会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 3. 发明授权
    • Ion implantation apparatus for semiconductor manufacture
    • 用于半导体制造的离子注入装置
    • US4839523A
    • 1989-06-13
    • US588981
    • 1984-03-13
    • Shunroku TayaKatsunobu AbeAtsushi Shibata
    • Shunroku TayaKatsunobu AbeAtsushi Shibata
    • C30B31/22H01J37/05H01J37/317H01L21/265
    • C30B31/22H01J37/05H01J37/317H01J37/3171
    • An ion implantation apparatus which is suited for manufacturing semiconductor devices and which is particularly suited for implanting double charged ions into the wafers 22. Ions of a predetermined mass only are selected by a mass-separating electromagnet 14 from an ion beam 12 that is emitted from an ion source 10, and are implanted into the wafer 22 via a slit 16. Between the slit 16 and the mass-separating electromagnet, there are provided field electrodes 24 having a direction of deflection which is the same as that of the mass-separating electromagnet 14 to separate ions having different energy levels, and deflection magnets 26 having a direction of deflection at right angles with the direction of deflection of the mass-separating electromagnet. The slit 16 is arranged so that undeflected neutral particles and low energy ions deflected by the field electrodes 24 will pass through the slit while high energy ions will be deflected the proper amount to pass through the slit. Correction means 32 can be located between the slit and the wafer to ensure that the beam passing through the slit strikes the wafer at the proper angle.
    • 一种适用于制造半导体器件的离子注入装置,其特别适于将双电荷离子注入到晶片22中。仅通过质量分离电磁体14从离子束12中选出一个预定质量的离子,离子束12从 离子源10,并且经由狭缝16注入晶片22中。在狭缝16和质量分离电磁体之间,提供具有与质量分离的偏转方向相同的偏转方向的场电极24 用于分离具有不同能级的离子的电磁体14以及具有与质量分离电磁体的偏转方向成直角的偏转方向的偏转磁体26。 狭缝16布置成使得由场电极24偏转的未偏转的中性粒子和低能离子将穿过狭缝,同时高能离子将被偏转适当的量以通过狭缝。 校正装置32可以位于狭缝和晶片之间,以确保通过狭缝的光束以适当的角度撞击晶片。