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1. 发明授权

US08643849B2 Measurement systems and methods 失效
标题翻译：测量系统和方法
公开(公告)号：US08643849B2
公开(公告)日：2014-02-04
申请号：US13312423
申请日：2011-12-06
申请人： Li Tao , Guiju Song , Xinjun Wan , Kevin George Harding , Steven Robert Hayashi , James Joseph Hoffman , Charles Walter Muekmore , Yana Zhang Williams , Shukuan Xu
发明人： Li Tao , Guiju Song , Xinjun Wan , Kevin George Harding , Steven Robert Hayashi , James Joseph Hoffman , Charles Walter Muekmore , Yana Zhang Williams , Shukuan Xu
IPC分类号： G02B11/24
CPC分类号： G01B11/2513 , G01B11/2527 , G01S17/36 , G01S17/89
摘要： A measurement system comprising a light source unit, a projection unit and an optics unit is disclosed. The light source unit is configured to generate a plurality of modulated phase shifted light beams. The projection unit is configured to reflect the modulated phase shifted light beams onto an object surface. The optics unit is configured to capture the modulated phase shifted light beams from the object surface. The measurement system further comprises a photodetector and a processor. The photodetector is configured to receive the modulated phase shifted light beams from the optics unit to generate electrical signals. The processor is configured to retrieve position information of the object surface based on the electrical signals from the photodetector. A measurement method is also presented.
摘要翻译：公开了一种包括光源单元，投影单元和光学单元的测量系统。光源单元被配置为产生多个调制相移光束。投影单元被配置为将调制的相移光束反射到物体表面上。光学单元被配置为捕获来自物体表面的经调制的相移光束。测量系统还包括光电检测器和处理器。光电检测器被配置为从光学单元接收经调制的相移光束以产生电信号。处理器被配置为基于来自光电检测器的电信号来检索物体表面的位置信息。还提出了一种测量方法。

2. 发明申请

US20120147383A1 MEASUREMENT SYSTEMS AND METHODS 失效
标题翻译：测量系统和方法
公开(公告)号：US20120147383A1
公开(公告)日：2012-06-14
申请号：US13312423
申请日：2011-12-06
申请人： Li TAO , Guiju Song , Xinjun Wan , Kevin George Harding , Steven Robert Hayashi , James Joseph Hoffman , Charles Walter Muekmore , Yana Zhang Williams , Shukuan Xu
发明人： Li TAO , Guiju Song , Xinjun Wan , Kevin George Harding , Steven Robert Hayashi , James Joseph Hoffman , Charles Walter Muekmore , Yana Zhang Williams , Shukuan Xu
IPC分类号： G01B11/24
CPC分类号： G01B11/2513 , G01B11/2527 , G01S17/36 , G01S17/89
摘要： A measurement system comprising a light source unit, a projection unit and an optics unit is disclosed. The light source unit is configured to generate a plurality of modulated phase shifted light beams. The projection unit is configured to reflect the modulated phase shifted light beams onto an object surface. The optics unit is configured to capture the modulated phase shifted light beams from the object surface. The measurement system further comprises a photodetector and a processor. The photodetector is configured to receive the modulated phase shifted light beams from the optics unit to generate electrical signals. The processor is configured to retrieve position information of the object surface based on the electrical signals from the photodetector. A measurement method is also presented.
摘要翻译：公开了一种包括光源单元，投影单元和光学单元的测量系统。光源单元被配置为产生多个调制相移光束。投影单元被配置为将调制的相移光束反射到物体表面上。光学单元被配置为捕获来自物体表面的经调制的相移光束。测量系统还包括光电检测器和处理器。光电检测器被配置为从光学单元接收经调制的相移光束以产生电信号。处理器被配置为基于来自光电检测器的电信号来检索物体表面的位置信息。还提出了一种测量方法。

