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1. 发明授权

US08269830B1 Inspecting potentially interfering features in a machine vision system 有权
标题翻译：检查机器视觉系统中潜在的干扰特征
公开(公告)号：US08269830B1
公开(公告)日：2012-09-18
申请号：US13086912
申请日：2011-04-14
申请人： Mark Lawrence Delaney
发明人： Mark Lawrence Delaney
IPC分类号： H04N7/18
CPC分类号： G01N21/95684 , G01N21/8851 , G01N2021/646 , G01N2021/95638 , G01N2021/95646 , G01N2021/95661 , G01N2021/95669 , G06T7/001 , G06T2200/24 , G06T2207/10056 , G06T2207/20081 , G06T2207/30141
摘要： A robust video tool is provided for use in a machine vision inspection system. The robust video tool comprises a region of interest, a user interface, edge detection operations, and excluded region operations that determine a set of current-feature edge points which includes edge points detected in the region of interest and excludes edge points in an excluded region. The excluded region is determined by an excluded region generator, based on at least one previously characterized feature which is a feature characterized by using a video tool that detects the edge points of, and characterizes dimensional parameters of, the previously characterized feature. Importantly, the robust video tool features and operations are configured to allow learn mode programming on a workpiece that is either properly fabricated or improperly fabricated, and the resulting program will operate reliably on a run mode workpiece that is either properly fabricated or improperly fabricated.
摘要翻译：提供了一种强大的视频工具，用于机器视觉检测系统。强大的视频工具包括感兴趣的区域，用户界面，边缘检测操作和排除区域操作，其确定一组当前特征边缘点，其包括在感兴趣区域中检测到的边缘点并排除排除区域中的边缘点。排除区域由排除区域生成器基于至少一个先前表征的特征来确定，该特征是特征在于使用检测先前表征的特征的边缘点和表征尺寸参数的视频工具的特征。重要的是，强大的视频工具功能和操作被配置为允许在正确制造或不正确地制造的工件上进行学习模式编程，并且所得到的程序将在正确制造或不正确地制造的运行模式工件上可靠地运行。

2. 发明授权

US07961933B2 Method of setting reference data for inspection of fillets and inspection device using same 失效
标题翻译：设置用于检查鱼片和检查装置的参考数据的方法
公开(公告)号：US07961933B2
公开(公告)日：2011-06-14
申请号：US11880169
申请日：2007-07-20
申请人： Yoshiki Fujii , Yasutomo Doi , Akira Nakajima , Toshihiro Moriya , Yasuaki Nakajima
发明人： Yoshiki Fujii , Yasutomo Doi , Akira Nakajima , Toshihiro Moriya , Yasuaki Nakajima
IPC分类号： G06K9/00
CPC分类号： G01N21/95684 , B23K31/125 , G01N2021/95669 , G06T7/001 , G06T2207/30141 , G06T2207/30152
摘要： Reference data for automatically inspecting shapes of fillets formed on a substrate are set to an inspection device that illuminates the substrate from specified directions to generate an image. For each type of components mounted to the substrate, a database is prepared, registering sets of reference data corresponding to different fillet shapes in correlation with heights of solder for forming fillets having these shapes. After components to be an object of inspection are identified, specified steps are carried out on each of these components, including the step of obtaining data on the height of solder for forming the fillet related to a land for which a target area for inspection has been set and reading out reference data corresponding to the data obtained from the reference data registered in the database.
摘要翻译：用于自动检查形成在基底上的鱼片形状的参考数据被设置为从指定方向照射衬底以产生图像的检查装置。对于安装到基板的每种类型的部件，准备数据库，将与形成具有这些形状的圆角的焊料的高度相对应的不同的圆角形状对应的参考数据集合对齐。在识别到作为检验对象的部件之后，对这些部件中的每一个进行指定的步骤，包括获得与用于检查的目标区域相关的焊盘相关的焊盘高度的数据的步骤设置和读出与从数据库中注册的参考数据获得的数据相对应的参考数据。

