专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US06928079B2 Multiplexer controlling absorption of delay fluctuation on individual transmission path 失效
标题翻译：多路复用器控制单个传输路径上延迟波动的吸收
公开(公告)号：US06928079B2
公开(公告)日：2005-08-09
申请号：US09803790
申请日：2001-03-12
申请人： Kimihide Ono , Hideki Mori
发明人： Kimihide Ono , Hideki Mori
IPC分类号： H04L12/885 , H04L12/951 , H04Q11/04 , H04J3/06
CPC分类号： H04L49/254 , H04J2203/0076 , H04J2203/0089 , H04L49/206 , H04L49/30 , H04L49/3009 , H04L2012/5649 , H04L2012/5671
摘要： A multiplexer is provided for making data into a plurality of cells and then for transmitting the plurality of cells through a cell transmission path. The multiplexer includes a first delay-fluctuation adding unit adding a first maximum value of delay fluctuation occurring when the multiplexer transmits the cell, to a predetermined area of the cell; a second delay-fluctuation adding unit adding a second maximum value of delay fluctuation occurring when the multiplexer reproduces the data from the cell, to the predetermined area; a storage unit storing the data; and a data-read control unit controlling reading the data stored in the storage unit by following a maximum value of delay fluctuation stored in the predetermined area. Accordingly, the multiplexer can control absorption of the delay fluctuation individually for each cell transmission path.
摘要翻译：提供多路复用器用于将数据制成多个单元，然后用于通过单元传输路径发送多个单元。多路复用器包括：第一延迟波动加法单元，将多路复用器发送单元发生的延迟波动的第一最大值加到单元的预定区域; 第二延迟波动加法单元，将当多路复用器从单元再现数据时发生的延迟波动的第二最大值加到预定区域; 存储所述数据的存储单元; 以及数据读取控制单元，通过跟随存储在预定区域中的延迟波动的最大值来控制存储在存储单元中的数据。因此，多路复用器可以分别控制每个单元传输路径的延迟波动的吸收。

2. 发明授权

US08463161B2 Image forming apparatus having transfer belt spacing mechanism 有权
标题翻译：具有转印带间隔机构的图像形成装置
公开(公告)号：US08463161B2
公开(公告)日：2013-06-11
申请号：US13036284
申请日：2011-02-28
申请人： Hideki Mori
发明人： Hideki Mori
IPC分类号： G03G15/08
CPC分类号： G03G15/1605 , G03G21/1623 , G03G21/168 , G03G2221/1642
摘要： An image forming apparatus includes an image bearing member; a belt unit which is rotatable in contact with the image bearing member and which is capable of being drawn out of a main assembly of the image forming apparatus; a cam member for switching a position of the belt member relative to the image bearing member; a motor for rotating the cam member; a controller for controlling the motor to contact and space the belt member relative to the image bearing member; a lever movable between a first position in which the belt member is fixed to the main assembly of the image forming apparatus and a second position in which the belt member is capable of being drawn out of the main assembly of the image forming apparatus; and a spacing mechanism for spacing the belt member from the image bearing member by converting movement of the lever from the first position to the second position to a rotation of the cam member, when the belt member is contacted to the image bearing member.
摘要翻译：图像形成装置包括：图像承载部件; 带单元，其能够与图像承载构件接触地旋转并且能够从图像形成装置的主组件中拉出; 凸轮构件，用于切换带构件相对于图像承载构件的位置; 用于使所述凸轮构件旋转的马达; 控制器，用于控制马达相对于图像承载部件接触和间隔皮带部件; 可在第一位置和第二位置之间移动的杆，其中，所述带构件固定到所述图像形成装置的主组件，在所述第二位置，所述带构件能够从所述图像形成装置的主组件引出; 以及间隔机构，用于当带构件与图像承载构件接触时，通过将杠杆的运动从第一位置转移到第二位置，使带构件与图像承载构件间隔开。

