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1. 发明申请

US20080126920A1 Method for creating FMEA sheet and device for automatically creating FMEA sheet 审中-公开
标题翻译：创建FMEA工作表的方法和自动创建FMEA工作表的设备
公开(公告)号：US20080126920A1
公开(公告)日：2008-05-29
申请号：US11907667
申请日：2007-10-16
申请人： Keiji Otaka , Toshihiro Moriya , Soichiro Kita , Akira Nakajima , Hidefumi Konishi , Masayoshi Abe , Hideki Yachiku
发明人： Keiji Otaka , Toshihiro Moriya , Soichiro Kita , Akira Nakajima , Hidefumi Konishi , Masayoshi Abe , Hideki Yachiku
IPC分类号： G06F17/27
CPC分类号： G06F17/2755 , G06Q10/06
摘要： An method for creating an FMEA sheet includes the steps of, retrieving a plurality of documents, dividing words in each of the plurality of retrieved documents into a plurality of morpheme words by morphological analysis, calculating a co-occurrence frequency of each of the plurality of morpheme words, generating a co-occurrence frequency network with morpheme words having a greater co-occurrence frequency than a predetermined level in the plurality of morpheme words, grouping the plurality of documents using the co-occurrence frequency network, extracting a word same as an FMEA word registered in an FMEA word concept dictionary created in advance from each of the plurality of documents belonging to a same group as a word to be used in creating the FMEA sheet and substituting the extracted word to the FMEA sheet.
摘要翻译：一种创建FMEA表的方法包括以下步骤：检索多个文档，通过形态分析将多个检索文档中的每一个分割成多个语素字，计算多个文档中的每一个的同现频率语素词，在多个语素字中产生具有比预定级别更大的同现频率的词素词的共现频率网络，使用同现频率网络对多个文档进行分组，提取与 FMEA字被注册在FMEA字概念字典中，预先从属于与创建FMEA表中使用的单词属于同一组的多个文档中的每一个文档而替换所提取的单词到FMEA表。

2. 发明申请

US20080082527A1 Database generation and use aid apparatus 审中-公开
标题翻译：数据库生成和使用辅助装置
公开(公告)号：US20080082527A1
公开(公告)日：2008-04-03
申请号：US11900804
申请日：2007-09-12
申请人： Hideki Yachiku , Hidefumi Konishi , Masayoshi Abe , Toshihiro Moriya
发明人： Hideki Yachiku , Hidefumi Konishi , Masayoshi Abe , Toshihiro Moriya
IPC分类号： G06F17/30
CPC分类号： G06F16/2465
摘要： A precedent database is generated by registering location indicating information that shows location of each of a plurality of precedent data. A knowledge database is generated by repeating processes of carrying out a search of this precedent database according to a specified condition formula and registering knowledge names representing results of the search in correlation with the condition formula. Component and failure names in the knowledge database are inserted as items of a generated FMEA sheet. Items of the FMEA sheet are specified and displayed such that corresponding text data can be referenced.
摘要翻译：通过登记显示多个先前数据中的每一个的位置的位置指示信息来生成先例数据库。通过重复根据指定条件公式对该先验数据库进行搜索的处理来生成知识数据库，并且与条件公式相关地记录表示搜索结果的知识名称。知识数据库中的组件和故障名称作为生成的FMEA表的项目插入。指定和显示FMEA表的项目，以便可以引用相应的文本数据。

3. 发明申请

US20060204074A1 PC board inspecting method and apparatus and inspection logic setting method and apparatus 有权
标题翻译： PC板检查方法及装置及检查逻辑设定方法及装置
公开(公告)号：US20060204074A1
公开(公告)日：2006-09-14
申请号：US11358914
申请日：2006-02-21
申请人： Toshihiro Moriya , Hirotaka Wada , Takako Onishi , Atsushi Shimizu , Akira Nakajima
发明人： Toshihiro Moriya , Hirotaka Wada , Takako Onishi , Atsushi Shimizu , Akira Nakajima
IPC分类号： G06K9/00
CPC分类号： H05K13/08
摘要： A PC board inspecting method capable of detecting deviation of an IC component at high speed with small storage capacity utilizes inspection logic particular to a component to be inspected. The inspection logic includes a color condition for specifying a color appearing in the body of the component to be inspected. The component is radiated with a plurality of color rays at different angles of incidence. An image formed by reflection light of the color rays is captured, and an inspection image including at least part of an edge of the body of the component to be inspected is captured. By using the color condition, a component body area satisfying the color condition is extracted from the inspection image by an image process.
摘要翻译：能够以小的存储容量检测IC组件在高速下的偏差的PC板检查方法利用要检查的部件特有的检查逻辑。检查逻辑包括用于指定出现在要检查的部件的主体中的颜色的颜色条件。该组件以不同入射角的多根彩色光线照射。捕获由彩色光线的反射光形成的图像，并且捕获包括要检查的部件的主体的边缘的至少一部分的检查图像。通过使用颜色条件，通过图像处理从检查图像中提取满足色彩条件的部件体区域。

