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    • 1. 发明申请
    • Optical ranging sensor and warm water wash toilet seat
    • 光学测距传感器和温水洗马桶座
    • US20070210267A1
    • 2007-09-13
    • US11710986
    • 2007-02-27
    • Kentaroh IshiiIsamu OhkuboAkifumi Yamaguchi
    • Kentaroh IshiiIsamu OhkuboAkifumi Yamaguchi
    • G01N21/86G01V8/00
    • G01S17/48
    • A light receiving device 12 that receives reflected light condensed by a light receiving condenser means 14 has two first and second electrodes 15, 16 provided on a light receiving surface at prescribed intervals along a baseline that connects a light emitting device 11 with the light receiving device and a resistive region 21 provided between the two electrodes. An electric charge generated at the incident position of light incident on the light receiving surface of the light receiving device 12 becomes a photo current and outputted from the first and second electrodes 15, 16 via the resistive region 21. The resistance value of the resistive region 21 of the light receiving device 12 is distributed so as to be roughly inversely proportional to a distance from the optical axis of the light receiving condenser means 14 to the incident position of a light spot on the light receiving surface.
    • 接收由受光聚光器装置14会聚的反射光的光接收装置12具有沿着将发光装置11与光接收装置连接的基线以规定间隔设置在受光面上的两个第一和第二电极15,16 以及设置在两个电极之间的电阻区域21。 在入射到光接收装置12的光接收表面的光的入射位置处产生的电荷变成光电流,并且经由电阻区域21从第一和第二电极15,16输出。 光接收装置12的电阻区域21的电阻值被分布成与从光接收电容器14的光轴到光接收表面上的光点的入射位置大致成反比 。
    • 2. 发明授权
    • Light receiving element and light receiving device incorporating circuit and optical disk drive
    • 光接收元件和光接收装置并入电路和光盘驱动器
    • US07307326B2
    • 2007-12-11
    • US10499357
    • 2002-12-10
    • Shigeki HayashidaTatsuya MoriokaYoshihiko TaniIsamu OhkuboHideo Wada
    • Shigeki HayashidaTatsuya MoriokaYoshihiko TaniIsamu OhkuboHideo Wada
    • H01L31/00H01L31/0232
    • H01L31/103H01L31/02161
    • A light receiving device includes a silicon substrate, a first P type diffusion layer on the silicon substrate, and a P type semiconductor layer on the P type diffusion layer. On a surface part of the P type semiconductor layer, two N type diffusion layers as light receiving parts, and a second P type diffusion layer between the two N type diffusion layers are provided. On the P type semiconductor layer, an antireflection film structure composed of a first silicon oxide formed by thermal oxidation and a second silicon oxide formed by CVD is provided. A film thickness of the first silicon oxide is set at about 15 nm, thus a defect in a interface between the first silicon oxide and the P type semiconductor layer is prevented. A film thickness of the second silicon oxide is set at about 100 nm, thus a leak current between cathodes is prevented when a power supply voltage is applied for long period of time.
    • 光接收装置包括硅衬底,硅衬底上的第一P型扩散层和P型扩散层上的P型半导体层。 在P型半导体层的表面部分设置有作为光接收部的两个N型扩散层和在两个N型扩散层之间的第二P型扩散层。 在P型半导体层上,提供了由通过热氧化形成的第一氧化硅和通过CVD形成的第二氧化硅构成的抗反射膜结构。 第一氧化硅的膜厚设定为约15nm,因此防止了第一氧化硅与P型半导体层之间的界面的缺陷。 第二氧化硅的膜厚设定为约100nm,因此长时间施加电源电压时,能够防止阴极之间的漏电流。
    • 6. 发明授权
    • Circuit-integrated light-receiving device
    • 电路集成光接收装置
    • US06313484B1
    • 2001-11-06
    • US09472886
    • 1999-12-28
    • Isamu OhkuboMasaru KuboNaoki FukunagaTakahiro TakimotoMutsumi OkaToshimitsu Kasamatsu
    • Isamu OhkuboMasaru KuboNaoki FukunagaTakahiro TakimotoMutsumi OkaToshimitsu Kasamatsu
    • H01L2715
    • H01L27/1443
    • A circuit-integrated light-receiving device of the present invention includes: a semiconductor substrate of a first conductivity type; a first semiconductor crystal growth layer of the first conductivity type provided on a surface of the semiconductor substrate, wherein the first semiconductor crystal growth layer includes a first portion whose impurity concentration gradually decreases in a direction away from the surface of the semiconductor substrate and a second portion located in a first region above the first portion whose impurity concentration distribution is uniform in a depth direction; a buried diffusion layer of the first conductivity type located in a second region which is above the first portion of the first semiconductor crystal growth layer and does not overlap the first region; a second semiconductor crystal growth layer of a second conductivity type which is provided across a surface of the first semiconductor crystal growth layer and a surface of the buried diffusion layer; and a separation diffusion region having the first conductivity type for dividing the second semiconductor crystal growth layer into a light-receiving device section and a signal processing circuit section. The first region is located in the light-receiving device section. In the signal processing circuit section, the buried diffusion layer is in contact with the first portion of the first semiconductor crystal growth layer.