3. 发明申请

US20090202141A1 VISUAL INSPECTION METHOD AND VISUAL INSPECTION APPARATUS 有权
标题翻译：视觉检测方法和视觉检测装置
公开(公告)号：US20090202141A1
公开(公告)日：2009-08-13
申请号：US12424105
申请日：2009-04-15
申请人： Yoshihiro SASAKI , Masahiko Nagao
发明人： Yoshihiro SASAKI , Masahiko Nagao
IPC分类号： G06K9/00
CPC分类号： G06T7/0004 , G01N21/95684 , G01N2021/95669 , G06T2207/30141
摘要： In a visual inspection method and apparatus, a picture processing unit converts an original picture, obtained by taking a photograph of a BGA illuminated by a ring illuminator from above, by using a camera, and labels a binary picture obtained by this binary conversion. Then, it forms a circumscribing rectangle circumscribing an outer circumference of a labeling picture obtained by the labeling, and inverts a labeling picture within the formed rectangle, and removes a portion of a region formed by the outer circumference and the circumscribing rectangle in a picture obtained by the inversion, and then generates an inspection picture by adding a picture obtained by the removal to the labeling picture, and accordingly judges a pass or rejection of the inspection target sample based on the generated inspection picture. Thus, the inspection can be carried out at a high accuracy irrespectively of a low cost.
摘要翻译：在视觉检查方法和装置中，图像处理单元通过使用照相机将从环形照明器照射的BGA的照片获取的原始图像转换成通过使用照相机的标签，并且对通过该二进制转换获得的二值图像进行标记。然后，形成围绕通过标签获得的标示图案的外周的外接矩形，并且反转所形成的矩形内的标记图像，并且去除由所获得的图像中的外圆周和外接矩形形成的区域的一部分通过反转，然后通过将通过去除获得的图像添加到标记图片来生成检查图像，并且因此基于生成的检查图像来判断检查对象样本的通过或拒绝。因此，可以高精度地进行检查，而不管成本低。

4. 发明授权

US11927436B2 Measurement machine and method for detecting a defect in solder joints 有权
公开(公告)号：US11927436B2
公开(公告)日：2024-03-12
申请号：US17404097
申请日：2021-08-17
申请人： HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
发明人： Jaime E. Llinas , Saravanan Rathakrishnan , Yanyan Xia , ZeLin Wu , Yanli Li , JunHui Li , Jian Miremadi
IPC分类号： G01B15/00 , G01B9/04 , G01B11/02 , G01N21/956 , G01B21/04
CPC分类号： G01B15/00 , G01B9/04 , G01B11/02 , G01N21/956 , G01B21/042 , G01N2021/95638 , G01N2021/95669
摘要： Example implementations relate to an inspection method for training a measurement machine to accurately measure side joint lengths and detecting a defect among a plurality of solder joints. The method includes receiving a first data representing the side joint lengths of the plurality of solder joints measured by a first measurement machine and a second data representing the side joint lengths measured by a second measurement machine. Further, the method includes determining a correlation value based on a statistical analysis of a relationship between the first data and the second data. The method further includes updating an algorithm used by the first measurement machine to measure the side joint lengths, based on the correlation value to reduce deviation between the first data and the second data. Later, the updated algorithm is used as a dimensional metrology in the first measurement machine for detecting the defect in the solder joints.

5. 发明申请

US20080040058A1 Method of setting reference data for inspection of fillets and inspection device using same 失效
标题翻译：设置用于检查鱼片和检查装置的参考数据的方法
公开(公告)号：US20080040058A1
公开(公告)日：2008-02-14
申请号：US11880169
申请日：2007-07-20
申请人： Yoshiki Fujii , Yasutomo Doi , Akira Nakajima , Toshihiro Moriya , Yasuaki Nakajima
发明人： Yoshiki Fujii , Yasutomo Doi , Akira Nakajima , Toshihiro Moriya , Yasuaki Nakajima
IPC分类号： G06F19/00
CPC分类号： G01N21/95684 , B23K31/125 , G01N2021/95669 , G06T7/001 , G06T2207/30141 , G06T2207/30152
摘要： Reference data for automatically inspecting shapes of fillets formed on a substrate are set to an inspection device that illuminates the substrate from specified directions to generate an image. For each type of components mounted to the substrate, a database is prepared, registering sets of reference data corresponding to different fillet shapes in correlation with heights of solder for forming fillets having these shapes. After components to be an object of inspection are identified, specified steps are carried out on each of these components, including the step of obtaining data on the height of solder for forming the fillet related to a land for which a target area for inspection has been set and reading out reference data corresponding to the data obtained from the reference data registered in the database.
摘要翻译：用于自动检查形成在基底上的鱼片形状的参考数据被设置为从指定方向照射衬底以产生图像的检查装置。对于安装到基板的每种类型的部件，准备数据库，将与形成具有这些形状的圆角的焊料的高度相对应的不同的圆角形状对应的参考数据集合对齐。在识别到作为检验对象的部件之后，对这些部件中的每一个进行指定的步骤，包括获得与用于检查的目标区域相关的焊盘相关的焊盘高度的数据的步骤设置和读出与从数据库中注册的参考数据获得的数据相对应的参考数据。