4. 发明申请

US20060153439A1 PC board inspecting apparatus, inspection logic setting method, and inspection logic setting apparatus 审中-公开
标题翻译： PC板检查装置，检查逻辑设定方法以及检查逻辑设定装置
公开(公告)号：US20060153439A1
公开(公告)日：2006-07-13
申请号：US11329432
申请日：2006-01-11
申请人： Toshihiro Moriya , Hirotaka Wada , Takako Onishi , Atsushi Shimizu , Akira Nakajima
发明人： Toshihiro Moriya , Hirotaka Wada , Takako Onishi , Atsushi Shimizu , Akira Nakajima
IPC分类号： G06K9/00
CPC分类号： G01R31/048 , G01N21/95684
摘要： A technology is provided for automatically producing an inspection logic to be used in the action of inspecting a PC board. An inspection logic setting apparatus is arranged for acquiring a plurality of first images of components to be detected by the inspection and a plurality of second images of components to be rejected by the inspection, dividing each first and second images into the plurality of blocks, calculating a color distance between the plurality of first images and the plurality of second images in each block, selecting one or more blocks from the plurality of blocks which are relatively greater in the color distance, and assigning the selected block(s) to an area condition.
摘要翻译：提供了一种技术，用于自动产生在检查PC板的动作中使用的检查逻辑。一种检查逻辑设置装置，用于通过检查获取待检测的成分的多个第一图像以及通过检查要被拒绝的成分的多个第二图像，将每个第一和第二图像划分成多个块，计算在每个块中的多个第一图像和多个第二图像之间的颜色距离，从多个颜色距离相对较大的多个块中选择一个或多个块，并将所选择的块分配给区域条件。

5. 发明授权

US07961933B2 Method of setting reference data for inspection of fillets and inspection device using same 失效
标题翻译：设置用于检查鱼片和检查装置的参考数据的方法
公开(公告)号：US07961933B2
公开(公告)日：2011-06-14
申请号：US11880169
申请日：2007-07-20
申请人： Yoshiki Fujii , Yasutomo Doi , Akira Nakajima , Toshihiro Moriya , Yasuaki Nakajima
发明人： Yoshiki Fujii , Yasutomo Doi , Akira Nakajima , Toshihiro Moriya , Yasuaki Nakajima
IPC分类号： G06K9/00
CPC分类号： G01N21/95684 , B23K31/125 , G01N2021/95669 , G06T7/001 , G06T2207/30141 , G06T2207/30152
摘要： Reference data for automatically inspecting shapes of fillets formed on a substrate are set to an inspection device that illuminates the substrate from specified directions to generate an image. For each type of components mounted to the substrate, a database is prepared, registering sets of reference data corresponding to different fillet shapes in correlation with heights of solder for forming fillets having these shapes. After components to be an object of inspection are identified, specified steps are carried out on each of these components, including the step of obtaining data on the height of solder for forming the fillet related to a land for which a target area for inspection has been set and reading out reference data corresponding to the data obtained from the reference data registered in the database.
摘要翻译：用于自动检查形成在基底上的鱼片形状的参考数据被设置为从指定方向照射衬底以产生图像的检查装置。对于安装到基板的每种类型的部件，准备数据库，将与形成具有这些形状的圆角的焊料的高度相对应的不同的圆角形状对应的参考数据集合对齐。在识别到作为检验对象的部件之后，对这些部件中的每一个进行指定的步骤，包括获得与用于检查的目标区域相关的焊盘相关的焊盘高度的数据的步骤设置和读出与从数据库中注册的参考数据获得的数据相对应的参考数据。

