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    • 2. 发明授权
    • Molded test probe assembly
    • 成型测试探头组件
    • US5334931A
    • 1994-08-02
    • US790334
    • 1991-11-12
    • Norman B. ClarkeLawrence G. CookRobert G. DoyleMichael Renner
    • Norman B. ClarkeLawrence G. CookRobert G. DoyleMichael Renner
    • G01R1/067G01R1/02
    • G01R1/067Y10T29/49117Y10T29/49224
    • A probe 100 which can be formed from a molded plastic provides an inexpensive construction for a probe which may be readily replaced in electrical testing apparatus, particularly of the automated type. A conductive contact tip 18 is preferably co-molded into a cantilevered portion 14' of a body block 14 and a conductive material 16 is provided over a portion of the surface of the body block 14 extending from the contact tip 18 to an attachment portion 15 of the body block. Cooperating attachment structures 22, 24 are provided on both the body block 14 and a holder block 20 to provide a snap fit therebetween. The holder block 20 can be provided with a resilient tab 29 opposing the attachment portion of the body block for engagement with a connector lug 12 of the testing apparatus, sandwiching the connector lug 12 between the attachment portion 15 of the body block 14 and the holder block 20. Flanges of the holder block 20 provide lateral support for the cantilevered portion 14' of the body block. Contact tip 18 is located on cantilevered portion 14' with high precision through the use of a preload block 140 which is separated from the body block 14 or probe tip sub-assembly 210 after molding.
    • 可以由模制塑料形成的探针100为探针提供了便宜的结构,该探针可以在电气测试装置,特别是自动化类型中容易地替换。 导电接触尖端18优选地共模塑成体块14的悬臂部分14',并且导电材料16设置在主体块14的从接触尖端18延伸到附接部分15的表面的一部分上 的身体块。 配合的附接结构22,24设置在主体块14和保持器块20两者上,以在其间形成卡扣配合。 保持器块20可以设置有与主体块的附接部分相对的弹性突片29,用于与测试装置的连接器凸耳12接合,将连接器凸耳12夹在主体块14的附接部分15之间, 保持器块20的法兰为主体块的悬臂部分14'提供侧向支撑。 接触尖端18通过使用在模制之后与主体块14或探针末端子组件210分离的预加载块140而以高精度位于悬臂部分14'上。
    • 5. 发明授权
    • Method of making conductive molded tip head assembly
    • 制造导电模压头组件的方法
    • US5457882A
    • 1995-10-17
    • US178194
    • 1994-01-06
    • Norman B. ClarkeLawrence G. CookRobert G. DoyleMichael Renner
    • Norman B. ClarkeLawrence G. CookRobert G. DoyleMichael Renner
    • G01R1/067H01R43/16
    • G01R1/067Y10T29/49117Y10T29/49224
    • A probe 100 which can be formed from a molded plastic provides an inexpensive construction for a probe which may be readily replaced in electrical testing apparatus, particularly of the automated type. A conductive contact tip 18 is preferably co-molded into a cantilevered portion 14' of a body block 14 and a conductive material 16 is provided over a portion of the surface of the body block 14 extending from the contact tip 18 to an attachment portion 15 of the body block. Cooperating attachment structures 22, 24 are provided on both the body block 14 and a holder block 20 to provide a snap fit therebetween. The holder block 20 can be provided with a resilient tab 29 opposing the attachment portion of the body block for engagement with a connector lug 12 of the testing apparatus, sandwiching the connector lug 12 between the attachment portion 15 of the body block 14 and the holder block 20. Flanges of the holder block 20 provide lateral support for the cantilevered portion 14' of the body block. Contact tip 18 is located on cantilevered portion 14' with high precision through the use of a preload block 140 which is separated from the body block 14 or probe tip sub-assembly 210 after molding.
    • 可以由模制塑料形成的探针100为探针提供了便宜的结构,该探针可以在电气测试装置,特别是自动化类型中容易地替换。 导电接触尖端18优选地共模塑成体块14的悬臂部分14',并且导电材料16设置在主体块14的从接触尖端18延伸到附接部分15的表面的一部分上 的身体块。 配合的附接结构22,24设置在主体块14和保持器块20两者上,以在它们之间提供卡扣配合。 保持器块20可以设置有与主体块的附接部分相对的弹性突片29,用于与测试装置的连接器凸耳12接合,将连接器凸耳12夹在主体块14的附接部分15之间, 保持器块20的法兰为主体块的悬臂部分14'提供侧向支撑。 接触尖端18通过使用在模制之后与主体块14或探针末端子组件210分离的预加载块140而以高精度位于悬臂部分14'上。