3. 发明申请

US20120149281A1 DISTANCE MEASUREMENT SYSTEMS AND METHODS 审中-公开
标题翻译：距离测量系统和方法
公开(公告)号：US20120149281A1
公开(公告)日：2012-06-14
申请号：US13312595
申请日：2011-12-06
申请人： Xinjun WAN , Guju Song , Kevin George Harding , Shukuan Xu , Steven Robert Hayashi , Robert William Tait , James Joseph Hoffman , Charles Walter Muchmore , Matthew Michael Gluesenkamp
发明人： Xinjun WAN , Guju Song , Kevin George Harding , Shukuan Xu , Steven Robert Hayashi , Robert William Tait , James Joseph Hoffman , Charles Walter Muchmore , Matthew Michael Gluesenkamp
IPC分类号： B24B51/00 , G01B11/24
CPC分类号： G01B11/026
摘要： A distance measurement system comprises an optical distance sensor configured to generate a light beam, a first optical module, and a processor. The first optical module is configured to receive the light beam, and generate and selectively transmit a plurality of light beams having different light channels for projection onto one or more points of an object to generate one or more reflected light beams scattered from the respective one or more points of the object, and capture and transmit the one or more reflected light beams into the optical distance sensor to retrieve a plurality of distance data to the respective one or more points of the object. The processor is configured to process the distance data to determine position information of the respective one or more points of the object. A distance measurement method is also presented.
摘要翻译：距离测量系统包括被配置为产生光束的光学距离传感器，第一光学模块和处理器。第一光学模块被配置为接收光束，并且生成并选择性地透射具有不同光通道的多个光束，用于投射到物体的一个或多个点上，以产生从相应的一个或多个散射的一个或多个反射光束并且将一个或多个反射光束捕获并传输到光学距离传感器中以将多个距离数据提取到对象的相应一个或多个点。处理器被配置为处理距离数据以确定对象的相应一个或多个点的位置信息。还提出了一种距离测量方法。

4. 发明授权

US07812968B2 Fringe projection system and method for a probe using a coherent fiber bundle 有权
标题翻译：边缘投影系统和使用相干光纤束的探针的方法
公开(公告)号：US07812968B2
公开(公告)日：2010-10-12
申请号：US12042740
申请日：2008-03-05
申请人： Clark Alexander Bendall , Kevin George Harding , Guiju Song , Li Tao , Ming Jia , Xinjun Wan
发明人： Clark Alexander Bendall , Kevin George Harding , Guiju Song , Li Tao , Ming Jia , Xinjun Wan
IPC分类号： G01B9/02 , G01B11/02
CPC分类号： G01B11/25 , A61B1/07 , G02B23/2415 , G02B23/2469 , G02B23/26 , G02B27/60
摘要： A probe is presented that includes a light source, a coherent fiber bundle, and a pattern selector. The pattern selector is disposed between the light source and the proximal end of the coherent fiber bundle. The pattern selector includes at least one patterned zone through which light from the light source passes to project at least one fringe set onto a surface. Each of the at least one fringe sets has a structured-light pattern. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is presented.
摘要翻译：提出了一种包括光源，相干光纤束和图案选择器的探针。图案选择器设置在光源和相干光纤束的近端之间。图案选择器包括至少一个图案化区域，光源通过该图案区域将至少一个边缘组投影到表面上。至少一个边缘组中的每一个具有结构化光图案。探头还包括用于获得表面的至少一个图像的成像器和被配置为对至少一个图像执行相移分析的处理单元。提出了一种用于使用探针在表面上投影适合于相移分析的多个边缘组的方法。

5. 发明申请

US20130300855A1 SYSTEM AND METHOD FOR PERFORMING AN INTERNAL INSPECTION ON A WIND TURBINE ROTOR BLADE 审中-公开
标题翻译：在风力涡轮机叶片上执行内部检查的系统和方法
公开(公告)号：US20130300855A1
公开(公告)日：2013-11-14
申请号：US13980345
申请日：2011-01-21
申请人： Peter James Fritz , Kevin George Harding , Guiju Song , Yong Yang , Li Tao , Xinjun Wan
发明人： Peter James Fritz , Kevin George Harding , Guiju Song , Yong Yang , Li Tao , Xinjun Wan
IPC分类号： H04N7/18
CPC分类号： H04N7/18 , F03D17/00 , G01N21/954 , Y02E10/721
摘要： A system (200) and method for performing an internal inspection on a rotor blade (16) of a wind turbine are disclosed. The system includes a sensing device (202), a cable (210) for raising and lowering the sensing device within the rotor blade, and a positioning device (206) attached to at least one of the sensing device and the cable. The positioning device can be configured to space the sensing device apart from an interior surface (208) of the rotor blade as the sensing device is raised and lowered within the rotor blade.
摘要翻译：公开了一种用于对风力涡轮机的转子叶片（16）执行内部检查的系统（200）和方法。该系统包括感测装置（202），用于升高和降低转子叶片内的感测装置的电缆（210）和附接到感测装置和电缆中的至少一个的定位装置（206）。定位装置可以被配置成当感测装置在转子叶片内升高和降低时，将感测装置与转子叶片的内表面（208）隔开。

