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1. 发明授权

US07275197B2 Testing apparatus 失效
标题翻译：测试仪器
公开(公告)号：US07275197B2
公开(公告)日：2007-09-25
申请号：US11048632
申请日：2005-02-01
申请人： Kenji Inaba , Masashi Miyazaki
发明人： Kenji Inaba , Masashi Miyazaki
IPC分类号： G01R31/28 , G06F11/00 , G01R27/28
CPC分类号： G01R31/31907 , G01R31/3167 , G01R31/31905 , G01R31/31908 , G01R31/31926 , H04B17/0085 , H04B17/17 , H04B17/20
摘要： A testing apparatus including a plurality of testing module slots to which different types of testing modules for testing a device under test are optionally mounted, includes an operation order holding unit for holding information indicating that a test operation by a first testing module should be performed before a test operation by a second testing module, a trigger return signal receiving unit for receiving a trigger return signal from the first testing module, the trigger return signal indicating that the first testing module has completed the test operation thereof, when the test operation of the first testing module has been completed, and a trigger signal supplying unit for supplying a trigger signal to the second testing module, the trigger signal indicating that the second testing module should start the test operation thereof, when the trigger return signal receiving unit receives the trigger return signal.
摘要翻译：一种测试装置，包括多个测试模块槽，可选地安装有用于测试被测设备的不同类型的测试模块的操作顺序保存单元，用于保存指示应该在第一测试模块之前执行测试操作的信息第二测试模块的测试操作，触发返回信号接收单元，用于从第一测试模块接收触发返回信号，触发返回信号指示第一测试模块已经完成了其测试操作，当测试操作第一测试模块已经完成，并且触发信号提供单元，用于向第二测试模块提供触发信号，触发信号指示第二测试模块应当开始其测试操作，当触发返回信号接收单元接收到触发返回信号。

2. 发明申请

US20050240852A1 Testing apparatus 失效
公开(公告)号：US20050240852A1
公开(公告)日：2005-10-27
申请号：US11048632
申请日：2005-02-01
申请人： Kenji Inaba , Masashi Miyazaki
发明人： Kenji Inaba , Masashi Miyazaki
IPC分类号： G01R31/28 , G01R31/3167 , G01R31/319 , G06F11/00
CPC分类号： G01R31/31907 , G01R31/3167 , G01R31/31905 , G01R31/31908 , G01R31/31926 , H04B17/0085 , H04B17/17 , H04B17/20
摘要： A testing apparatus including a plurality of testing module slots to which different types of testing modules for testing a device under test are optionally mounted, includes operation order holding means for holding information indicating that a test operation by a first testing module among the plurality of testing modules should be performed before a test operation by a second testing module among the plurality of testing modules, trigger return signal receiving means for receiving a trigger return signal from the first testing module, the trigger return signal indicating that the first testing module has completed the test operation thereof, when the test operation of the first testing module has been completed, and trigger signal supplying means for supplying a trigger signal to the second testing module, the trigger signal indicating that the second testing module should start the test operation thereof, when the trigger return signal receiving means receives the trigger return signal.

3. 发明申请

US20050193298A1 Testing apparatus 失效
标题翻译：测试仪器
公开(公告)号：US20050193298A1
公开(公告)日：2005-09-01
申请号：US10773562
申请日：2004-02-06
申请人： Kenji Inaba , Masashi Miyazaki
发明人： Kenji Inaba , Masashi Miyazaki
IPC分类号： G01R31/28 , G01R31/3167 , G01R31/319 , G06F11/00
CPC分类号： G01R31/31924 , G01R31/3167
摘要： A testing apparatus including a plurality of testing module slots to which different types of testing modules for testing a device under test are optionally mounted, includes operation order holding means for holding information indicating that a test operation by a first testing module among the plurality of testing modules should be performed before a test operation by a second testing module among the plurality of testing modules, trigger return signal receiving means for receiving a trigger return signal from the first testing module, the trigger return signal indicating that the first testing module has completed the test operation thereof, when the test operation of the first testing module has been completed, and trigger signal supplying means for supplying a trigger signal to the second testing module, the trigger signal indicating that the second testing module should start the test operation thereof, when the trigger return signal receiving means receives the trigger return signal.
摘要翻译：一种测试装置，包括多个测试模块槽，可选地安装有用于测试被测设备的不同类型的测试模块的操作顺序保持装置，用于保持指示在多个测试中由第一测试模块进行的测试操作的信息模块应在多个测试模块之间的第二测试模块进行测试操作之前进行，触发返回信号接收装置用于从第一测试模块接收触发返回信号，触发返回信号指示第一测试模块已经完成在第一测试模块的测试操作已经完成的情况下，以及用于向第二测试模块提供触发信号的触发信号提供装置，指示第二测试模块应该开始其测试操作的触发信号，当触发返回信号接收装置接收触发返回点燃