6. 发明申请

US20070053577A1 Production of test patterns for test inspection 审中-公开
标题翻译：生产试验检验试验图案
公开(公告)号：US20070053577A1
公开(公告)日：2007-03-08
申请号：US10565919
申请日：2004-07-07
申请人： Karl Schanz
发明人： Karl Schanz
IPC分类号： G06K9/00
CPC分类号： H05K3/3484 , G01N21/95607 , G01N2021/95615 , G01N2021/95638 , G01N2021/95669 , G01N2021/95676 , H05K1/0269 , H05K3/1225 , H05K2203/163
摘要： A method and an arrangement for a testing of substrates provided with a predetermined pattern, in particular circuit boards with an application of solder paste. In accordance with the invention the actual pattern applied to the substrate by means of a printing or structuring process is optically detected, the optically detected actual pattern is compared with a desired pattern and in dependence on the comparison and taking into account permissible tolerances it is determined to which further process the observed substrate provided with the actual pattern is to be delivered, wherein the optical detection of the actual pattern is effected in the form of digital data with the formation of an actual data set, a desired data set is formatted from control data for the application of the pattern to the substrates, and data processing is carried out to the effect that the desired data set and the actual data set are compared datawise with one another taking into account permissible tolerances.
摘要翻译：一种用于测试具有预定图案的基板的方法和装置，特别是具有焊膏应用的电路板。根据本发明，通过光学检测应用于基板的实际图案，将光学检测的实际图案与期望的图案进行比较，并且根据比较并考虑到确定的允许公差进一步处理提供有实际图案的观察衬底将被传送到其上，其中实际图案的光学检测以形成实际数据集的数字数据的形式进行，期望的数据集由控制用于将图案应用于基板的数据和数据处理被执行为使得期望数据集和实际数据集在数据上彼此比较，同时考虑到允许的公差。

7. 发明授权

US07149344B2 Systems and methods for detecting defects in printed solder paste 有权
标题翻译：用于检测印刷焊膏缺陷的系统和方法
公开(公告)号：US07149344B2
公开(公告)日：2006-12-12
申请号：US11091986
申请日：2005-03-29
申请人： David P. Prince
发明人： David P. Prince
IPC分类号： G06K9/00
CPC分类号： G06T7/0004 , B23K1/0016 , B23K3/08 , B23K31/12 , B23K2101/40 , B23K2101/42 , G01N21/95607 , G01N21/95684 , G01N2021/95646 , G01N2021/95669 , G06T7/44 , G06T2207/30152 , H05K1/0269 , H05K3/1216 , H05K3/3484 , H05K2203/0126
摘要： A method of analyzing an image of a substance deposited onto a substrate, the image comprising a plurality of pixels, includes defining a region of interest in the image, associating the region of interest with first and second perpendicular axis, wherein a set of pixels in the image lie along the first axis, converting the pixels in the region of interest to a single dimensional array aligned with the first axis and projecting along the second axis, and applying at least one threshold to the single dimensional array, the threshold based at least in part on a predetermined limit.
摘要翻译：一种分析沉积在基底上的物质的图像的方法，所述图像包括多个像素，包括在图像中限定感兴趣区域，将感兴趣区域与第一和第二垂直轴相关联，其中，一组像素在图像沿着第一轴线位于第一轴上，将感兴趣区域中的像素转换为与第一轴对齐并且沿着第二轴线突出的单维阵列，并且将至少一个阈值应用于单维阵列，该阈值至少基于部分地在预定的限制上。