6. 发明申请

US20090225320A1 Fringe Projection System and Method for a Probe using a Coherent Fiber Bundle 有权
标题翻译：边缘投影系统和使用相干光纤束的探头的方法
公开(公告)号：US20090225320A1
公开(公告)日：2009-09-10
申请号：US12042740
申请日：2008-03-05
申请人： Clark Alexander Bendall , Kevin George Harding , Guiju Song , Li Tao , Ming Jia , Xinjun Wan
发明人： Clark Alexander Bendall , Kevin George Harding , Guiju Song , Li Tao , Ming Jia , Xinjun Wan
IPC分类号： G01N21/55
CPC分类号： G01B11/25 , A61B1/07 , G02B23/2415 , G02B23/2469 , G02B23/26 , G02B27/60
摘要： A probe is presented that includes a light source, a coherent fiber bundle, and a pattern selector. The pattern selector is disposed between the light source and the proximal end of the coherent fiber bundle. The pattern selector includes at least one patterned zone through which light from the light source passes to project at least one fringe set onto a surface. Each of the at least one fringe sets has a structured-light pattern. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is presented.
摘要翻译：提出了一种包括光源，相干光纤束和图案选择器的探针。图案选择器设置在光源和相干光纤束的近端之间。图案选择器包括至少一个图案化区域，光源通过该图案区域将至少一个边缘组投影到表面上。至少一个边缘组中的每一个具有结构化光图案。探头还包括用于获得表面的至少一个图像的成像器和被配置为对至少一个图像执行相移分析的处理单元。提出了一种用于使用探针在表面上投影适合于相移分析的多个边缘组的方法。

7. 发明授权

US08107083B2 System aspects for a probe system that utilizes structured-light 有权
标题翻译：利用结构光的探针系统的系统方面
公开(公告)号：US08107083B2
公开(公告)日：2012-01-31
申请号：US12249513
申请日：2008-10-10
申请人： Clark Alexander Bendall , Kevin George Harding , Thomas Karpen , Guiju Song , Li Tao
发明人： Clark Alexander Bendall , Kevin George Harding , Thomas Karpen , Guiju Song , Li Tao
IPC分类号： G01B9/02
CPC分类号： G01B11/25 , G01N21/954 , G01N2021/9544 , G06T7/521
摘要： A probe system includes an imager and an inspection light source. The probe system is configured to operate in an inspection mode and a measurement mode. During inspection mode, the inspection light source is enabled. During measurement mode, the inspection light source is disabled, and a structured-light pattern is projected. The probe system is further configured to capture at least one measurement mode image. In the at least one measurement mode image, the structured-light pattern is projected onto an object. The probe system is configured to utilize pixel values from the at least one measurement mode image to determine at least one geometric dimension of the object. A probe system configured to detect relative movement between a probe and the object between captures of two or more of a plurality of images is also provided.
摘要翻译：探针系统包括成像器和检查光源。探针系统被配置为在检查模式和测量模式下操作。在检查模式下，检查光源被使能。在测量模式期间，检查光源被禁用，并且结构化光图案被投影。探测系统还被配置成捕获至少一个测量模式图像。在至少一个测量模式图像中，将结构光图案投影到对象上。探测系统被配置为利用来自至少一个测量模式图像的像素值来确定对象的至少一个几何尺寸。还提供了一种探测系统，其被配置为在多个图像中的两个或更多个图像的捕获之间检测探测器与物体之间的相对运动。

8. 发明授权

US07969583B2 System and method to determine an object distance from a reference point to a point on the object surface 有权
标题翻译：确定从参考点到物体表面上的点的物体距离的系统和方法
公开(公告)号：US07969583B2
公开(公告)日：2011-06-28
申请号：US12042800
申请日：2008-03-05
申请人： Clark Alexander Bendall , Kevin George Harding , Guiju Song , Li Tao
发明人： Clark Alexander Bendall , Kevin George Harding , Guiju Song , Li Tao
IPC分类号： G01B11/14 , G01B11/02
CPC分类号： G01B11/25 , G02B23/2407
摘要： A system for determining an object distance z includes a plurality of light emitters. A group of at least one of the plurality of light emitters includes an emitter group, and the pattern projected when one emitter group is emitting includes a fringe set. The light pattern of one fringe set exhibits a phase-shift relative to the light patterns of the other fringe sets, and the phase-shift varies as the distance from the origin of the plurality of fringe sets varies. The system further includes a processing unit that is configured to compute a ripple metric value associated with each of a plurality of possible z values. The processing unit is further configured to determine an approximated z value using the computed ripple metric values. A probe system is also provided. The probe system is configured to project a plurality of fringe sets from the probe onto an object. The light pattern of one fringe set exhibits a phase-shift relative to the light patterns of the other fringe sets, and the phase-shift varies as the distance from the origin of the plurality of fringe sets varies. The probe system is further configured to compute a ripple metric value associated with each of a plurality of possible z values, where z is an object distance. The probe system is also configured to determine an approximated z value using the computed ripple metric values. A method for determining an object distance z is also provided.
摘要翻译：用于确定对象距离z的系统包括多个发光器。多个发光体中的至少一个的一组包括发射体组，并且当一个发射体组发射时投射的图案包括边缘组。一个条纹集合的光图案相对于其他条纹集合的光图案显示相移，并且相移随着多个条纹集合的原点的距离变化而变化。该系统还包括处理单元，其被配置为计算与多个可能z值中的每一个相关联的纹波度量值。处理单元还被配置为使用所计算的纹波度量值来确定近似的z值。还提供探针系统。探针系统被配置为将多个边缘组从探针投影到物体上。一个条纹集合的光图案相对于其他条纹集合的光图案显示相移，并且相移随着多个条纹集合的原点的距离变化而变化。探针系统还被配置为计算与多个可能z值中的每一个相关联的波纹度量值，其中z是对象距离。探针系统还被配置为使用计算的纹波度量值来确定近似的z值。还提供了一种用于确定对象距离z的方法。

