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    • 2. 发明授权
    • System and method for performing sputter deposition with multiple targets using independent ion and electron sources and independent target biasing with DC pulse signals
    • 使用独立离子和电子源执行多个靶的溅射沉积的系统和方法以及具有DC脉冲信号的独立目标偏置
    • US06679976B2
    • 2004-01-20
    • US10137897
    • 2002-05-02
    • David Alan BaldwinTodd Lanier Hylton
    • David Alan BaldwinTodd Lanier Hylton
    • C23C1434
    • H01J37/3233C23C14/46C23C14/54H01J37/3178H01J37/34
    • A system and method for performing sputter deposition includes at least one ion source that generates at least one ion current directed at first and second targets, at least one electron source that generates at least one electron current directed at the first and second targets, and circuitry that biases the first and second targets with independent first and second DC voltage pulse signals. A first current sensor, coupled to the biasing circuitry, monitors a positive current and a negative current from the first target during one or more cycles of the first DC voltage pulse signal, and a second current sensor, coupled to the biasing circuitry, monitors a positive current and a negative current from the second target during one or more cycles of the second DC voltage pulse signal. A controller, coupled to the first and second current sensors, varies the at least one ion current independently from the at least one electron current.
    • 用于执行溅射沉积的系统和方法包括至少一个离子源,其产生指向第一和第二靶的至少一个离子电流,至少一个电子源,其产生指向第一和第二靶的至少一个电子电流,以及电路 它利用独立的第一和第二直流电压脉冲信号偏置第一和第二目标。 耦合到偏置电路的第一电流传感器在第一DC电压脉冲信号的一个或多个周期期间监测来自第一目标的正电流和负电流,并且耦合到偏置电路的第二电流传感器监视一个 在第二DC电压脉冲信号的一个或多个周期期间来自第二目标的正电流和负电流。 耦合到第一和第二电流传感器的控制器独立于至少一个电子电流改变至少一个离子电流。
    • 4. 发明授权
    • System and method for performing sputter etching using independent ion and electron sources and a substrate biased with an a-symmetric bi-polar DC pulse signal
    • 使用独立离子和电子源进行溅射蚀刻的系统和方法以及用对称双极性DC脉冲信号偏置的衬底
    • US07316764B2
    • 2008-01-08
    • US10812409
    • 2004-03-29
    • David Alan BaldwinTodd Lanier Hylton
    • David Alan BaldwinTodd Lanier Hylton
    • C23C14/35
    • C23C14/46C23C14/54H01J37/3178H01J37/3233H01J37/34
    • A system and method for performing sputter etching includes an ion source that generates an ion current that is directed at a substrate and an electron source that generates an electron current directed at the substrate. Biasing circuitry biases the substrate with an a-symmetric bi-polar DC voltage pulse signal. The biasing circuitry is formed from a positive voltage source with respect to ground, a negative voltage source with respect to ground and a high frequency switch. At least one current sensor, coupled to the biasing circuitry, monitors a positive current and a negative current from the substrate during one or more cycles of the a-symmetric bi-polar DC voltage pulse signal. A control system, coupled to the at least one current sensor, varies the ion current independently from the electron current. The ion and electron sources create a continuous plasma that is proximate the substrate and the biasing circuitry causes the substrate to alternatively attract ions and electrons from the plasma. The ions attracted from the plasma sputter etch the substrate. The electrons attracted from the plasma neutralize accumulated charge on the substrate.
