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    • 9. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US06459642B1
    • 2002-10-01
    • US09703820
    • 2000-11-01
    • Beak Hyung ChoDu Eung KimJong Pil Son
    • Beak Hyung ChoDu Eung KimJong Pil Son
    • G11C700
    • G11C29/83G11C5/14G11C29/832
    • The invention discloses a semiconductor memory device in which faulty cells causing standby current failure will be replaced with redundancy cells. The semiconductor memory device includes: a plurality of word lines, a plurality of bit lines, a plurality of cells connected between the word lines and bit lines for storing data and a memory cell array of a plurality of cell blocks having a plurality of cell power lines for providing supply voltage to the cells; a plurality of row decoder circuits for decoding external row addresses and generating selection signals for predetermined word lines included in the cell blocks; and a plurality of cell power repairing circuits for selectively blocking between cell power lines providing supply voltage to faulty cells and power source at an occurrence of faulty cells causing standby current failure. At this time, the cell power lines of the cell blocks are arranged in an identical direction to word lines; the row decoder circuits are respectively arranged between two neighboring cell blocks; and the cell power repairing circuits are respectively arranged between the cell blocks of the memory cell array, thereby reducing the size of a chip.
    • 本发明公开了一种半导体存储器件,其中引起备用电流故障的故障单元将被替换为冗余单元。 半导体存储器件包括:多个字线,多个位线,连接在字线和用于存储数据的位线之间的多个单元,以及具有多个单元电力的多个单元块的存储单元阵列 为电池提供电源电压的线路; 多个行解码器电路,用于解码外部行地址并产生用于包括在单元块中的预定字线的选择信号; 以及多个单元电力修复电路,用于在出现故障单元并导致待机电流故障时,选择性地阻塞在故障单元和电源之间提供电源电压的单元电源线之间。 此时,单元块的单元电力线被排列成与字线相同的方向; 行解码器电路分别布置在两个相邻的单元块之间; 并且电池功率修复电路分别布置在存储单元阵列的单元块之间,从而减小芯片的尺寸。