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    • 6. 发明申请
    • ORGANIC EL DEVICE
    • 有机EL设备
    • US20120181526A1
    • 2012-07-19
    • US13498525
    • 2010-09-22
    • Kenji KasaharaMasaya Shimizu
    • Kenji KasaharaMasaya Shimizu
    • H01L51/52
    • H01L51/5092H01L27/3246H01L51/5231H01L51/524
    • The present invention provides an organic EL device. The organic EL device is provided with a first substrate, an anode that is located on the first substrate, a light emitting layer that is located on the anode, a partition wall that is formed of an insulating material and partitions the light emitting layer, a cathode that covers the light emitting layer and extends on the partition wall, and a second substrate that is superimposed onto the first substrate via a seal member, and in this structure, the cathode has a multilayer structure including an electron injection layer that injects electrons to the light emitting layer, and at least one electrically conductive layer, and the electron injection layer covers the light emitting layer, and the at least one electrically conductive layer covers the electron injection layer.
    • 本发明提供一种有机EL器件。 有机EL元件设置有第一基板,位于第一基板上的阳极,位于阳极上的发光层,由绝缘材料形成并分隔发光层的分隔壁, 阴极,其覆盖发光层并在分隔壁上延伸;以及第二基板,其经由密封构件叠加在第一基板上,并且在该结构中,阴极具有多层结构,该多层结构包括将电子注入的电子注入层 所述发光层和至少一个导电层,并且所述电子注入层覆盖所述发光层,并且所述至少一个导电层覆盖所述电子注入层。
    • 7. 发明申请
    • Group III-V compound semiconductor and method for producing the same
    • III-V族化合物半导体及其制造方法
    • US20060022308A1
    • 2006-02-02
    • US11140236
    • 2005-05-27
    • Masaya ShimizuShinichi MorishimaMakoto Sasaki
    • Masaya ShimizuShinichi MorishimaMakoto Sasaki
    • H01L29/12
    • C30B25/02C30B25/18C30B29/403H01L21/0237H01L21/02458H01L21/02513H01L21/0254H01L21/02573H01L21/0262H01L33/007
    • A Group III-V compound semiconductor includes, at least, a substrate, a buffer layer of the general formula InuGavAlwN (wherein, 0≦u≦1, 0≦v≦1, 0≦w≦1, u+v+w=1) and a Group III-V compound semiconductor crystal layer of the general formula InxGayAlzN (wherein, 0≦x≦1, 0≦y≦1, 0≦z≦1, x+y+z=1), in this order, wherein the buffer layer has a thickness of at least about 5 Å and not more than about 90 Å. A method is provided for producing the Group III-V compound semiconductor, including forming a buffer layer of the general formula InuGavAlwN on a substrate to give a thickness of at least about 5 Å and not more than about 90 Å at temperatures lower than the growing temperature of the compound semiconductor crystal layer before growing the compound semiconductor crystal layer, and then growing a Group III-V compound semiconductor crystal layer of the general formula InxGayAlzN on the buffer layer.
    • III-V族化合物半导体至少包括基底,通式为AlN的缓冲层 (其中,0≤u≤1,0<=v≤1,0<= w <= 1,u + v + w =​​ 1)和通式为In的III-V族化合物半导体晶体层 (其中,0≤x≤1,0<= y <=1,0.0≤z <= 1,x + y + z = 1),其中缓冲层具有至少约和不大于约的厚度。 提供了用于制备III-V族化合物半导体的方法,包括形成通式为III-V族化合物半导体的缓冲层, N,在生长化合物半导体晶体层之前,在比化合物半导体晶体层的生长温度低的温度下,给出至少约不小于约90的厚度,然后生长III-V族 在缓冲层上具有通式为Al x Ga y Al y Al z的化合物半导体晶体层。
    • 10. 发明授权
    • Test system for optical line which carries out fault search for optical line from user optical terminal side
    • 用户光端机进行光线故障检测的光线测试系统
    • US07167237B2
    • 2007-01-23
    • US10524067
    • 2004-06-28
    • Masaya ShimizuHiroaki EndoTakashi Sakamoto
    • Masaya ShimizuHiroaki EndoTakashi Sakamoto
    • G01N21/00
    • G01M11/3154G01M11/3136H04B10/071
    • A fault searching system searches for a fault in an optical line connected with an optical fiber carrying out data transmission between a transmission apparatus and a user optical terminal. A connecting unit detaches a terminal portion of the optical line at the user optical terminal, and connects an OTDR to the terminal portion of the optical line. At least one of a test light with a wavelength different from a wavelength of light used for data transmission in the optical line, and a test light whose peak level is less than or equal to a predetermined level, is caused to be incident upon the terminal portion of the optical line. A searching unit searches for a fault in the optical line from the user optical terminal side by detecting backward scattering light or return light from the optical line produced by the test light caused by the OTDR.
    • 故障搜索系统在与发送装置和用户光学终端之间进行数据传输的光纤连接的光线路中寻找故障。 连接单元将用户光学终端处的光线路的终端部分分离,并将OTDR连接到光线路的终端部分。 在光线路中用于数据传输的光波长不同的测试光和峰值电平小于或等于预定电平的测试光中的至少一个被入射到终端 部分光路。 搜索单元通过检测由OTDR引起的由测试光产生的光线路的反向散射光或返回光,从用户光学终端侧检索光线路中的故障。