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1. 发明授权

US10895584B2 Method of controlling a probe using constant command signals 有权
公开(公告)号：US10895584B2
公开(公告)日：2021-01-19
申请号：US16141413
申请日：2018-09-25
申请人： Louis Pacheco
发明人： Louis Pacheco
IPC分类号： G01Q10/06 , G01Q60/28 , G01Q60/30 , G01Q20/04 , G01Q60/26 , G01Q60/38
摘要： A method for commanding a tip of a probe is disclosed, wherein a command signal, representative of the force applied by said tip on the surface of a sample to be analyzed, includes at least one cycle successively defined by: a first step where the value of said command signal decreases from a maximum value (Smax) to a minimum value (Smin) so as to move said tip away from said surface at a predetermined distance called detachment height; a second step where the value of the command signal is maintained constant at said minimum value so as to maintain the tip at said detachment height; a third step where the value of the command signal increases from the minimum value up to said maximum value so as to bring the tip closer towards the surface to be analyzed until the tip comes into contact with the surface; and a fourth step where the value of the command signal is maintained constant at said maximum value to maintain the tip in contact with the surface to be analyzed under a constant force between the tip and the surface to be analyzed; the command signal being controlled between two successive steps to avoid any oscillation of the tip.

2. 发明申请

US20190094267A1 METHOD OF CONTROLLING A PROBE 审中-公开
公开(公告)号：US20190094267A1
公开(公告)日：2019-03-28
申请号：US16141413
申请日：2018-09-25
申请人： Louis Pacheco
发明人： Louis Pacheco
IPC分类号： G01Q10/06 , G01Q20/04 , G01Q60/26 , G01Q60/28 , G01Q60/38
摘要： A method for commanding a tip of a probe is disclosed, wherein a command signal, representative of the force applied by said tip on the surface of a sample to be analyzed, includes at least one cycle successively defined by: a first step where the value of said command signal decreases from a maximum value (Smax) to a minimum value (Smin) so as to move said tip away from said surface at a predetermined distance called detachment height; a second step where the value of the command signal is maintained constant at said minimum value so as to maintain the tip at said detachment height; a third step where the value of the command signal increases from the minimum value up to said maximum value so as to bring the tip closer towards the surface to be analyzed until the tip comes into contact with the surface; and a fourth step where the value of the command signal is maintained constant at said maximum value to maintain the tip in contact with the surface to be analyzed under a constant force between the tip and the surface to be analyzed; the command signal being controlled between two successive steps to avoid any oscillation of the tip.

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