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1. 发明申请

US20120203473A1 APPARATUS AND METHOD FOR MEASURING SEMICONDUCTOR CARRIER LIFETIME 有权
标题翻译：测量半导体载体寿命的装置和方法
公开(公告)号：US20120203473A1
公开(公告)日：2012-08-09
申请号：US13500305
申请日：2010-10-01
申请人： Kazushi Hayashi , Hiroyuki Takamatsu , Yoshito Fukumoto , Naokazu Sakoda , Masahiro Inui , Shingo Sumie
发明人： Kazushi Hayashi , Hiroyuki Takamatsu , Yoshito Fukumoto , Naokazu Sakoda , Masahiro Inui , Shingo Sumie
IPC分类号： G06F19/00 , G01N21/55
CPC分类号： G01N21/3151 , G01N21/31 , G01N2021/3568 , H01L22/14 , H01L2924/0002 , H01L2924/00
摘要： In a semiconductor carrier lifetime measuring apparatus A1 of the present invention, at least two types of light having mutually different wavelengths are irradiated onto a semiconductor X to be measured, a predetermined measurement wave is irradiated onto the semiconductor X to be measured, a reflected wave of the measurement wave that has been reflected by the semiconductor X to be measured or a transmitted wave of the measurement wave that has transmitted through the semiconductor X to be measured is detected, and the carrier lifetime in the semiconductor X to be measured is obtained based on the detection results so as to minimize the error. Accordingly, the semiconductor carrier lifetime measuring apparatus A1 configured as described above can more accurately measure the carrier lifetime.
摘要翻译：在本发明的半导体载体寿命测量装置A1中，将具有相互不同波长的至少两种类型的光照射到要测量的半导体X上，将预定测量波照射到要测量的半导体X上，反射波检测被测半导体X所反射的测量波，或检测通过半导体X的被测量的测定波的透过波，测定半导体X的载流子寿命，检测结果，以最小化误差。因此，如上所述构成的半导体载体寿命测定装置A1能够更准确地测定载流子寿命。

2. 发明申请

US20130153778A1 CRYSTALLINE QUALITY EVALUATION APPARATUS FOR THIN-FILM SEMICONDUCTORS, USING +82 -PCD TECHNIQUE 有权
标题翻译：薄膜半导体晶体质量评估装置，采用+ 82 -PCD技术
公开(公告)号：US20130153778A1
公开(公告)日：2013-06-20
申请号：US13819288
申请日：2011-09-01
申请人： Naokazu Sakoda , Hiroyuki Takamatsu , Masahiro Inui , Futoshi Ojima
发明人： Naokazu Sakoda , Hiroyuki Takamatsu , Masahiro Inui , Futoshi Ojima
IPC分类号： G01T1/16
CPC分类号： G01T1/16 , G01N21/63 , G01N21/8422 , G01N22/00 , H01L22/12
摘要： The present invention provides a crystalline quality evaluation apparatus (1) and a crystalline quality evaluation method for thin-film semiconductors, which are designed to evaluate crystalline quality of a sample (2) of a thin-film semiconductor (2a) by emitting excitation light and an electromagnetic wave to irradiate a measurement site of the sample (2), and detecting an intensity of a reflected electromagnetic wave from the sample (2). In the present invention, the thin-film semiconductor (2a) of the sample (2) is formed on an electrically conductive film (2b), and a dielectric (3) transparent to the excitation light is additionally disposed between the sample (2) and a waveguide (13) for emitting the electromagnetic wave therefrom. Thus, the thin-film semiconductor crystalline quality evaluation apparatus (1) and method configured in this manner make it possible to evaluate the crystalline quality even in the above situation where the electrically conductive film (2b) is formed under the semiconductor thin-film (2a).
摘要翻译：本发明提供一种薄膜半导体的结晶质量评价装置（1）和结晶质量评价方法，其被设计为通过发射激发光来评价薄膜半导体（2a）的样品（2）的结晶质量和用于照射样品（2）的测量部位的电磁波，以及检测来自样品（2）的反射电磁波的强度。在本发明中，样品（2）的薄膜半导体（2a）形成在导电膜（2b）上，并且在样品（2）之间另外设置对激发光透明的电介质（3）以及用于从其发射电磁波的波导（13）。因此，这样构成的薄膜半导体结晶质量评价装置（1）和方法即使在半导体薄膜下形成导电膜（2b）的情况下也能够评价结晶质量 2a）。

