专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US06838413B2 Oxysulfide photocatalyst for decomposition of water by visible light 失效
标题翻译：用于通过可见光分解水的氧硫化物光催化剂
公开(公告)号：US06838413B2
公开(公告)日：2005-01-04
申请号：US10433460
申请日：2002-01-23
申请人： Kazunari Domen , Michikazu Hara , Tsuyoshi Takata , Akio Ishikawa
发明人： Kazunari Domen , Michikazu Hara , Tsuyoshi Takata , Akio Ishikawa
IPC分类号： B01J23/63 , B01J27/04 , B01J27/045 , B01J35/00 , B01J35/02 , B01J37/02 , B01J37/04 , C01B3/04 , C01B13/02 , C01G23/00 , C01G33/00 , B01J27/02 , B01J23/00 , B01J27/043 , C01D5/10 , C09K11/08
CPC分类号： B01J35/004 , B01J23/63 , B01J27/04 , B01J27/045 , B01J35/002 , B01J37/0201 , B01J37/04 , C01B3/042 , C01B13/0207 , Y02E60/364
摘要： A photocatalyst which comprises an oxysulfide containing at least one transition metal; a preferable photocatalyst which also comprises a rare earth element such as Sm in addition to the above and wherein the transition metal is at least one selected from the group consisting of Ti and Nb; a more preferable photocatalyst which further comprises a promoter comprising a transition metal such as Pt loaded on each of the above photocatalyst; and a catalyst for use in the decomposition of water by a light which comprises one of the above oxysulfide photocatalysts.
摘要翻译：包含含有至少一种过渡金属的氧硫化物的光催化剂; 除了上述之外还包含稀土元素如Sm的优选光催化剂，其中过渡金属是选自Ti和Nb中的至少一种; 更优选的光催化剂还包含一种助催化剂，该助催化剂包含负载在上述每种光催化剂上的过渡金属如Pt; 以及用于通过包含上述氧硫化物光催化剂之一的光分解水的催化剂。

2. 发明申请

US20140313433A1 Process for the Production of a Layered Body and Layered Bodies Obtainable Therefrom 审中-公开
标题翻译：生产分层体和分层体的方法
公开(公告)号：US20140313433A1
公开(公告)日：2014-10-23
申请号：US14131614
申请日：2012-07-06
申请人： Udo Guntermann , Detlef Gaiser , Myriam Grasse , Akio Ishikawa
发明人： Udo Guntermann , Detlef Gaiser , Myriam Grasse , Akio Ishikawa
IPC分类号： G06F3/041
摘要： Described is a process for the production of a layered body S2 comprising: i. provision of a layered body S1 comprising a substrate and an electrically conductive layer which is applied to the substrate and comprises an electrically conductive polymer P1; ii. partial covering of a part of the electrically conductive layer with a covering layer D, comprising a polymer P2 contained therein, from a covering phase to obtain at least one covered region Dd and at least one non-covered region Du of the electrically conductive layer; iii. reduction of the electrical conductivity of the electrically conductive layer in at least a part of the at least one non-covered region Du compared with the electrical conductivity of the electrically conductive layer in the at least one covered region Dd; iv. at least partial removal of the covering layer D by an alkaline aqueous treatment.
摘要翻译：描述了生产层状体S2的方法，包括：i。提供层叠体S1，其包括衬底和施加到衬底并且包括导电聚合物P1的导电层; ii。部分覆盖导电层的一部分覆盖层D，其中包含聚合物P2包含在其中的覆盖层，以获得导电层的至少一个覆盖区域Dd和至少一个非覆盖区域Du; iii。在所述至少一个非覆盖区域Du的至少一部分中导电层的导电率降低至与所述至少一个覆盖区域Dd中的所述导电层的导电率相比较; iv。通过碱性水性处理至少部分去除覆盖层D.

