专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US5847571A Membrane probing of circuits 失效
标题翻译：电路膜探测
公开(公告)号：US5847571A
公开(公告)日：1998-12-08
申请号：US675416
申请日：1996-07-03
申请人： Ken Kuang-Fu Liu , Byoung-Youl Min , Kunio Sano , Takashi Sato
发明人： Ken Kuang-Fu Liu , Byoung-Youl Min , Kunio Sano , Takashi Sato
IPC分类号： G01R1/073 , H01L21/66
CPC分类号： G01R1/0735
摘要： First and second bumps electrically connected at first and second positions along a conductive run borne by a flexible substrate are respectively oriented for contact with a pad of a die under test and a pad of a tester. A probe frame is bonded to the substrate between connector frames bonded at opposite ends of the substrate. Alternatively, a pair of bumps exposed on the same surface of a flexible substrate are electrically connected at different positions along a conductive run. One of the bumps is oriented for contact with a pad of a die under test, and the other is in contact with a pad on a surface of a printed circuit board directed away from the die. The pad of the printed circuit board is provided for electrical connection to a tester.
摘要翻译：沿着沿着由柔性基板传导的导体的第一和第二位置电连接的第一和第二凸起分别被定向成与被测试模具的焊盘和测试仪的焊盘接触。探针架结合在衬底的相对两端的连接器框架之间的基片上。或者，暴露在柔性基板的相同表面上的一对凸块在导电性行程的不同位置电连接。凸块中的一个被定向成与待测试的模具的焊盘接触，另一个与印刷电路板的远离模具的表面上的焊盘接触。印刷电路板的焊盘被提供用于电连接到测试仪。

2. 发明授权

US5999268A Apparatus for aligning a semiconductor wafer with an inspection contactor 失效
标题翻译：用于使半导体晶片与检查接触器对准的装置
公开(公告)号：US5999268A
公开(公告)日：1999-12-07
申请号：US950832
申请日：1997-10-15
申请人： Toshihiro Yonezawa , Kunio Sano , Takashi Sato
发明人： Toshihiro Yonezawa , Kunio Sano , Takashi Sato
IPC分类号： G01R31/28 , G01B11/00 , G01R31/02
CPC分类号： G01R31/2887
摘要： An aligning apparatus includes a first image pickup camera for picking up an image of an inspection contactor, a moving body located so as to be movable in X-, Y-, Z- and .theta.-directions and having the first image pickup camera fixed thereon, a wafer bearer capable of being located on the moving body and supporting a semiconductor wafer, a control circuit for controlling movements of the moving body moved in the individual directions, and a second image pickup camera for picking up an image of the semiconductor wafer on the bearer moving under the control of the control circuit. Positions for the first and second image pickup cameras to pick up the images are stored, the first image pickup camera picks up an image of the contact, the position of the contact is stored, the second image pickup camera picks up an image of an electrode of a chip corresponding to the contact, the position of the electrode is stored, and then the contact and the electrode are aligned with each other in accordance with the respective positions of the contact and the electrode.
摘要翻译：对准装置包括用于拾取检查接触器的图像的第一图像拾取相机，位于X，Y，Z和Y方向上可移动并且第一图像拾取相机固定在其上的移动体，能够位于移动体上并支撑半导体晶片的晶片载体，用于控制沿各个方向移动的移动体的运动的控制电路和用于拾取半导体晶片的图像的第二图像拾取相机承载在控制电路的控制下移动。存储用于拾取图像的第一和第二图像拾取相机的位置，第一图像拾取相机拾取接触的图像，存储接触的位置，第二图像拾取相机拾取电极的图像与电极对应的芯片，存储电极的位置，然后根据触点和电极的相应位置使触点和电极彼此对准。

3. 发明授权

US5665610A Semiconductor device checking method 失效
标题翻译：半导体器件检查方法
公开(公告)号：US5665610A
公开(公告)日：1997-09-09
申请号：US650486
申请日：1996-05-17
申请人： Yoshiro Nakata , Shinichi Oki , Koichi Nagao , Kenzo Hatada , Shigeoki Mori , Takashi Sato , Kunio Sano
发明人： Yoshiro Nakata , Shinichi Oki , Koichi Nagao , Kenzo Hatada , Shigeoki Mori , Takashi Sato , Kunio Sano
IPC分类号： G01R31/28 , H01L21/66
CPC分类号： G01R31/2884 , G01R31/2831
摘要： A plated layer made of a metal which is hard to oxidize is formed on the surface of a check electrode of a semiconductor chip which is formed on a semiconductor wafer. A bump of a contactor is caused to come in contact with the check electrode on which the plated layer is formed in the direction perpendicular to the semiconductor chip. Then, a voltage is applied to the bump of the contactor to make a check such as burn-in on the semiconductor chip in a lump.
摘要翻译：在形成在半导体晶片上的半导体芯片的检查电极的表面上形成由难以氧化的金属制成的镀层。使接触器的凸起与垂直于半导体芯片的方向上形成有镀层的检查电极接触。然后，向接触器的凸起施加电压，以一次性地对半导体芯片进行诸如老化的检查。