3. 发明授权

US08952338B2 Crystalline quality evaluation apparatus for thin-film semiconductors, using μ-PCD technique 有权
标题翻译：使用μ-PCD技术的薄膜半导体晶体质量评估装置
公开(公告)号：US08952338B2
公开(公告)日：2015-02-10
申请号：US13819288
申请日：2011-09-01
申请人： Naokazu Sakoda , Hiroyuki Takamatsu , Masahiro Inui , Futoshi Ojima
发明人： Naokazu Sakoda , Hiroyuki Takamatsu , Masahiro Inui , Futoshi Ojima
IPC分类号： G01T1/16 , G01N21/63 , H01L21/66 , G01N21/84 , G01N22/00
CPC分类号： G01T1/16 , G01N21/63 , G01N21/8422 , G01N22/00 , H01L22/12
摘要： The present invention provides a crystalline quality evaluation apparatus (1) and a crystalline quality evaluation method for thin-film semiconductors, which are designed to evaluate crystalline quality of a sample (2) of a thin-film semiconductor (2a) by emitting excitation light and an electromagnetic wave to irradiate a measurement site of the sample (2), and detecting an intensity of a reflected electromagnetic wave from the sample (2). In the present invention, the thin-film semiconductor (2a) of the sample (2) is formed on an electrically conductive film (2b), and a dielectric (3) transparent to the excitation light is additionally disposed between the sample (2) and a waveguide (13) for emitting the electromagnetic wave therefrom. Thus, the thin-film semiconductor crystalline quality evaluation apparatus (1) and method configured in this manner make it possible to evaluate the crystalline quality even in the above situation where the electrically conductive film (2b) is formed under the semiconductor thin-film (2a).
摘要翻译：本发明提供一种薄膜半导体的结晶质量评价装置（1）和结晶质量评价方法，其被设计为通过发射激发光来评价薄膜半导体（2a）的样品（2）的结晶质量和用于照射样品（2）的测量部位的电磁波，以及检测来自样品（2）的反射电磁波的强度。在本发明中，样品（2）的薄膜半导体（2a）形成在导电膜（2b）上，并且在样品（2）之间另外设置对激发光透明的电介质（3）以及用于从其发射电磁波的波导（13）。因此，这样构成的薄膜半导体结晶质量评价装置（1）和方法即使在半导体薄膜下形成导电膜（2b）的情况下也能够评价结晶质量 2a）。

4. 发明授权

US07522287B2 Photothermal conversion measurement apparatus, photothermal conversion measurement method, and sample cell 失效
标题翻译：光热转换测量装置，光热转换测量方法和样品池
公开(公告)号：US07522287B2
公开(公告)日：2009-04-21
申请号：US11350954
申请日：2006-02-10
申请人： Eiji Takahashi , Hiroyuki Takamatsu , Masato Kannaka , Naokazu Sakoda , Tsutomu Morimoto
发明人： Eiji Takahashi , Hiroyuki Takamatsu , Masato Kannaka , Naokazu Sakoda , Tsutomu Morimoto
IPC分类号： G01B11/02 , G01N21/00 , G01N1/10
CPC分类号： G01N21/171 , G01N21/031 , G01N2021/1712 , G01N2021/178 , G01N2201/105
摘要： A liquid sample is irradiated with excitation light and measurement light, and a measurement position at which a traveling path of the measurement light passes through an excitation section of the excitation light in the sample is changed while the sample is being irradiated with the excitation light and the measurement light. Then, the phase change of the measurement light is measured for each measurement by optical interferometry on the basis of the measurement light after the measurement light passes through the sample. The measurement position is changed by, for example, scanning the excitation light, moving the sample, moving a lens that collects the excitation light in the sample so as to change the light-collecting position (focal position) in the sample, etc.
摘要翻译：用激发光和测量光照射液体样品，并且在样品被激发光照射的同时改变测量光的行进路径通过样品中的激发光的激发部分的测量位置，以及测量灯。然后，基于测量光通过样品后的测量光，通过光学干涉测量对每次测量测量测量光的相位变化。通过例如扫描激发光，移动样品，移动收集样品中的激发光的透镜来改变测量位置，以便改变样品中的聚光位置（焦点位置）等。