4. 发明授权

US07096139B2 Testing apparatus 失效
标题翻译：测试仪器
公开(公告)号：US07096139B2
公开(公告)日：2006-08-22
申请号：US10780286
申请日：2004-02-17
申请人： Masashi Miyazaki , Kenji Inaba , Toshiyuki Miura
发明人： Masashi Miyazaki , Kenji Inaba , Toshiyuki Miura
IPC分类号： G01R31/00
CPC分类号： G01R31/31907
摘要： A testing apparatus having testing module slots onto which different types of testing modules are selectively mounted includes controlling modules for supplying control signals to the testing modules mounted on the testing module slots. The control signals are used for controlling the testing module. The apparatus also includes a setting information supplying unit for supplying hardware setting information to a specific testing module, an enable signal controlling unit for instructing the specific testing module to generate and supply an enable signal to the controlling module corresponding to the specific testing module, and a setting unit for setting the controlling module received said enable signal from the specific testing module so as to supply the control signal corresponding to the specific testing module based on the hardware setting information.
摘要翻译：具有测试模块插槽的测试装置，选择性地安装有不同类型的测试模块的控制模块包括用于向安装在测试模块插槽上的测试模块提供控制信号的控制模块。控制信号用于控制测试模块。该装置还包括：设置信息提供单元，用于向特定测试模块提供硬件设置信息;使能信号控制单元，用于指示特定测试模块生成并向与特定测试模块相对应的控制模块提供使能信号，以及设置单元，用于设置从特定测试模块接收到所述使能信号的控制模块，以便基于硬件设置信息提供对应于特定测试模块的控制信号。

5. 发明授权

US07237167B2 Testing apparatus 失效
标题翻译：测试仪器
公开(公告)号：US07237167B2
公开(公告)日：2007-06-26
申请号：US10773562
申请日：2004-02-06
申请人： Kenji Inaba , Masashi Miyazaki
发明人： Kenji Inaba , Masashi Miyazaki
IPC分类号： G01R31/28 , G06F11/00 , G01R27/28
CPC分类号： G01R31/31924 , G01R31/3167
摘要： A testing apparatus including a plurality of testing module slots to which different types of testing modules for testing a device under test are optionally mounted, includes a first and a second testing modules, and a synchronization controlling unit. The synchronization controlling unit includes an operation order holding unit for holding information indicating that a test operation by a first testing module should be performed before a test operation by a second testing module, a trigger return signal receiving unit for receiving a trigger return signal from the first testing module, and a trigger signal supplying unit for supplying a trigger signal to the second testing module, the trigger signal indicating that the second testing module should start the test operation thereof, when the trigger return signal receiving unit receives the trigger return signal.
摘要翻译：包括多个测试模块插槽的测试装置包括第一测试模块和第二测试模块以及同步控制单元，用于测试被测设备的不同类型的测试模块可选地安装在该测试模块插槽上。同步控制单元包括：操作顺序保持单元，用于保持指示在由第二测试模块进行的测试操作之前由第一测试模块执行的测试操作的信息;触发返回信号接收单元，用于从第一测试模块和触发信号提供单元，用于向第二测试模块提供触发信号，触发信号指示第二测试模块应当开始其测试操作，当触发返回信号接收单元接收到触发返回信号时。

6. 发明申请

US20050182583A1 Testing apparatus 失效
标题翻译：测试仪器
公开(公告)号：US20050182583A1
公开(公告)日：2005-08-18
申请号：US10780286
申请日：2004-02-17
申请人： Masashi Miyazaki , Kenji Inaba , Toshiyuki Miura
发明人： Masashi Miyazaki , Kenji Inaba , Toshiyuki Miura
IPC分类号： G01R31/28 , G01R31/319 , G06F19/00
CPC分类号： G01R31/31907
摘要： A testing apparatus having a plurality of testing module slots onto which different types of testing modules are optionally mounted includes a plurality of controlling modules for supplying a control signal to each of the testing modules, the testing modules being mounted on the testing module slots respectively, the control signal being used for controlling the testing module, setting information supplying means for supplying hardware setting information to a specific testing module among the testing modules, the hardware setting information being set in advance in the controlling module in order to send the control signal in response to the specific testing module, enable signal controlling means for instructing the testing module to generate and supply an enable signal to the controlling module supplying the control signal to the testing module, and setting means for setting a specific controlling module of the controlling modules to supply the control signal in response to the specific testing module to the specific testing module based on the hardware setting information, the specific controlling module receiving the enable signal from the specific testing module.
摘要翻译：具有多个测试模块插槽的测试装置，可选地安装有不同类型的测试模块的多个控制模块包括用于向每个测试模块提供控制信号的多个控制模块，测试模块分别安装在测试模块插槽上，控制信号用于控制测试模块，设置信息提供装置，用于向测试模块中的特定测试模块提供硬件设置信息，硬件设置信息被预先设置在控制模块中，以便将控制信号发送到响应于特定的测试模块，启用信号控制装置，用于指示测试模块向控制模块生成并提供使能信号，该控制模块向测试模块提供控制信号;以及设置装置，用于将控制模块的特定控制模块设置为根据规格提供控制信号特定测试模块根据硬件设置信息到具体测试模块，具体控制模块从特定测试模块接收使能信号。

