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    • 1. 发明授权
    • Self-refresh test time reduction scheme
    • 自刷新测试时间缩短方案
    • US06246619B1
    • 2001-06-12
    • US09498985
    • 2000-02-07
    • Christopher EmatrudoJeffrey S. EarlMichael C. Stephens, Jr.Luigi Ternullo, Jr.Michael F. Vincent
    • Christopher EmatrudoJeffrey S. EarlMichael C. Stephens, Jr.Luigi Ternullo, Jr.Michael F. Vincent
    • G11C2900
    • G11C29/50G11C29/12
    • A circuit for a DRAM is described which, when in test mode, notifies a tester when the self-refresh operation of a dynamic random access memory (DRAM) reaches various stages of completion. By signaling the tester when, i.e., ⅛, ¼, ½, etc. of the self-refresh cycle is reached, the amount of time needed for verification of the self-refresh oscillator frequency is reduced correspondingly by a factor of 8, 4, 2 etc. The signaling of a partial test time is achieved by adding self-refresh status logic circuits which decode the high order most significant bits of the refresh address counter. The activation of the third most significant bit signals completion of ⅛th of the self-refresh cycle, the activation of the second most significant bit signals completion of ¼th of the self-refresh cycle, the activation of the most significant bit signals completion of ½ of the self-refresh cycle, and deactivation of the most significant bit signals completion of the self-refresh cycle.
    • 描述了用于DRAM的电路,当处于测试模式时,当动态随机存取存储器(DRAM)的自刷新操作达到各种完成阶段时,通知测试者。 当达到自刷新周期的⅛,¼,½等时,通过信号通知测试仪,验证自刷新振荡器频率所需的时间相应减少了8倍,4倍, 2等等。通过添加对刷新地址计数器的高阶最高有效位进行解码的自刷新状态逻辑电路来实现部分测试时间的信令。 第三最高有效位的激活信号完成自刷新周期的第‧秒,第二最高有效位信号的激活完成自刷新周期的第1/4,最高有效位信号的激活完成为1/2的 自刷新周期,以及最高有效位信号的去激活完成自刷新周期。
    • 3. 发明授权
    • Reticle option layer detection method
    • 掩模选项层检测方法
    • US06764867B1
    • 2004-07-20
    • US09764243
    • 2001-01-19
    • Michael C. Stephens, Jr.Christopher EmatrudoJeffrey S. Earl
    • Michael C. Stephens, Jr.Christopher EmatrudoJeffrey S. Earl
    • H01L2100
    • H01L22/20H01L22/34H01L2924/3011
    • A new method of detecting a reticle option layer in an integrated circuit device has been achieved. The method may be applied to detect the presence of the threshold voltage implantation reticle option layer by direct die probing or by probing a pin of a package integrated circuit. The current through a first MOS transistor is measured by forcing a test voltage on the drain and the gate. The gate and the drain of the first MOS transistor are connected together while the source is connected to a reference voltage. The first MOS transistor has the standard threshold implantation but not the threshold voltage reticle option. The current through a second MOS transistor is measured by forcing the same test voltage on the drain and the gate. The gate and said drain of the second MOS transistor are connected together while the source is connected to a reference voltage. The second MOS transistor has the standard threshold voltage implantation and the threshold voltage implantation reticle option layer. The current through the first NMOS transistor and the current through the second MOS transistor are compared to detect the presence of the threshold voltage implantation reticle option layer in the integrated circuit device.
    • 已经实现了在集成电路装置中检测掩模版选择层的新方法。 该方法可以用于通过直接芯片探测或通过探测封装集成电路的引脚来检测阈值电压注入掩模版选择层的存在。 通过在漏极和栅极上施加测试电压来测量通过第一MOS晶体管的电流。 第一MOS晶体管的栅极和漏极连接在一起,同时源极连接到参考电压。 第一个MOS晶体管具有标准阈值植入,但不是阈值电压掩模版选项。 通过第二MOS晶体管的电流通过在漏极和栅极上施加相同的测试电压来测量。 第二MOS晶体管的栅极和漏极连接在一起,同时源极连接到参考电压。 第二MOS晶体管具有标准阈值电压注入和阈值电压注入掩模版选择层。 比较通过第一NMOS晶体管的电流和通过第二MOS晶体管的电流,以检测集成电路器件中阈值电压注入掩模版选项层的存在。
    • 4. 发明授权
    • Timing circuit for a burst-mode address counter
    • 脉冲串地址计数器的定时电路
    • US06195309B1
    • 2001-02-27
    • US09320427
    • 1999-05-26
    • Christopher Ematrudo
    • Christopher Ematrudo
    • G11C800
    • G11C7/1018G11C7/22
    • A burst-mode capable RAM chip includes a timing circuit for clocking a burst counter during a burst transfer. In response to an input indicating the beginning of the burst transfer, the timing circuit generates a first signal that loads the initial address of the burst transfer into the latches of a burst counter. Then, the timing circuit generates a second signal to increment the burst counter to the second address in the burst transfer after the load of the initial address has successfully completed but prior to the second clock cycle. Finally, the timing circuit generates subsequent signals to increment the burst counter through the remaining addresses of the burst transfer. Each of the subsequent signals is generated in response to an input from the system clock.
    • 具有突发模式的RAM芯片包括用于在突发传送期间对突发计数器进行计时的定时电路。 响应于指示突发传输的开始的输入,定时电路产生将突发传输的初始地址加载到突发计数器的锁存器中的第一信号。 然后,在初始地址的加载成功完成之后但在第二时钟周期之前,定时电路产生第二信号,以将突发计数器增加到突发传输中的第二地址。 最后,定时电路产生后续信号,以通过突发传送的剩余地址来增加突发计数器。 响应于来自系统时钟的输入而产生每个后续信号。