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    • 1. 发明授权
    • Optical encoder photodetector array with multiple resolutions
    • 具有多种分辨率的光学编码器光电探测器阵列
    • US07301142B2
    • 2007-11-27
    • US11499696
    • 2006-08-07
    • Koichi ShichiIsamu Ohkubo
    • Koichi ShichiIsamu Ohkubo
    • G01D5/34
    • H03M1/301G01D5/36H03M1/485
    • A photodetector for an optical encoder has plural sets of segmented photodiodes, each set of which is made by two adjoining segmented photodiodes capable of coping with a scale slit having a reference resolution. Output lines of the two adjoining segmented photodiodes are connected together in each set of the photodiodes. These output lines are connected to output lines of the corresponding segmented photodiodes in the other sets. The two adjoining segmented photodiodes function like one segmented photodiode, and thereby, the resolution of the applied scale slit is made ½ of the reference resolution. Thus, this photodetector easily copes with a scale slit having a half resolution of the reference resolution at low cost only by modification of wiring without changing any configuration of the segmented photodiodes.
    • 用于光学编码器的光电检测器具有多组分段光电二极管,每组由两个相邻的分段光电二极管制成,能够对准具有参考分辨率的刻度狭缝。 两个相邻的分段光电二极管的输出线在每组光电二极管中连接在一起。 这些输出线连接到其他组中对应的分段光电二极管的输出线。 两个相邻的分段光电二极管的功能类似于一个分段的光电二极管,因此,施加的刻度狭缝的分辨率为参考分辨率的1/2。 因此,该光电检测器仅通过修改布线而容易地处理具有参考分辨率的半分辨率的刻度狭缝,而不改变分段光电二极管的任何配置。
    • 3. 发明授权
    • Light sensitive element and light sensitive element having internal circuitry
    • 具有内部电路的光敏元件和光敏元件
    • US06404029B1
    • 2002-06-11
    • US09656461
    • 2000-09-06
    • Makoto HosokawaNaoki FukunagaTakahiro TakimotoMasaru KuboToshihiko FukushimaIsamu Ohkubo
    • Makoto HosokawaNaoki FukunagaTakahiro TakimotoMasaru KuboToshihiko FukushimaIsamu Ohkubo
    • H01L2714
    • H01L27/1443H01L31/0352
    • A photosensitive device includes a semiconductor substrate and a first semiconductor layer, both of a first conductivity type, with the semiconductor layer being formed on the semiconductor substrate and having a lower impurity concentration than that of the semiconductor substrate. A second semiconductor layer, of a second conductivity type, is formed on the first semiconductor layer and at least one diffusion layer of the first conductivity type is formed from the surface of the second semiconductor layer so as to reach the surface of the first semiconductor layer. The diffusion layer subdivides the second semiconductor layer into a plurality of semiconductor regions At least one photodiode portion for converting signal light into an electrical signal is formed at a junction between at least one of the plurality of semiconductor regions and the first semiconductor layer. A depletion layer which is formed in the first semiconductor layer when a reverse bias voltage is applied to the at least one photodiode portion has a field intensity of about 0.3 V/&mgr;m or more.
    • 光敏器件包括半导体衬底和第一半导体层,它们都是第一导电型,半导体层形成在半导体衬底上,杂质浓度低于半导体衬底的半导体层。 第二导电类型的第二半导体层形成在第一半导体层上,并且从第二半导体层的表面形成至少一个第一导电类型的扩散层,以到达第一半导体层的表面 。 扩散层将第二半导体层细分为多个半导体区域在多个半导体区域和第一半导体层中的至少一个之间的接合处形成至少一个用于将信号光转换成电信号的光电二极管部分。 当向至少一个光电二极管部分施加反向偏置电压时,在第一半导体层中形成的耗尽层具有约0.3V / m 2以上的场强度。
    • 5. 发明申请
    • Photodetector for optical encoder
    • 光学编码器光电探测器
    • US20060266931A1
    • 2006-11-30
    • US11499696
    • 2006-08-07
    • Koichi ShichiIsamu Ohkubo
    • Koichi ShichiIsamu Ohkubo
    • H01J40/14G01D5/34
    • H03M1/301G01D5/36H03M1/485
    • A photodetector for an optical encoder has plural sets of segmented photodiodes, each set of which is made by two adjoining segmented photodiodes capable of coping with a scale slit having a reference resolution. Output lines of the two adjoining segmented photodiodes are connected together in each set of the photodiodes. These output lines are connected to output lines of the corresponding segmented photodiodes in the other sets. The two adjoining segmented photodiodes function like one segmented photodiode, and thereby, the resolution of the applied scale slit is made ½ of the reference resolution. Thus, this photodetector easily copes with a scale slit having a half resolution of the reference resolution at low cost only by modification of wiring without changing any configuration of the segmented photodiodes.
    • 用于光学编码器的光电检测器具有多组分段光电二极管,每组由两个相邻的分段光电二极管制成,能够对准具有参考分辨率的刻度狭缝。 两个相邻的分段光电二极管的输出线在每组光电二极管中连接在一起。 这些输出线连接到其他组中对应的分段光电二极管的输出线。 两个相邻的分段光电二极管的功能类似于一个分段的光电二极管,因此,施加的刻度狭缝的分辨率为参考分辨率的1/2。 因此,该光电检测器仅通过修改布线而容易地处理具有参考分辨率的半分辨率的刻度狭缝,而不改变分段光电二极管的任何配置。
    • 8. 发明授权
    • Photodiode device including window defined in passivation layer for removing electrostatic charge
    • 光电二极管器件包括在钝化层中定义的窗口,用于去除静电电荷
    • US06873025B2
    • 2005-03-29
    • US09984657
    • 2001-10-30
    • Hideo WadaIsamu OhkuboKazuhiro NatsuakiNaoki FukunagaShigeki Hayashida
    • Hideo WadaIsamu OhkuboKazuhiro NatsuakiNaoki FukunagaShigeki Hayashida
    • H01L27/14H01L29/40H01L29/88H01L31/0216H01L31/06H01L31/10
    • H01L31/02161
    • A photodiode includes a first conductivity type semiconductor substrate or a first conductivity type semiconductor layer; a second conductivity type semiconductor layer provided on the first conductivity type semiconductor substrate or the first conductivity type semiconductor layer; an anti-reflection film provided on a surface of a portion of the second conductivity type semiconductor layer which is in a light receiving area; a first conductive layer provided in an area in the vicinity of the light receiving area; and a passivation layer provided on the first conductive layer. Light incident on the photodiode is detected by a junction of the one of the first conductivity type semiconductor substrate and the first conductivity type semiconductor layer, and the second conductivity type semiconductor layer. The area in the vicinity of the light receiving area includes a window area having an opening in the passivation layer for partially exposing the first conductive layer.
    • 光电二极管包括第一导电类型半导体衬底或第一导电类型半导体层; 设置在所述第一导电型半导体基板或所述第一导电型半导体层上的第二导电型半导体层; 设置在所述第二导电型半导体层的位于光接收区域的部分的表面上的防反射膜; 设置在所述光接收区域附近的区域中的第一导电层; 以及设置在第一导电层上的钝化层。 通过第一导电类型半导体衬底和第一导电类型半导体层之一以及第二导电类型半导体层的接合来检测入射在光电二极管上的光。 光接收区域附近的区域包括在钝化层中具有用于部分地暴露第一导电层的开口的窗口区域。