3. 发明授权

US08300954B2 Information processing apparatus and method, and program 失效
标题翻译：信息处理装置和方法，程序
公开(公告)号：US08300954B2
公开(公告)日：2012-10-30
申请号：US12383809
申请日：2009-03-27
申请人： Yuya Aoki , Takuo Morimura , Shinobu Yamada , Hirosuke Nagano , Kentaro Fukazawa , Hideki Mori , Yasuhiko Suga , Shunsuke Harasaki , Seiichi Inomata , Tetsujiro Kondo
发明人： Yuya Aoki , Takuo Morimura , Shinobu Yamada , Hirosuke Nagano , Kentaro Fukazawa , Hideki Mori , Yasuhiko Suga , Shunsuke Harasaki , Seiichi Inomata , Tetsujiro Kondo
IPC分类号： G06K9/62 , G06K9/46
CPC分类号： G06T3/403
摘要： An information processing apparatus includes a first classification unit configured to set each of pixels forming a first image as a pixel of interest and classify the pixels of interest into one of a plurality of provided classes of a first type in accordance with a predetermined rule; a feature amount generation unit configured to generate a shifted waveform whose phase is shifted with respect to a waveform of the first image containing the pixels of interest and configured to generate a feature amount; a second classification unit configured to be provided with a plurality of classes of a second type in accordance with the feature amount for each of the plurality of classes of the first type and configured to classify the pixels of interest; and a prediction calculation unit configured to predictively calculate pixels forming a second image.
摘要翻译：信息处理设备包括：第一分类单元，被配置为将形成第一图像的每个像素设置为感兴趣的像素，并根据预定规则将感兴趣的像素分类为多个提供的第一类别中的一个; 特征量产生单元，被配置为生成相移相对于包含感兴趣像素的第一图像的波形的移位波形，并且被配置为生成特征量; 第二分类单元，被配置为根据第一类型的多个类中的每一个的特征量被提供有多个第二类的类别，并且被配置为对感兴趣的像素进行分类; 以及预测计算单元，被配置为预测地计算形成第二图像的像素。

4. 发明申请

US20100246934A1 INSPECTION DEVICE FOR DISK-SHAPED SUBSTRATE 失效
标题翻译：用于盘形基板的检查装置
公开(公告)号：US20100246934A1
公开(公告)日：2010-09-30
申请号：US12738760
申请日：2008-10-22
申请人： Yoshinori Hayashi , Hiroshi Wakaba , Yoko Ono , Koichi Miyazono , Hideki Mori
发明人： Yoshinori Hayashi , Hiroshi Wakaba , Yoko Ono , Koichi Miyazono , Hideki Mori
IPC分类号： G06K9/00
CPC分类号： H01L22/20 , G01N21/9503 , H01L22/12
摘要： An inspection apparatus of a disk-shaped substrate able to precisely quantitatively inspect positions of formation of film layers formed on the surface of a disk-shaped substrate is provided, that is, an inspection apparatus of a disk-shaped substrate on which film layers are formed designed to generate captured image data expressing a captured image corresponding to a field of view based on image signals successively output from an image capturing unit capturing an image of a predetermined surface at an outer circumference part of the disk-shaped substrate and to generate film layer edge position information Y4E24 (θ) expressing longitudinal direction positions at corresponding positions (θ) along the circumferential direction of an edge line E24 of a film layer image part ISa (24) corresponding to the film layer 24 on the surface image ISa with reference to, from the captured image data, longitudinal direction positions YE15aL (θ) at the different positions (θ) along the circumferential direction of a boundary line E15a between a surface image part ISa corresponding to the predetermined surface on the captured image and its outer image part IBKL.
摘要翻译：提供了能够精确地定量检查形成在盘状基板的表面上的膜层的形成位置的盘状基板的检查装置，即，其中膜层为被形成为基于从在盘状基板的外周部分捕获预定表面的图像的图像捕获单元连续输出的图像信号生成表示与视场相对应的拍摄图像的拍摄图像数据，并且生成胶片沿着与表面图像ISa上的薄膜层24相对应的薄膜层图像部分ISa（24）的边缘线E24的圆周方向的相应位置（＆amp;θ）表示纵向位置的层边缘位置信息Y4E24（＆参考来自拍摄图像数据的不同位置处的纵向位置YE15aL（＆amp; tas）沿着与捕获图像上的预定表面相对应的表面图像部分ISa与其外部图像部分IBKL之间的边界线E15a的圆周方向。