7. 发明授权

US07745926B2 Composite multi-layer substrate and module using the substrate 有权
标题翻译：复合多层基板和使用基板的模块
公开(公告)号：US07745926B2
公开(公告)日：2010-06-29
申请号：US11896013
申请日：2007-08-29
申请人： Masashi Miyazaki , Mitsuhiro Takayama , Tatsuro Sawatari
发明人： Masashi Miyazaki , Mitsuhiro Takayama , Tatsuro Sawatari
IPC分类号： H01L23/04
CPC分类号： H05K1/185 , H01L23/49822 , H01L23/5389 , H01L24/19 , H01L24/82 , H01L2224/04105 , H01L2224/2518 , H01L2224/32225 , H01L2224/32245 , H01L2224/73267 , H01L2224/92244 , H01L2924/01004 , H01L2924/01005 , H01L2924/01006 , H01L2924/01019 , H01L2924/01027 , H01L2924/01029 , H01L2924/01033 , H01L2924/01037 , H01L2924/01057 , H01L2924/01078 , H01L2924/01082 , H01L2924/014 , H01L2924/12042 , H01L2924/14 , H01L2924/15153 , H01L2924/15159 , H01L2924/181 , H01L2924/19041 , H01L2924/19042 , H01L2924/19043 , H01L2924/19105 , H01L2924/30105 , H01L2924/30107 , H01L2924/3025 , H05K1/021 , H05K3/445 , H05K3/4641 , H05K2201/0969 , H05K2201/09745 , H01L2924/00
摘要： A composite multi-layer substrate comprising a flat plate-like core member formed of a material having an excellent electric conductivity, an excellent heat conductivity, and a high rigidity, a front resin layer and a rear resin layer covering at least the front and rear surfaces of the core member, and a bottomless hole formed in the core member through the front and rear sides of the core member, wherein an electronic component is installed in the bottomless hole, whereby since the strength of the composite multi-layer substrate can be assured by the rigidity of the core member, conventional prior art glass cloth can be eliminated, deterioration in the electric characteristics caused by ion migration can be avoided and will result in reduced production cost.
摘要翻译：一种复合多层基板，包括由具有优异导电性，优异导热性和高刚性的材料形成的平板状芯体，至少覆盖前后树脂层和后树脂层芯构件的表面和通过芯构件的前后侧形成在芯构件中的无底孔，其中电子部件安装在无底孔中，由此，复合多层基板的强度可以通过芯构件的刚性保证，可以消除传统的现有技术的玻璃布，可以避免由离子迁移引起的电特性的劣化，并且将导致降低生产成本。

8. 发明申请

US20090307323A1 APPARATUS AND METHOD FOR SUPPORTING SETTING OF DESTINATION OF EMAIL 审中-公开
标题翻译：支持电子邮件目的地的设备和方法
公开(公告)号：US20090307323A1
公开(公告)日：2009-12-10
申请号：US12475549
申请日：2009-05-31
申请人： Shingo Kato , Masashi Miyazaki , Hiroshige Ochimizu , Masami Tada
发明人： Shingo Kato , Masashi Miyazaki , Hiroshige Ochimizu , Masami Tada
IPC分类号： G06F15/82
CPC分类号： G06Q10/107
摘要： In a client 20, an operation accepting section 22 obtains a primary address entered in an address entry field, and a transmitting section 21 sends the primary address to a mail server 10. In the mail server 10, a receiving section 19 receives the primary address; a message generating section 13 generates a message including out-of-office information corresponding to the primary address; and a transmitting section 11 sends the message to the client 20. In the client 20, a receiving section 29 receives the message, and a display section 24 displays an out-of-office message that a user corresponding to the primary address is away, and thereafter displays detailed information including buttons for setting an alternative address according to a click operation on a specific portion. An address updating section 26a displays an alternative address in the address entry field according to a button click operation.
摘要翻译：在客户端20中，操作接受部分22获得在地址输入字段中输入的主地址，并且发送部分21将主地址发送到邮件服务器10.在邮件服务器10中，接收部分19接收主地址 ; 消息生成部13生成包含与主地址对应的不在办公信息的消息; 并且发送部11将消息发送到客户端20.在客户端20中，接收部分29接收消息，并且显示部分24显示与主地址相对应的用户离开的外出消息，然后根据特定部分的点击操作显示包括用于设置替代地址的按钮的详细信息。地址更新部分26a根据按钮点击操作在地址输入字段中显示替代地址。