3. 发明授权

US08687000B2 Image generating apparatus and computer program 失效
标题翻译：图像生成装置和计算机程序
公开(公告)号：US08687000B2
公开(公告)日：2014-04-01
申请号：US12718431
申请日：2010-03-05
申请人： Mehrdad Panahpour Tehrani , Akio Ishikawa
发明人： Mehrdad Panahpour Tehrani , Akio Ishikawa
IPC分类号： G06T15/00 , G06T15/40 , G09G5/00 , G06K9/00 , H04N13/00 , H04N13/02
CPC分类号： G06T15/405 , G06T15/005
摘要： The present invention relates to an image generating apparatus for generating an image from a viewpoint specified by a user. According to the invention, the apparatus has a storage unit that stores a plurality of pre-images from viewpoints on predetermined lines and depth maps indicating a depth value of each pixel of a corresponding pre-image, and an image generating unit that generates a first image from a first viewpoint based on the pre-images and depth maps.
摘要翻译：本发明涉及从用户指定的视点生成图像的图像生成装置。根据本发明，该装置具有存储单元，该存储单元从预定行上的视点存储多个预图像，并且指示相应预图像的每个像素的深度值的深度图以及生成第一图像的图像生成单元基于前图像和深度图从第一视点的图像。

4. 发明授权

US08422761B2 Defect and critical dimension analysis systems and methods for a semiconductor lithographic process 有权
标题翻译：半导体光刻工艺的缺陷和关键尺寸分析系统和方法
公开(公告)号：US08422761B2
公开(公告)日：2013-04-16
申请号：US12637331
申请日：2009-12-14
申请人： Tadashi Kitamura , Akio Ishikawa
发明人： Tadashi Kitamura , Akio Ishikawa
IPC分类号： G06K9/00
CPC分类号： G06T7/0006 , G06T7/13 , G06T2207/30148
摘要： Apparatus and method evaluate a wafer fabrication process for forming patterns on a wafer based upon design data. Within a recipe database, two or more inspection regions are defined on the wafer for analysis. Patterns within each of the inspection regions are automatically selected based upon tendency for measurement variation resulting from variation in the fabrication process. For each inspection region, at least one image of patterns within the inspection region is captured, a reference pattern, represented by one or both of (a) one or more line segments and (b) one or more curves, is automatically generated from the design data. An inspection unit detects edges within each of the images and registers the image with the reference pattern. One or more measurements are determined from the edges for each of the selected patterns and are processed within a statistical analyzer to form statistical information associated with the fabrication process.
摘要翻译：基于设计数据，装置和方法评估在晶片上形成图案的晶片制造工艺。在配方数据库中，在晶片上定义两个或更多个检查区域用于分析。基于制造过程的变化导致的测量变化的趋势，自动地选择每个检查区域内的图案。对于每个检查区域，捕获检查区域内的图案的至少一个图像，由（a）一个或多个线段和（b）一个或多个曲线中的一个或两个表示的参考图案从设计数据。检查单元检测每个图像内的边缘，并用参考图案注册图像。从针对每个所选择的图案的边缘确定一个或多个测量值，并在统计分析器内处理以形成与制造过程相关联的统计信息。

5. 发明授权

US08164633B2 Calibration apparatus and method for imaging devices and computer program 有权
标题翻译：用于成像装置和计算机程序的校准装置和方法
公开(公告)号：US08164633B2
公开(公告)日：2012-04-24
申请号：US12350621
申请日：2009-01-08
申请人： Mehrdad Panahpour Tehrani , Akio Ishikawa , Shigeyuki Sakazawa
发明人： Mehrdad Panahpour Tehrani , Akio Ishikawa , Shigeyuki Sakazawa
IPC分类号： H04N17/00 , H04N17/02
CPC分类号： G06T7/80
摘要： The present invention relates to calibration of camera parameters for converting a world coordinate system, which indicates a position in the real space, to a coordinate used in an image and vice versa. The apparatus according to the invention has a detection unit, which determines corresponding pixel pairs from the captured image and the model image and outputs corresponding data indicating determined pixel pairs, and a selection unit, which selects pixel pairs to be left in the corresponding data and removes data related to an unselected pixel pair from the corresponding data for generating selected corresponding data. The apparatus further has a calculation unit, which calculates camera parameters based on the selected corresponding data.
摘要翻译：本发明涉及用于将指示真实空间中的位置的世界坐标系转换为图像中使用的坐标的相机参数的校准，反之亦然。根据本发明的装置具有检测单元，该检测单元从捕获的图像和模型图像确定相应的像素对，并输出指示确定的像素对的对应数据，以及选择单元，其选择要留在相应数据中的像素对，以及从相应的数据移除与未选择的像素对有关的数据，以产生所选择的相应数据。该装置还具有计算单元，其基于所选择的相应数据来计算摄像机参数。