6. 发明申请

US20060257015A1 Board inspection apparatus and method and apparatus for setting inspection logic thereof 有权
标题翻译：板检查装置及其检查逻辑的设置方法和装置
公开(公告)号：US20060257015A1
公开(公告)日：2006-11-16
申请号：US11377938
申请日：2006-03-16
申请人： Takatoshi Katahata , Hirotaka Wada , Toshihiro Moriya , Atsushi Shimizu , Akira Nakajima
发明人： Takatoshi Katahata , Hirotaka Wada , Toshihiro Moriya , Atsushi Shimizu , Akira Nakajima
IPC分类号： G06K9/00
CPC分类号： G06T7/001 , G06T2207/30141 , G06T2207/30148 , G06T2207/30152
摘要： image In generating inspection logic of a new component, the image of a new component is obtained, the trend data for selected characteristics of the focused region of the new component is computed; a previously inspected component having characteristics similar to that of the new component is selected by comparing the trend data of the new component with trend data of the previously inspected component, the image of the selected (previously inspected) component is read from the storage device, and inspection logic for the new component is generated using the images of the new component and images of the previously inspected component as teaching data.
摘要翻译：图像在产生新分量的检验逻辑时，获得新分量的图像，计算出新分量聚焦区域选定特征的趋势数据; 通过将新组件的趋势数据与先前检查的组件的趋势数据进行比较来选择具有与新组件类似的特征的先前检查的组件，从存储设备读取所选（先前检查）组件的图像，并且使用新组件的图像和先前检查的组件的图像作为教学数据来生成新组件的检查逻辑。

7. 发明授权

US07822261B2 Board inspecting apparatus, its parameter setting method and parameter setting apparatus 有权
标题翻译：板检测装置，其参数设定方法和参数设定装置
公开(公告)号：US07822261B2
公开(公告)日：2010-10-26
申请号：US11472508
申请日：2006-06-21
申请人： Toshihiro Moriya , Hirotaka Wada , Takako Onishi , Atsushi Shimizu , Akira Nakajima
发明人： Toshihiro Moriya , Hirotaka Wada , Takako Onishi , Atsushi Shimizu , Akira Nakajima
IPC分类号： G06K9/00
CPC分类号： G01N21/8851 , G01N21/95684 , G06T7/0004 , G06T2207/30141
摘要： For each teaching image, a plurality of patterns of color pickup regions each include a first region for picking up a color of a first part and a second region for picking up a color of a second part are set, the color of each pixel in the first region and the color of each pixel in the second region are mapped as a target point and an exclusion point respectively, to a color space for each of the patterns of the color pickup regions, a degree in separation between a target point distribution and an exclusion point distribution in the color space is calculated for each of the patterns of the color pickup regions, a pattern of a color pickup region having a maximum degree in separation is selected, a color range which divides the color space and has the largest difference between the number of target points and the number of exclusion points in the selected pattern therein is found, and the found color range is set as a color condition used in a board inspecting process.
摘要翻译：对于每个示教图像，多个图案的颜色拾取区域各自包括用于拾取第一部分的颜色的第一区域和用于拾取第二部分的颜色的第二区域，每个像素的颜色在第一区域和第二区域中的每个像素的颜色分别作为目标点和排除点映射到颜色拾取区域的每个图案的颜色空间，目标点分布和针对颜色拾取区域的每个图案计算颜色空间中的排除点分布，选择具有最大分离度的颜色拾取区域的图案，分割颜色空间并且具有最大差异的颜色范围找到所选择的图案中的目标点的数量和排除点的数量，并且将所发现的颜色范围设置为在板检查处理中使用的颜色条件。

8. 发明申请

US20080040058A1 Method of setting reference data for inspection of fillets and inspection device using same 失效
标题翻译：设置用于检查鱼片和检查装置的参考数据的方法
公开(公告)号：US20080040058A1
公开(公告)日：2008-02-14
申请号：US11880169
申请日：2007-07-20
申请人： Yoshiki Fujii , Yasutomo Doi , Akira Nakajima , Toshihiro Moriya , Yasuaki Nakajima
发明人： Yoshiki Fujii , Yasutomo Doi , Akira Nakajima , Toshihiro Moriya , Yasuaki Nakajima
IPC分类号： G06F19/00
CPC分类号： G01N21/95684 , B23K31/125 , G01N2021/95669 , G06T7/001 , G06T2207/30141 , G06T2207/30152
摘要： Reference data for automatically inspecting shapes of fillets formed on a substrate are set to an inspection device that illuminates the substrate from specified directions to generate an image. For each type of components mounted to the substrate, a database is prepared, registering sets of reference data corresponding to different fillet shapes in correlation with heights of solder for forming fillets having these shapes. After components to be an object of inspection are identified, specified steps are carried out on each of these components, including the step of obtaining data on the height of solder for forming the fillet related to a land for which a target area for inspection has been set and reading out reference data corresponding to the data obtained from the reference data registered in the database.
摘要翻译：用于自动检查形成在基底上的鱼片形状的参考数据被设置为从指定方向照射衬底以产生图像的检查装置。对于安装到基板的每种类型的部件，准备数据库，将与形成具有这些形状的圆角的焊料的高度相对应的不同的圆角形状对应的参考数据集合对齐。在识别到作为检验对象的部件之后，对这些部件中的每一个进行指定的步骤，包括获得与用于检查的目标区域相关的焊盘相关的焊盘高度的数据的步骤设置和读出与从数据库中注册的参考数据获得的数据相对应的参考数据。