4. 发明授权

US6084419A Method and apparatus for inspecting semiconductor integrated circuits, and contactor incorporated in the apparatus 失效
标题翻译：用于检查半导体集成电路的方法和装置以及包含在该装置中的接触器
公开(公告)号：US6084419A
公开(公告)日：2000-07-04
申请号：US28091
申请日：1998-02-23
申请人： Takashi Sato , Kunio Sano
发明人： Takashi Sato , Kunio Sano
IPC分类号： G01R31/28 , G01R31/02 , G01R1/04 , G01R31/302
CPC分类号： G01R31/2886
摘要： A wafer inspecting apparatus inspects the electric characteristics of IC chips of a wafer W. The inspection is carried out by simultaneously examining the inspecting electrodes of all IC chips in a contact manner in the state where the wafer W is held on the main chuck. The wafer inspecting apparatus is provided with a contactor, and this contactor is made up of a first contactor, a second contactor and a driving mechanism. The first contactor has a large number of contact projections on the lower surface thereof and a large number of contact electrodes on the entire upper surface thereof. The contact projections are brought into simultaneous contact with the inspecting electrodes. The contact electrodes are electrically connected to the contact projections, respectively. The second contactor has a number of contact elements, such as pogo-pins, which are brought into contact with the contact electrodes of the first contactor. The second contactor is movable, and the driving mechanism moves this second contactor in the X- and Y-directions in such a manner that the contact elements and the contact electrodes are sequentially brought into contact with each other. The contactor may include a third contactor as well. The third contactor is arranged between the first contactor and the wafer W.
摘要翻译：晶片检查装置检查晶片W的IC芯片的电特性。通过在将晶片W保持在主卡盘上的状态下以接触方式同时检查所有IC芯片的检查电极来进行检查。晶片检查装置设有接触器，该接触器由第一接触器，第二接触器和驱动机构构成。第一接触器在其下表面上具有大量接触突起，并且在其整个上表面上具有大量的接触电极。接触突起与检查电极同时接触。接触电极分别与接触突起电连接。第二接触器具有与第一接触器的接触电极接触的多个接触元件，例如弹簧销。第二接触器是可移动的，并且驱动机构使得第二接触器在X方向和Y方向上移动，使得接触元件和接触电极相互接触。接触器也可以包括第三接触器。第三接触器布置在第一接触器和晶片W之间。

5. 发明授权

US5703494A Probing test apparatus 失效
标题翻译：探测试验机
公开(公告)号：US5703494A
公开(公告)日：1997-12-30
申请号：US553013
申请日：1995-11-03
申请人： Kunio Sano
发明人： Kunio Sano
IPC分类号： G01R1/073 , G01R1/067 , H01L21/66 , G01R31/02
CPC分类号： G01R1/06705
摘要： A probing test apparatus comprising a probe card having a plurality of probes and first terminals contacted with and electrically connected to conductive pads of a circuit, a test head having a signal transmitting circuit through which the test signal is transmitted to the probes, a performance board having second terminals electrically connected to the signal transmitting circuit, a contact ring interposed between the performance board and the probe card and whose impedance has been adjusted, a plurality of first-type pogopins each having a pair of pin members contacting the first and second terminals to transmit the test signal to the probes, and a plurality of second-type pogopins each having a pair of pin members contacting the first and second terminals, the second-type pogopins being arranged in the contact ring, surrounding each first-type pogopin in a plane perpendicular to the axes of the pin members, and electrically connected to the first terminal grounded.
摘要翻译：一种探测测试装置，包括具有多个探针的探针和与电路的导电焊盘接触并电连接到电路的导电焊盘的探针卡，具有信号传输电路的测试头，测试信号通过该测试头传输到探头，演奏板具有电连接到所述信号传输电路的第二端子，插入在所述性能板和所述探针卡之间并且阻抗已被调节的接触环，多个第一类型的pogopins，每个具有一对与所述第一和第二端子将测试信号传输到探针，以及多个第二种类的pogopins，每个具有一对针构件接触第一和第二端子，第二类型的pogopins布置在接触环中，围绕每个第一类型的pogopin 垂直于销构件的轴线的平面，并且电连接到第一端子接地。

