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1. 发明授权

US07362114B2 Apparatus for interfacing electronic packages and test equipment 失效
标题翻译：用于连接电子封装和测试设备的设备
公开(公告)号：US07362114B2
公开(公告)日：2008-04-22
申请号：US10974147
申请日：2004-10-27
申请人： John M. Winter , Larre H. Nelson , John C. Bergeron , Lourie M. Sarcione
发明人： John M. Winter , Larre H. Nelson , John C. Bergeron , Lourie M. Sarcione
IPC分类号： G01R31/02
CPC分类号： G01R1/07314 , G01R1/0441 , G01R1/06722
摘要： A test apparatus for testing electrical devices such as ICs is provided. The test apparatus includes a test socket mounted on a DUT board in which a contact plunger assembly is at least partially positioned.
摘要翻译：提供了一种用于测试IC等电气设备的测试装置。测试装置包括安装在DUT板上的测试插座，其中接触柱塞组件至少部分地定位。

2. 发明授权

US07315176B2 Electrical test probes, methods of making, and methods of using 有权
标题翻译：电气测试探针，制作方法和使用方法
公开(公告)号：US07315176B2
公开(公告)日：2008-01-01
申请号：US11155230
申请日：2005-06-16
申请人： Larre H. Nelson , John M. Winter
发明人： Larre H. Nelson , John M. Winter
IPC分类号： G01R31/02
CPC分类号： G01R1/06722 , H01R13/2421
摘要： Disclosed herein is an electronic test probe including a compression spring disposed in the housing in engagement with a plunger, the compression spring including a first section of coils including a first centerline and a second section of coils including a second centerline spaced apart from and parallel to the first centerline.
摘要翻译：本文公开了一种电子测试探针，其包括设置在壳体中的与柱塞接合的压缩弹簧，该压缩弹簧包括第一部分线圈，其包括第一中心线和第二部分线圈，该第一部分线圈包括与第二中心线间隔开并平行于第一个中心线。

3. 发明授权

US09910069B1 Biasing method and device construction for a spring probe 有权
公开(公告)号：US09910069B1
公开(公告)日：2018-03-06
申请号：US14545342
申请日：2015-04-24
申请人： Larre H. Nelson , John M. Winter , Yoshihide Kimura
发明人： Larre H. Nelson , John M. Winter , Yoshihide Kimura
IPC分类号： G01R1/067
CPC分类号： G01R1/06722
摘要： A device for testing integrated circuits utilizing a compression spring that has one longitudinal centerline that is concentric to the housing of the test probe and terminates in a number of reduced diameter coil windings that are non-concentric to the housing so as to provide a side load to the probe.

4. 发明授权

US06685492B2 Sockets for testing electronic packages having contact probes with contact tips easily maintainable in optimum operational condition 失效
标题翻译：用于测试具有接触探针的电子封装的插座，可在最佳操作条件下轻松维护
公开(公告)号：US06685492B2
公开(公告)日：2004-02-03
申请号：US10151060
申请日：2002-05-17
申请人： John M. Winter , Larre H. Nelson , John C. Bergeron
发明人： John M. Winter , Larre H. Nelson , John C. Bergeron
IPC分类号： H01R1324
CPC分类号： G01R1/0466 , H01R13/2421 , H01R2201/20
摘要： An electrical socket (10) mounts a plurality of electrical contact probes (20, 22, 24, 26, 28, 30, 32) for providing an electrical connection between terminals of an electronic package (1,1′) received in a seat (10d) formed in the socket and respective conductive pads of a DUT board. The contact probes each have a slidable contact tip (20m, 26m, 28m, 30m, 32m) which is adapted for engagement with a respective terminal of an electronic package received in the socket and which is removable from the contact probe for ease of replacement. The removable contact tips or plungers are provided with a retainer surface (20t, 28t, 30t, 32t) for interengagement with a removable retainer member of the socket.
摘要翻译：电插座（10）安装多个电接触探针（20,22,24,26,28,30,32），用于在接收在座位（1）中的电子封装（1,1'）的端子之间提供电连接 10d）形成在插座和DUT板的各个导电焊盘上。接触探针各自具有可滑动的接触尖端（20m，26m，28m，30m，32m），其适于与容纳在插座中的电子组件的相应端子接合，并且可以从接触探针移除以便于更换。可拆卸接触尖端或柱塞设置有用于与插座的可移除的保持构件相互接合的保持器表面（20t，28t，30t，32t）。