5. 发明申请

US20100177953A1 DISC WAFER INSPECTING DEVICE AND INSPECTING METHOD 有权
标题翻译：光盘检测设备和检查方法
公开(公告)号：US20100177953A1
公开(公告)日：2010-07-15
申请号：US12376469
申请日：2007-08-09
申请人： Yoshinori Hayashi , Takeki Kogawa , Hideki Mori , Akimasa Hori
发明人： Yoshinori Hayashi , Takeki Kogawa , Hideki Mori , Akimasa Hori
IPC分类号： G06K9/00
CPC分类号： G01B11/08 , G01B11/24 , G01N21/9503 , G01R31/311
摘要： [Problem] An inspecting device and an inspecting method enabling better precision inspection for a processing region formed on a surface of a semiconductor wafer or other disc wafer are provided.[Means for Solution] The inspecting device is configured having image capturing means 130a, 130b for capturing an image of an outer edge and its neighboring region of a rotating wafer 10, wafer outer edge position measuring means 200 for measuring the radial direction position of the outer edge at each of the plurality of rotational angle positions θn of the wafer 10 based on the images obtained by the image capturing means 130a, 130b, an edge-to-edge distance measuring means 200 for measuring the edge-to-edge distance Bθn, between the outer edge of the wafer 10 and the edge of an insulating film 11 at each of the plurality of rotational angle positions θn based on the images obtained by the image capturing means 130a, and an inspection information generating means 200 for generating predetermined inspection information based on the radial direction position Aθn of the outer edge of the wafer 10 and the edge-to-edge distance Bθn.
摘要翻译： [问题]提供一种检查装置和对形成在半导体晶片或其他盘晶片的表面上的处理区域进行更好的精密检查的检查方法。 [解决方案]检查装置配置有用于捕获旋转晶片10的外边缘及其相邻区域的图像的图像捕获装置130a，130b，用于测量旋转晶片10的径向位置的晶片外边缘位置测量装置200 基于由图像捕获装置130a，130b获得的图像的晶片10的多个旋转角度位置＆amp; t的每一个的外边缘; n边缘到边缘距离测量装置200，用于测量边缘到边缘距离B＆amp; N; n，基于由图像捕获装置130a获得的图像，在多个旋转角度位置＆amp; tt中的每一个的晶片10的外边缘和绝缘膜11的边缘之间; n， n是根据晶片10的外边缘的径向位置A和距离n以及边缘到边缘距离B的关系产生预定检查信息的装置; n。

6. 发明申请

US20100066998A1 SURFACE INSPECTION APPARATUS 有权
标题翻译：表面检查装置
公开(公告)号：US20100066998A1
公开(公告)日：2010-03-18
申请号：US12595699
申请日：2008-04-25
申请人： Yoshinori Hayashi , Masao Kawamura , Hideki Mori
发明人： Yoshinori Hayashi , Masao Kawamura , Hideki Mori
IPC分类号： G01N21/00
CPC分类号： G01N21/9503
摘要： [Problem] To provide a surface inspection apparatus able to suitably inspect the outer circumference edge part of a semiconductor wafer or other plate-shaped member.[Technical Solution] A semiconductor wafer inspection apparatus 10 has a camera lens 22 arranged facing an outer circumference edge part 101 of a semiconductor wafer 100, an imaging surface 24 arranged facing an outer circumference end face of a semiconductor wafer 100 via the camera lens 22, a mirror 12 forming an image of a first outer circumference bevel surface 101b of the semiconductor wafer 100 on the imaging surface 24 via the camera lens 22, a mirror 14 forming an image of a second outer circumference bevel surface 101c of the semiconductor wafer 100 on the imaging surface 24 via the camera lens 22, a correction lens 26 forming an image of an outer circumference end face 101a of the semiconductor wafer 100 on the imaging surface 24 via the center part of the camera lens 22, and an illumination light guide lamp part 18 illuminating surfaces so that, compared with the outer circumference end face 101a, the first outer circumference bevel surface 101b and second outer circumference bevel surface 101c become brighter.
摘要翻译： [问题]提供一种能够适当地检查半导体晶片或其他板状部件的外周缘部的表面检查装置。技术方案半导体晶片检查装置10具有面向半导体晶片100的外周缘部101配置的摄像透镜22，经由照相机镜头22配置成与半导体晶片100的外周端面相对配置的摄像面24 ，通过照相机镜头22在成像面24上形成半导体晶片100的第一外周斜面101b的图像的反射镜12，形成半导体晶片100的第二外周斜面101c的图像的反射镜通过照相机镜头22在成像表面24上，通过照相机镜头22的中心部分在成像表面24上形成半导体晶片100的外周端面101a的图像的校正透镜26和照明光导灯部18照射表面，使得与外周端面101a相比，第一外周斜面101b和第二外圆周面斜面101c变得更亮。

