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    • 2. 发明授权
    • Process gas delivery for semiconductor process chambers
    • 半导体处理室的工艺气体输送
    • US08382897B2
    • 2013-02-26
    • US13456189
    • 2012-04-25
    • Kedarnath SangamAnh N. Nguyen
    • Kedarnath SangamAnh N. Nguyen
    • C30B25/14
    • H01L21/3141C23C16/405C23C16/45544C23C16/45582H01L21/31645Y10T117/10Y10T137/87249
    • Methods for gas delivery to a process chamber are provided herein. In some embodiments, a method may include flowing a process gas through one or more gas conduits, each gas conduit having an inlet and an outlet for facilitating the flow of gas through the gas conduits and into a gas inlet funnel having a second volume, wherein each gas conduit has a first volume less than the second volume, and wherein each gas conduit has a cross-section that increases from a first cross-section proximate the inlet to a second cross-section proximate the outlet but excluding any intersection points between the gas inlet funnel and the gas conduit, and wherein the second cross-section is non-circular; and delivering the process gas to the substrate via the gas inlet funnel.
    • 本文提供了将气体输送到处理室的方法。 在一些实施例中,方法可以包括使工艺气体流过一个或多个气体导管,每个气体管道具有入口和出口,用于促进气体流过气体导管并进入具有第二体积的气体入口漏斗,其中 每个气体管道具有小于第二容积的第一容积,并且其中每个气体导管具有从靠近入口的第一横截面增加到靠近出口的第二横截面的横截面,但不包括 气体入口漏斗和气体导管,并且其中第二横截面是非圆形的; 以及经由进气漏斗将工艺气体输送到衬底。
    • 3. 发明授权
    • Process gas delivery for semiconductor process chamber
    • 半导体处理室的工艺气体输送
    • US08187381B2
    • 2012-05-29
    • US12197029
    • 2008-08-22
    • Kedarnath SangamAnh N. Nguyen
    • Kedarnath SangamAnh N. Nguyen
    • C30B35/00
    • H01L21/3141C23C16/405C23C16/45544C23C16/45582H01L21/31645Y10T117/10Y10T137/87249
    • Methods and apparatus for a gas delivery assembly are provided herein. In some embodiments, the gas delivery assembly includes a gas inlet funnel having a first volume and one or more gas conduits; each gas conduit having an inlet and an outlet for facilitating the flow of a gas therethrough and into the first volume, wherein each gas conduit has a second volume less than the first volume, and wherein each gas conduit has a cross-section that increases from a first cross-section proximate the inlet to a second cross-section proximate the outlet, wherein the second cross-section is non-circular. In some embodiments, each conduit has a longitudinal axis that intersects a central axis of the gas inlet funnel.
    • 本文提供了用于气体输送组件的方法和装置。 在一些实施例中,气体输送组件包括具有第一体积和一个或多个气体导管的气体入口漏斗; 每个气体管道具有入口和出口,用于促进气体流过其中并进入第一容积,其中每个气体管道具有小于第一容积的第二容积,并且其中每个气体导管的横截面从 靠近所述出口的靠近所述入口的第二横截面的第一横截面,其中所述第二横截面是非圆形的。 在一些实施例中,每个导管具有与进气漏斗的中心轴线相交的纵向轴线。
    • 6. 发明授权
    • Head for vaporizing and flowing various precursor materials onto semiconductor wafers during chemical vapor deposition
    • 用于在化学气相沉积期间将各种前体材料蒸发并流动到半导体晶片上
    • US06299692B1
    • 2001-10-09
    • US09621335
    • 2000-07-21
    • Vincent KuMing XiXiaoxiong YuanAnzhong ChangAnh N. Nguyen
    • Vincent KuMing XiXiaoxiong YuanAnzhong ChangAnh N. Nguyen
    • C23C1600
    • C23C16/4485
    • A vaporizer head for evenly flowing at low pressure into a processing chamber vaporized precursor compounds for deposition of metal and other layers onto a semiconductor, has a bulb-like body with a center axis, a lengthwise cavity, an input end and an output end. The cavity has an opening for receiving a stream of vaporized precursor compound. There are a plurality of passages for flow of vapor through the head, each passage having a length and a diameter. They extend radially from along and around the cavity like the spokes of a wheel at inclined angles relative to the center axis from the cavity to a tapered output surface of the head. The cavity has a well-like bottom for capturing any droplets or particles of precursor compound and preventing them from leaving the head except as vapor. The plurality of passages have sufficiently large diameters such that there is only a low pressure drop in the vapor flowing through the head.