9. 发明申请

US20080034258A1 FAULT MANAGEMENT APPARATUS, FAULT MANAGEMENT METHOD, FAULT MANAGEMENT PROGRAM AND RECORDING MEDIUM RECORDING THE SAME 审中-公开
标题翻译：故障管理装置，故障管理方法，故障管理程序和记录介质
公开(公告)号：US20080034258A1
公开(公告)日：2008-02-07
申请号：US11697548
申请日：2007-04-06
申请人： Toshihiro Moriya , Akira Nakajima
发明人： Toshihiro Moriya , Akira Nakajima
IPC分类号： G06F11/34
CPC分类号： G05B19/4184 , G05B23/0297 , Y02P90/14
摘要： A fault management apparatus that enables calculation of evaluation values relating to a fault occurring to a management target as objective values without involvement of human judgment is provided. Fault information containing fault content information showing content of a fault occurring to a process in a production line, and detection status information and action content information associated with the fault is stored in a fault occurrence history storage part as a fault occurrence history. A fault extraction part reads the fault occurrence history from the fault occurrence history storage part to extract fault information containing specific fault content information. An influence degree calculation part calculates a degree of influence showing the degree of influence caused by a specific fault by performing statistical processing based on detection status information and action content information contained in the fault information extracted by the fault extraction part.
摘要翻译：提供一种故障管理装置，其能够计算与管理目标发生的故障有关的评估值作为客观值而不涉及人的判断。包含显示生产线中的过程发生的故障的故障内容信息的故障信息，以及与故障相关联的检测状态信息和动作内容信息作为故障发生历史存储在故障发生历史存储部中。故障提取部从故障发生历史存储部读出故障发生历史，提取含有特定故障内容信息的故障信息。影响度计算部分通过基于由故障提取部分提取的故障信息中包含的检测状态信息和动作内容信息进行统计处理来计算表示由特定故障引起的影响程度的影响程度。

10. 发明授权

US07720274B2 Board inspection apparatus and method and apparatus for setting inspection logic thereof 有权
标题翻译：板检查装置及其检查逻辑的设置方法和装置
公开(公告)号：US07720274B2
公开(公告)日：2010-05-18
申请号：US11377938
申请日：2006-03-16
申请人： Takatoshi Katahata , Hirotaka Wada , Toshihiro Moriya , Atsushi Shimizu , Akira Nakajima
发明人： Takatoshi Katahata , Hirotaka Wada , Toshihiro Moriya , Atsushi Shimizu , Akira Nakajima
IPC分类号： G06K9/00
CPC分类号： G06T7/001 , G06T2207/30141 , G06T2207/30148 , G06T2207/30152
摘要： In generating inspection logic of a new component, the image of a new component is obtained, the trend data for selected characteristics of the focused region of the new component is computed; a previously inspected component having characteristics similar to that of the new component is selected by comparing the trend data of the new component with trend data of the previously inspected component, the image of the selected (previously inspected) component is read from the storage device, and inspection logic for the new component is generated using the images of the new component and images of the previously inspected component as teaching data.
摘要翻译：在生成新分量的检验逻辑时，获得新分量的图像，计算出新分量聚焦区域选定特征的趋势数据; 通过将新组件的趋势数据与先前检查的组件的趋势数据进行比较来选择具有与新组件类似的特征的先前检查的组件，从存储设备读取所选（先前检查）组件的图像，并且使用新组件的图像和先前检查的组件的图像作为教学数据来生成新组件的检查逻辑。

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