5. 发明申请

US20060181708A1 Photothermal conversion measurement apparatus, photothermal conversion measurement method, and sample cell 失效
公开(公告)号：US20060181708A1
公开(公告)日：2006-08-17
申请号：US11350954
申请日：2006-02-10
申请人： Eiji Takahashi , Hiroyuki Takamatsu , Masato Kannaka , Naokazu Sakoda , Tsutomu Morimoto
发明人： Eiji Takahashi , Hiroyuki Takamatsu , Masato Kannaka , Naokazu Sakoda , Tsutomu Morimoto
IPC分类号： G01N21/59
CPC分类号： G01N21/171 , G01N21/031 , G01N2021/1712 , G01N2021/178 , G01N2201/105
摘要： A liquid sample is irradiated with excitation light and measurement light, and a measurement position at which a traveling path of the measurement light passes through an excitation section of the excitation light in the sample is changed while the sample is being irradiated with the excitation light and the measurement light. Then, the phase change of the measurement light is measured for each measurement by optical interferometry on the basis of the measurement light after the measurement light passes through the sample. The measurement position is changed by, for example, scanning the excitation light, moving the sample, moving a lens that collects the excitation light in the sample so as to change the light-collecting position (focal position) in the sample, etc.

6. 发明申请

US20080218742A1 Apparatus and method for detecting tire shape 有权
标题翻译：轮胎形状检测装置及方法
公开(公告)号：US20080218742A1
公开(公告)日：2008-09-11
申请号：US11898906
申请日：2007-09-17
申请人： Naokazu Sakoda , Eiji Takahashi , Tsutomu Morimoto , Yasuhiro Matsushita , Toshikatsu Nonaka , Shiro Horiguchi
发明人： Naokazu Sakoda , Eiji Takahashi , Tsutomu Morimoto , Yasuhiro Matsushita , Toshikatsu Nonaka , Shiro Horiguchi
IPC分类号： G01N21/00 , G01N21/55
CPC分类号： G01M17/027
摘要： A tire shape detecting apparatus includes a projector that applies a plurality line light beams in a continuously joined manner, from a direction different from the detection height direction (Z-axis direction) in one light section line, or that applies one line light beam in a condensed manner in the line length direction thereof in order that the one light section line may be formed on the one line Ls on the surface of the tire; and a camera for picking up images of the plurality of line light beams applied to the tire surface in the direction in which the principal ray of each of the plurality of line light beams performs specular reflection with respect to the tire surface, or in the direction in which the principal ray of the condensed one line light beam performs specular reflection with respect to the tire surface.
摘要翻译：轮胎形状检测装置包括投影仪，其从与一条光线中的检测高度方向（Z轴方向）不同的方向以连续接合的方式施加多条线光束，或者将一条线光束在其长度方向上以冷凝方式，以便在轮胎表面上的一条线Ls上形成一条光线; 以及照相机，用于拾取施加到轮胎表面上的多条线光束的图像，所述方向在多条线光束中的每条线的主光线相对于轮胎表面进行镜面反射的方向上，其中冷凝的一行光束的主射线相对于轮胎表面执行镜面反射。