7. 发明申请

US20090177415A1 Surface Roughness Inspection System 有权
标题翻译：表面粗糙度检测系统
公开(公告)号：US20090177415A1
公开(公告)日：2009-07-09
申请号：US12086081
申请日：2006-12-05
申请人： Yoshinori Hayashi , Hideki Mori
发明人： Yoshinori Hayashi , Hideki Mori
IPC分类号： G01B11/30
CPC分类号： G01B11/303 , G01N21/9501
摘要： [Problem] To provide a surface roughness inspection system enabling suitable inspection even when the surface of the object being inspected is curved.[Means for Solution] A system having an imaging unit 20 having a line sensor 22 and scanning the surface of an object being inspected 101 in a direction perpendicular to the direction of extension of the line sensor 22 and outputting a density signal for each pixel from the line sensor 22 and a processing unit 50 processing the density signal from the line sensor 22 of the imaging unit 20, the processing unit 50 having a means for acquiring a pixel density value based on a density signal from the line sensor 22 (S2) and a density state generating means for generating a density state information Pf showing the density state in the scan direction of the object surface based on all of the pixel density values acquired for the object surface 101 being inspected (S7).
摘要翻译： [问题]提供一种表面粗糙度检查系统，即使被检查物体的表面弯曲，也能够进行适当的检查。 [解决方案]具有成像单元20的系统具有线传感器22，并且在垂直于线传感器22的延伸方向的方向上扫描被检查物体101的表面，并输出每个像素的浓度信号线传感器22和处理单元50处理来自成像单元20的线传感器22的浓度信号，处理单元50具有用于基于来自线传感器22的密度信号获取像素密度值的装置（S2）密度状态产生装置，用于基于对被检测物体表面101获得的所有像素密度值，生成表示物体表面的扫描方向上的浓度状态的浓度状态信息Pf（S7）。

8. 发明授权

US07279719B2 Light emitting diode 有权
标题翻译：发光二极管
公开(公告)号：US07279719B2
公开(公告)日：2007-10-09
申请号：US10393024
申请日：2003-03-21
申请人： Yoshinobu Suehiro , Hideki Mori , Tatsuya Takashima
发明人： Yoshinobu Suehiro , Hideki Mori , Tatsuya Takashima
IPC分类号： H01L29/22
CPC分类号： H01L33/60 , H01L33/486 , H01L33/507 , H01L2224/48091 , H01L2224/48227 , H01L2224/48465 , H01L2924/181 , H01L2924/1815 , Y10S428/917 , H01L2924/00014 , H01L2924/00 , H01L2924/00012
摘要： A counter reflecting surface is provided opposite to a light emitting element in its light emitting surface. A side reflecting member having an inclined reflecting surface is provided apart from and so as to surround the light emitting element. A phosphor layer is provided on the counter reflecting surface and the reflecting surface of the side reflecting member.
摘要翻译：反射面相对于其发光面的发光元件设置。具有倾斜的反射表面的侧反射部件设置成围绕发光元件并且围绕发光元件。荧光体层设置在反射反射面和侧面反射部件的反射面上。