    • 将用于在低压下均匀流动到处理室中的蒸发器头部具有用于将金属和其它层沉积到半导体上的蒸发的前体化合物具有具有中心轴,纵向腔,输入端和输出端的灯泡状体。 空腔具有用于接收蒸发的前体化合物流的开口。 存在多个用于蒸汽流过头部的通道,每个通道具有长度和直径。 它们相对于从中心轴线到中心轴线的倾斜角度,沿着腔体的周边和周围径向延伸,如同轮的轮辐一样沿径向延伸到头部的锥形输出表面。 空腔具有良好的底部,用于捕获前体化合物的任何液滴或颗粒,并防止它们离开头部,除了作为蒸气。 多个通道具有足够大的直径,使得在流过头部的蒸气中只有低压降。
    • 9. 发明授权
    • High temperature chemical vapor deposition chamber
    • 高温化学气相沉积室
    • US06364954B2
    • 2002-04-02
    • US09211998
    • 1998-12-14
    • Salvador P. UmotoySteve H. ChiaoAnh N. NguyenBe V. VoJoel HustonJames J. ChenLawrence Chung-Lai Lei
    • Salvador P. UmotoySteve H. ChiaoAnh N. NguyenBe V. VoJoel HustonJames J. ChenLawrence Chung-Lai Lei
    • C23C1600
    • C23C16/45565C23C16/4401C23C16/4405C23C16/4412C23C16/45514C23C16/45574C23C16/4584C23C16/5096
    • An apparatus for wafer processing, which comprises a chamber body and a heated liner which are thermally isolated from each other by isolating pins. During wafer processing, e.g., deposition of titanium nitride film by thermal reaction between titanium tetrachloride and ammonia, a wafer substrate is heated to a reaction temperature in the range of 600-700° C. by a heated support pedestal. The chamber liner and the interior chamber walls are maintained at a temperature between 150-250° C. to prevent deposition of undesirable by-products inside the chamber. This facilitates the chamber cleaning procedure, which can be performed using an in-situ chlorine-based process. The excellent thermal isolation between the heated liner and the chamber body allows the chamber exterior to be maintained at a safe operating temperature of 60-65° C. A heated exhaust assembly is also used in conjunction with the process chamber to remove exhaust gases and reaction by-products. External heaters are used to maintain the exhaust assembly at a temperature of about 150-200° C. to minimize undesirable deposits on the interior surfaces of the exhaust assembly.
    • 一种用于晶片处理的装置,其包括通过隔离销彼此热隔离的室主体和加热衬套。 在晶片加工期间,例如通过四氯化钛和氨之间的热反应沉积氮化钛膜,通过加热的支撑基座将晶片基板加热至600-700℃范围内的反应温度。 腔室衬里和内部室壁保持在150-250℃之间的温度,以防止在室内沉积不期望的副产物。 这有助于室清洁程序,其可以使用原位氯基方法进行。 加热的衬套和腔体之间的良好的隔热能使室外保持在60-65℃的安全工作温度。加热排气组件还与处理室结合使用以除去废气和反应 副产品。 使用外部加热器将排气组件保持在约150-200℃的温度下,以使排气组件的内表面上的不期望的沉积物最小化。