5. 发明授权

US06992496B2 Apparatus for interfacing electronic packages and test equipment 失效
公开(公告)号：US06992496B2
公开(公告)日：2006-01-31
申请号：US10382078
申请日：2003-03-05
申请人： John M. Winter , Larre H. Nelson , John C. Bergeron , Lourie M. Sarcione
发明人： John M. Winter , Larre H. Nelson , John C. Bergeron , Lourie M. Sarcione
IPC分类号： G01R31/02
CPC分类号： G01R1/07314 , G01R1/0441 , G01R1/06722
摘要： A test apparatus for testing electrical devices such as ICs is provided. The test apparatus includes a test socket mounted on a DUT board in which a contact plunger assembly is at least partially positioned.

6. 发明申请

US20070296436A1 ELECTRICAL TEST PROBES WITH A CONTACT ELEMENT, METHODS OF MAKING AND USING THE SAME 失效
标题翻译：具有接触元件的电气测试探针，制造和使用它的方法
公开(公告)号：US20070296436A1
公开(公告)日：2007-12-27
申请号：US11621717
申请日：2007-01-10
申请人： John M. Winter
发明人： John M. Winter
IPC分类号： G01R31/02
CPC分类号： G01R1/06733 , H01R13/2421
摘要： Disclosed herein are electrical test probes and methods for making the same. In one embodiment, an electrical test probe comprises: a barrel, a plunger, a contact element, and a spring. The barrel comprises a contact area defined by a stop engagement and an opening at a first end of the barrel. The plunger is slidably disposed through the opening, the contact element, and the contact area. The plunger comprises a tip and a stop protrusion with a plunger extension extending therebetween. The contact element is disposed in the contact area, between the barrel and the plunger. The spring is in operational engagement with the plunger.
摘要翻译：本文公开了电测试探针及其制备方法。在一个实施例中，电测试探针包括：筒，柱塞，接触元件和弹簧。桶包括由止动接合限定的接触区域和在桶的第一端处的开口。柱塞可滑动地设置穿过开口，接触元件和接触区域。柱塞包括尖端和止动突起，其中柱塞延伸部在其间延伸。接触元件设置在接触区域中，在筒体和柱塞之间。弹簧与柱塞可操作地接合。

7. 发明授权

US5698990A Counterforce spring assembly for printed circuit board test fixtures 失效
标题翻译：用于印刷电路板测试夹具的反力弹簧组件
公开(公告)号：US5698990A
公开(公告)日：1997-12-16
申请号：US677920
申请日：1996-07-10
申请人： James R. Aussant , Robert A. Morin , John M. Winter
发明人： James R. Aussant , Robert A. Morin , John M. Winter
IPC分类号： G01R1/073 , G01R31/02
CPC分类号： G01R1/073
摘要： A counterforce spring assembly for printed circuit board test fixtures is provided. A number of counterforce spring assemblies are provided in an array between the top plate and probe plate of the test fixture. Each counterforce spring assembly includes a support cup residing in an aperture through the probe plate. A compression spring resides in the support cup and provides spring-biasing of the top plate to the probe plate during the UUT testing cycle. Each counterforce spring assembly includes a circumferential flange to limit downward travel of the top plate toward the probe plate. Each assembly is small enough to fit between probe apertures corresponding to component leads of the UUT. The counterforce spring assemblies can be freely placed underneath the top plate to provide even spring-biasing thereof to prevent bowing and bending of the top plate which often causes errors in the testing of printed circuit boards.
摘要翻译：提供了一种用于印刷电路板测试夹具的反力弹簧组件。在测试夹具的顶板和探针板之间的阵列中设置有多个反力弹簧组件。每个反力弹簧组件包括位于穿过探针板的孔中的支撑杯。压缩弹簧驻留在支撑杯中，并且在UUT测试周期期间将顶板弹簧偏置到探针板。每个反作用力弹簧组件包括周向凸缘，以限制顶板朝向探针板的向下移动。每个组件足够小以适合与UUT的元件引线相对应的探针孔之间。反力弹簧组件可以自由地放置在顶板下方以提供均匀的弹簧偏置，以防止顶板的弯曲和弯曲，这通常会导致印刷电路板的测试误差。