    • 本发明的电路集成光接收装置包括:第一导电类型的半导体衬底; 设置在所述半导体衬底的表面上的第一导电类型的第一半导体晶体生长层,其中所述第一半导体晶体生长层包括其杂质浓度在远离所述半导体衬底的表面的方向上逐渐减小的第一部分,以及第二半导体晶体生长层 位于第一部分上方的第一部分的部分,其杂质浓度分布在深度方向上是均匀的; 位于第一半导体晶体生长层的第一部分之上并且不与第一区域重叠的第二区域中的第一导电类型的掩埋扩散层; 设置在第一半导体晶体生长层的表面和掩埋扩散层的表面之间的第二导电类型的第二半导体晶体生长层; 以及具有第一导电类型的分离扩散区域,用于将第二半导体晶体生长层分割成光接收装置部分和信号处理电路部分。 第一区域位于光接收装置部分中。 在信号处理电路部中,埋入扩散层与第一半导体晶体生长层的第一部分接触。
    • 7. 发明授权
    • Optical encoder photodetector array with multiple resolutions
    • 具有多种分辨率的光学编码器光电探测器阵列
    • US07301142B2
    • 2007-11-27
    • US11499696
    • 2006-08-07
    • Koichi ShichiIsamu Ohkubo
    • Koichi ShichiIsamu Ohkubo
    • G01D5/34
    • H03M1/301G01D5/36H03M1/485
    • A photodetector for an optical encoder has plural sets of segmented photodiodes, each set of which is made by two adjoining segmented photodiodes capable of coping with a scale slit having a reference resolution. Output lines of the two adjoining segmented photodiodes are connected together in each set of the photodiodes. These output lines are connected to output lines of the corresponding segmented photodiodes in the other sets. The two adjoining segmented photodiodes function like one segmented photodiode, and thereby, the resolution of the applied scale slit is made ½ of the reference resolution. Thus, this photodetector easily copes with a scale slit having a half resolution of the reference resolution at low cost only by modification of wiring without changing any configuration of the segmented photodiodes.
    • 用于光学编码器的光电检测器具有多组分段光电二极管,每组由两个相邻的分段光电二极管制成,能够对准具有参考分辨率的刻度狭缝。 两个相邻的分段光电二极管的输出线在每组光电二极管中连接在一起。 这些输出线连接到其他组中对应的分段光电二极管的输出线。 两个相邻的分段光电二极管的功能类似于一个分段的光电二极管,因此,施加的刻度狭缝的分辨率为参考分辨率的1/2。 因此,该光电检测器仅通过修改布线而容易地处理具有参考分辨率的半分辨率的刻度狭缝,而不改变分段光电二极管的任何配置。
    • 9. 发明授权
    • Light sensitive element and light sensitive element having internal circuitry
    • 具有内部电路的光敏元件和光敏元件
    • US06404029B1
    • 2002-06-11
    • US09656461
    • 2000-09-06
    • Makoto HosokawaNaoki FukunagaTakahiro TakimotoMasaru KuboToshihiko FukushimaIsamu Ohkubo
    • Makoto HosokawaNaoki FukunagaTakahiro TakimotoMasaru KuboToshihiko FukushimaIsamu Ohkubo
    • H01L2714
    • H01L27/1443H01L31/0352
    • A photosensitive device includes a semiconductor substrate and a first semiconductor layer, both of a first conductivity type, with the semiconductor layer being formed on the semiconductor substrate and having a lower impurity concentration than that of the semiconductor substrate. A second semiconductor layer, of a second conductivity type, is formed on the first semiconductor layer and at least one diffusion layer of the first conductivity type is formed from the surface of the second semiconductor layer so as to reach the surface of the first semiconductor layer. The diffusion layer subdivides the second semiconductor layer into a plurality of semiconductor regions At least one photodiode portion for converting signal light into an electrical signal is formed at a junction between at least one of the plurality of semiconductor regions and the first semiconductor layer. A depletion layer which is formed in the first semiconductor layer when a reverse bias voltage is applied to the at least one photodiode portion has a field intensity of about 0.3 V/&mgr;m or more.
    • 光敏器件包括半导体衬底和第一半导体层,它们都是第一导电型,半导体层形成在半导体衬底上,杂质浓度低于半导体衬底的半导体层。 第二导电类型的第二半导体层形成在第一半导体层上,并且从第二半导体层的表面形成至少一个第一导电类型的扩散层,以到达第一半导体层的表面 。 扩散层将第二半导体层细分为多个半导体区域在多个半导体区域和第一半导体层中的至少一个之间的接合处形成至少一个用于将信号光转换成电信号的光电二极管部分。 当向至少一个光电二极管部分施加反向偏置电压时,在第一半导体层中形成的耗尽层具有约0.3V / m 2以上的场强度。