9. 发明申请

US20130057650A1 OPTICAL GAGE AND THREE-DIMENSIONAL SURFACE PROFILE MEASUREMENT METHOD 审中-公开
标题翻译：光栅和三维表面轮廓测量方法
公开(公告)号：US20130057650A1
公开(公告)日：2013-03-07
申请号：US13257268
申请日：2009-03-19
申请人： Guiju Song , Kevin George Harding , Ming Jia , Bo Yang , Qingying Hu , Jianming Zheng , Li Tao
发明人： Guiju Song , Kevin George Harding , Ming Jia , Bo Yang , Qingying Hu , Jianming Zheng , Li Tao
IPC分类号： H04N13/02 , G06K9/00
CPC分类号： G01B11/2527
摘要： An optical gage (10) with a small field of view for three-dimensional surface profile measurement includes a projector (20) having a light source (22) and projection optics (28, 30, 42) that guide light along a projection light path. An optical grating device (34) is arranged in the projection light path and modifies the projection light distribution to project a structured light pattern (46). A phase shifting apparatus (47) shifts the structured light pattern to at least three positions with desired phase shift on said surface (80) to be measured. A viewer (50) includes viewing optics with a viewing light path that is non-parallel to the projection light path, a light sensing array (58) for sensing images of diffuse reflections of the structured light patterns from said surface, and a camera (57) for recording the images. The optical gage further includes a computer (61) which comprises data input communication with the camera and a processor for modeling the surface being profiled based on surface contour information provided by the images.
摘要翻译：具有用于三维表面轮廓测量的小视野的光学计（10）包括具有光源（22）和投影光学器件（28,30,42）的投影仪（20），其沿着投影光路。光栅装置（34）布置在投影光路中并修改投影光分布以投影结构光图案（46）。相移装置（47）将结构化光图案移动到要测量的所述表面（80）上期望的相移的至少三个位置。观察器（50）包括具有不平行于投影光路的观察光路的观察光学器件，用于感测来自所述表面的结构化光图案的漫反射的图像的光感测阵列（58）和相机 57）用于记录图像。光学计进一步包括计算机（61），其包括与相机的数据输入通信，以及处理器，用于基于由图像提供的表面轮廓信息来对正在被轮廓的表面进行建模。

10. 发明授权

US07821649B2 Fringe projection system and method for a probe suitable for phase-shift analysis 有权
标题翻译：边缘投影系统和适用于相移分析的探头的方法
公开(公告)号：US07821649B2
公开(公告)日：2010-10-26
申请号：US12042821
申请日：2008-03-05
申请人： Clark Alexander Bendall , Guiju Song , Li Tao , Kevin George Harding , Thomas Karpen
发明人： Clark Alexander Bendall , Guiju Song , Li Tao , Kevin George Harding , Thomas Karpen
IPC分类号： G01B11/24 , G01B11/14 , G01N21/55
CPC分类号： G01B11/2527
摘要： A probe includes an insertion tube and a plurality of light emitters disposed on the distal end of the insertion tube. The probe further includes at least one intensity modulating element through which light from the plurality of light emitters is passed to project a plurality of fringe sets onto a surface. Each of the plurality of fringe sets intern have a structured-light pattern that is projected when one emitter group of at least one of the plurality of light emitters is emitting. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is also presented.
摘要翻译：探针包括插入管和设置在插入管的远端上的多个发光体。探针还包括至少一个强度调制元件，来自多个发光体的光通过该强度调制元件通过，以将多个边缘组投影到表面上。多个边缘组实体中的每一个具有当多个发光体中的至少一个发光体的一个发射极组发射时投影的结构光图案。探头还包括用于获得表面的至少一个图像的成像器和被配置为对至少一个图像执行相移分析的处理单元。还提出了一种用于使用探针在表面上投影适用于相移分析的多个边缘组的方法。

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