6. 发明申请

US20100215247A1 System And Method For A Semiconductor Lithographic Process Control Using Statistical Information In Defect Identification 有权
标题翻译：使用统计信息进行缺陷识别的半导体平版印刷过程控制的系统和方法
公开(公告)号：US20100215247A1
公开(公告)日：2010-08-26
申请号：US12725141
申请日：2010-03-16
申请人： Tadashi Kitamura , Akio Ishikawa
发明人： Tadashi Kitamura , Akio Ishikawa
IPC分类号： G06K9/00
CPC分类号： G06T7/001 , G06T2207/10004 , G06T2207/30148
摘要： A system and method is described for evaluating a wafer fabrication process for forming patterns on a wafer based upon data. Multiple inspection regions are defined on the wafer for analysis. For each inspection region, images of patterns within the inspection region are captured, edges are detected, and lines are registered to lines of a reference pattern automatically generated from the design data. Line widths are determined from the edges. Measured line widths are analyzed to provide statistics and feedback information regarding the fabrication process. In particular embodiments defects are identified as where measured line widths lie outside boundaries determined from the statistics. In particular embodiments, lines of different drawn width and/or orientation are grouped and analyzed separately. Measured line widths may also be grouped for analysis according to geometry such as shape or proximity to other shapes in the inspection region to provide feedback for optical proximity correction rules.
摘要翻译：描述了一种基于数据来评估在晶片上形成图案的晶片制造工艺的系统和方法。在晶片上定义多个检查区域用于分析。对于每个检查区域，捕获检查区域内的图案的图像，检测边缘，并且将线注册到从设计数据自动生成的参考图案的线上。线宽从边缘确定。分析测量线宽以提供关于制造过程的统计和反馈信息。在特定实施例中，将缺陷识别为测量的线宽在从统计确定的边界之外的位置。在特定实施例中，将不同拉伸宽度和/或取向的线分开并分开分析。测量的线宽也可以根据诸如形状或检查区域中其他形状的接近度的几何形状进行分组，以提供用于光学邻近校正规则的反馈。

7. 发明授权

US07492942B2 Image defect inspection method, image defect inspection apparatus, and appearance inspection apparatus 失效
标题翻译：图像缺陷检查方法，图像缺陷检查装置和外观检查装置
公开(公告)号：US07492942B2
公开(公告)日：2009-02-17
申请号：US11206706
申请日：2005-08-17
申请人： Akio Ishikawa , Shinji Ueyama
发明人： Akio Ishikawa , Shinji Ueyama
IPC分类号： G06K9/00
CPC分类号： G01N21/95607
摘要： In an image defect inspection method and apparatus, which detects a gray level difference between the corresponding portions of two images, automatically sets a threshold value based on the distribution of the detected gray level difference, compares the detected gray level difference with the threshold value, and judges one or the other of the portions to be defective if the gray level difference is larger than the threshold value, provisions are made to reduce the occurrence of false defects when there is a brightness difference between the two images undergoing the comparison. In the image defect inspection method, the brightness difference between the two images is computed (S106), and the threshold value is determined in such a manner that the threshold value increases with the computed brightness difference (S107).
摘要翻译：在检测两个图像的对应部分之间的灰度差的图像缺陷检查方法和装置中，基于检测到的灰度级差的分布自动设置阈值，将检测到的灰度级差与阈值进行比较，并且如果灰度级差大于阈值，则判断出有缺陷的部分中的一个或另一个部分，当进行比较的两个图像之间存在亮度差时，进行减少假缺陷的发生。在图像缺陷检查方法中，计算两个图像之间的亮度差（S106），并且以阈值随计算的亮度差增大的方式确定阈值（S107）。

