会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 6. 发明申请
    • DISPLAY DEVICE INCLUDING LIGHT EMITTING ELEMENT
    • 显示装置,包括发光元件
    • US20110175862A1
    • 2011-07-21
    • US13006668
    • 2011-01-14
    • Atsushi UmezakiRyo Arasawa
    • Atsushi UmezakiRyo Arasawa
    • G09G5/00
    • G09G3/3233G09G2300/0861
    • Each of a plurality of pixels includes a transistor, a capacitor, and a display element. One terminal of the capacitor is electrically connected to a first line. The other terminal of the capacitor is electrically connected to a gate of the transistor. In a first period, a first terminal of the transistor is electrically connected to the gate of the transistor and the gate of the transistor is electrically connected to a second line. In a second period, the first terminal of the transistor is electrically connected to the gate of the transistor and a second terminal of the transistor is electrically connected to a third line. In a third period, the first terminal of the transistor is electrically connected to the first line and the second terminal of the transistor is electrically connected to the display element.
    • 多个像素中的每一个包括晶体管,电容器和显示元件。 电容器的一个端子电连接到第一线。 电容器的另一个端子电连接到晶体管的栅极。 在第一时段中,晶体管的第一端电连接到晶体管的栅极,并且晶体管的栅极电连接到第二线。 在第二时段中,晶体管的第一端电连接到晶体管的栅极,晶体管的第二端电连接到第三线。 在第三时段中,晶体管的第一端电连接到第一线,并且晶体管的第二端电连接到显示元件。
    • 8. 发明申请
    • Semiconductor device
    • 半导体器件
    • US20070178614A1
    • 2007-08-02
    • US11657163
    • 2007-01-24
    • Ryo ArasawaTomoyuki Iwabuchi
    • Ryo ArasawaTomoyuki Iwabuchi
    • H01L21/66
    • H01L22/32H01L27/12H01L2924/0002H01L2924/00
    • An object of the invention is to manage variation of electrical characteristics of an element in a semiconductor device due to a vapor deposition process by measuring electrical characteristics of a TEG. A substrate 100 of an active matrix EL panel includes a vapor deposition region 101 having a film formed by a vapor deposition method. In the vapor deposition region 101, a pixel region 102 is provided. A TEG 109 is provided in the vapor deposition region 101 having a film formed in a vapor deposition step and outside of the pixel region 102. A measurement terminal portion 110 for measuring the TEG 109 is provided outside of a sealing region 103.
    • 本发明的一个目的是通过测量TEG的电特性来管理由于气相沉积工艺而导致的半导体器件元件的电特性变化。 有源矩阵EL面板的基板100包括具有通过气相沉积法形成的膜的气相沉积区域101。 在蒸镀区域101中设置有像素区域102。 在蒸镀区域101中设置TEG109,该气相沉积区域101具有在气相沉积步骤中形成的膜并且在像素区域102外部。 用于测量TEG109的测量端子部分110设置在密封区域103的外侧。