forming apparatus can change an operating state between a normal mode and a power saving mode having power consumption lower than that of the normal mode. The image forming apparatus sets a detection range based on at least one of an angle of a manipulation panel, existence or non-existence of an output to the sheet discharge unit, and existence or non-existence of placement of the authentication device. The image forming apparatus detects an approach of a human body when the operating state is in the power saving mode. When a sensor detects that the human body approaches the detection range, the image forming apparatus returns the operating state from the power saving mode to the normal mode.

10. 发明授权

US08314849B2 Shape measuring device 失效
标题翻译：形状测量装置
公开(公告)号：US08314849B2
公开(公告)日：2012-11-20
申请号：US12879712
申请日：2010-09-10
申请人： Tomoaki Yamada
发明人： Tomoaki Yamada
IPC分类号： H04N5/228
CPC分类号： G01B11/25 , G01B11/2527 , G06T7/521
摘要： The present invention relates to a shape measuring device that can improve measurement accuracy. A liquid crystal element 35 projects striped projection patterns whose intensities are changed according to the position in three sinusoidal states with initial phases of 0, 120, and 240 degrees onto an object 2 to be measured, each of a CCD sensor 44 and a CCD sensor 50 picks up an image obtained by forming reflection light from the object 2 to be measured by the projected projection pattern, and a controller 23 evaluates reliability of a measurement result at a position where a position conjugated with an image pickup surface of image pickup means is different along an optical path direction on the basis of each received light amount of each pixel of a plurality of images picked up when at least two projection patterns are projected. As a result, measurement accuracy can be improved. The present invention can be applied to a shape measuring device that measures the shape of an object to be measured.
摘要翻译：本发明涉及一种能够提高测量精度的形状测量装置。液晶元件35将根据具有0,120和240度的初始相位的三个正弦状态中的位置的强度发生变化的条纹投影图案投影到被测量物体2上，CCD传感器44和CCD传感器 50拾取通过由投影投影图案形成来自待测对象2的反射光而获得的图像，并且控制器23评估与图像拾取装置的图像拾取表面共轭的位置处的测量结果的可靠性基于在投影至少两个投影图案时拾取的多个图像的每个像素的每个接收光量，沿光路方向不同。结果，可以提高测量精度。本发明可以应用于测量待测物体的形状的形状测量装置。

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