8. 发明授权

US07545970B2 Visual inspection method and visual inspection apparatus 有权
标题翻译：目视检查方法和目视检查仪器
公开(公告)号：US07545970B2
公开(公告)日：2009-06-09
申请号：US11206163
申请日：2005-08-18
申请人： Yoshihiro Sasaki , Masahiko Nagao
发明人： Yoshihiro Sasaki , Masahiko Nagao
IPC分类号： G06K9/00 , H04N7/18
CPC分类号： G06T7/0004 , G01N21/95684 , G01N2021/95669 , G06T2207/30141
摘要： In a visual inspection method and apparatus, a picture processing unit converts an original picture, obtained by taking a photograph of a BGA illuminated by a ring illuminator from above, using a camera, and labels a binary picture obtained by this binary conversion. Then, it forms a rectangle circumscribing an outer circumference of a labeling picture obtained by the labeling, and inverts a labeling picture within the formed circumscribing rectangle, and removes a portion of a region formed by the outer circumference and the circumscribing rectangle in a picture obtained by the inversion, and then generates an inspection picture by adding a picture obtained by the removal to the labeling picture, and accordingly judges a pass or rejection of the inspection target sample based on the generated inspection picture. Thus, the inspection can be carried out at high accuracy irrespectively of a low cost.
摘要翻译：在目视检查方法和装置中，图像处理单元使用照相机从通过从上方摄取由环形照明器照亮的BGA的照片而获得的原始图像，并且对通过该二进制转换获得的二进制图像进行标记。然后，形成围绕通过标签获得的标示图案的外周的矩形，并且反转形成的外接矩形内的标记图像，并且去除由所获得的图像中的外圆周和外接矩形形成的区域的一部分通过反转，然后通过将通过去除获得的图像添加到标记图片来生成检查图像，并且因此基于生成的检查图像来判断检查对象样本的通过或拒绝。因此，可以以高精度执行检查，而不管成本低。

9. 发明授权

US06950549B2 Visual inspection method and visual inspection apparatus 有权
公开(公告)号：US06950549B2
公开(公告)日：2005-09-27
申请号：US10073168
申请日：2002-02-13
申请人： Yoshihiro Sasaki , Masahiko Nagao
发明人： Yoshihiro Sasaki , Masahiko Nagao
IPC分类号： G01B11/24 , G01N21/956 , G06T1/00 , G06T5/00 , G06T7/00 , G06T7/60 , H01L23/12 , G06K9/00
CPC分类号： G06T7/0004 , G01N21/95684 , G01N2021/95669 , G06T2207/30141
摘要： In a visual inspection method and apparatus, a picture processing unit converts an original picture, obtained by taking a photograph of a BGA illuminated by a ring illuminator from above, using a camera, and labels a binary picture obtained by this binary conversion. Then, it forms a rectangle circumscribing an outer circumference of a labeling picture obtained by the labeling, and inverts a labeling picture within the formed circumscribing rectangle, and removes a portion of a region formed by the outer circumference and the circumscribing rectangle in a picture obtained by the inversion, and then generates an inspection picture by adding a picture obtained by the removal to the labeling picture, and accordingly judges a pass or rejection of the inspection target sample based on the generated inspection picture. Thus, the inspection can be carried out at high accuracy irrespectively of a low cost.

10. 发明申请

US20050169514A1 Systems and methods for detecting defects in printed solder paste 有权
公开(公告)号：US20050169514A1
公开(公告)日：2005-08-04
申请号：US11091986
申请日：2005-03-29
申请人： David Prince
发明人： David Prince
IPC分类号： G01B11/00 , B23K1/00 , B23K3/08 , B23K31/12 , G01N21/956 , G06K9/00 , G06T20060101 , G06T1/00 , G06T7/00 , G06T7/40 , G06T9/00 , H05K1/02 , H05K3/12 , H05K3/34
CPC分类号： G06T7/0004 , B23K1/0016 , B23K3/08 , B23K31/12 , B23K2101/40 , B23K2101/42 , G01N21/95607 , G01N21/95684 , G01N2021/95646 , G01N2021/95669 , G06T7/44 , G06T2207/30152 , H05K1/0269 , H05K3/1216 , H05K3/3484 , H05K2203/0126
摘要： A method of analyzing an image of a substance deposited onto a substrate, the image comprising a plurality of pixels, includes defining a region of interest in the image, associating the region of interest with first and second perpendicular axis, wherein a set of pixels in the image lie along the first axis, converting the pixels in the region of interest to a single dimensional array aligned with the first axis and projecting along the second axis, and applying at least one threshold to the single dimensional array, the threshold based at least in part on a predetermined limit.

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