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1. 发明授权

US08405835B2 Scanning microscope using heterodyne interferometer 有权
标题翻译：扫描显微镜使用外差干涉仪
公开(公告)号：US08405835B2
公开(公告)日：2013-03-26
申请号：US12696883
申请日：2010-01-29
申请人： Kyuman Cho , Kang-Hyuk Kwon
发明人： Kyuman Cho , Kang-Hyuk Kwon
IPC分类号： G01B9/02
CPC分类号： G01B9/0207 , G01B9/02003 , G01B9/02081 , G01B2290/70
摘要： The present invention relates to a scanning microscope using a heterodyne interferometer, which can be used for mapping or imaging complex optical parameters such as physical structures and material properties of a sample under test. The heterodyne interferometer is designed to provide in- and quadrature-phase interference signal which can be used for extracting the phase and amplitude change induced on the probe beam. The phase and the amplitude of the probe beam, which is reflected from or transmitted through the sample, are modified by the physical structures and material properties of the sample. Therefore, by scanning the probe beam, local variations of the phase and amplitude can be mapped, and, thereby, three-dimensional microscopic physical structures and material properties can be imaged by processing the phase and amplitude values.
摘要翻译：本发明涉及一种使用外差干涉仪的扫描显微镜，其可用于映射或成像复杂光学参数，例如被测样品的物理结构和材料性质。外差干涉仪设计用于提供正相和正交相干扰信号，可用于提取在探针上引起的相位和幅度变化。通过样品反射或透过样品的探针光束的相位和幅度被样品的物理结构和材料特性所改变。因此，通过扫描探测光束，可以映射相位和幅度的局部变化，从而可以通过处理相位和振幅值来成像三维微观物理结构和材料特性。

2. 发明申请

US20050117904A1 Integrated optical transmitter, receiver for free space optical communication and network system and application apparatus thereof 审中-公开
标题翻译：集成光发射机，自由空间光通信接收机及其网络系统及其应用装置
公开(公告)号：US20050117904A1
公开(公告)日：2005-06-02
申请号：US10381816
申请日：2001-08-01
申请人： Youngwan Choi , Kyuman Cho
发明人： Youngwan Choi , Kyuman Cho
IPC分类号： H04B10/114 , H04J14/02
CPC分类号： H04B10/1149
摘要： The present invention relates to the optical transmitter, receiver and application apparatus thereof for OWLL (Optical WireLess Link) which transmits and receives the optical signals through the free space and FSON (Free Space Optical Network) system using OWLL. Photonic devices such as laser diode and photo detector and integrated circuits for driving the photonic devices are formed directly into a single chip and the chip is assembled with optical instrument which is manufactured as a standardized optical module. Then, the optical transmitter, receiver and application apparatus thereof becomes small, light, cost-effective, multi-functional and reliable.
摘要翻译：本发明涉及用于通过自由空间发送和接收光信号的OWLL（Optical WireLess Link）的光发射机，接收机和应用装置，以及使用OWLL的FSON（自由空间光网络）系统。用于驱动光子器件的光子器件如激光二极管和光电检测器以及集成电路直接形成为单个芯片，芯片与被制造为标准化光学模块的光学仪器组装在一起。然后，其光发射机，接收机及其应用装置变得小巧，轻便，经济有效，多功能可靠。

3. 发明授权

US08289525B2 Optical surface measuring apparatus and method 有权
标题翻译：光学表面测量装置及方法
公开(公告)号：US08289525B2
公开(公告)日：2012-10-16
申请号：US12561671
申请日：2009-09-17
申请人： Seung-Yop Lee , Kyoung Up Kim , Jae Hyun Kim , Kyuman Cho , Young Kyu Park
发明人： Seung-Yop Lee , Kyoung Up Kim , Jae Hyun Kim , Kyuman Cho , Young Kyu Park
IPC分类号： G01B11/02
CPC分类号： G01B9/02068 , G01B9/02063 , G01B11/0608 , G01B11/2441
摘要： Disclosed herein is an apparatus and method which is capable of accurately measuring surface status, such as a minute variation in height (the height difference), a protrusion, a depression, surface damage and/or surface roughness, at each point on the surface of the object to be measured in an optical manner. In particular, the present invention provides an optical surface measuring apparatus and method which is capable of accurately measuring the minute surface status of the object to be measured using both a signal from an interferometer and a Focus Error (FE) signal from a Position Sensitive Detector (PSD) in order to overcome the 2π-ambiguity of the conventional interferometers and the limitation of the Focus Error (FE) signal.
摘要翻译：这里公开了一种能够精确地测量表面状态的装置和方法，例如在表面上的每个点处的高度（高度差），突起，凹陷，表面损伤和/或表面粗糙度的微小变化以光学方式测量的物体。特别地，本发明提供一种光学表面测量装置和方法，其能够使用来自干涉仪的信号和来自位置敏感检测器的聚焦误差（FE）信号来精确地测量待测物体的微小表面状态（PSD），以克服传统干涉仪的2＆pgr - - 歧义和对焦误差（FE）信号的限制。

4. 发明申请

US20100220337A1 OPTICAL SURFACE MEASURING APPARATUS AND METHOD 有权
标题翻译：光学表面测量装置和方法
公开(公告)号：US20100220337A1
公开(公告)日：2010-09-02
申请号：US12561671
申请日：2009-09-17
申请人： Seung-Yop LEE , Kyoung Up Kim , Jae Hyun Kim , Kyuman Cho , Young Kyu Park
发明人： Seung-Yop LEE , Kyoung Up Kim , Jae Hyun Kim , Kyuman Cho , Young Kyu Park
IPC分类号： G01B9/02 , G01B11/02
CPC分类号： G01B9/02068 , G01B9/02063 , G01B11/0608 , G01B11/2441
摘要： Disclosed herein is an apparatus and method which is capable of accurately measuring surface status, such as a minute variation in height (the height difference), a protrusion, a depression, surface damage and/or surface roughness, at each point on the surface of the object to be measured in an optical manner. In particular, the present invention provides an optical surface measuring apparatus and method which is capable of accurately measuring the minute surface status of the object to be measured using both a signal from an interferometer and an FE signal from a Position Sensitive Detector (PSD) in order to overcome the 2π-ambiguity of the conventional interferometers and the limitation of the FE signal.
摘要翻译：这里公开了一种能够精确地测量表面状态的装置和方法，例如在表面上的每个点处的高度（高度差），突起，凹陷，表面损伤和/或表面粗糙度的微小变化以光学方式测量的物体。特别地，本发明提供了一种光学表面测量装置和方法，其能够使用来自干涉仪的信号和来自位置敏感检测器（PSD）的FE信号来精确地测量待测物体的微小表面状态以克服常规干涉仪的2＆pgr - - 歧义和FE信号的限制。

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