    • 用于执行溅射蚀刻的系统和方法包括产生针对衬底的离子电流的离子源和产生指向衬底的电子电流的电子源。 偏置电路利用对称双极直流电压脉冲信号来偏置衬底。 偏置电路由相对于地的正电压源,相对于地的负电压源和高频开关形成。 耦合到偏置电路的至少一个电流传感器在a对称双极性DC电压脉冲信号的一个或多个周期期间监测来自衬底的正电流和负电流。 耦合到至少一个电流传感器的控制系统独立于电子电流改变离子电流。 离子和电子源产生邻近衬底的连续等离子体,并且偏置电路使衬底交替地从等离子体吸引离子和电子。 从等离子体溅射吸引的离子蚀刻衬底。 从等离子吸引的电子可以中和基板上的累积电荷。
    • 8. 发明授权
    • Multi-channel optical filter and multiplexer formed from stacks of thin-film layers
    • 由多层薄膜层组成的多通道滤光器和多路复用器
    • US06819871B1
    • 2004-11-16
    • US09810998
    • 2001-03-16
    • David Alan BaldwinTodd Lanier Hylton
    • David Alan BaldwinTodd Lanier Hylton
    • H04J1402
    • G02B6/29367G02B5/281G02B6/2938
    • A multi-channel optical device includes a first plurality of optical structures formed simultaneously using vapor deposition on different regions of a common substrate. Each optical structure in the plurality is comprised of a plurality of thin-film layers. The thickness of each layer in a given optical structure corresponds to a wavelength associated with one of the channels. A reflector has a surface parallel to the common substrate, and a transport region is disposed between the first plurality of optical structures and the reflector. An aperture is disposed at one end of the transport region, and the first plurality of optical structures are disposed along a length of the transport region. When an input optical signal is provided to the aperture, the device functions as an optical demultiplexer and output optical signals associated with different ones of the channels are generated at separate positions along a length of the transport region. When input optical signals are applied to separate positions along the length of the transport region, the device functions as an optical multiplexer and those input optical signals are combined in the transport region and output as a combined optical output signal at the aperture.
    • 多通道光学器件包括在公共衬底的不同区域上同时使用气相沉积形成的第一多个光学结构。 多个中的每个光学结构由多个薄膜层组成。 给定光学结构中每层的厚度对应于与一个通道相关联的波长。 反射器具有平行于公共基板的表面,并且传输区域设置在第一多个光学结构和反射器之间。 孔位于输送区的一端,第一多个光学结构沿输送区的长度设置。 当向孔径提供输入光信号时,该装置用作光解复用器,并且在沿着传送区域的长度的分开的位置处产生与不同信道相关联的输出光信号。 当输入光信号被施加到沿着传输区域的长度的分离位置时,该器件用作光复用器,并且这些输入光信号在传输区域中组合并作为光圈处的组合光输出信号输出。
    • 9. 发明授权
    • System and method for making thin-film structures using a stepped profile mask
    • 使用阶梯轮廓掩模制造薄膜结构的系统和方法
    • US06689255B2
    • 2004-02-10
    • US10166532
    • 2002-06-10
    • David Alan BaldwinTodd Lanier Hylton
    • David Alan BaldwinTodd Lanier Hylton
    • C23C1434
    • C23C14/547C23C14/044
    • A system and method for manufacturing thin-film structures disposed on a substrate. The thin-film structures have different respective thicknesses that vary along a radius of the substrate. A substrate rotates about an axis of rotation and a source of deposited material is directed at the rotating substrate. A mask having a stepped profile is positioned between the rotating substrate and the source. The stepped mask selectively blocks material emanating from the source from reaching the substrate. Each step of the profile of the mask corresponds to one of the respective thicknesses of the thin-film structures. The radius along which the different respective thicknesses of the film-thin structures vary is measured from the axis of rotation of the rotating substrate, and the substrate includes at least one wafer having a center that is either coincident or offset from the axis of rotation.
    • 一种用于制造设置在基板上的薄膜结构的系统和方法。 薄膜结构具有不同的各自的厚度,其沿衬底的半径变化。 衬底围绕旋转轴线旋转,并且沉积材料源指向旋转衬底。 具有阶梯轮廓的掩模位于旋转基底和源之间。 阶梯式掩模选择性地阻挡从源发出的材料到达衬底。 掩模的轮廓的每个步骤对应于薄膜结构的相应厚度之一。 薄膜结构的各个不同厚度的不同厚度的半径是从旋转基板的旋转轴测量的,并且基板包括具有与旋转轴线重合或偏离的中心的至少一个晶片。