8. 发明申请

US20070291850A1 Alarm information display unit 失效
标题翻译：报警信息显示单元
公开(公告)号：US20070291850A1
公开(公告)日：2007-12-20
申请号：US11808818
申请日：2007-06-13
申请人： Akio Ishikawa , Atsushi Koike
发明人： Akio Ishikawa , Atsushi Koike
IPC分类号： H04N11/04 , H04B1/66
CPC分类号： H04N21/4347 , H04N19/597 , H04N21/21805 , H04N21/2365 , H04N21/2383 , H04N21/8146
摘要： A plurality of cameras is placed so that those optical axes become parallel to the Z-axis and are in relative position t on the XY plane. Multi-view video compression coding apparatus determines depth distance Z and unit normal vector (nx, ny, nz) of the arbitrary point in the surface of the object, moves the first block by disparity vector based on t and Z, transforming the first block by linear transformation matrix based on t, Z and n, then, matching the first block to block of the second picture. Then, while changing Z and n arbitrarily, the second block of the second picture which is most similar to the first block is searched for. And the apparatus derives a prediction error between the first block and the second block, codes the prediction error, and adds Z and n to coded data.
摘要翻译：放置多个照相机，使得这些光轴变得平行于Z轴并且在XY平面上处于相对位置t。多视点视频压缩编码装置确定对象表面中的任意点的深度距离Z和单位法向量（nx，ny，nz），基于t和Z移动第一块视差矢量，将第一块通过基于t，Z和n的线性变换矩阵，然后匹配第一个块到第二个图像的块。然后，在任意地改变Z和n的同时，搜索与第一块最相似的第二图像的第二块。并且该装置导出第一块和第二块之间的预测误差，对预测误差进行编码，并将Z和n添加到编码数据。

9. 发明申请

US20060098863A1 Image defect inspection method, image defect inspection apparatus, and appearance inspection apparatus 失效
标题翻译：图像缺陷检查方法，图像缺陷检查装置和外观检查装置
公开(公告)号：US20060098863A1
公开(公告)日：2006-05-11
申请号：US11206706
申请日：2005-08-17
申请人： Akio Ishikawa , Shinji Ueyama
发明人： Akio Ishikawa , Shinji Ueyama
IPC分类号： G06K9/00
CPC分类号： G01N21/95607
摘要： In an image defect inspection method and apparatus, which detects a gray level difference between the corresponding portions of two images, automatically sets a threshold value based on the distribution of the detected gray level difference, compares the detected gray level difference with the threshold value, and judges one or the other of the portions to be defective if the gray level difference is larger than the threshold value, provisions are made to reduce the occurrence of false defects when there is a brightness difference between the two images undergoing the comparison. In the image defect inspection method, the brightness difference between the two images is computed (S106), and the threshold value is determined in such a manner that the threshold value increases with the computed brightness difference (S107).
摘要翻译：在检测两个图像的对应部分之间的灰度差的图像缺陷检查方法和装置中，基于检测到的灰度级差的分布自动设置阈值，将检测到的灰度级差与阈值进行比较，并且如果灰度级差大于阈值，则判断出有缺陷的部分中的一个或另一个部分，当进行比较的两个图像之间存在亮度差时，进行减少假缺陷的发生。在图像缺陷检查方法中，计算两个图像之间的亮度差（S106），并且以阈值随计算的亮度差增加的方式确定阈值（S107）。

10. 发明授权

US4019228A Crimping apparatus 失效
标题翻译：压接装置
公开(公告)号：US4019228A
公开(公告)日：1977-04-26
申请号：US611886
申请日：1975-09-10
申请人： Goro Ozawa , Kenzo Kosaka , Kasumi Sato , Akio Ishikawa , Toshiyuki Nanbu , Kiyoshi Adachi , Tsutomu Okaya , Takashi Goto , Hiroshi Kitagawa
发明人： Goro Ozawa , Kenzo Kosaka , Kasumi Sato , Akio Ishikawa , Toshiyuki Nanbu , Kiyoshi Adachi , Tsutomu Okaya , Takashi Goto , Hiroshi Kitagawa
IPC分类号： D02G1/12 , D02G1/20 , D02G1/16
CPC分类号： D02G1/122
摘要： A filamentary strand of a thermoplastic nature is ejected from an ejection nozzle being entrained on a heated medium flow into a stuffing chamber structured on a circulating endless surface moving at a speed slower than the ejection speed and the stuffed filamentary strand is transported, being carried by the endless surface, towards a downstream outlet of the stuffing room in such a way that the yarn mass is gradually compressed during displacement toward the downstream outlet of said stuffing room. During the transportation either a free or a positive cooling is employed. The resultant filamentary strand is provided with random, bulky and round three-dimensional crimps.
摘要翻译：热塑性本体的长丝股从喷嘴喷出，夹带在加热的介质流上，进入一个以循环循环的循环表面形成的填充室，该循环循环的表面以比喷射速度慢的速度运动，并且填充的长丝股被运送，由该无端面朝着填充室的下游出口，使得纱线质量在朝向所述填充室的下游出口移动期间逐渐被压缩。在运输期间，使用自由或正冷却。所得到的长丝股线被提供有随机，笨重和圆形的三维卷曲。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式