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    • 2. 发明授权
    • Method of measuring layer thickness and composition of alloy plating
    • 测量层厚度和合金电镀组成的方法
    • US4764945A
    • 1988-08-16
    • US860190
    • 1986-04-24
    • Tadahiro Abe
    • Tadahiro Abe
    • G01B15/02G01N23/223
    • G01N23/223G01B15/02G01N2223/076
    • Methods of measuring the thickness or thicknesses and the composition or compositions of an alloy plating having one layer or two layers different in composition from each other, wherein the alloy plating includes a metal identical with a substrate metal, suitable for use in analyzing a Zn--Fe group one layer or two layer alloy-plated steel plate. Characteristic X-rays and white X-rays irradiate an object (112, 10, 210) to be measured. A diffraction angle (2.theta.) of diffracted X-rays of the characteristic X-rays, which are diffracted by an intermetallic compound of the alloy plating, is measured; the composition of the alloy plating is measured from the diffraction angle, an intensity or intensities of fluorescent X-rays from an object to be measured are detected, wherein the flourescent X-rays generated by the white X-rays; and the thickness or thicknesses of the alloy plating are measured from the intensity or intensities of the fluorescent X-rays and the composition of the alloy plating.
    • PCT No.PCT / JP85 / 00551 Sec。 一九八六年四月二十四日 102(e)日期1986年4月24日PCT提交1985年10月3日PCT公布。 出版物WO86 / 02164 日期:1986年04月10日。测量组合物中具有一层或两层不同组成的合金镀层的厚度或厚度,组成或组成的方法,其中所述合金镀层包括与基底金属相同的金属,适合 用于分析Zn-Fe基一层或两层合金镀钢板。 特征X射线和白色X射线照射要测量的物体(112,10,210)。 测量由合金镀层的金属间化合物衍射的特征X射线衍射X射线的衍射角(2θ); 从衍射角测量合金镀层的组成,检测来自待测物体的荧光X射线的强度或强度,其中由白色X射线产生的荧光X射线; 并且根据荧光X射线的强度或强度以及合金镀层的组成来测量合金镀层的厚度或厚度。
    • 4. 发明授权
    • Magnetic recording medium and method for production thereof
    • 磁记录介质及其制造方法
    • US5169703A
    • 1992-12-08
    • US727057
    • 1991-07-08
    • Takahiro MiyazakiMinoru YamagaTadahiro AbeTsutomu Ogawa
    • Takahiro MiyazakiMinoru YamagaTadahiro AbeTsutomu Ogawa
    • G11B5/70G11B5/733
    • G11B5/733Y10S428/90Y10T428/24355Y10T428/24372
    • A magnetic recording medium having minute irregularities on the surface of a magnetic layer is disclosed. The value of the ratio A.sub.V /A.sub.P, where A.sub.V and A.sub.P are cross-sectional areas of valleys and projections as measured in a plane lower by 50 nm and in a plane higher than 50 nm than an intermediate plane of the magnetic layer, respectively, with the measurement being made using a three-dimensional roughness meter, is given by A.sub.V /A.sub.P .gtoreq.0.90, wherein the intermediate plane is a plane for which the cross-sectional area of the projections is approximately equal to that of the valleys. The minute irregularities on the surface of the magnetic layer are produced by providing a non-magnetic substrate presenting different surface roughnesses on its front surface and back surface, and by transferring surface irregularities constituting the surface roughness of the back surface of the non-magnetic substrate to the front surface of the substrate.
    • 公开了一种在磁性层的表面上具有微小凹凸的磁记录介质。 AV / AP的比值,其中AV和AP分别是在低于磁性层的中间平面的50nm以下的平面中测量的谷和投影的横截面积, 通过使用三维粗糙度计进行测量,由AV / AP> / = 0.90给出,其中中间平面是突起的横截面积大致等于谷的横截面面积的平面。 通过在其表面和背面上设置表现出不同表面粗糙度的非磁性基板,并且通过转印构成非磁性基板的背面的表面粗糙度的表面凹凸,来产生磁性层表面上的微小凹凸 到基板的前表面。
    • 5. 发明授权
    • Fluorescent X-ray analyzing method of solution specimen and specimen
sampler used for the method
    • 用于该方法的溶液样品和样品取样器的荧光X射线分析方法
    • US4788700A
    • 1988-11-29
    • US928657
    • 1986-11-05
    • Shigetoshi KurozumiTadahiro AbeHideo MaruyamaNoriko Yasui
    • Shigetoshi KurozumiTadahiro AbeHideo MaruyamaNoriko Yasui
    • G01N23/22G01N23/223H05G1/00
    • G01N23/2202
    • For analyzing the solution specimen according to the fluorescent X-ray analyzing method, a certain quantity of solution specimen to be analyzed is impregnated into a thin porous sheet, for example by dripping method, and the sheet is dried for evaporating the solvent. Held on an appropriate holder, for example, the sheet is placed in the vacuum atmosphere or the atmosphere of helium gas, so that the primary X-rays are irradiated and the wavelength or the intensity of the fluorescent X-rays generated from the solute remained in the sheet may be detected. The concentration of the solution may be changed by concentration or by dilution, so that an adequate intensity of the fluorescent X-ray may be generated. The specimen sampler is made of porous sheet material, to which the solution specimen to be analyzed is impregnated and dried to remain only the solute of the solution in the sheet. To the circumferential edge of the sheet is attached a circular edge of a support, so that the central portion of the porous sheet is sufficiently spaced from the circumferentially provided support.
    • 为了根据荧光X射线分析法对溶液样品进行分析,将一定量的待分析溶液试样浸渍在例如滴加法的薄多孔片材中,干燥以蒸发溶剂。 例如,在适当的保持器上,将片材放置在真空气氛或氦气气氛中,从而照射初级X射线,并且保留从溶质产生的荧光X射线的波长或强度 可能检测到纸张。 可以通过浓缩或稀释来改变溶液的浓度,从而可以产生足够强度的荧光X射线。 样品取样器由多孔片材制成,待分析的溶液样品被浸渍和干燥,以仅保留片材中溶液的溶质。 在片材的圆周边缘附着有支撑件的圆形边缘,使得多孔片材的中心部分与周向设置的支撑件充分地间隔开。