9. 发明授权

US5294291A Process for the formation of a conductive circuit pattern 失效
标题翻译：用于形成导电电路图案的工艺
公开(公告)号：US5294291A
公开(公告)日：1994-03-15
申请号：US947543
申请日：1992-09-21
申请人： Haruo Akahoshi , Toshinari Takada , Fujiko Yutani , Takeyuki Itabashi , Shin Nishimura , Satoru Amo , Akio Takahashi , Rituji Toba , Masashi Miyazaki
发明人： Haruo Akahoshi , Toshinari Takada , Fujiko Yutani , Takeyuki Itabashi , Shin Nishimura , Satoru Amo , Akio Takahashi , Rituji Toba , Masashi Miyazaki
IPC分类号： G03F7/40 , H05K3/06 , H05K3/10 , H05K3/38 , B44C1/22 , C23F1/00
CPC分类号： H05K3/108 , G03F7/40 , H05K2203/0285 , H05K2203/0392 , H05K2203/072 , H05K2203/0769 , H05K2203/0783 , H05K2203/0789 , H05K2203/1476 , H05K3/062 , H05K3/383
摘要： A process is provided for the formation of a conductive circuit pattern on a base metal formed on a substrate. On the base metal, a plating resist is first provided in a pattern corresponding to the circuit to be formed and a circuit pattern is then formed by plating. The plating resist is treated with a stripper and then with a stripping residue remover to cut off chemical bonds in the resist by a dehydrating decomposition reaction. The base metal is treated with an etchant for the base metal, whereby any resist residue still remaining after the treatment with the stripping residue remover is removed and the base metal are etched at areas which were covered by the plating resist.
摘要翻译：提供了一种在形成在基板上的基底金属上形成导电电路图案的工艺。在基体金属上，首先以与要形成的电路对应的图案设置电镀抗蚀剂，然后通过电镀形成电路图案。用剥离剂处理电镀抗蚀剂，然后用汽提残渣去除剂通过脱水分解反应来切断抗蚀剂中的化学键。用贱金属的蚀刻剂处理贱金属，除去在用剥离残渣去除剂处理后仍然残留的任何抗蚀剂残渣，并在被电镀抗蚀剂覆盖的区域上蚀刻贱金属。

10. 发明授权

US08791783B2 Electronic component to be embedded in substrate and component-embedded substrate 有权
标题翻译：嵌入基板和部件嵌入式基板的电子部件
公开(公告)号：US08791783B2
公开(公告)日：2014-07-29
申请号：US13642469
申请日：2011-05-11
申请人： Masashi Miyazaki , Yuichi Sugiyama , Yoshiki Hamada , Yutaka Hata , Hideki Yokota
发明人： Masashi Miyazaki , Yuichi Sugiyama , Yoshiki Hamada , Yutaka Hata , Hideki Yokota
IPC分类号： H01F27/29 , H01F5/00 , H01L27/08
CPC分类号： H01F27/327 , H01F17/0013 , H01F27/29 , H01F2017/0066 , H01L21/568 , H01L24/19 , H01L24/24 , H01L2224/04105 , H01L2224/24227 , H01L2224/73267 , H01L2224/92144 , H01L2924/01004 , H01L2924/01005 , H01L2924/01006 , H01L2924/01012 , H01L2924/01013 , H01L2924/01029 , H01L2924/01033 , H01L2924/01047 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/09701 , H01L2924/12042 , H01L2924/14 , H01L2924/15153 , H01L2924/1517 , H01L2924/181 , H01L2924/19041 , H01L2924/19042 , H01L2924/19105 , H05K1/165 , H05K1/185 , H05K3/4602 , H05K3/4608 , H05K2201/0355 , H05K2201/086 , H05K2201/1003 , H05K2201/10636 , H05K2201/10674 , H05K2203/0156 , Y02P70/611 , H01L2924/00
摘要： An electronic component to be embedded in a substrate is configured so that planar coils protected by insulators are sandwiched be a pair of magnetic layers. Ports, or openings or absent parts are provided at predetermined positions of one or both of the magnetic layers, and the predetermined positions correspond to the positions opposite to terminal electrodes of the planar coils. Accordingly, a contribution to reduction of the size and weight of electronic equipment can be made.
摘要翻译：嵌入在基板中的电子部件被配置为使得由绝缘体保护的平面线圈被夹在一对磁性层之间。在一个或两个磁性层的预定位置处提供端口或开口或不存在的部分，并且预定位置对应于与平面线圈的端子电极相对的位置。因此，可以对电子设备的尺寸和重量的减小做出贡献。

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