7. 发明申请

US20090046566A1 RECORDING LAYER FOR OPTICAL INFORMATION RECORDING MEDIUM, OPTICAL INFORMATION RECORDING MEDIUM, AND SPUTTERING TARGET FOR OPTICAL INFORMATION RECORDING MEDIUM 审中-公开
标题翻译：用于光信息记录介质的记录层，光信息记录介质和用于光信息记录介质的喷射目标
公开(公告)号：US20090046566A1
公开(公告)日：2009-02-19
申请号：US12090569
申请日：2006-10-17
申请人： Hideo Fujii , Tatewaki Ido , Yuki Tauchi , Naokazu Sakoda
发明人： Hideo Fujii , Tatewaki Ido , Yuki Tauchi , Naokazu Sakoda
IPC分类号： G11B7/26
CPC分类号： C22C13/00 , G11B7/243 , G11B7/258 , G11B2007/24304 , G11B2007/2431 , G11B2007/24312
摘要： Provided is a recording layer for optical information storage media, which not only excels in initial reflectivity and creativity of recording marks, but also extremely excels in durability under high temperature and high humidity conditions, and which can be adequately applied to next-generation optical discs using blue-violet laser. The recording layer for optical information storage media is a recording layer to create recording marks upon irradiation with a laser beam. This recording layer is composed of a tin-based alloy containing a total of 1.0 atomic percent or more and 15 atomic percent or less of at least one selected from neodymium (Nd), gadolinium (Gd), and lanthanum (La).
摘要翻译：提供了一种用于光学信息存储介质的记录层，其不仅优于记录标记的初始反射率和创造力，而且在高温和高湿度条件下的耐久性也非常优异，并且可以适用于下一代光盘使用蓝紫激光。用于光学信息存储介质的记录层是用激光束照射时产生记录标记的记录层。该记录层由含有总计1.0原子％以上且15原子％以下的选自钕（Nd），钆（Gd）和镧（La）中的至少一种的锡基合金构成。

8. 发明授权

US5439866A Silver-containing tobermorite 失效
标题翻译：含银雪宝石
公开(公告)号：US5439866A
公开(公告)日：1995-08-08
申请号：US108574
申请日：1993-11-01
申请人： Naokazu Sakoda , Kouju Sugiyama
发明人： Naokazu Sakoda , Kouju Sugiyama
IPC分类号： B01J20/10 , A01N59/16 , A23L3/3427 , A23L3/3445 , A23L3/358 , A61L2/16 , C01B33/20 , C01B33/24 , C01B33/38 , B01J20/04 , B01J20/12
CPC分类号： C01B33/38 , A01N59/16 , A23L3/3427 , A23L3/3445 , A23L3/358 , A61L2/16 , C01B33/20 , C01B33/24
摘要： A novel silver-containing tobermorite usable in place of silver-, copper- or zing-incorporating zeolites and having ethylene-adsorbing ability and antibacterial properties. Stated more particularly, a silver-containing tobermorite having a composition of [Ca.sub.5-Y/2 Ag.sub.Y+Z M.sub.x-z (Si.sub.6-x Al.sub.x O.sub.18 H.sub.2).4H.sub.2 O, 0.ltoreq.X.ltoreq.1, 0.001.ltoreq.Y.ltoreq.2, 0.ltoreq.Z.ltoreq.0.1, M is a monovalent cation] and prepared from a tobermorite [Ca.sub.5 M.sub.x (Si.sub.6-x Al.sub.x O.sub.18 H.sub.2).4H.sub.2 O, 0.ltoreq.X.ltoreq.1, M is as defined above] by exchanging Ca.sup.2+, or Ca.sup.2+ and a monovalent cation which are interlayer ions of the tobermorite for silver ion. The silver-containing tobermorite is excellent in heat resistance, water resistance and mechanical strength, and also outstanding in ethylene-adsorbing ability and antibacterial properties.
摘要翻译： PCT No.PCT / JP93 / 00284 Sec。 371日期：1993年11月1日 102（e）1993年11月1日PCT 1993年3月4日PCT公布。公开号WO93 / 17964 日期：1993年9月16日。一种新颖的含银雪松石，可用于代替含银，铜或锌的沸石，具有乙烯吸附能力和抗菌性能。更具体地说，具有组成为[Ca5-Y / 2AgY + ZMx-z（Si6-xAlxO18H2）·4H2O，0≤X≤1,0.1Y≤Y≤2的含银硅钙石，0 = Z <= 0.1，M是一价阳离子]，并由雪白土[Ca5Mx（Si6-xAlxO18H 2）·4H 2 O，0 X = 1，M如上定义]由交换 Ca2 +或Ca2 +和作为银离子的硅钙石的层间离子的一价阳离子。含银雪宝石具有优异的耐热性，耐水性和机械强度，并且还具有优异的乙烯吸附能力和抗菌性能。