6. 发明授权

US5254797A Method of treating exhaust gas 失效
标题翻译：废气处理方法
公开(公告)号：US5254797A
公开(公告)日：1993-10-19
申请号：US981983
申请日：1992-11-24
申请人： Yoshinori Imoto , Katsunosuke Hara , Masakatsu Hiraoka , Kunio Sano , Akira Inoue
发明人： Yoshinori Imoto , Katsunosuke Hara , Masakatsu Hiraoka , Kunio Sano , Akira Inoue
IPC分类号： B01D53/86 , A62D3/00 , C01B7/00 , F23G5/00
CPC分类号： B01D53/8668 , B01D53/8662
摘要： A catalyst composition including component A and component B, the component A being a carrier, preferably having a honeycomb structure, and being a single-component oxide or a multi-component composite oxide of at least one metal of titanium, silicon and zirconium, and the component B being a catalyst component deposited on the carrier of component A and being at least one member selected from the group of noble metals and other specifically limited metals and their oxides, is very effective for decomposing and removing poisonous organic chlorine compounds, such as dioxin and the like, or poisonous organic chlorine compound-forming substances contained in an exhaust gas exhausted from an incinerator of an incineration plant provided with the incinerator and a dust collector. In addition, and the generation of the poisonous organic chlorine compound from the incineration plant can be prevented.
摘要翻译：包含组分A和组分B的催化剂组合物，组分A是载体，优选具有蜂窝结构，并且是至少一种钛，硅和锆的金属的单组分氧化物或多组分复合氧化物，以及组分B是沉积在组分A的载体上的催化剂组分，并且是选自贵金属和其它特别有限的金属及其氧化物中的至少一种，对于分解和除去有毒的有机氯化合物是非常有效的，例如二恶英等，或从设置有焚化炉的焚烧厂的焚化炉排出的排气中含有的有机的含氯化合物形成物质和集尘器。此外，可以防止来自焚烧装置的有机有机氯化合物的产生。

7. 发明授权

US06652759B2 Method of treating waste water and apparatus for treating waste water using the method 失效
标题翻译：使用该方法处理废水和废水处理设备的方法
公开(公告)号：US06652759B2
公开(公告)日：2003-11-25
申请号：US09832940
申请日：2001-04-12
申请人： Tsutomu Taira , Keiji Hirano , Junji Okamura , Mitsuaki Ikeda , Kunio Sano
发明人： Tsutomu Taira , Keiji Hirano , Junji Okamura , Mitsuaki Ikeda , Kunio Sano
IPC分类号： C02F172
CPC分类号： C02F1/725 , C02F1/12 , C02F2101/38 , Y10S210/903 , Y10S210/908
摘要： The present invention provides a method of treating waste water including nitrogen-containing organic compounds to convert these compounds into harmless gases without performing a post-treatment. The method comprises spraying waste water in a heated space to gasify the waste water into waste gas, and oxidizing the waste gas by contacting it with a catalyst to convert the nitrogen-containing organic compounds into harmless gases. An apparatus for treating waste water using the method is also disclosed.
摘要翻译：本发明提供一种处理包括含氮有机化合物的废水在不进行后处理的情况下将这些化合物转化为无害气体的方法。该方法包括在加热的空间中喷洒废水，将废水气化成废气，并通过与废气接触而将废气氧化，从而将含氮有机化合物转化为无害气体。还公开了一种使用该方法处理废水的设备。

8. 发明授权

US5550482A Probe device 失效
公开(公告)号：US5550482A
公开(公告)日：1996-08-27
申请号：US274862
申请日：1994-07-14
申请人： Kunio Sano
发明人： Kunio Sano
IPC分类号： G01R1/067 , G01R31/28 , G01R1/073 , G01R31/02
CPC分类号： G01R31/2887 , G01R1/06705
摘要： A probe device for testing a wafer divided into IC chips has a vessel that accommodates a wafer mounting stand and a flexible probe card having contactor bumps. The vessel is configured in a separatable manner of a grounded aluminum cover portion to which the probe card is integrally fixed and a base portion fixed to the wafer mounting stand. The interior of the vessel is sealed with the wafer and the probe card facing each other therein. A space above the probe card forms a damper chamber into which a fluid is introduced in such a manner that the pressure thereof presses the bumps on the probe card against the wafer. Bumps in a peripheral edge portion of the probe card are placed into contact with electrodes in a peripheral edge portion of the vessel, and thence to a test head. The above configuration can prevent the effects of external electrical noise and thus enable stable electrical measurements unaffected by changes in ambient temperature. In order to remove the effects of thermal expansion of the probe card and the wafer, graticules are formed in each of X and Y directions around an array of bumps. The coordinate positions of the bumps on the probe card under normal temperature conditions are previously stored in a storage unit, the graticules are read by an imaging unit when the probe card has thermally expanded, the current coordinate positional data for the bumps is obtained from the results of this read and the stored bump coordinate positional data, and this is used to control the position of the mounting stand.

