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    • 8. 发明授权
    • Methods for determining the depth of defects
    • 确定缺陷深度的方法
    • US06874932B2
    • 2005-04-05
    • US10609812
    • 2003-06-30
    • John William DevittAnthony S. BaucoCraig Alan CantelloKevin G. Harding
    • John William DevittAnthony S. BaucoCraig Alan CantelloKevin G. Harding
    • G01N25/72
    • G01N25/72
    • A method facilitates inspection of a component surface. The method comprises positioning a surface of the component to be inspected in an optical path of at least one infrared radiation detector, heating the component surface using electromagnetic radiation to cause an increase in radiance from a defect present at the component surface, and detecting temperature variations within the component surface using the at least one infrared radiation detector, such that the surface irradiance is measured at predetermined locations across the component surface. The method further comprises detecting cracks in the component by analyzing radiation transient response data received by the infrared radiation detector, and correlating the temperature variations to the radiation transient response data to determine a depth of the detected cracks.
    • 一种方法便于检查部件表面。 该方法包括将待检查的部件的表面定位在至少一个红外辐射检测器的光路中,使用电磁辐射来加热部件表面,以使得从部件表面处存在的缺陷引起的辐射度增加,以及检测温度变化 在所述部件表面内使用所述至少一个红外辐射检测器,使得在组件表面上的预定位置处测量表面辐照度。 该方法还包括通过分析由红外辐射检测器接收的辐射瞬态响应数据来检测部件中的裂纹,并将温度变化与辐射瞬态响应数据相关联以确定检测到的裂纹的深度。