8. 发明申请

US20080073187A1 SIDE-MOUNTED LOCK-OFF ACCESSORY FOR A CIRCUIT BREAKER 有权
标题翻译：电路断路器的侧面安装锁定附件
公开(公告)号：US20080073187A1
公开(公告)日：2008-03-27
申请号：US11524702
申请日：2006-09-21
申请人： Willard J. Rezac , John M. Winter , Antonio Zubieta
发明人： Willard J. Rezac , John M. Winter , Antonio Zubieta
IPC分类号： H01H9/28
CPC分类号： H01H9/223 , H01H9/28
摘要： A circuit breaker lock-off device is side-mounted to a circuit breaker case in a tenacious engagement. The lock-off device has a generally planar body carrying a lock-off arm pivotable in a plane parallel to the body to place an engagement tab extending therefrom into a position for preventing movement of the breaker handle without being physically attached to the breaker handle. The lock-off arm and the body further have complementary rings for accepting a padlock shackle in the locked off position. The invention allows a rugged lock-off accessory which is field installable and which can accommodate various breaker handle geometries.
摘要翻译：断路器锁定装置以坚固的接合方式安装到断路器壳体上。锁定装置具有一个大致平面的主体，该主体具有可在平行于主体的平面中枢转的锁定臂，以将从其延伸的接合突片放置在防止断路器手柄移动而不物理地附接到断路器手柄的位置。锁定臂和主体还具有用于接受处于锁定位置的挂锁钩环的互补环。本发明允许可现场安装并且可以适应各种断路器手柄几何形状的坚固的锁定附件。

9. 发明授权

US5083103A Energy management accessory for circuit breaker 失效
标题翻译：电路断路器的能源管理附件
公开(公告)号：US5083103A
公开(公告)日：1992-01-21
申请号：US415013
申请日：1989-09-29
申请人： John M. Winter , Jerry L. Scheel , Matthew D. Sortland
发明人： John M. Winter , Jerry L. Scheel , Matthew D. Sortland
IPC分类号： H01H71/74 , H01H3/26 , H01H71/70 , H01H73/02 , H01H75/00 , H01H83/20
CPC分类号： H01H71/70 , H01H3/264 , H01H2003/266 , H01H83/20
摘要： A circuit breaker control system includes a motor driven fork assembly, activated from a remote location, for simultaneously opening all of the breaker load contacts and locking them in an open condition. A DC voltage is selectively applied to energize the reversible DC motor. The switch at the remote location can be operated to enable a user-customer to return the breaker to operable condition at the breaker site. This is accomplished with an SCR circuit that is enabled by the remote switch and actuated by the user to operate the motor in a reverse direction to release the load contacts.
摘要翻译：断路器控制系统包括从远程位置启动的马达驱动叉组件，用于同时打开所有断路器负载触点并将其锁定在开启状态。选择性地施加DC电压以使可逆DC电动机通电。可以操作远程位置处的开关，以使用户客户能够在断路器位置将断路器返回到可操作状态。这是通过SCR电路实现的，该电路由远程开关使能并由使用者驱动以在相反方向上操作马达以释放负载触点。

10. 发明授权

US4906967A Electronic circuit breaker with withstand capability 失效
标题翻译：具有耐受能力的电子断路器
公开(公告)号：US4906967A
公开(公告)日：1990-03-06
申请号：US249240
申请日：1988-09-26
申请人： John M. Winter
发明人： John M. Winter
IPC分类号： H01H77/10
CPC分类号： H01H77/101 , H01H2071/507
摘要： An electronic circuit breaker having withstand capability. When the fault current exceeds the required withstand level, the mechanism force trips the circuit breaker. The forces generated by a blow-on contact loop are exerted on the various components of the operating mechanism, including the quick trip latch and secondary latch. As the fault current exceeds the required withstand level, the forces on the operating mechanism exceed the spring force holding together the quick trip latch and secondary latch. These two components rotate as one assembly during a trip operation initiated by energizing the trip coil. In the force trip operation, these two components separate unlatching the mechanism and opening the circuit breaker contacts.
摘要翻译：具有承受能力的电子断路器。当故障电流超过要求的耐受水平时，机构的力会跳闸。由吹塑接触回路产生的力被施加在操作机构的各个部件上，包括快速跳闸闩锁和辅助闩锁。当故障电流超过所需的耐受水平时，操作机构上的力超过弹簧力，将弹簧力保持在一起。在通过激励跳闸线圈启动的跳闸操作期间，这两个部件作为一个组件旋转。在力跳闸操作中，这两个部件分开解锁机构并打开断路器触点。

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