9. 发明授权

US5374599A Catalyst for treating wastewater, process for producing it, and process for treating wastewater with the catalyst 失效
标题翻译：用于处理废水的催化剂，其生产方法，以及用催化剂处理废水的方法
公开(公告)号：US5374599A
公开(公告)日：1994-12-20
申请号：US154362
申请日：1993-11-18
申请人： Tohru Ishii , Kiichiro Mitsui , Kunio Sano , Keniti Shishida , Yusuke Shiota
发明人： Tohru Ishii , Kiichiro Mitsui , Kunio Sano , Keniti Shishida , Yusuke Shiota
IPC分类号： B01J23/745 , B01J23/75 , B01J23/755 , B01J23/83 , B01J23/89 , B01J37/03 , C02F1/02 , C02F1/72 , B01J23/40 , B01J23/74
CPC分类号： B01J23/745 , B01J23/75 , B01J23/755 , B01J23/83 , B01J23/8906 , B01J37/03 , C02F1/025 , C02F1/725
摘要： The present invention provides a catalyst used in wastewater treatment process wherein not only an organic compound not containing nitrogen, sulfur or halogen is decomposed, but also a nitrogen-containing compound, a sulfur-containing compound and an organic halogeno compound are effectively decomposed, thereby wastewater are treated with excellent efficiency for a long period of time. The invention also provides a production process for the catalyst and said wastewater treatment process. The first catalyst comprises: an oxide of iron as an A component; and at least one kind of element as a B component selected from a group consisting of cobalt, nickel, cerium, silver, gold, platinum, palladium, rhodium, ruthenium and iridium. The second catalyst comprises: an oxide as an A component containing iron and at least one kind of element selected from a group consisting of titanium, silicon and zirconium; and at least one kind of element as a B component selected from a group consisting of cobalt, nickel, cerium, silver, gold, platinum, palladium, rhodium, ruthenium and iridium.
摘要翻译：本发明提供了一种用于废水处理方法的催化剂，其中不仅分解不含氮，硫或卤素的有机化合物，而且有效地分解含氮化合物，含硫化合物和有机卤代化合物，从而废水长期处理效率高。本发明还提供了催化剂和所述废水处理方法的生产方法。第一催化剂包括：作为A成分的铁的氧化物; 以及选自钴，镍，铈，银，金，铂，钯，铑，钌和铱中的至少一种作为B成分的元素。第二催化剂包括：作为含铁的A成分的氧化物和选自钛，硅和锆的至少一种元素; 以及选自钴，镍，铈，银，金，铂，钯，铑，钌和铱中的至少一种作为B成分的元素。

10. 发明授权

US5192452A Catalyst for water treatment 失效
标题翻译：用于水处理的催化剂
公开(公告)号：US5192452A
公开(公告)日：1993-03-09
申请号：US782787
申请日：1991-10-24
申请人： Kiichiro Mitsui , Tooru Ishii , Sadao Terui , Kunio Sano , Akira Inoue
发明人： Kiichiro Mitsui , Tooru Ishii , Sadao Terui , Kunio Sano , Akira Inoue
IPC分类号： B01J23/34 , B01J23/38 , B01J23/70 , B01J23/89 , C02F1/72 , C02F1/78
CPC分类号： B01J23/38 , B01J23/34 , B01J23/70 , B01J23/89 , C02F1/725 , C02F1/78 , Y10S210/916 , Y10S210/917
摘要： This invention relates to a catalyst for use in water treatment and to a method for the water treatment by the use of the catalyst. The catalyst comprises a first catalyst component e.g. the oxide of titanium, silicon, aluminum and zirconium, and a second catalyst component e.g. manganese, iron, cobalt, nickel, cerium, tungsten, copper, silver, gold, platinum, palladium, rhodium, ruthenium, and iridium or a sparingly water-soluble compound of the metal.
摘要翻译：本发明涉及一种用于水处理的催化剂和一种通过使用该催化剂进行水处理的方法。催化剂包括第一催化剂组分，例如钛，硅，铝和锆的氧化物，以及第二催化剂组分锰，铁，钴，镍，铈，钨，铜，银，金，铂，钯，铑，钌和铱或金属的微水溶性化合物。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式