9. 发明申请

US20070216802A1 IMAGE PROCESSING APPARATUS AND METHOD AND PROGRAM 失效
标题翻译：图像处理设备及方法与程序
公开(公告)号：US20070216802A1
公开(公告)日：2007-09-20
申请号：US11687294
申请日：2007-03-16
申请人： Tetsujiro Kondo , Masashi Uchida , Takuo Morimura , Daisuke Kikuchi , Takeshi Miyai , Hideo Kasama , Takeshi Kunihiro , Yoshiaki Nakamura , Hideki Mori , Yasuhiko Suga , Kenichiro Hosokawa , Shizuo Chikaoka
发明人： Tetsujiro Kondo , Masashi Uchida , Takuo Morimura , Daisuke Kikuchi , Takeshi Miyai , Hideo Kasama , Takeshi Kunihiro , Yoshiaki Nakamura , Hideki Mori , Yasuhiko Suga , Kenichiro Hosokawa , Shizuo Chikaoka
IPC分类号： H04N7/01
CPC分类号： H04N7/014 , H04N5/144 , H04N7/012
摘要： An image processing apparatus includes a converter converting an interlace image including a first number of pixels into a first progressive image, an interpolator interpolating the first progressive image to generate a second progressive image including a second number of pixels, a classification unit classifying, in accordance with a feature of the second progressive image, into classes, subject pixels forming a third progressive image, which serves as a target image, including the second number of pixels and having a quality higher than the second progressive image, a storage unit storing a prediction coefficient for each of the classes obtained by conducting learning using a plurality of progressive images, each including the second number of pixels, and a computation unit performing computation using the second progressive image and the prediction coefficient for each of the classes to determine the third progressive image from the second progressive image.
摘要翻译：图像处理装置包括将包括第一数量的像素的隔行扫描图像转换为第一逐行图像的转换器，内插第一逐行图像的内插器，以生成包括第二数量的像素的第二逐行图像;分类单元，具有第二渐进图像的特征的类别，形成第三逐行图像的被摄体像素，其用作包括第二数量的像素并且具有高于第二逐行图像的质量的目标图像;存储单元，其存储预测使用多个逐行图像进行学习而获得的每个类别的系数，每个逐行图像包括第二数量的像素;以及计算单元，使用第二逐行图像和每个类别的预测系数执行计算，以确定第三渐进图像来自第二个渐进图像的图像。

10. 发明授权

US07122861B2 Semiconductor device and manufacturing method thereof 失效
标题翻译：半导体装置及其制造方法
公开(公告)号：US07122861B2
公开(公告)日：2006-10-17
申请号：US11086174
申请日：2005-03-22
申请人： Hideki Mori
发明人： Hideki Mori
IPC分类号： H01L29/76 , H01L21/336
CPC分类号： H01L29/7816 , H01L29/0638 , H01L29/0878 , H01L29/0882 , H01L29/0886 , H01L29/1095 , H01L29/456 , H01L29/66681
摘要： The present invention relates to a semiconductor device including a high withstand voltage MOS transistor and a manufacturing method thereof. The semiconductor device according to the present invention includes a MOS transistor in which a second-conductivity type source region is formed on a first-conductivity type semiconductor region, an offset drain region is interconnected to a second-conductivity type drain region and has a concentration lower than an impurity concentration of a drain region, the offset drain region is composed of a portion that does not overlap a first-conductivity type semiconductor region and a portion that overlaps part of the surface of the first-conductivity type semiconductor region and a gate electrode is formed on the surface extending from a channel region between the source region and the offset drain region to part of the offset drain region through a gate insulating film.Thus, there can be obtained an offset drain type MOS transistor having a stable threshold voltage Vth and a low ON-state resistance.
摘要翻译：本发明涉及一种包括高耐压MOS晶体管的半导体器件及其制造方法。根据本发明的半导体器件包括MOS晶体管，其中在第一导电型半导体区域上形成第二导电型源极区，偏移漏极区域与第二导电型漏极区域互连，并且具有浓度低于漏极区域的杂质浓度的情况下，偏移漏极区域由不与第一导电型半导体区域重叠的部分和与第一导电型半导体区域的表面的一部分重叠的部分构成，电极形成在通过栅极绝缘膜从源极区域和偏移漏极区域之间的沟道区域延伸到偏移漏极区域的一部分的表面上。因此，可以获得具有稳定阈值电压Vth和低导通电阻的偏移漏极型MOS晶体管。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式