9. 发明授权

US08284393B2 Tire shape inspection method and tire shape inspection device 有权
标题翻译：轮胎形状检查方法和轮胎形状检查装置
公开(公告)号：US08284393B2
公开(公告)日：2012-10-09
申请号：US12737009
申请日：2009-06-03
申请人： Eiji Takahashi , Naokazu Sakoda
发明人： Eiji Takahashi , Naokazu Sakoda
IPC分类号： G01N21/00
CPC分类号： G01B11/25 , G06T7/0004 , G06T7/521 , G06T2207/10028
摘要： Disclosed is a tire shape inspection method that can reliably and without misidentification perform accurate shape defect inspection in a short period of time by excluding measurement values in a range in which embossed marks are formed from distribution information for surface height measurement values on the sidewall surface of a tire. In the method, a processor automatically detects the positions of the embossed marks based on sample surface shape information obtained from a sample of the tire, and automatically sets coordinate information for a mask range surrounding the area where said marks are present (S2-S15). The processor also causes a surface shape image based on the sample surface shape information and a mask range image based on the coordinate information for the mask range to be displayed superimposed on a display means, and changes the coordinate information for the mask range according to an operating input (S16). The processor also corrects deviation in the coordinate system between the surface height distribution information obtained from the tire undergoing inspection and the coordinate information for the mask range after changing, and excludes measurement values in the mask range from shape defect inspection processing.
摘要翻译：公开了一种轮胎形状检查方法，其能够可靠且无误差地在短时间内进行精确的形状缺陷检查，通过从形成有凸纹标记的范围内的测量值排除在侧壁表面上的表面高度测量值的分布信息轮胎在该方法中，处理器根据从轮胎样本获取的样本表面形状信息，自动检测压花标记的位置，并且自动设置围绕存在所述标记的区域的掩模范围的坐标信息（S2-S15）。处理器还基于样本表面形状信息和基于要在显示装置上重叠显示的掩模范围的坐标信息的掩模范围图像引起表面形状图像，并且根据显示装置改变掩模范围的坐标信息操作输入（S16）。处理器还校正从进行检查的轮胎获得的表面高度分布信息和改变后的掩模范围的坐标信息之间的坐标系中的偏差，并且从形状缺陷检查处理中排除掩模范围内的测量值。

10. 发明授权

US07724377B2 Apparatus and method for detecting tire shape 有权
标题翻译：轮胎形状检测装置及方法
公开(公告)号：US07724377B2
公开(公告)日：2010-05-25
申请号：US11898906
申请日：2007-09-17
申请人： Naokazu Sakoda , Eiji Takahashi , Tsutomu Morimoto , Yasuhiro Matsushita , Toshikatsu Nonaka , Shiro Horiguchi
发明人： Naokazu Sakoda , Eiji Takahashi , Tsutomu Morimoto , Yasuhiro Matsushita , Toshikatsu Nonaka , Shiro Horiguchi
IPC分类号： G01B11/24
CPC分类号： G01M17/027
摘要： A tire shape detecting apparatus includes a projector that applies a plurality line light beams in a continuously joined manner, from a direction different from the detection height direction (Z-axis direction) in one light section line, or that applies one line light beam in a condensed manner in the line length direction thereof in order that the one light section line may be formed on the one line Ls on the surface of the tire; and a camera for picking up images of the plurality of line light beams applied to the tire surface in the direction in which the principal ray of each of the plurality of line light beams performs specular reflection with respect to the tire surface, or in the direction in which the principal ray of the condensed one line light beam performs specular reflection with respect to the tire surface.
摘要翻译：轮胎形状检测装置包括投影仪，其从与一条光线中的检测高度方向（Z轴方向）不同的方向以连续接合的方式施加多条线光束，或者将一条线光束在其长度方向上以冷凝方式，以便在轮胎表面上的一条线Ls上形成一条光线; 以及照相机，用于拾取施加到轮胎表面上的多条线光束的图像，所述图像沿着所述多条线光束中的每一条的主光线相对于轮胎表面进行镜面反射的方向，或者朝向其中冷凝的一行光束的主射线相对于轮胎表面执行镜面反射。

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