会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Burn-in socket testing apparatus
    • 老化插座测试仪
    • US5486771A
    • 1996-01-23
    • US363559
    • 1994-12-23
    • Keith L. VolzRobert M. RennRobert D. IrlbeckFrederick R. DeakDavid C. Johnson
    • Keith L. VolzRobert M. RennRobert D. IrlbeckFrederick R. DeakDavid C. Johnson
    • G01R31/26G01R1/04H01R33/76H01R33/97H05K7/10G01R31/02H05K1/02
    • H05K7/1023G01R1/0433
    • This invention is directed to a mechanical, robotically operated burn-in socket testing apparatus for integrated circuit "chips", where such chips, as known in the art, are typically planar electronic devices. The apparatus, operationally mounted to a planar electronic board, such as a mother board, comprises a first frame member for mounting to the mother board, where the first frame member includes electrical means for engaging chip leads and applying electrical current thereto during the burn-in testing. A second frame member is disposed in sliding engagement with the first frame member, where the second frame member is movable from a first position to a second position. Finally, cooperative latching and camming means are provided between the first and second frame members to effect the movement between the first and second positions, and to securely hold the chip during burn-in, where the camming means includes a pivotal member movable from a remote position free of the chip to a position engaging the chip.
    • 本发明涉及用于集成电路“芯片”的机械式机器人操作的老化插座测试装置,其中如本领域已知的这样的芯片通常是平面电子器件。 该装置可操作地安装在诸如母板的平面电子板上,包括用于安装到母板的第一框架构件,其中第一框架构件包括用于接合芯片引线并在燃烧期间向其施加电流的电气装置, 在测试。 第二框架构件设置成与第一框架构件滑动接合,其中第二框架构件可从第一位置移动到第二位置。 最后,协作锁定和凸轮装置设置在第一和第二框架构件之间以实现第一和第二位置之间的移动,并且在老化期间牢固地保持芯片,其中凸轮装置包括可从远程 位置没有芯片到与芯片接合的位置。
    • 5. 发明授权
    • Backplane connector utilizing flexible film circuitry
    • 背板连接器采用柔性薄膜电路
    • US5308249A
    • 1994-05-03
    • US78665
    • 1993-06-16
    • Robert M. RennRobert D. IrlbeckFrederick R. DeakKeith L. VolzDavid C. JohnsonWarren A. Bates
    • Robert M. RennRobert D. IrlbeckFrederick R. DeakKeith L. VolzDavid C. JohnsonWarren A. Bates
    • H01R12/70H01R12/79H01R12/89H01R9/09
    • H01R12/79H01R12/89H01R12/7005
    • The invention is directed to an electronic assembly, such as a backplane assembly of the type including a mother board, a connector housing mounted on the mother board, and a daughter board slidably insertable into the connector housing for electrical interconnection to the mother board. The assembly comprises an elongated connector housing having a pair of parallelly disposed spaced apart housing members defining at least one slot therebetween for receiving the daughter board. A force generating member is disposed within the slot, where the force generating members comprises a pair of resilient, essentially L-shaped members. One leg of each of the L-shaped members is fixedly disposed between the mother board and the housing members, while the others of the legs upstand within the slot in a spaced apart relationship to receive the daughter board therebetween, the upstanding legs including at least one pair of opposing elastomeric members to apply a compressive pressure to said daughter board. Further, a flexible circuit element is mounted on the force generating member and is operatively disposed to electrically interconnect the daughter board to the mother board. A preferred feature thereof is the provision of a camming means on the upstanding legs to allow insertion of the daughter board without causing damage to the circuitry on the flexible circuit element, preferable in the form of a flat film.
    • 本发明涉及一种电子组件,例如背板组件,其类型包括母板,安装在母板上的连接器壳体,以及可滑动地插入到连接器壳体中以与母板电连接的子板。 组件包括细长的连接器壳体,其具有一对平行设置的间隔开的壳体构件,其在其间限定了至少一个狭槽,用于接收子板。 力产生构件设置在槽内,其中力产生构件包括一对弹性的,基本上为L形的构件。 每个L形构件的一条腿固定地设置在母板和壳体构件之间,而其他腿以间隔开的关系在槽内立起,以在其间接纳子板,直立腿至少包括 一对相对的弹性体构件以向所述子板施加压缩压力。 此外,柔性电路元件安装在力产生构件上并且可操作地设置成将子板电连接到母板。 其优选的特征是在直立腿上设置凸轮装置以允许子板的插入,而不会损坏柔性电路元件上的电路,优选为平板形式。
    • 10. 发明授权
    • Integrated circuit chip testing apparatus
    • 集成电路芯片测试仪
    • US5493237A
    • 1996-02-20
    • US250267
    • 1994-05-27
    • Keith L. VolzRobert M. RennRobert D. IrlbeckFrederick R. Deak
    • Keith L. VolzRobert M. RennRobert D. IrlbeckFrederick R. Deak
    • G01R1/04G01R31/00
    • G01R1/0483
    • This disclosure relates to testing apparatus (10), preferably an LGA burn-in test socket, for an integrated chip (28). The apparatus (10), arranged for mounting on a planar electronic device (46), such as a printed circuit board, includes a frame member (12) for mounting to the planar electronic device (46), where the frame member (12) includes a central opening (22) extending between first and second surfaces, and dimensionally sized to receive the chip (28). Recesses (35) are provided for receiving an electronic interface member (18) mounting plural flexible electrical connectors (106), such as an elastomeric connector, as known in the art, for engaging the traces or pads of the chip to the planar device during testing. Further, plural recesses (40) extend from at least the first surface, where each recess includes a compression spring (41). Positioned over and for engagement with the frame member is a floatably mounted force applying member (14) having first and second parallel surfaces. A central opening (75), concentric with the central opening ( 22) of the frame member (12) is present. Additionally, plural posts (62) extend from the second parallel surface for receipt in respective recesses (44). Finally, camming levers (16) are provided for urging the force applying member toward the frame member, along with pivotal pusher members (78) responsive to the camming levers to engage and secure the chip during testing thereof.
    • 本公开涉及用于集成芯片(28)的测试装置(10),优选地是LGA老化测试插座。 布置成安装在诸如印刷电路板的平面电子设备(46)上的设备(10)包括用于安装到平面电子设备(46)的框架构件(12),其中框架构件(12) 包括在第一表面和第二表面之间延伸的中心开口(22),并且尺寸尺寸适于接纳芯片(28)。 凹部(35)被设置用于接收安装多个柔性电连接器(106)的电子接口部件(18),所述多个柔性电连接器(106)如本领域已知的用于将芯片的迹线或焊盘接合到平面器件的弹性连接器 测试。 此外,多个凹部(40)从至少第一表面延伸,其中每个凹部包括压缩弹簧(41)。 定位在框架构件上并用于与框架构件接合的是具有第一和第二平行表面的可浮动安装的施力构件(14)。 存在与框架构件(12)的中心开口(22)同心的中心开口(75)。 此外,多个柱(62)从第二平行表面延伸以便接收在相应的凹部(44)中。 最后,提供凸轮杆(16),用于响应于所述凸轮杆将所述施力部件朝着所述框架构件推动,以及枢轴推动器构件(78),以在其测试期间接合和固定所述芯片。